DE69220104D1 - Magnetfelddetektionsanordnung mit hoher Empfindlichkeit - Google Patents

Magnetfelddetektionsanordnung mit hoher Empfindlichkeit

Info

Publication number
DE69220104D1
DE69220104D1 DE69220104T DE69220104T DE69220104D1 DE 69220104 D1 DE69220104 D1 DE 69220104D1 DE 69220104 T DE69220104 T DE 69220104T DE 69220104 T DE69220104 T DE 69220104T DE 69220104 D1 DE69220104 D1 DE 69220104D1
Authority
DE
Germany
Prior art keywords
magnetic field
high sensitivity
field detection
detection arrangement
arrangement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69220104T
Other languages
English (en)
Other versions
DE69220104T2 (de
Inventor
Akikazu Odawara
Satoshi Nakayama
Satoshi Sekiya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Science Corp
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Application granted granted Critical
Publication of DE69220104D1 publication Critical patent/DE69220104D1/de
Publication of DE69220104T2 publication Critical patent/DE69220104T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/035Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
    • G01R33/0354SQUIDS
    • G01R33/0356SQUIDS with flux feedback
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00Superconductor technology: apparatus, material, process
    • Y10S505/825Apparatus per se, device per se, or process of making or operating same
    • Y10S505/842Measuring and testing
    • Y10S505/843Electrical
    • Y10S505/845Magnetometer
    • Y10S505/846Magnetometer using superconductive quantum interference device, i.e. squid
DE69220104T 1991-02-25 1992-02-13 Magnetfelddetektionsanordnung mit hoher Empfindlichkeit Expired - Fee Related DE69220104T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3030457A JPH04269680A (ja) 1991-02-25 1991-02-25 高感度磁場検出装置

Publications (2)

Publication Number Publication Date
DE69220104D1 true DE69220104D1 (de) 1997-07-10
DE69220104T2 DE69220104T2 (de) 1997-09-25

Family

ID=12304433

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69220104T Expired - Fee Related DE69220104T2 (de) 1991-02-25 1992-02-13 Magnetfelddetektionsanordnung mit hoher Empfindlichkeit

Country Status (4)

Country Link
US (1) US5280242A (de)
EP (1) EP0501241B1 (de)
JP (1) JPH04269680A (de)
DE (1) DE69220104T2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0141758B1 (ko) * 1995-08-25 1998-07-15 구자홍 초전도 양자간섭소자를 이용한 고주파신호 발생기
JP3360550B2 (ja) * 1996-10-17 2002-12-24 住友電気工業株式会社 磁気センサ駆動回路装置
JP2002148322A (ja) * 2000-11-09 2002-05-22 Seiko Instruments Inc 超伝導量子干渉素子を用いた信号検出器およびその測定方法
JP2005315744A (ja) * 2004-04-28 2005-11-10 Canon Inc 検出素子、検出装置、および素子と試薬を含む検出用キット
US8432374B2 (en) * 2010-02-26 2013-04-30 Au Optronics Corporation SNR enhancement for differential input device
CN104698405B (zh) * 2013-12-05 2017-11-21 中国科学院上海微系统与信息技术研究所 读出电路及所适用的双级的超导量子干涉传感器

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4004217A (en) * 1975-10-31 1977-01-18 S.H.E. Corporation Flux locked loop
US4389612A (en) * 1980-06-17 1983-06-21 S.H.E. Corporation Apparatus for reducing low frequency noise in dc biased SQUIDS
US4663590A (en) * 1985-11-06 1987-05-05 Sperry Corporation Single frequency noise reduction circuit for squids
JPH01269074A (ja) * 1988-04-20 1989-10-26 Hitachi Ltd Squid磁束計
JPH02257076A (ja) * 1989-03-30 1990-10-17 Fujitsu Ltd ディジタルスクイド制御方式
JP2807519B2 (ja) * 1989-12-26 1998-10-08 富士通株式会社 超伝導装置

Also Published As

Publication number Publication date
US5280242A (en) 1994-01-18
EP0501241A2 (de) 1992-09-02
DE69220104T2 (de) 1997-09-25
JPH04269680A (ja) 1992-09-25
EP0501241B1 (de) 1997-06-04
EP0501241A3 (en) 1993-09-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: SII NANO TECHNOLOGY INC., CHIBA, JP

8328 Change in the person/name/address of the agent

Representative=s name: WIESE KONNERTH FISCHER PATENTANWAELTE PARTNERSCHAF

8328 Change in the person/name/address of the agent

Representative=s name: SCHROETER LEHMANN FISCHER & NEUGEBAUER, 81479 MUEN

8339 Ceased/non-payment of the annual fee