DE60037828D1 - Speichererweiterungsmodul mit gestapelter speicherpackung - Google Patents

Speichererweiterungsmodul mit gestapelter speicherpackung

Info

Publication number
DE60037828D1
DE60037828D1 DE60037828T DE60037828T DE60037828D1 DE 60037828 D1 DE60037828 D1 DE 60037828D1 DE 60037828 T DE60037828 T DE 60037828T DE 60037828 T DE60037828 T DE 60037828T DE 60037828 D1 DE60037828 D1 DE 60037828D1
Authority
DE
Germany
Prior art keywords
memory
stacked
module
stacked memory
packages
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60037828T
Other languages
English (en)
Inventor
Tayung Wong
John Carrillo
Jay Robinson
Clement Fang
David Jeffrey
Nikhil Vaidya
Nagaraj Mitty
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sun Microsystems Inc
Original Assignee
Sun Microsystems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sun Microsystems Inc filed Critical Sun Microsystems Inc
Application granted granted Critical
Publication of DE60037828D1 publication Critical patent/DE60037828D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/006—Identification
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1012—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
    • G06F11/1024—Identification of the type of error
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406—Management or control of the refreshing or charge-regeneration cycles
    • G11C11/40615—Internal triggering or timing of refresh, e.g. hidden refresh, self refresh, pseudo-SRAMs
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
    • G11C5/04—Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C2029/4402—Internal storage of test result, quality data, chip identification, repair information
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/18—Printed circuits structurally associated with non-printed electric components
    • H05K1/181—Printed circuits structurally associated with non-printed electric components associated with surface mounted components
DE60037828T 1999-11-18 2000-11-15 Speichererweiterungsmodul mit gestapelter speicherpackung Expired - Lifetime DE60037828D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/442,850 US6683372B1 (en) 1999-11-18 1999-11-18 Memory expansion module with stacked memory packages and a serial storage unit
PCT/US2000/031439 WO2001037090A1 (en) 1999-11-18 2000-11-15 A memory expansion module with stacked memory packages

Publications (1)

Publication Number Publication Date
DE60037828D1 true DE60037828D1 (de) 2008-03-06

Family

ID=23758396

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60037828T Expired - Lifetime DE60037828D1 (de) 1999-11-18 2000-11-15 Speichererweiterungsmodul mit gestapelter speicherpackung

Country Status (8)

Country Link
US (1) US6683372B1 (de)
EP (1) EP1232439B1 (de)
JP (1) JP3999516B2 (de)
KR (1) KR100626223B1 (de)
AT (1) ATE384293T1 (de)
AU (1) AU1920001A (de)
DE (1) DE60037828D1 (de)
WO (1) WO2001037090A1 (de)

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Also Published As

Publication number Publication date
JP3999516B2 (ja) 2007-10-31
KR100626223B1 (ko) 2006-09-20
AU1920001A (en) 2001-05-30
WO2001037090A1 (en) 2001-05-25
ATE384293T1 (de) 2008-02-15
KR20020070979A (ko) 2002-09-11
US6683372B1 (en) 2004-01-27
EP1232439A1 (de) 2002-08-21
JP2003515216A (ja) 2003-04-22
EP1232439B1 (de) 2008-01-16

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