CA2029540A1 - Solder joint locator - Google Patents

Solder joint locator

Info

Publication number
CA2029540A1
CA2029540A1 CA2029540A CA2029540A CA2029540A1 CA 2029540 A1 CA2029540 A1 CA 2029540A1 CA 2029540 A CA2029540 A CA 2029540A CA 2029540 A CA2029540 A CA 2029540A CA 2029540 A1 CA2029540 A1 CA 2029540A1
Authority
CA
Canada
Prior art keywords
solder joint
determines
pixels
center
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2029540A
Other languages
French (fr)
Other versions
CA2029540C (en
Inventor
Michael W. Bushroe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raytheon Co
Original Assignee
Michael W. Bushroe
Hughes Aircraft Company
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Michael W. Bushroe, Hughes Aircraft Company filed Critical Michael W. Bushroe
Publication of CA2029540A1 publication Critical patent/CA2029540A1/en
Application granted granted Critical
Publication of CA2029540C publication Critical patent/CA2029540C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30152—Solder

Abstract

ABSTRACT OF THE DISCLOSURE

A system (82) and method for locating features in an image. In the preferred embodiments, the present invention accepts as input a tilted view X-ray image of a PC board (10), as well as expected locations of solder joints (18) in the PC board (10). The present invention then determines the actual center locations (32) of these solder joints (18) by defining windows within the image and checking individual areas within the window, to see if they fall below a predetermined threshold. In addition, the system (82) determines if these pixels are connected to other pixels that have been previously determined to be part of the solder joint (18). Finally, the system (82) determines the center of the group of pixels determined to be part of the solder joint and displays the coordinate location of this center.
CA002029540A 1989-12-21 1990-11-09 Solder joint locator Expired - Fee Related CA2029540C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US454,804 1989-12-21
US07/454,804 US5164994A (en) 1989-12-21 1989-12-21 Solder joint locator

Publications (2)

Publication Number Publication Date
CA2029540A1 true CA2029540A1 (en) 1991-06-22
CA2029540C CA2029540C (en) 1994-05-24

Family

ID=23806172

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002029540A Expired - Fee Related CA2029540C (en) 1989-12-21 1990-11-09 Solder joint locator

Country Status (8)

Country Link
US (1) US5164994A (en)
EP (1) EP0433803A1 (en)
JP (1) JPH04120403A (en)
KR (1) KR940000029B1 (en)
CA (1) CA2029540C (en)
IL (1) IL96335A0 (en)
NO (1) NO905397L (en)
TR (1) TR25247A (en)

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ATE246803T1 (en) * 1997-05-05 2003-08-15 Macrotron Process Technologies METHOD AND CIRCUIT ARRANGEMENT FOR TESTING SOLDER JOINTS
US6141033A (en) * 1997-05-15 2000-10-31 Cognex Corporation Bandwidth reduction of multichannel images for machine vision
US6608647B1 (en) 1997-06-24 2003-08-19 Cognex Corporation Methods and apparatus for charge coupled device image acquisition with independent integration and readout
US5978080A (en) * 1997-09-25 1999-11-02 Cognex Corporation Machine vision methods using feedback to determine an orientation, pixel width and pixel height of a field of view
US6025854A (en) * 1997-12-31 2000-02-15 Cognex Corporation Method and apparatus for high speed image acquisition
US6236769B1 (en) 1998-01-28 2001-05-22 Cognex Corporation Machine vision systems and methods for morphological transformation of an image with zero or other uniform offsets
US6282328B1 (en) 1998-01-28 2001-08-28 Cognex Corporation Machine vision systems and methods for morphological transformation of an image with non-uniform offsets
US6381375B1 (en) 1998-02-20 2002-04-30 Cognex Corporation Methods and apparatus for generating a projection of an image
US6215915B1 (en) 1998-02-20 2001-04-10 Cognex Corporation Image processing methods and apparatus for separable, general affine transformation of an image
US6633663B1 (en) * 1998-05-05 2003-10-14 International Business Machines Corporation Method and system for determining component dimensional information
US6314201B1 (en) 1998-10-16 2001-11-06 Agilent Technologies, Inc. Automatic X-ray determination of solder joint and view delta Z values from a laser mapped reference surface for circuit board inspection using X-ray laminography
US6526165B1 (en) * 1998-11-30 2003-02-25 Cognex Corporation Methods and apparatuses for refining a geometric description of an object having a plurality of extensions
US6687402B1 (en) 1998-12-18 2004-02-03 Cognex Corporation Machine vision methods and systems for boundary feature comparison of patterns and images
US6381366B1 (en) 1998-12-18 2002-04-30 Cognex Corporation Machine vision methods and system for boundary point-based comparison of patterns and images
KR100339008B1 (en) * 1999-04-12 2002-05-31 구자홍 Method for cross sectional inspection of PCB using X-ray
US6813377B1 (en) * 1999-08-06 2004-11-02 Cognex Corporation Methods and apparatuses for generating a model of an object from an image of the object
US6898333B1 (en) 1999-08-06 2005-05-24 Cognex Corporation Methods and apparatus for determining the orientation of an object in an image
GB9918681D0 (en) * 1999-08-09 1999-10-13 Smithkline Beecham Plc Novel method
GB9923795D0 (en) 1999-10-09 1999-12-08 British Aerospace Micropositioning system
US6684402B1 (en) 1999-12-01 2004-01-27 Cognex Technology And Investment Corporation Control methods and apparatus for coupling multiple image acquisition devices to a digital data processor
US6748104B1 (en) 2000-03-24 2004-06-08 Cognex Corporation Methods and apparatus for machine vision inspection using single and multiple templates or patterns
US6744913B1 (en) * 2000-04-18 2004-06-01 Semiconductor Technology & Instruments, Inc. System and method for locating image features
US6459807B1 (en) 2000-06-13 2002-10-01 Semiconductor Technologies & Instruments, Inc. System and method for locating irregular edges in image data
US7024031B1 (en) * 2001-10-23 2006-04-04 August Technology Corp. System and method for inspection using off-angle lighting
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JP3974022B2 (en) * 2002-11-21 2007-09-12 富士通株式会社 Feature amount calculation method and apparatus for soldering inspection, and program for executing the method
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Also Published As

Publication number Publication date
NO905397L (en) 1991-06-24
KR910012993A (en) 1991-08-08
NO905397D0 (en) 1990-12-13
CA2029540C (en) 1994-05-24
US5164994A (en) 1992-11-17
EP0433803A1 (en) 1991-06-26
KR940000029B1 (en) 1994-01-05
JPH04120403A (en) 1992-04-21
IL96335A0 (en) 1991-08-16
TR25247A (en) 1993-01-01

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Legal Events

Date Code Title Description
EEER Examination request
MKLA Lapsed