DE69213811D1 - Regeleinrichtung für Halbleiterlaser zur Bestimmung der Lebensdauer der Halbleiterlaser durch Feststellung des im Halbleiterlaser, beginnend vom Anfangszustand, erfolgenden Stromanstiegs - Google Patents

Regeleinrichtung für Halbleiterlaser zur Bestimmung der Lebensdauer der Halbleiterlaser durch Feststellung des im Halbleiterlaser, beginnend vom Anfangszustand, erfolgenden Stromanstiegs

Info

Publication number
DE69213811D1
DE69213811D1 DE69213811T DE69213811T DE69213811D1 DE 69213811 D1 DE69213811 D1 DE 69213811D1 DE 69213811 T DE69213811 T DE 69213811T DE 69213811 T DE69213811 T DE 69213811T DE 69213811 D1 DE69213811 D1 DE 69213811D1
Authority
DE
Germany
Prior art keywords
determining
semiconductor laser
semiconductor
starting
control device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69213811T
Other languages
English (en)
Other versions
DE69213811T2 (de
Inventor
Shinichi Sato
Hiroaki Katoh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of DE69213811D1 publication Critical patent/DE69213811D1/de
Publication of DE69213811T2 publication Critical patent/DE69213811T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/0014—Measuring characteristics or properties thereof
    • H01S5/0021—Degradation or life time measurements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068—Stabilisation of laser output parameters
    • H01S5/06825—Protecting the laser, e.g. during switch-on/off, detection of malfunctioning or degradation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/0617—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium using memorised or pre-programmed laser characteristics
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068—Stabilisation of laser output parameters
    • H01S5/06804—Stabilisation of laser output parameters by monitoring an external parameter, e.g. temperature
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068—Stabilisation of laser output parameters
    • H01S5/06808—Stabilisation of laser output parameters by monitoring the electrical laser parameters, e.g. voltage or current
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068—Stabilisation of laser output parameters
    • H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
DE69213811T 1991-05-10 1992-05-07 Regeleinrichtung für Halbleiterlaser zur Bestimmung der Lebensdauer der Halbleiterlaser durch Feststellung des im Halbleiterlaser, beginnend vom Anfangszustand, erfolgenden Stromanstiegs Expired - Fee Related DE69213811T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3105293A JP2546080B2 (ja) 1991-05-10 1991-05-10 半導体レーザー制御装置

Publications (2)

Publication Number Publication Date
DE69213811D1 true DE69213811D1 (de) 1996-10-24
DE69213811T2 DE69213811T2 (de) 1997-01-30

Family

ID=14403644

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69230734T Expired - Fee Related DE69230734T2 (de) 1991-05-10 1992-05-07 Regeleinrichtung zur Erhöhung der Lebensdauer von Halbleiterlasern durch Detektion des im Halbleiterlaser, beginnend vom Anfangszustand, erfolgenden Stromanstiegs
DE69213811T Expired - Fee Related DE69213811T2 (de) 1991-05-10 1992-05-07 Regeleinrichtung für Halbleiterlaser zur Bestimmung der Lebensdauer der Halbleiterlaser durch Feststellung des im Halbleiterlaser, beginnend vom Anfangszustand, erfolgenden Stromanstiegs

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE69230734T Expired - Fee Related DE69230734T2 (de) 1991-05-10 1992-05-07 Regeleinrichtung zur Erhöhung der Lebensdauer von Halbleiterlasern durch Detektion des im Halbleiterlaser, beginnend vom Anfangszustand, erfolgenden Stromanstiegs

Country Status (5)

Country Link
US (1) US5334826A (de)
EP (2) EP0669684B1 (de)
JP (1) JP2546080B2 (de)
KR (1) KR960006211B1 (de)
DE (2) DE69230734T2 (de)

Families Citing this family (80)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3248155B2 (ja) * 1991-12-26 2002-01-21 富士通株式会社 半導体レーザの駆動方法
JP2917642B2 (ja) * 1992-01-24 1999-07-12 三菱電機株式会社 レーザ出力制御装置
US5552590A (en) * 1992-09-08 1996-09-03 Nippondenso Co., Ltd. Optical information reading apparatus having means for judging laser deterioration
DE4396839T1 (de) * 1992-12-18 1997-07-31 Olympus Optical Co Wellenlängenstabilisierende Vorrichtung
JP3379837B2 (ja) * 1994-10-27 2003-02-24 富士通株式会社 光学読取装置
US5583683A (en) * 1995-06-15 1996-12-10 Optical Corporation Of America Optical multiplexing device
US5839104A (en) * 1996-02-20 1998-11-17 Ncr Corporation Point-of-sale system having speech entry and item recognition support system
US5844928A (en) * 1996-02-27 1998-12-01 Lucent Technologies, Inc. Laser driver with temperature sensor on an integrated circuit
US5734672A (en) 1996-08-06 1998-03-31 Cutting Edge Optronics, Inc. Smart laser diode array assembly and operating method using same
JPH11135871A (ja) * 1997-10-28 1999-05-21 Nec Corp レーザダイオード駆動方法および回路
SE519081C3 (sv) 1998-01-21 2003-02-19 Altitun Ab Förfarande och anordning för optimering av lasrars operationspunkt, jämte anordning
DE19818621A1 (de) * 1998-04-25 1999-10-28 Mannesmann Vdo Ag Schaltungsanordnung zur Einstellung der Helligkeit stromgesteuerter Leuchtdioden zur Beleuchtung einer Anzeige
SE518827C2 (sv) 1999-02-17 2002-11-26 Altitun Ab Metod för karakterisering av en avstämbar laser
US6856964B1 (en) * 1999-03-22 2005-02-15 Ncr Corporation System and methods for integrating a self-checkout system into an existing store system
US6516010B1 (en) 1999-07-13 2003-02-04 Agere Systems, Inc. Method and apparatus for active numeric temperature compensation of an etalon in a wavelength stabilized laser
US6333602B1 (en) * 1999-12-14 2001-12-25 Exfo Photonic Solutions Inc. Smart light source with integrated operational parameters data storage capability
WO2003067510A1 (en) * 2000-11-28 2003-08-14 Ceyx Technologies, Inc. Laser temperature performance compensation
JP2002197709A (ja) * 2000-10-18 2002-07-12 Sony Corp 記録再生装置、状態検出方法、および、データ出力方法、情報処理装置、および、情報処理方法、並びに記録媒体
KR100801446B1 (ko) * 2000-10-18 2008-02-11 소니 가부시끼 가이샤 정보처리장치 및 정보처리방법, 보수정보 관리시스템 및기록매체
US20040197101A1 (en) * 2001-02-05 2004-10-07 Sasser Gary D. Optical transceiver module with host accessible on-board diagnostics
US7149430B2 (en) * 2001-02-05 2006-12-12 Finsiar Corporation Optoelectronic transceiver having dual access to onboard diagnostics
US7346278B2 (en) * 2001-02-05 2008-03-18 Finisar Corporation Analog to digital signal conditioning in optoelectronic transceivers
US7302186B2 (en) 2001-02-05 2007-11-27 Finisar Corporation Optical transceiver and host adapter with memory mapped monitoring circuitry
US7079775B2 (en) * 2001-02-05 2006-07-18 Finisar Corporation Integrated memory mapped controller circuit for fiber optics transceiver
US6712265B2 (en) * 2001-07-30 2004-03-30 United Microelectronics, Corp. System and method for interlocking management in semiconductor material supply equipment
US6975642B2 (en) 2001-09-17 2005-12-13 Finisar Corporation Optoelectronic device capable of participating in in-band traffic
EP1470522A4 (de) * 2001-12-27 2005-10-05 Ceyx Technologies Inc Integriertes steuersystem für laseroptik und betriebsverfahren
US7505498B2 (en) 2002-01-08 2009-03-17 Jorge Sanchez Apparatus and method for measurement for dynamic laser signals
AU2003210453A1 (en) 2002-01-08 2003-07-24 Photon-X, Inc. Temperature controller module
US6862302B2 (en) * 2002-02-12 2005-03-01 Finisar Corporation Maintaining desirable performance of optical emitters over temperature variations
US7561855B2 (en) 2002-06-25 2009-07-14 Finisar Corporation Transceiver module and integrated circuit with clock and data recovery clock diplexing
US7486894B2 (en) * 2002-06-25 2009-02-03 Finisar Corporation Transceiver module and integrated circuit with dual eye openers
US7664401B2 (en) * 2002-06-25 2010-02-16 Finisar Corporation Apparatus, system and methods for modifying operating characteristics of optoelectronic devices
US7809275B2 (en) * 2002-06-25 2010-10-05 Finisar Corporation XFP transceiver with 8.5G CDR bypass
US7437079B1 (en) 2002-06-25 2008-10-14 Finisar Corporation Automatic selection of data rate for optoelectronic devices
US7477847B2 (en) * 2002-09-13 2009-01-13 Finisar Corporation Optical and electrical channel feedback in optical transceiver module
JP2004111827A (ja) * 2002-09-20 2004-04-08 Alps Electric Co Ltd 半導体レーザの光出力制御回路
AU2003274631A1 (en) * 2002-10-30 2004-05-25 Intune Technologies Limited Method for compensation of degradation in tunable lasers
US7035300B2 (en) * 2002-11-05 2006-04-25 Finisar Corporation Calibration of a multi-channel optoelectronic module with integrated temperature control
US7230961B2 (en) 2002-11-08 2007-06-12 Finisar Corporation Temperature and jitter compensation controller circuit and method for fiber optics device
US7317743B2 (en) * 2002-11-08 2008-01-08 Finisar Corporation Temperature and jitter compensation controller circuit and method for fiber optics device
US7830936B2 (en) * 2003-01-10 2010-11-09 Avago Technologies Fiber Ip (Singapore) Pte. Ltd. Calibration of laser systems
US7287177B2 (en) * 2003-12-04 2007-10-23 International Business Machines Corporation Digital reliability monitor having autonomic repair and notification capability
US20050144524A1 (en) * 2003-12-04 2005-06-30 International Business Machines Corporation Digital reliability monitor having autonomic repair and notification capability
US7426586B2 (en) * 2003-12-15 2008-09-16 Finisar Corporation Configurable input/output terminals
US7630631B2 (en) * 2004-04-14 2009-12-08 Finisar Corporation Out-of-band data communication between network transceivers
JP4832730B2 (ja) * 2004-06-18 2011-12-07 ミヤチテクノス株式会社 励起用半導体レーザ装置
US7447438B2 (en) * 2004-07-02 2008-11-04 Finisar Corporation Calibration of digital diagnostics information in an optical transceiver prior to reporting to host
US8639122B2 (en) * 2004-07-02 2014-01-28 Finisar Corporation Filtering digital diagnostics information in an optical transceiver prior to reporting to host
US7504610B2 (en) * 2004-09-03 2009-03-17 Mindspeed Technologies, Inc. Optical modulation amplitude compensation system having a laser driver with modulation control signals
US7532820B2 (en) 2004-10-29 2009-05-12 Finisar Corporation Systems and methods for providing diagnostic information using EDC transceivers
EP1681750A1 (de) * 2005-01-17 2006-07-19 Fanuc Ltd Laseroszillator und Methode zur Abschätzung der Lebensdauer der Pumplichtquelle
US20070047605A1 (en) * 2005-08-26 2007-03-01 Edward Barkan Laser power control arrangements in electro-optical readers
US7609736B2 (en) * 2005-09-30 2009-10-27 Symbol Technologies, Inc. Laser power control arrangements in electro-optical readers
US8611384B2 (en) * 2006-05-18 2013-12-17 Finisar Corporation High-temperature operation of vertical cavity surface emitting lasers
US9047359B2 (en) * 2007-02-01 2015-06-02 Hand Held Products, Inc. Apparatus and methods for monitoring one or more portable data terminals
EP2071568A1 (de) * 2007-12-13 2009-06-17 Harman/Becker Automotive Systems GmbH Temperaturerfassung in einem optischen Wiedergabe- und Aufzeichnungsgerät
US8750341B2 (en) * 2008-01-04 2014-06-10 Mindspeed Technologies, Inc. Method and apparatus for reducing optical signal speckle
JP2009200242A (ja) * 2008-02-21 2009-09-03 Fujitsu Ltd 光送信機および制御方法
JP2011522280A (ja) 2008-03-31 2011-07-28 マインドスピード・テクノロジーズ・インコーポレイテッド 携帯用ＬＣｏＳ／ＬＣＤ／ＤＬＰ投影システムにおける電力損の低減
US8159956B2 (en) 2008-07-01 2012-04-17 Finisar Corporation Diagnostics for serial communication busses
US20100158055A1 (en) * 2008-12-18 2010-06-24 Symbol Technologies, Inc. Method and apparatus for controlling and monitoring laser power in barcode readers
EP2440016B1 (de) * 2010-10-08 2019-01-23 Lantiq Beteiligungs-GmbH & Co.KG Laserdiodensteuervorrichtung
US8643296B2 (en) 2010-11-22 2014-02-04 Mindspeed Technologies, Inc. Color mixing and desaturation with reduced number of converters
JP5805962B2 (ja) * 2011-02-25 2015-11-10 ナブテスコ株式会社 電子機器のヘルスモニタリング装置
US9107245B2 (en) 2011-06-09 2015-08-11 Mindspeed Technologies, Inc. High accuracy, high dynamic range LED/laser driver
US9385606B2 (en) 2012-12-03 2016-07-05 M/A-Com Technology Solutions Holdings, Inc. Automatic buck/boost mode selection system for DC-DC converter
US10097908B2 (en) 2014-12-31 2018-10-09 Macom Technology Solutions Holdings, Inc. DC-coupled laser driver with AC-coupled termination element
WO2018045093A1 (en) 2016-08-30 2018-03-08 Macom Technology Solutions Holdings, Inc. Driver with distributed architecture
SG11201805644VA (en) * 2016-11-04 2018-07-30 Shenzhen Idata Tech Company Ltd A Temperature-measuring Scan head and Its Use Method
US10630052B2 (en) 2017-10-04 2020-04-21 Macom Technology Solutions Holdings, Inc. Efficiency improved driver for laser diode in optical communication
CN108123364A (zh) * 2017-12-28 2018-06-05 中国科学院长春光学精密机械与物理研究所 一种半导体激光装置
US10965089B2 (en) * 2018-05-07 2021-03-30 Mitsubishi Electric Corporation Laser device, laser machining apparatus, and method for controlling output of laser device
US11005573B2 (en) 2018-11-20 2021-05-11 Macom Technology Solutions Holdings, Inc. Optic signal receiver with dynamic control
WO2020217355A1 (ja) * 2019-04-24 2020-10-29 三菱電機株式会社 劣化診断装置および光トランシーバの劣化診断方法
US11575437B2 (en) 2020-01-10 2023-02-07 Macom Technology Solutions Holdings, Inc. Optimal equalization partitioning
EP4088394A4 (de) 2020-01-10 2024-02-07 Macom Tech Solutions Holdings Inc Optimale entzerrung der partitionierung
US11658630B2 (en) 2020-12-04 2023-05-23 Macom Technology Solutions Holdings, Inc. Single servo loop controlling an automatic gain control and current sourcing mechanism
US11616529B2 (en) 2021-02-12 2023-03-28 Macom Technology Solutions Holdings, Inc. Adaptive cable equalizer
CN116184089B (zh) * 2023-03-07 2023-10-24 武汉天兴通光电科技有限公司 一种二氧化碳玻璃管激光器使用寿命检测装置

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54102885A (en) * 1978-01-30 1979-08-13 Hitachi Ltd Automatic ouput control circuit for semiconductor laser
JPS5512155A (en) * 1978-07-11 1980-01-28 Matsushita Electric Ind Co Ltd Sureace roughening liquid for high polymer material
DE2911858C2 (de) * 1979-03-26 1983-01-13 Robert Bosch Gmbh, 7000 Stuttgart Schaltung zur Begrenzung der von einem Halbleiterlaser abgegebenen Lichtleistung
US4267439A (en) * 1979-12-12 1981-05-12 Key Tronic Corporation Document reader lamp life extension system
JPS56153786A (en) * 1980-04-30 1981-11-27 Sumitomo Electric Ind Ltd Monitoring circuit for bias current of laser-diode
JPS5816581A (ja) * 1981-07-22 1983-01-31 Oki Electric Ind Co Ltd パルス変調形光出力制御回路
JPS58134668A (ja) * 1982-02-05 1983-08-10 Fuji Xerox Co Ltd 半導体レ−ザ用出力安定化装置
JPS5972575A (ja) * 1982-10-20 1984-04-24 Casio Comput Co Ltd 光学的読取装置
JPS6049690A (ja) * 1983-08-29 1985-03-18 Nippon Telegr & Teleph Corp <Ntt> 半導体レ−ザダイオ−ドのスクリ−ニング方法
JPS60142582A (ja) * 1983-12-28 1985-07-27 Olympus Optical Co Ltd 半導体レ−ザの寿命判定方式
US4639606A (en) * 1984-10-26 1987-01-27 Optel System Limited Bar code scanner laser radiation exposure limit control system
JPS61144087A (ja) * 1984-12-18 1986-07-01 Hitachi Cable Ltd 半導体レ−ザ駆動回路
HUT39871A (en) * 1985-02-19 1986-10-29 Videoton Elekt Vallalat Method for measuring the temperature of semiconductor laser diode and circuit arrangement for carrying out thereof
JPS6282758U (de) * 1985-05-10 1987-05-27
JPS6225482A (ja) * 1985-07-25 1987-02-03 Olympus Optical Co Ltd 半導体レ−ザの駆動装置
JPS6251280A (ja) * 1985-08-30 1987-03-05 Konishiroku Photo Ind Co Ltd 半導体レ−ザ駆動回路
JPS63142877A (ja) * 1986-12-05 1988-06-15 Matsushita Electric Ind Co Ltd レ−ザ寿命警告装置
DE3706635A1 (de) * 1987-03-02 1988-09-15 Spindler & Hoyer Kg Verfahren zur stabilisierung der frequenz einer laserdiode unabhaengig vom diodenstrom
EP0287360B1 (de) * 1987-04-13 1993-03-17 Sharp Kabushiki Kaisha Ansteuerungsvorrichtung für einen Halbleiterlaser
JP2533535B2 (ja) * 1987-05-01 1996-09-11 三菱電機株式会社 光ディスク装置
JP2804027B2 (ja) * 1987-07-13 1998-09-24 ファナック 株式会社 レーザ出力補正方式
JPH071809Y2 (ja) * 1988-07-11 1995-01-18 横河電機株式会社 レーザダイオード駆動回路
US5179269A (en) * 1989-03-01 1993-01-12 Asahi Kogaku Kogyo Kabushiki Kaisha Bar code reader having an automatically actuated visible light laser beam
JPH0361966A (ja) * 1989-07-31 1991-03-18 Ricoh Co Ltd 半導体レーザの出力制御装置
US5260553A (en) * 1990-09-17 1993-11-09 Metrologic Instruments, Inc. Automatic hand-supportable laser bar code symbol scanner and method of reading bar code symbols using the same
US5019769A (en) * 1990-09-14 1991-05-28 Finisar Corporation Semiconductor laser diode controller and laser diode biasing control method
JP2733135B2 (ja) * 1990-11-20 1998-03-30 富士通株式会社 光学読取装置のレーザー発生制御方式

Also Published As

Publication number Publication date
JP2546080B2 (ja) 1996-10-23
KR960006211B1 (ko) 1996-05-09
KR920022606A (ko) 1992-12-19
EP0669684B1 (de) 2000-03-01
EP0512541B1 (de) 1996-09-18
DE69230734T2 (de) 2000-06-29
EP0512541A2 (de) 1992-11-11
EP0669684A2 (de) 1995-08-30
EP0512541A3 (en) 1993-11-18
JPH04334078A (ja) 1992-11-20
DE69213811T2 (de) 1997-01-30
US5334826A (en) 1994-08-02
EP0669684A3 (de) 1996-03-13
DE69230734D1 (de) 2000-04-06

Similar Documents

Publication Publication Date Title
DE69213811T2 (de) Regeleinrichtung für Halbleiterlaser zur Bestimmung der Lebensdauer der Halbleiterlaser durch Feststellung des im Halbleiterlaser, beginnend vom Anfangszustand, erfolgenden Stromanstiegs
DE69005263D1 (de) Verbesserte Vorionisationselektrode für gepulste Gaslaser.
DE69005187T2 (de) Durch transversale Entladung angeregter Laserkopf mit drei Elektroden.
DE3870958D1 (de) Halbleiteranordnung vom druckkontakt-typ.
DE59303588D1 (de) Polarisiertes leistungsrelais
DE69108394D1 (de) Elektronischer hilfskontakt für einen schütz.
DE3889740D1 (de) Elektromagnetisches Schütz mit reduziertem Lärm des magnetischen Ankers.
DE3886014T2 (de) Umstellventil-vorrichtung vom kolbenschiebertyp.
DE69016258T2 (de) Durch Entladung angeregte, gepulste Laservorrichtung.
DE225431T1 (de) Pufferschaltung zur kompensierung des millerstromes.
DE3853687D1 (de) Steuerschaltung für Laserdrucker.
DE69018940D1 (de) Laser, angeregt durch hf-entladung.
DE3485253D1 (de) Leistungsverteilungs- oder kombinierungsgeraet vom typ gekoppelter hohlraumresonatoren.
DE3884790T2 (de) Durch hf-entladung angeregter laser.
DE69003128T2 (de) Ansteuerschaltung für Halbleiterlaser.
DE69103217D1 (de) Verstellantrieb vom Typ mit Schwingspule.
DE69010492T2 (de) Schrägstromaufnehmer für elektroerosionsgerät.
DE69204645D1 (de) Entladungsröhre für Laser.
JPS54151324A (en) Demagnetizer
SU817947A1 (ru) Устройство дл управлени электро-дВигАТЕлЕМ
DE3783713D1 (de) Verfahren zur verhinderung der schlechten kontaktgabe bei elektrischen schalter kontakten welche durch organopolysiloxane gase verursacht wird.
IT8320402A0 (it) Circuito erogatore di corrente per un attuatore elettromeccanico.
JPS5760884A (en) Semiconductor laser
JPS53131714A (en) Multi-stepped driving system for cumulative selection type switch matrix
DE3886637D1 (de) Auslöseeinrichtung für Schutzschalter.

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: SEEGER SEEGER LINDNER PARTNERSCHAFT PATENTANWAELTE

8339 Ceased/non-payment of the annual fee