CN103776873A - Method for constructing current-voltage mapping by virtue of voltage-current mapping - Google Patents

Method for constructing current-voltage mapping by virtue of voltage-current mapping Download PDF

Info

Publication number
CN103776873A
CN103776873A CN201410054956.XA CN201410054956A CN103776873A CN 103776873 A CN103776873 A CN 103776873A CN 201410054956 A CN201410054956 A CN 201410054956A CN 103776873 A CN103776873 A CN 103776873A
Authority
CN
China
Prior art keywords
lambda
current
voltage
epsiv
matrix
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201410054956.XA
Other languages
Chinese (zh)
Other versions
CN103776873B (en
Inventor
曹章
徐立军
黄驰
孙世杰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beihang University
Original Assignee
Beihang University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beihang University filed Critical Beihang University
Priority to CN201410054956.XA priority Critical patent/CN103776873B/en
Publication of CN103776873A publication Critical patent/CN103776873A/en
Application granted granted Critical
Publication of CN103776873B publication Critical patent/CN103776873B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

The invention relates to a method for constructing current-voltage mapping by virtue of voltage-current mapping. The method is characterized in that for a sensor with N electrodes in electric tomography, a current-voltage matrix is exclusively calculated through a derived formula through the parameters such as characteristic value and characteristic vector of a voltage-current matrix so as to construct the current-voltage mapping. The invention provides a method for directly constructing the current-voltage mapping, the method can be applied to the direct reconstruction algorithm in the field of the electric tomography, the physical significance of the method is clear, and the method is simple and feasible.

Description

A kind of method by the mapping of voltage-to-current map construction current-voltage
Technical field
The present invention relates to electricity chromatography imaging field, relate in particular to a kind of method by the mapping of voltage-to-current map construction current-voltage.
Background technology
Electricity tomography (Electrical Tomography is called for short ET) technology is the one of chromatography imaging technique.By testee is applied to excitation, and detect the variation of its boundary value, utilize the distribution of specific reconstruction algorithm reconstruct measurand internal electrical characterisitic parameter, thereby obtain the distribution situation of interior of articles.Compared with other chromatography imaging techniques, that electricity tomography has is radiationless, Noninvasive, portability, fast response time, the advantage such as cheap.
Electricity chromatography imaging reconstruction algorithm generally can be divided into two classes: the reconstruction algorithm based on sensitivity matrix and directly reconstruction algorithm.Use the former conventionally need to separate ill linear equation, this just means all pixel values that must simultaneously rebuild measured zone.The latter is shone upon to realize by calculating current-voltage mapping or voltage-to-current, and the gray-scale value of each pixel can be through directly, independently calculating acquisition.
The building method of current-voltage mapping is the important component part of the direct reconstruction algorithm of electricity tomography.For the sensor that has N electrode, can apply Law of Inner Product and construct current-voltage mapping.But also do not shine upon to construct at present the direct building method of current-voltage mapping according to voltage-to-current.
Summary of the invention
The object of the invention is to propose a kind of direct building method that shines upon to construct current-voltage mapping according to voltage-to-current.
Technical scheme of the present invention is:
Step 1, the current density having on the electrode of sensor of N electrode have general expression
Figure BDA0000466964810000011
being write as matrix form has:
J = 1 A C · V - - - ( 1 )
Wherein J is current density vector, the internal surface area that A is each electrode, and C is capacitance matrix, and V is voltage vector, and expression formula is:
C = C 1,1 - C 1,2 - C 1,3 . . . - C 1 , N - C 2,1 C 2,2 - C 2,3 . . . - C 2 , N - C 3,1 - C 3 , 2 C 3,3 . . . - C 3 , N . . . . . . . . . . . . . . . - C N , 1 - C N , 2 - C N , 3 . . . C N , N , j 1 j 2 j 3 . . . j N , V = V 1 V 2 V 3 . . . V N - - - ( 2 )
J sthe current density on the individual electrode inside surface of s (1≤s≤N), V tt the magnitude of voltage on electrode, C s,tit is the capacitance between electrode s and electrode t.Self-capacitance C s,sbe defined as the electric capacity summation between s electrode and other N-1 electrode,
C s , s = Σ t = 1 t ≠ s N C s , t - - - ( 3 )
So have
Λ ϵ N × N = 1 A C - - - ( 4 )
Figure BDA0000466964810000026
being number of poles is N, voltage-to-current mapping matrix when specific inductive capacity is distributed as ε (z).
Known according to Kirchhoff's law, loop current sum is zero, and the order of current density vector J is N-1, and the order of Matrix C is also N-1, and the order that can draw thus voltage vector is also N-1, therefore order
Figure BDA0000466964810000027
So
V = R ϵ N × N J = R ϵ N × N Λ ϵ N × N V - - - ( 6 )
Wherein
Figure BDA0000466964810000029
being number of poles is N, current-voltage mapping matrix when specific inductive capacity is distributed as ε (z).
Front N-1 the eigenwert that can prove V is-1, and last eigenwert is 0.By calculating eigenwert and the proper vector of V, can obtain:
V=P{diag([-1-1…-10]) N×N}P T (7)
Wherein diag () n × Nrepresent the diagonal matrix on N rank, P tp=I, P=[p 1p 2p n-1p n].Defined feature vector p ii (1≤i≤N-1) row of P, i.e. Vp i=(1) p i, p neigenwert 0 characteristic of correspondence vector, i.e. Vp n=(0) p n.Because the mean value of every row in equation (5) is all 0, therefore
p N = 1 N 1 1 . . . 1 1 1 × N T , So V can be written as:
V = - I N × N + p N p N T - - - ( 8 )
Wherein I n × Nit is the unit matrix on N rank.
Similarly, by computation of characteristic values and proper vector, order be N-1, can be written as following form:
Λ ϵ N × N = QΣ Λ Q T = Q { diag ( λ 1 λ 2 . . . λ N - 1 0 ) N × N } Q T - - - ( 9 )
Wherein Σ Λ=diag ([λ 1λ 2λ n-10] n × N) by N the diagonal matrix that eigenwert forms of R, the matrix that Q is made up of corresponding proper vector.Q tq=I, Q=[q 1q 2q n-1q n], proper vector q ii (1≤i≤N-1) row of Q, i.e. Rq iiq i, q n proper vector 0 characteristic of correspondence vector, i.e. Rq n=(0) q n, p N = 1 N 1 1 . . . 1 1 1 × N T , Therefore have
Q T VQ = Q T ( - I N × N + p N p N T ) Q = - I N × N + Q T ( q N q N T ) Q - - - ( 10 )
= diag ( - 1 - 1 . . . - 1 0 ) N × N
Step 2, formula (7) substitution formula (6) is had:
P { diag ( - 1 - 1 . . . - 1 0 ) N × N } P T = R ϵ N × N Λ ϵ N × N P { diag ( - 1 - 1 . . . - 1 0 ) N × N } P T
(11)
Both members is premultiplication P simultaneously t, the right side takes advantage of P to obtain:
diag ( - 1 - 1 . . . - 1 0 ) N × N = P T R ϵ N × N Λ ϵ N × N P { diag ( - 1 - 1 . . . - 1 0 ) N × N }
(12)
The matrix that a Matrix Multiplication obtains take diagonal matrix if easily know is still diagonal matrix, and this matrix is also diagonal matrix.So known:
P T R ϵ N × N Λ ϵ N × N P { diag ( 1 1 . . . 1 0 ) N × N } - - - ( 13 )
At formula (13) premultiplication P, P is taken advantage of on the right side again t:
P { diag ( 1 1 . . . 1 0 ) N × N } P T = R ϵ N × N Λ ϵ N × N - - - ( 14 )
Formula (7) and formula (9) substitution formula (14) are obtained
- V = R ϵ N × N Λ ϵ N × N = R ϵ N × N Q Σ Λ Q T - - - ( 15 )
At formula (15) premultiplication Q t, the right side takes advantage of Q to obtain:
- Q T VQ = Q T R ϵ N × N Q Σ Λ - - - ( 16 )
By formula (10) substitution formula (16) and get final product:
- diag ( - 1 - 1 . . . - 1 0 ) N × N = Q T R ϵ N × N Qdiag ( λ 1 λ 2 . . . λ N - 1 0 ) N × N - - - ( 17 )
So have:
diag ( 1 λ 1 1 λ 2 . . . 1 λ N - 1 0 ) N × N Q T R ϵ N × N Q - - - ( 18 )
At formula (18) premultiplication Q, Q is taken advantage of on the right side t:
R ϵ N × N = Q { diag ( 1 λ 1 1 λ 2 . . . 1 λ N - 1 0 ) N × N } Q T - - - ( 19 )
Formula is known thus, matrix can be determined by unique.
Further, with reference to this method, any orthogonal set of current excitation pattern may be used to calculate current-voltage mapping.
Accompanying drawing explanation
Fig. 1 is implementing procedure figure.
Fig. 2 is embodiment isoboles.
Embodiment
Referring to Fig. 1, a kind of building method algorithm block diagram that shines upon to construct current-voltage mapping according to voltage-to-current.As example, the embodiment of this method is described take 16 end to end ring resistance networks shown in Fig. 2.
Said method comprising the steps of:
Step 1, the current density having on the electrode of sensor of N=16 electrode have general expression
Figure BDA0000466964810000048
being write as matrix form has:
J = 1 A C · V - - - ( 20 )
Wherein J is current density vector, the internal surface area that A is each electrode, and C is capacitance matrix, and V is voltage vector, and expression formula is:
C = C 1,1 - C 1,2 - C 1,3 . . . - C 1 , 16 - C 2,1 C 2,2 - C 2,3 . . . - C 2 , 16 - C 3,1 - C 3 , 2 C 3,3 . . . - C 3 , 16 . . . . . . . . . . . . . . . - C 16 , 1 - C 16 , 2 - C 16 , 3 . . . C 16 , 16 , j 1 j 2 j 3 . . . j 16 , V = V 1 V 2 V 3 . . . V 16 - - - ( 21 )
J sthe current density on the individual electrode inside surface of s (1≤s≤16), V tt the magnitude of voltage on electrode, C s,tit is the capacitance between electrode s and electrode t.Self-capacitance C s,sbe defined as the electric capacity summation between s electrode and other 15 electrodes,
C s , s = Σ t = 1 t ≠ s N C s , t - - - ( 22 )
So have
Λ ϵ 16 × 16 = 1 A C - - - ( 23 )
Known according to Kirchhoff's law, loop current sum is zero, and the order of current density vector J is 15, and the order of Matrix C is also 15, and the order that can draw thus voltage vector is also 15, therefore order
Figure BDA0000466964810000056
So
V = R ϵ 16 × 16 J = R ϵ 16 × 16 Λ ϵ 16 × 16 V - - - ( 25 )
Front 15 eigenwerts that can prove V are-1, and last eigenwert is 0.By calculating eigenwert and the proper vector of V, can obtain:
V=P{diag([-1-1…-10]) 16×16}P T (26)
Wherein diag () 16 × 16represent the diagonal matrix on 16 rank, P tp=I, P=[p 1p 2p 15p 16].Defined feature vector p ii (1≤i≤15) row of P, i.e. Vp i=(1) p i, p 16eigenwert 0 characteristic of correspondence vector, i.e. Vp 16=(0) p 16.Because the mean value of every a line in equation (24) is all 0, therefore p 16 = 1 4 1 1 . . . 1 1 1 × 16 T ,
So V can be written as:
V = - I 16 × 16 + p 16 p 16 T - - - ( 27 )
Wherein I 16 × 16it is the unit matrix on 16 rank.
Similarly, by computation of characteristic values and proper vector,
Figure BDA0000466964810000062
order be 15, can be written as following form:
Λ ϵ 16 × 16 = QΣ Λ Q T = Q { diag ( λ 1 λ 2 . . . λ 15 0 ) 16 × 16 } Q T - - - ( 28 )
Wherein Σ Λ=diag ([λ 1λ 2λ 150] 16 × 16) by 16 diagonal matrix that eigenwert forms of R, the matrix that Q is made up of corresponding proper vector.Q tq=I, Q=[q 1q 2q 15q 16], proper vector q ii (1≤i≤15) row of Q, i.e. Rq iiq i, q 16 proper vector 0 characteristic of correspondence vector, i.e. Rq 16=(0) q 16,
q 16 = 1 4 1 1 . . . 1 1 1 × 16 T .
From formula (24), in ring resistance network, can be calculated current matrix:
Figure BDA0000466964810000065
Hence one can see that, and voltage-to-current mapping matrix is
Figure BDA0000466964810000066
Calculate according to formula (28)
Figure BDA0000466964810000067
(31)
Figure BDA0000466964810000071
Step 2, formula (26) substitution formula (25) is had:
P { diag ( - 1 - 1 . . . - 1 0 ) 16 × 16 } P T = R ϵ 16 × 16 Λ ϵ 16 × 16 P { diag ( - 1 - 1 . . . - 1 0 ) 16 × 16 } P T
(33)
Obtain
R ϵ 16 × 16 = Qdiag ( 1 λ 1 1 λ 2 . . . 1 λ 15 0 ) 16 × 16 Q T
= Qdiag ( 1 0.5 + 0.2071 iλ 1 0.5 - 0.2071 i . . . 1 0.5 - 2.5137 i 0 ) 16 × 16 Q T - - - ( 34 )
Figure BDA0000466964810000075
Formula is known thus, matrix
Figure BDA0000466964810000076
can be determined by unique.
For proving this conclusion, do following checking: under adjacent incentive mode, calculate node potential matrix
Figure BDA0000466964810000077
Be consistent with the V setting, can verify thus this method.
A kind of described method by the mapping of voltage-to-current structure current-voltage, has provided a kind of computing method that current-voltage shines upon, the method explicit physical meaning, simple.With reference to this method, any orthogonal set of excitation measurement pattern may be used to calculate current-voltage mapping.
Description to the present invention and embodiment thereof, is not limited to this above, is only one of embodiments of the present invention shown in accompanying drawing.In the situation that not departing from the invention aim, design and the similar structure of this technical scheme or embodiment without creating, all belong to protection domain of the present invention.

Claims (1)

1. a direct building method that shines upon to construct current-voltage mapping according to voltage-to-current, is characterized in that, the method comprises the steps:
Step 1, the current density having on the each electrode of sensor of N electrode have general expression
Figure FDA0000466964800000011
so voltage-to-current mapping matrix while having specific inductive capacity to be distributed as ε (z):
Λ ϵ N × N = 1 A C - - - ( 1 )
Known according to Kirchhoff's law, loop current sum is zero, and the order of current density vector J is N-1, and the order of Matrix C is also N-1, and the order that can draw thus voltage vector is also N-1, therefore order
Figure FDA0000466964800000013
So
V = R ϵ N × N J = R ϵ N × N Λ ϵ N × N V - - - ( 3 )
Eigenwert and the proper vector of calculating V, can obtain:
V=P{diag([-1-1…-10]) N×N}P T (4)
Wherein diag () n × Nrepresent the diagonal matrix on N rank, P tp=I, P=[p 1p 2p n-1p n], proper vector p ii (1≤i≤n-1) row of P, i.e. Vp i=(1) p i, p neigenwert 0 characteristic of correspondence vector,
Be Vp n=(0) p n, p N = 1 N 1 1 . . . 1 1 1 × N T , Be that V can be written as:
V = - I N × N + p N p N T - - - ( 5 )
Similarly, by computation of characteristic values and proper vector,
Figure FDA0000466964800000017
order be N-1, can be written as following form:
Λ ϵ N × N = QΣ Λ Q T = Q { diag ( λ 1 λ 2 . . . λ N - 1 0 ) N × N } Q T - - - ( 6 )
Wherein Σ Λ=diag ([λ 1λ 2λ n-10] n × N) by N the diagonal matrix that eigenwert forms of R, the matrix that Q is made up of corresponding proper vector, Q tq=I, Q=[q 1q 2q n-1q n], proper vector q ibe
I (1≤i≤N-1) row of Q, i.e. Rq iiq i, q nproper vector 0 characteristic of correspondence vector,
Rq N=(0)q N p N = 1 N 1 1 . . . 1 1 1 × N T , So have
Q T VQ = Q T ( - I N × N + p N p N T ) Q
= - I N × N + Q T ( q N q N T ) Q - - - ( 7 )
= diag ( - 1 - 1 . . . - 1 0 ) N × N
Step 2, formula (4) substitution formula (3) is had:
P { diag ( - 1 - 1 . . . - 1 0 ) N × N } P T = R ϵ N × N Λ ϵ N × N P { diag ( - 1 - 1 . . . - 1 0 ) N × N } P T
(8)
, through deriving, current-voltage shines upon corresponding matrix
Figure FDA0000466964800000023
can be written as:
R ϵ N × N = Qdiag ( 1 λ 1 1 λ 2 . . . 1 λ N - 1 0 ) N × N Q T - - - ( 9 )
Formula is known thus, matrix
Figure FDA0000466964800000025
can be determined by unique.
CN201410054956.XA 2014-02-18 2014-02-18 A kind of method mapped by voltage-to-current map construction current-voltage Active CN103776873B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410054956.XA CN103776873B (en) 2014-02-18 2014-02-18 A kind of method mapped by voltage-to-current map construction current-voltage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410054956.XA CN103776873B (en) 2014-02-18 2014-02-18 A kind of method mapped by voltage-to-current map construction current-voltage

Publications (2)

Publication Number Publication Date
CN103776873A true CN103776873A (en) 2014-05-07
CN103776873B CN103776873B (en) 2016-04-06

Family

ID=50569372

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410054956.XA Active CN103776873B (en) 2014-02-18 2014-02-18 A kind of method mapped by voltage-to-current map construction current-voltage

Country Status (1)

Country Link
CN (1) CN103776873B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107091858A (en) * 2017-03-27 2017-08-25 北京航空航天大学 A kind of method mapped by Current Voltage map construction voltage x current

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7085405B1 (en) * 1997-04-17 2006-08-01 Ge Medical Systems Israel, Ltd. Direct tomographic reconstruction
WO2006102388A1 (en) * 2005-03-22 2006-09-28 The Ohio State University 3d and real-time electrical capacitance volume-tomography: sensor design and image reconstruction
CN101520478A (en) * 2009-03-13 2009-09-02 北京航空航天大学 Direct image reconstruction method based on capacitance tomography of round sensor
CN103163404A (en) * 2013-02-01 2013-06-19 北京航空航天大学 Current-voltage mapping construction method based on adjacent stimulus measurement model
CN103412189A (en) * 2013-07-30 2013-11-27 北京航空航天大学 Information filtering demodulation method for electrical tomography system

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7085405B1 (en) * 1997-04-17 2006-08-01 Ge Medical Systems Israel, Ltd. Direct tomographic reconstruction
WO2006102388A1 (en) * 2005-03-22 2006-09-28 The Ohio State University 3d and real-time electrical capacitance volume-tomography: sensor design and image reconstruction
CN101520478A (en) * 2009-03-13 2009-09-02 北京航空航天大学 Direct image reconstruction method based on capacitance tomography of round sensor
CN103163404A (en) * 2013-02-01 2013-06-19 北京航空航天大学 Current-voltage mapping construction method based on adjacent stimulus measurement model
CN103412189A (en) * 2013-07-30 2013-11-27 北京航空航天大学 Information filtering demodulation method for electrical tomography system

Non-Patent Citations (5)

* Cited by examiner, † Cited by third party
Title
JENNIFER L. MUELLER ET AL.: "DIRECT RECONSTRUCTIONS OF CONDUCTIVITIES FROM BOUNDARY MEASUREMENTS", 《SIAM J. SCI. COMPUT.》 *
LIJUN XU ET AL.: "A Digital Switching Demodulator for Electrical Capacitance Tomography", 《IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT》 *
ZHANG CAO ET AL.: "Direct image reconstruction for electrical capacitance tomography by using the enclosure method", 《MEAS. SCI. TECHNOL.》 *
傅健等: "一种用于CT空间分辨率增强的图像重建方法", 《航空动力学报》 *
王保良等: "多相流参数检测电容层析成像技术研究", 《石油化工自动化》 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107091858A (en) * 2017-03-27 2017-08-25 北京航空航天大学 A kind of method mapped by Current Voltage map construction voltage x current
CN107091858B (en) * 2017-03-27 2020-02-14 北京航空航天大学 Method for constructing voltage-current mapping from current-voltage mapping

Also Published As

Publication number Publication date
CN103776873B (en) 2016-04-06

Similar Documents

Publication Publication Date Title
Schmidt et al. The distribution of relaxation times as basis for generalized time-domain models for Li-ion batteries
Baltopoulos et al. Damage identification in carbon fiber reinforced polymer plates using electrical resistance tomography mapping
Tehrani et al. L1 regularization method in electrical impedance tomography by using the L1-curve (Pareto frontier curve)
CN111281385B (en) Electrical impedance imaging method based on tissue space distribution characteristics and impedance variation characteristics along with frequency
CN107369187A (en) The electricity tomography regularization reconstruction method for the sum that is deteriorated based on adjoint point
de Castro Martins et al. Electrical impedance tomography reconstruction through simulated annealing with incomplete evaluation of the objective function
CN108710767A (en) A kind of lithium battery thermal process space-time modeling method based on ISOMAP
CN104965134B (en) Grounding net of transformer substation surface potential distribution calculation method based on echo state network
Ding et al. Second-order sensitivity coefficient based electrical tomography imaging
CN103163404B (en) Current-voltage mapping construction method based on adjacent stimulus measurement model
CN103776873B (en) A kind of method mapped by voltage-to-current map construction current-voltage
CN103065286A (en) Image reconstruction method in quasi-static electrical impedance imaging
CN103149472B (en) Voltage-current mapping constructing method based on double-terminal excitation measuring model
Fouchard et al. Flexible numerical platform for electrical impedance tomography
CN103116101B (en) Adjacent excitation measurement mode based voltage-current mapping construction method
CN110501587A (en) A kind of Radon inverse transformation capacitance chromatography imaging method based on electric force lines distribution
Cabrera-Padilla et al. Lipschitz Grothendieck-integral operators
CN107845119A (en) A kind of electricity tomography mixed method
Ding et al. Fuzzy optimal solution of electric tomography imaging: Modelling and application
Xu et al. Galerkin boundary element method for the forward problem of ERT
CN105701824A (en) Electrical tomographic image reconstruction method based on circular-arc grid subdivision
Wang et al. An iterative linear back-projection algorithm for electrical impedance tomography
Kim et al. Image reconstruction using genetic algorithm in electrical impedance tomography
CN110470743A (en) Electricity/ultrasound information fusion double-modal tomography method
Zeeshan et al. Augmenting resolution capabilities of image reconstruction in adaptive electrical capacitance tomography

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant