US5600734A
(en)
*
|
1991-10-04 |
1997-02-04 |
Fujitsu Limited |
Electron beam tester
|
US6067379A
(en)
*
|
1988-12-09 |
2000-05-23 |
Cognex Corporation |
Method and apparatus for locating patterns in an optical image
|
DE4041484A1
(en)
*
|
1990-12-22 |
1992-06-25 |
Thomson Brandt Gmbh |
DEMAGNETIZING CIRCUIT FOR THE PIPES IN A TELEVISION RECEIVER
|
JP3062338B2
(en)
*
|
1991-03-01 |
2000-07-10 |
キヤノン株式会社 |
Image processing device
|
JP3237928B2
(en)
*
|
1992-12-04 |
2001-12-10 |
株式会社東芝 |
Pattern inspection method and apparatus
|
JPH07117498B2
(en)
*
|
1991-12-11 |
1995-12-18 |
インターナショナル・ビジネス・マシーンズ・コーポレイション |
Inspection system
|
IL102659A
(en)
*
|
1992-07-27 |
1997-07-13 |
Orbot Instr Ltd |
Apparatus and method for comparing and aligning two digital representations of an image
|
US5859923A
(en)
*
|
1992-12-29 |
1999-01-12 |
Cognex Corporation |
Mark quality inspection apparatus and method
|
JP3132794B2
(en)
*
|
1993-06-21 |
2001-02-05 |
シオノギクオリカプス株式会社 |
Inspection device for printed characters of solid preparations
|
US5452368A
(en)
*
|
1993-08-02 |
1995-09-19 |
Motorola, Inc. |
Method of detecting defects in semiconductor package leads
|
US5479683A
(en)
*
|
1993-12-29 |
1996-01-02 |
Bausch & Lomb Incorporated |
Three-dimensional eyewinder apparatus
|
US6026176A
(en)
|
1995-07-25 |
2000-02-15 |
Cognex Corporation |
Machine vision methods and articles of manufacture for ball grid array inspection
|
US5872870A
(en)
*
|
1996-02-16 |
1999-02-16 |
Cognex Corporation |
Machine vision methods for identifying extrema of objects in rotated reference frames
|
US5909504A
(en)
*
|
1996-03-15 |
1999-06-01 |
Cognex Corporation |
Method of testing a machine vision inspection system
|
US6298149B1
(en)
|
1996-03-21 |
2001-10-02 |
Cognex Corporation |
Semiconductor device image inspection with contrast enhancement
|
US6259827B1
(en)
|
1996-03-21 |
2001-07-10 |
Cognex Corporation |
Machine vision methods for enhancing the contrast between an object and its background using multiple on-axis images
|
US5978502A
(en)
*
|
1996-04-01 |
1999-11-02 |
Cognex Corporation |
Machine vision methods for determining characteristics of three-dimensional objects
|
US5835634A
(en)
*
|
1996-05-31 |
1998-11-10 |
Adobe Systems Incorporated |
Bitmap comparison apparatus and method using an outline mask and differently weighted bits
|
US6137893A
(en)
*
|
1996-10-07 |
2000-10-24 |
Cognex Corporation |
Machine vision calibration targets and methods of determining their location and orientation in an image
|
US5960125A
(en)
|
1996-11-21 |
1999-09-28 |
Cognex Corporation |
Nonfeedback-based machine vision method for determining a calibration relationship between a camera and a moveable object
|
US5953130A
(en)
*
|
1997-01-06 |
1999-09-14 |
Cognex Corporation |
Machine vision methods and apparatus for machine vision illumination of an object
|
US6075881A
(en)
|
1997-03-18 |
2000-06-13 |
Cognex Corporation |
Machine vision methods for identifying collinear sets of points from an image
|
US5974169A
(en)
*
|
1997-03-20 |
1999-10-26 |
Cognex Corporation |
Machine vision methods for determining characteristics of an object using boundary points and bounding regions
|
US6141033A
(en)
*
|
1997-05-15 |
2000-10-31 |
Cognex Corporation |
Bandwidth reduction of multichannel images for machine vision
|
US6608647B1
(en)
|
1997-06-24 |
2003-08-19 |
Cognex Corporation |
Methods and apparatus for charge coupled device image acquisition with independent integration and readout
|
US5978080A
(en)
*
|
1997-09-25 |
1999-11-02 |
Cognex Corporation |
Machine vision methods using feedback to determine an orientation, pixel width and pixel height of a field of view
|
AU9676298A
(en)
*
|
1997-10-01 |
1999-04-23 |
Island Graphics Corporation |
Image comparing system
|
US6025854A
(en)
*
|
1997-12-31 |
2000-02-15 |
Cognex Corporation |
Method and apparatus for high speed image acquisition
|
US6282328B1
(en)
|
1998-01-28 |
2001-08-28 |
Cognex Corporation |
Machine vision systems and methods for morphological transformation of an image with non-uniform offsets
|
US6236769B1
(en)
|
1998-01-28 |
2001-05-22 |
Cognex Corporation |
Machine vision systems and methods for morphological transformation of an image with zero or other uniform offsets
|
US6381375B1
(en)
|
1998-02-20 |
2002-04-30 |
Cognex Corporation |
Methods and apparatus for generating a projection of an image
|
US6215915B1
(en)
|
1998-02-20 |
2001-04-10 |
Cognex Corporation |
Image processing methods and apparatus for separable, general affine transformation of an image
|
US6075886A
(en)
*
|
1998-03-09 |
2000-06-13 |
Xerox Corporation |
Method and apparatus for reducing the complexity of color correction using subsampling
|
US6173213B1
(en)
|
1998-05-11 |
2001-01-09 |
Ellison Machinery Company |
Motorized inbound laser orientation and wheel recognition station
|
JP2000067247A
(en)
*
|
1998-06-08 |
2000-03-03 |
Toshiba Corp |
Image recognizing device
|
US6154567A
(en)
*
|
1998-07-01 |
2000-11-28 |
Cognex Corporation |
Pattern similarity metric for image search, registration, and comparison
|
US7016539B1
(en)
|
1998-07-13 |
2006-03-21 |
Cognex Corporation |
Method for fast, robust, multi-dimensional pattern recognition
|
US6687402B1
(en)
|
1998-12-18 |
2004-02-03 |
Cognex Corporation |
Machine vision methods and systems for boundary feature comparison of patterns and images
|
US6381366B1
(en)
|
1998-12-18 |
2002-04-30 |
Cognex Corporation |
Machine vision methods and system for boundary point-based comparison of patterns and images
|
CA2371998C
(en)
*
|
1999-02-11 |
2006-01-24 |
British Telecommunications Public Limited Company |
Analysis of video signal quality
|
KR100326563B1
(en)
*
|
1999-03-30 |
2002-03-12 |
곽정소 |
Degaussing Circuit and Method of Driving The Same
|
US6735327B1
(en)
|
1999-09-16 |
2004-05-11 |
Shofner Engineering Associates, Inc. |
Color and trash measurements by image analysis
|
US6684402B1
(en)
|
1999-12-01 |
2004-01-27 |
Cognex Technology And Investment Corporation |
Control methods and apparatus for coupling multiple image acquisition devices to a digital data processor
|
JP3604993B2
(en)
*
|
2000-03-16 |
2004-12-22 |
シャープ株式会社 |
Image encoding device, image encoding method, image decoding device, and image decoding method
|
US6748104B1
(en)
|
2000-03-24 |
2004-06-08 |
Cognex Corporation |
Methods and apparatus for machine vision inspection using single and multiple templates or patterns
|
DE10103958C1
(en)
*
|
2001-01-30 |
2002-05-29 |
Infineon Technologies Ag |
Defect detection method for semiconductor exposure mask uses comparison of actual mask image with reference mask image
|
US6959112B1
(en)
|
2001-06-29 |
2005-10-25 |
Cognex Technology And Investment Corporation |
Method for finding a pattern which may fall partially outside an image
|
US8081820B2
(en)
|
2003-07-22 |
2011-12-20 |
Cognex Technology And Investment Corporation |
Method for partitioning a pattern into optimized sub-patterns
|
US7190834B2
(en)
|
2003-07-22 |
2007-03-13 |
Cognex Technology And Investment Corporation |
Methods for finding and characterizing a deformed pattern in an image
|
WO2005010561A2
(en)
*
|
2003-07-22 |
2005-02-03 |
L-3 Communications Security and Detection Systems Corporation |
Methods and apparatus for detecting objects in baggage using x-rays
|
US7423280B2
(en)
*
|
2004-08-09 |
2008-09-09 |
Quad/Tech, Inc. |
Web inspection module including contact image sensors
|
US9098932B2
(en)
*
|
2004-08-11 |
2015-08-04 |
Ati Technologies Ulc |
Graphics processing logic with variable arithmetic logic unit control and method therefor
|
JP4154374B2
(en)
*
|
2004-08-25 |
2008-09-24 |
株式会社日立ハイテクノロジーズ |
Pattern matching device and scanning electron microscope using the same
|
US8437502B1
(en)
|
2004-09-25 |
2013-05-07 |
Cognex Technology And Investment Corporation |
General pose refinement and tracking tool
|
US20060147707A1
(en)
*
|
2004-12-30 |
2006-07-06 |
Jian Meng |
Compacted, chopped fiber glass strands
|
DE102005026630A1
(en)
*
|
2005-06-03 |
2006-12-07 |
Würth Elektronik GmbH & Co. KG |
Identical objects, e.g. electronic printed circuit boards, inspecting method, involves recording, storing and displaying image of printed circuit board to be inspected after inspection of another board to be inspected
|
US8111904B2
(en)
|
2005-10-07 |
2012-02-07 |
Cognex Technology And Investment Corp. |
Methods and apparatus for practical 3D vision system
|
US8162584B2
(en)
|
2006-08-23 |
2012-04-24 |
Cognex Corporation |
Method and apparatus for semiconductor wafer alignment
|
US8103085B1
(en)
|
2007-09-25 |
2012-01-24 |
Cognex Corporation |
System and method for detecting flaws in objects using machine vision
|
JP5408139B2
(en)
*
|
2008-10-09 |
2014-02-05 |
日本電気株式会社 |
Anomaly detection system, anomaly detection method and anomaly detection program
|
JP5719967B2
(en)
*
|
2012-03-13 |
2015-05-20 |
富士フイルム株式会社 |
Imaging device with projector and control method thereof
|
US9679224B2
(en)
|
2013-06-28 |
2017-06-13 |
Cognex Corporation |
Semi-supervised method for training multiple pattern recognition and registration tool models
|