DE60108543D1 - Verbesserte Referenzschichtstruktur in einer magnetischen Speicherzelle - Google Patents
Verbesserte Referenzschichtstruktur in einer magnetischen SpeicherzelleInfo
- Publication number
- DE60108543D1 DE60108543D1 DE60108543T DE60108543T DE60108543D1 DE 60108543 D1 DE60108543 D1 DE 60108543D1 DE 60108543 T DE60108543 T DE 60108543T DE 60108543 T DE60108543 T DE 60108543T DE 60108543 D1 DE60108543 D1 DE 60108543D1
- Authority
- DE
- Germany
- Prior art keywords
- memory cell
- layer structure
- magnetic memory
- reference layer
- improved reference
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/161—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/514,961 US6297983B1 (en) | 2000-02-29 | 2000-02-29 | Reference layer structure in a magnetic storage cell |
US514961 | 2000-02-29 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60108543D1 true DE60108543D1 (de) | 2005-03-03 |
DE60108543T2 DE60108543T2 (de) | 2006-02-16 |
Family
ID=24049417
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60108543T Expired - Fee Related DE60108543T2 (de) | 2000-02-29 | 2001-02-23 | Verbesserte Referenzschichtstruktur in einer magnetischen Speicherzelle |
Country Status (5)
Country | Link |
---|---|
US (2) | US6297983B1 (de) |
EP (1) | EP1132918B1 (de) |
JP (2) | JP2001308292A (de) |
DE (1) | DE60108543T2 (de) |
HK (1) | HK1036144A1 (de) |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5013494B2 (ja) * | 2001-04-06 | 2012-08-29 | ルネサスエレクトロニクス株式会社 | 磁性メモリの製造方法 |
US6418048B1 (en) * | 2001-08-15 | 2002-07-09 | Read-Rite Corporation | Spin-dependent tunneling sensor suitable for a magnetic memory |
US6518588B1 (en) * | 2001-10-17 | 2003-02-11 | International Business Machines Corporation | Magnetic random access memory with thermally stable magnetic tunnel junction cells |
US6794695B2 (en) * | 2002-04-29 | 2004-09-21 | Hewlett-Packard Development Company, L.P. | Magneto resistive storage device having a magnetic field sink layer |
US6597598B1 (en) | 2002-04-30 | 2003-07-22 | Hewlett-Packard Development Company, L.P. | Resistive cross point memory arrays having a charge injection differential sense amplifier |
US6574129B1 (en) | 2002-04-30 | 2003-06-03 | Hewlett-Packard Development Company, L.P. | Resistive cross point memory cell arrays having a cross-couple latch sense amplifier |
US6762952B2 (en) * | 2002-05-01 | 2004-07-13 | Hewlett-Packard Development Company, L.P. | Minimizing errors in a magnetoresistive solid-state storage device |
JP2004128229A (ja) * | 2002-10-02 | 2004-04-22 | Nec Corp | 磁性メモリ及びその製造方法 |
KR100506932B1 (ko) * | 2002-12-10 | 2005-08-09 | 삼성전자주식회사 | 기준 셀들을 갖는 자기 램 소자 및 그 구조체 |
JP2004235443A (ja) * | 2003-01-30 | 2004-08-19 | Renesas Technology Corp | 薄膜磁性体記憶装置およびその製造方法 |
US6944053B2 (en) * | 2003-06-17 | 2005-09-13 | Hewlett-Packard Development Company, L.P. | Magnetic memory with structure providing reduced coercivity |
DE10338422B4 (de) * | 2003-08-18 | 2007-08-16 | Infineon Technologies Ag | Selektiver Plasmaätzprozess zur Aluminiumoxid-Strukturierung und dessen Verwendung |
US6984529B2 (en) * | 2003-09-10 | 2006-01-10 | Infineon Technologies Ag | Fabrication process for a magnetic tunnel junction device |
US6794697B1 (en) * | 2003-10-01 | 2004-09-21 | Hewlett-Packard Development Company, L.P. | Asymmetric patterned magnetic memory |
US7050326B2 (en) * | 2003-10-07 | 2006-05-23 | Hewlett-Packard Development Company, L.P. | Magnetic memory device with current carrying reference layer |
JP2005129801A (ja) * | 2003-10-24 | 2005-05-19 | Sony Corp | 磁気記憶素子及び磁気メモリ |
JP2006185961A (ja) * | 2004-12-24 | 2006-07-13 | Toshiba Corp | 磁気ランダムアクセスメモリ |
US7419610B2 (en) * | 2005-08-05 | 2008-09-02 | Hitachi Global Storage Technologies Netherlands B.V. | Method of partial depth material removal for fabrication of CPP read sensor |
US8389976B2 (en) * | 2006-12-29 | 2013-03-05 | Intel Corporation | Methods of forming carbon nanotube transistors for high speed circuit operation and structures formed thereby |
US8564079B2 (en) * | 2008-04-21 | 2013-10-22 | Qualcomm Incorporated | STT MRAM magnetic tunnel junction architecture and integration |
US20100315869A1 (en) * | 2009-06-15 | 2010-12-16 | Magic Technologies, Inc. | Spin torque transfer MRAM design with low switching current |
JP5214691B2 (ja) | 2010-09-17 | 2013-06-19 | 株式会社東芝 | 磁気メモリ及びその製造方法 |
US9146287B2 (en) * | 2010-11-15 | 2015-09-29 | Infineon Technologies Ag | XMR sensors with high shape anisotropy |
JP5535161B2 (ja) * | 2011-09-20 | 2014-07-02 | 株式会社東芝 | 磁気抵抗効果素子およびその製造方法 |
JP5542761B2 (ja) * | 2011-09-20 | 2014-07-09 | 株式会社東芝 | 磁気抵抗効果素子およびその製造方法 |
US8615868B2 (en) | 2011-11-29 | 2013-12-31 | HGST Netherlands B.V. | Method for manufacturing a magnetic sensor using two step ion milling |
US9123879B2 (en) | 2013-09-09 | 2015-09-01 | Masahiko Nakayama | Magnetoresistive element and method of manufacturing the same |
US9368717B2 (en) | 2013-09-10 | 2016-06-14 | Kabushiki Kaisha Toshiba | Magnetoresistive element and method for manufacturing the same |
US9385304B2 (en) | 2013-09-10 | 2016-07-05 | Kabushiki Kaisha Toshiba | Magnetic memory and method of manufacturing the same |
US9231196B2 (en) | 2013-09-10 | 2016-01-05 | Kuniaki SUGIURA | Magnetoresistive element and method of manufacturing the same |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4945397A (en) * | 1986-12-08 | 1990-07-31 | Honeywell Inc. | Resistive overlayer for magnetic films |
JPH05190508A (ja) * | 1992-01-14 | 1993-07-30 | Matsushita Electric Ind Co Ltd | 薄膜のエッチング方法および積層薄膜のエッチング方法 |
US5650958A (en) * | 1996-03-18 | 1997-07-22 | International Business Machines Corporation | Magnetic tunnel junctions with controlled magnetic response |
JPH10163544A (ja) * | 1996-11-29 | 1998-06-19 | Sanyo Electric Co Ltd | 磁気抵抗効果素子及びその製造方法 |
US6028786A (en) * | 1997-04-28 | 2000-02-22 | Canon Kabushiki Kaisha | Magnetic memory element having coupled magnetic layers forming closed magnetic circuit |
US6169686B1 (en) * | 1997-11-20 | 2001-01-02 | Hewlett-Packard Company | Solid-state memory with magnetic storage cells |
US5936293A (en) * | 1998-01-23 | 1999-08-10 | International Business Machines Corporation | Hard/soft magnetic tunnel junction device with stable hard ferromagnetic layer |
US6219212B1 (en) * | 1998-09-08 | 2001-04-17 | International Business Machines Corporation | Magnetic tunnel junction head structure with insulating antiferromagnetic layer |
US6233172B1 (en) * | 1999-12-17 | 2001-05-15 | Motorola, Inc. | Magnetic element with dual magnetic states and fabrication method thereof |
-
2000
- 2000-02-29 US US09/514,961 patent/US6297983B1/en not_active Expired - Lifetime
-
2001
- 2001-02-23 EP EP01301659A patent/EP1132918B1/de not_active Expired - Lifetime
- 2001-02-23 DE DE60108543T patent/DE60108543T2/de not_active Expired - Fee Related
- 2001-02-27 JP JP2001051626A patent/JP2001308292A/ja active Pending
- 2001-05-31 US US09/871,395 patent/US6479353B2/en not_active Expired - Lifetime
- 2001-10-08 HK HK01107057A patent/HK1036144A1/xx not_active IP Right Cessation
-
2008
- 2008-02-13 JP JP2008032272A patent/JP2008193103A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
DE60108543T2 (de) | 2006-02-16 |
EP1132918A2 (de) | 2001-09-12 |
HK1036144A1 (en) | 2001-12-21 |
US20010022742A1 (en) | 2001-09-20 |
US6297983B1 (en) | 2001-10-02 |
EP1132918B1 (de) | 2005-01-26 |
US6479353B2 (en) | 2002-11-12 |
EP1132918A3 (de) | 2003-01-08 |
JP2008193103A (ja) | 2008-08-21 |
JP2001308292A (ja) | 2001-11-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE60108543D1 (de) | Verbesserte Referenzschichtstruktur in einer magnetischen Speicherzelle | |
DE60119199D1 (de) | Speicherzelle | |
DE69921737D1 (de) | Magnetische Speicherzelle | |
DE60140406D1 (de) | Elektrochemische stapelzelle | |
DE60205569D1 (de) | MRAM mit gestapelten Speicherzellen | |
DE60216708D1 (de) | Speicherzellestruktur | |
DE60109735D1 (de) | Honigwabenstruktur mit dreieckigen zellen | |
DE69903206D1 (de) | Magnetische Speicheranordnungen mit einer Vielzahl magnetischer Tunnelverbindungen | |
DE69923244D1 (de) | Magnetoresistiven Speicheranordnungen | |
DE10195853T1 (de) | Verbesserte Speicherzelle hoher Dichte | |
DE1120790T1 (de) | Magnetischer Speicher mit Strukturen die magnetische Störungen in Abfühlschichten verhüten | |
DE50106237D1 (de) | Querträger in Hybridbauweise | |
DE60105974D1 (de) | Aufbewahrungsbehälter | |
NO20030069L (no) | Arrangement i en detektor | |
DE10084982T1 (de) | Steuern einer Burst-Sequenz in synchronen Speichern | |
DE59903684D1 (de) | Dual-port speicherzelle | |
DE50014731D1 (de) | Speicherzellenanordnung | |
DE60140314D1 (de) | Ionenspeicher | |
DE50013663D1 (de) | Flacher magnetkern | |
DE60118833D1 (de) | Halbleiter-Speicher mit unterteilter Wortleitungstruktur | |
NO20002735D0 (no) | Magnetisk energilager | |
DE69810628D1 (de) | Zufallszugriff in einer mobilen Telefonanordnung | |
DE50100990D1 (de) | Reaktorstruktur in Wärmeübertrager-Schichtstapelbauweise | |
FI20001646A0 (fi) | Sovitelma rummun yhteydessä | |
DE50109936D1 (de) | DRAM-Speicherzelle |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |