US20070116862A1 - Semiconductor Device Having Resin Anti-Bleed Feature - Google Patents

Semiconductor Device Having Resin Anti-Bleed Feature Download PDF

Info

Publication number
US20070116862A1
US20070116862A1 US11/624,596 US62459607A US2007116862A1 US 20070116862 A1 US20070116862 A1 US 20070116862A1 US 62459607 A US62459607 A US 62459607A US 2007116862 A1 US2007116862 A1 US 2007116862A1
Authority
US
United States
Prior art keywords
substrate
barrier
resin
porosity
generally
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US11/624,596
Inventor
Robert Furtaw
John Abbott
Emily Hoffman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Priority to US11/624,596 priority Critical patent/US20070116862A1/en
Publication of US20070116862A1 publication Critical patent/US20070116862A1/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/564Details not otherwise provided for, e.g. protection against moisture
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/02Containers; Seals
    • H01L23/10Containers; Seals characterised by the material or arrangement of seals between parts, e.g. between cap and base of the container or between leads and walls of the container
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01079Gold [Au]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16152Cap comprising a cavity for hosting the device, e.g. U-shaped cap
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/191Disposition
    • H01L2924/19101Disposition of discrete passive components
    • H01L2924/19105Disposition of discrete passive components in a side-by-side arrangement on a common die mounting substrate

Definitions

  • the present invention relates generally to semiconductor devices, and more particularly to a device for controlling a bleeding of resin on a substrate.
  • a conventional electronic device such as the device 10 illustrated in FIG. 1A , comprises a flip-chip 12 that is bonded to a substrate 14 , wherein the bond generally defines electrical connections (not shown) between the substrate and the flip-chip.
  • the flip chip 12 is bonded to the substrate 14 via a plurality of solder balls, wherein the solder balls are melted in order to electrically connect and bond the substrate and the flip-chip.
  • a protective cap 16 is typically bonded over a flip-chip region 18 , wherein the cap is bonded to the substrate via an adhesive 20 .
  • a typical adhesive 20 is comprised of a temperature-curable bonding agent suspended in a fluid-like resin, wherein the bonding agent is typically cured by an application of heat thereto.
  • the bonding agent is typically cured by an application of heat thereto.
  • the resin tends to bleed onto surrounding regions 22 of the substrate, as illustrated in FIGS. 1A and 1B .
  • Such a bleeding of the resin has a potential to contaminate the substrate 14 , the flip-chip 12 , and/or various other components 24 associated with the substrate.
  • the resin that is bled onto other components 24 may form an electrically-insulative layer (not shown) over the components, wherein future electrical connections to the components may be affected by the coating of resin thereover.
  • the adhesive 20 comprises an electrically-conductive bonding agent (e.g., wherein an electrical connection between the cap 16 and the substrate 14 is desired)
  • minute portions of the electrically-conductive bonding agent can also bleed or leach out with the resin before, during, or after the curing of the adhesive.
  • a bleeding of the electrically-conductive bonding agent may provide further disadvantageous results in the finished device 10 , such as an electrical shorting of various circuits, capacitance bleeding, etc.
  • a bleeding of the resin over a side 26 of the substrate provides the potential for a short-circuiting of one or more connectors 28 associated with the device 10 .
  • the connectors 28 may further comprise bonding pads (not shown), wherein the bonding pads are highly susceptible to resin-bleed contamination.
  • the present invention is generally directed toward a resin-bleed control device and method for controlling a bleed of resin on a substrate, wherein conventional processing for forming other electronic devices on the substrate can further incorporate a formation of the resin-bleed control device.
  • the device comprises a substrate having a surface, wherein an interior region, a peripheral region, and an exterior region of the surface are generally defined on the surface of the substrate.
  • One or more electrical devices such as a flip chip, are further associated with the interior region of the substrate.
  • a cap is bonded to the substrate.
  • the interior region is generally isolated from the external environment by the cap.
  • the cap is bonded to one or more of the substrate and one or more electrical devices via an adhesive, wherein the adhesive is comprised of a plurality of components.
  • the adhesive generally resides on the surface of the substrate in the peripheral region, wherein the cap is further placed on the adhesive for bonding to the substrate.
  • a first barrier is further formed over the surface of the substrate, wherein the first barrier generally resides between the adhesive and the exterior region of the surface of the substrate, wherein the first barrier generally prevents one or more of the plurality of components of the adhesive, such as a resin, from bleeding substantially onto the exterior region of the surface of the substrate.
  • a porosity of the first barrier is less than a porosity of one or more of the interior region and the exterior region of the surface of the substrate, wherein the porosity of the first barrier generally provides a capillary action to prevent the resin from bleeding onto the exterior region of the surface of the substrate.
  • the first barrier is comprised of a metal, wherein the porosity of the metal is substantially less than the porosity of the substrate, and wherein the resin flow is generally confined to a surface of the metal after reaching the first barrier.
  • the first barrier for example, is further formed on the surface of the substrate during a formation of other components associated with the device, such as a formation of bonding pads or electrical interconnects.
  • the formation of the first barrier can be performed in a manner that does not require additional steps in processing the device, and can also increase reliability of the device without substantially increasing manufacturing costs.
  • the first barrier is formed substantially close to a side of the device, wherein minimal surface real estate is utilized to prevent bleeding of resin onto the exterior region of the substrate.
  • the device comprises a second barrier formed on the surface of the substrate, wherein the second barrier is formed within one or more of the interior region and peripheral region. Consequently, the flow of resin is generally confined between the first barrier and the second barrier.
  • the second barrier for example, is further formed generally concurrently to the formation of the first barrier.
  • FIG. 1A is a prior art plan view of a typical substrate illustrating a bleed of resin onto the substrate.
  • FIG. 1B is a prior art perspective view of a conventional substrate having a cap adhered thereto.
  • FIG. 2A is a plan view of an exemplary device for preventing resin bleed in accordance with one exemplary aspect of the present invention.
  • FIG. 2B is a partial cross-sectional view of the device of FIG. 2A in accordance with another exemplary aspect of the invention.
  • FIG. 3 is an exploded plan view of a portion of the device of FIG. 2A in accordance with yet another exemplary aspect of the present invention.
  • FIG. 4 is a plan view of another exemplary device for preventing resin bleed according to still another exemplary aspect of the present invention.
  • FIG. 5 is a block diagram of an exemplary method for controlling a resin-bleed on a substrate in accordance with another aspect of the present invention.
  • the present invention is directed towards a device for controlling a bleed of resin on a substrate. More particularly, the present invention provides a cost-effective solution for minimizing resin bleed into one or more regions of the substrate. Accordingly, the present invention will now be described with reference to the drawings, wherein like reference numerals are used to refer to like elements throughout. It should be understood that the description of these aspects are merely illustrative and that they should not be taken in a limiting sense. In the following description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the present invention. It will be evident to one skilled in the art, however, that the present invention may be practiced without these specific details.
  • FIG. 2A illustrates an exemplary electronic device 100 , such as an integrated circuit package 102 , in accordance with one aspect of the present invention.
  • the device 100 for example, comprises a substrate 105 , such as a ceramic or semiconductive substrate or carrier, wherein a surface 107 of the substrate is generally defined.
  • An interior region 108 , a peripheral region 110 , and an exterior region 112 (e.g., a side surface 113 ) of the surface 107 are further defined, wherein an integrated circuit 115 generally resides within the interior region.
  • the integrated circuit 115 for example, comprises a flip-chip 117 that is electrically connected to one or more contacts (not shown) associated with the substrate 105 .
  • the one or more contacts associated with the substrate 105 are operable to electrically connect the integrated circuit 115 to various other devices (not shown), as will be discussed hereafter.
  • the device 100 may further comprise various other electrical components 118 , such as a plurality of capacitors 119 , wherein the other electrical components further reside within the interior region 108 of the substrate.
  • the other electrical components 118 are further electrically connected to one or more of the integrated circuit 115 and other devices (not shown) associated with the device 100 .
  • FIG. 2B illustrates a partial cross-section of the device 100 of FIG. 2A , wherein a plurality of connectors 120 are illustrated across a bottom surface 121 of the substrate 105 .
  • the plurality of connectors 120 may comprise pads, sockets or pins, wherein the plurality of connectors are electrically connected to the integrated circuit 115 and various other components 118 , wherein other devices (not shown) may be further electrically connected to the device 100 .
  • FIG. 2B further illustrates a cap 122 that generally resides over the interior region 108 of the substrate 105 .
  • the cap 122 generally surrounds the integrated circuit 115 , and is operable to protect the integrated circuit and/or other electrical components 118 (e.g., the plurality of capacitors 119 ) that generally reside in the interior region 108 from an external environment 123 .
  • the cap 122 generally prevents dust, moisture, or the like, from entering an interior space 124 that is generally defined between the cap 122 and the interior region 108 of the surface 107 of the substrate 105 .
  • the cap 122 for example, is comprised of a plastic, ceramic, metal, such as copper or aluminum, or a composite material such as copper tungsten or aluminum nitride.
  • the cap 122 contacts the integrated circuit 115 , wherein the cap is operable to generally dissipate heat associated with the integrated circuit 115 .
  • the cap 122 may be further associated with a heat sink (not shown), wherein the heat sink is further operable to conduct heat from the integrated circuit 115 via the cap.
  • the cap 122 in another example, further provides protection to the integrated circuit 115 from contact with physical sources associated with the external environment 123 (e.g., the cap generally prevents objects associated with the external environment from contacting the integrated circuit 115 ).
  • the cap 122 is operable to provide electrical shielding of the integrated circuit 115 from electrical sources associated with the external environment 123 , or an electrical ground to the substrate 105 .
  • the cap 122 comprises any structure, such as a spacer (not shown), or the like, wherein the cap provides a physical separation of the integrated circuit 115 from other physical sources associated with the external environment 123 .
  • the cap 122 is generally affixed to the surface 107 of the substrate 105 by an adhesive 125 .
  • the adhesive 125 is applied to the peripheral region 110 of the surface 107 of the substrate 105 , and the cap 122 is subsequently placed over the adhesive, such that the cap is substantially adhered to the substrate via the adhesive.
  • the adhesive 125 is further applied to the integrated circuit 115 , as illustrated in FIG. 2B , wherein the adhesive generally provides an advantageous thermal conductivity between the integrated circuit and the cap 122 for purposes of heat dissipation.
  • the adhesive 125 for example, is generally comprised of a plurality of components, such as a metal in one or more binders, wherein the adhesive is curable by an application of heat thereto (e.g., at a temperature of approximately 150° C.), and wherein the cap 122 is generally bonded to the substrate 105 upon curing of the adhesive.
  • the adhesive 125 can comprise a resin 130 that will leech or bleed onto the surface 107 of the substrate 105 prior to curing of the adhesive.
  • the resin 130 will bleed from the adhesive 125 and onto the surface 107 of the substrate 105 .
  • the bleed of resin 130 can carry along one or more of the plurality of components of the adhesive 125 , such as the trace amounts of the metal, wherein the trace amounts of metal is further bled onto the surface 107 .
  • Such a bleed of resin 130 with or without the trace amounts of metal, can have deleterious effects on the device 100 if the bleed of resin extends onto the bottom surface 121 of the substrate and onto the plurality of contacts 120 .
  • a first barrier 135 is formed over the surface 107 of the substrate 105 within the peripheral region 110 in order to control the bleed of resin 130 .
  • the first barrier 135 generally surrounds the interior region 108 of the substrate 105 , and further generally isolates the interior region from the exterior region 112 of the substrate.
  • the first barrier 135 is formed substantially close to the side surface 113 of the substrate, wherein the first barrier occupies a minimal amount of surface area of the substrate. Accordingly, the first barrier 135 is operable to generally control the flow of resin 130 , such that the resin is generally prevented from flowing onto the surface 107 of the substrate 105 in the exterior region 112 thereof.
  • the first barrier 135 has a surface 140 that has a porosity that is less than a porosity of the surface 107 of the substrate 105 in one or more of the interior region 108 and the exterior region 112 .
  • the first barrier 135 is comprised of a material having a porosity that is less than a porosity of the substrate 105 .
  • the first barrier 135 for example, is comprised of one or more metals such as gold, silver, nickel, copper, and titanium, wherein the one or more metals are plated (e.g., electroplated) on the surface 107 of the substrate 105 .
  • the first barrier 135 is formed on the surface 107 of the substrate 105 by silk-screening.
  • the first barrier 135 for example, is formed on the substrate 105 in conjunction with a formation of other metal features (not shown) on the substrate, such as during formation of bonding pads or wiring lines associated with the electrical connection of the integrated circuit 115 to the substrate 105 .
  • the first barrier 135 comprises silver or gold that is electroplated to a thickness of less than about one micron.
  • the first barrier 135 is comprised of any material that has a porosity that is less than the porosity of the surface 107 of the substrate 105 , and any thickness of the first barrier is contemplated as falling within the scope of the present invention.
  • the surface 140 of the first barrier 135 is less porous than the surface 107 of the substrate 105 .
  • Such a porosity of the surface 140 of the first barrier 135 generally provides a channeling of the bleed, or flow, of resin 130 along the smoother, less porous surface 140 of the first barrier, wherein the resin flow generally follows a path of least resistance.
  • the surface 140 of the first barrier 135 is operable to provide a capillary action, wherein the resin 130 is generally pulled toward the first barrier. Accordingly, the bleed of resin 130 is controlled by the first barrier 135 , wherein the surface 140 of the first barrier provides less resistance to flow than the surface 107 of the substrate 105 .
  • FIG. 3 illustrates an exploded view 145 of the device 100 of FIG.
  • the resin bleed 130 flows from the adhesive 125 onto the surface 107 of the substrate 105 .
  • the resin 130 Upon encountering the first barrier 135 , the resin 130 is generally channeled along the surface 140 of the first barrier. It is believed that the flow of resin 130 is generally controlled by capillary and/or other forces associated with the surface 140 of the first barrier 135 , since the surface 140 is less porous than the surface 107 of the substrate 105 .
  • the resin 130 is generally deterred from bleeding into the external region after bleeding onto the first barrier. Therefore, the bleed of resin 130 is controlled still further, wherein the resin is generally prevented from bleeding into the external region 112 and bottom surface 121 of the substrate 105 , thus preventing a bleed of resin onto the plurality of connectors 120 .
  • Such a control of the flow or bleed of resin 130 is highly advantageous if any electrically conductive components of the adhesive 125 are also carried or bled with the resin during its flow. Consequently, since the flow of resin 130 is generally controlled by the first barrier, electrically conductive or insulative components associated with the adhesive 125 are substantially prevented from contacting the connectors 120 , and thus providing a more reliable device 100 .
  • the first barrier 135 comprises a ring 141 formed on the surface 107 of the substrate 105 within the peripheral region 110 , wherein the first barrier generally surrounds the interior region 108 , thus limiting the resin bleed 130 to within the interior region 108 .
  • the first barrier 135 comprises a plurality of barriers (not shown) formed in the peripheral region 110 of the surface 107 of the substrate 105 , wherein each barrier controls a particular portion of resin bleed 130 from bleeding into the exterior region 112 .
  • the present invention contemplates any configuration of the first barrier 135 , wherein the first barrier generally controls the resin bleed 130 from flowing into the exterior region 112 of the substrate 105 .
  • FIG. 4 illustrates another exemplary device 150 , wherein a second barrier 155 is formed over the surface 107 of the substrate 105 .
  • the second barrier 155 can be formed in a manner similar to the formation of the first barrier 135 , and may be comprised of a similar material (e.g., a metal).
  • the second barrier 155 has a surface 157 that has a porosity that is less than the porosity of the surface 107 of the substrate 105 . Consequently, the second barrier 155 can further control the bleed of resin 130 .
  • the second barrier 155 is formed on the surface 107 in one or more the interior region 108 and peripheral region 110 of the substrate 105 , wherein the bleed of resin 130 is generally confined between the first barrier 135 and the second barrier 155 .
  • further barriers can be formed on the substrate 105 in accordance with the present invention (e.g., between the integrated circuit 115 and the various other electrical components 118 ), wherein the further barriers provide a further control of resin bleed on the substrate, and such further barriers are contemplated as falling within the scope of the present invention.
  • FIG. 5 is a schematic block diagram illustrating an exemplary method 200 for controlling a bleed of resin on a substrate. While exemplary methods are illustrated and described herein as a series of acts or events, it will be appreciated that the present invention is not limited by the illustrated ordering of such acts or events, as some steps may occur in different orders and/or concurrently with other steps apart from that shown and described herein, in accordance with the invention. In addition, not all illustrated steps may be required to implement a methodology in accordance with the present invention. Moreover, it will be appreciated that the methods may be implemented in association with the systems illustrated and described herein as well as in association with other systems not illustrated.
  • the method 200 begins with act 205 , wherein a substrate, such as a ceramic substrate, is provided, wherein the substrate has a first surface having a first porosity associated therewith.
  • a substrate such as a ceramic substrate
  • the substrate has a first surface having a first porosity associated therewith.
  • one or more regions of the first surface are generally defined, wherein an adhesive is operable to be applied to the first surface within one or more regions in order to secure a cap thereto.
  • the adhesive for example, is comprised of a suspension of metal in a resin, wherein the adhesive is operable to be cured by an application of heat thereto.
  • the resin is operable to bleed or flow from the adhesive onto the first surface
  • a first barrier is formed over the first surface of the substrate, wherein the first barrier generally defines a second surface having a second porosity.
  • the second porosity of the first barrier is less than the first porosity of the substrate.
  • the first barrier for example, is formed via electroplating a metal onto the first surface of the substrate, wherein the first barrier generally surrounds the one or more regions of the first surface. Since the second porosity of the first barrier is less than the first porosity of the substrate, the second surface is operable to generally provide a capillary effect for any resin that may bleed onto the second surface. Such a capillary action further generally prevents the bleed of resin outside of the one or more regions, therein generally controlling the bleed of resin.
  • the resin will follow the path of least resistance upon bleeding of the adhesive (e.g., prior to curing of the adhesive), the resin will flow via capillary action on the second surface, but will not substantially flow from the second surface back onto the first surface, because the second porosity of the first barrier is less than the first porosity of the substrate.

Abstract

A device and a method for controlling resin bleed, the device comprising a substrate having a surface, wherein an interior region, a peripheral region, and an exterior region of the surface are generally defined. An adhesive generally resides on the surface of the substrate in the peripheral region thereof, wherein the adhesive comprises a plurality of components, such as a metal and a resin. A first barrier is formed on the surface of the substrate generally between the adhesive and the exterior region, wherein the first barrier generally prevents one or more of the plurality of components of the adhesive from bleeding onto the exterior region of the surface of the substrate.

Description

    FIELD OF THE INVENTION
  • The present invention relates generally to semiconductor devices, and more particularly to a device for controlling a bleeding of resin on a substrate.
  • BACKGROUND OF THE INVENTION
  • In the semiconductor processing industry, various processes are performed on various substrates in order to form a multitude of various semiconductive components. For example, two or more differing components may be bonded to one another for purposes of electrical interconnection, heat dissipation, or to provide protection from environmental factors. In flip-chip semiconductor processing, for example, a conventional electronic device, such as the device 10 illustrated in FIG. 1A, comprises a flip-chip 12 that is bonded to a substrate 14, wherein the bond generally defines electrical connections (not shown) between the substrate and the flip-chip. Typically, the flip chip 12 is bonded to the substrate 14 via a plurality of solder balls, wherein the solder balls are melted in order to electrically connect and bond the substrate and the flip-chip. As illustrated in FIG. 1B, in order to dissipate heat from the bonded flip-chip 12 (shown in phantom) and/or protect the bonded flip-chip from various environmental factors, such as dust or physical contact with other external devices (not shown), a protective cap 16 is typically bonded over a flip-chip region 18, wherein the cap is bonded to the substrate via an adhesive 20.
  • A typical adhesive 20 is comprised of a temperature-curable bonding agent suspended in a fluid-like resin, wherein the bonding agent is typically cured by an application of heat thereto. Such a curing process generally forms the bond between the cap 16 and the substrate 14, however, the resin tends to bleed onto surrounding regions 22 of the substrate, as illustrated in FIGS. 1A and 1B. Such a bleeding of the resin has a potential to contaminate the substrate 14, the flip-chip 12, and/or various other components 24 associated with the substrate. For example, the resin that is bled onto other components 24 may form an electrically-insulative layer (not shown) over the components, wherein future electrical connections to the components may be affected by the coating of resin thereover.
  • Furthermore, in an instance wherein the adhesive 20 comprises an electrically-conductive bonding agent (e.g., wherein an electrical connection between the cap 16 and the substrate 14 is desired), minute portions of the electrically-conductive bonding agent can also bleed or leach out with the resin before, during, or after the curing of the adhesive. Such a bleeding of the electrically-conductive bonding agent may provide further disadvantageous results in the finished device 10, such as an electrical shorting of various circuits, capacitance bleeding, etc. For example, a bleeding of the resin over a side 26 of the substrate provides the potential for a short-circuiting of one or more connectors 28 associated with the device 10. The connectors 28, for example, may further comprise bonding pads (not shown), wherein the bonding pads are highly susceptible to resin-bleed contamination.
  • Conventionally, undesirable affects from resin bleed are minimized by providing a large bleed area on the substrate for the resin to bleed onto, wherein no electrical components are associated with the bleed area. However, as real estate on substrates becomes more and more valuable due to ever decreasing sizes of associated electronic devices, providing such a large area for resin bleed becomes less practical. Additionally, conventional devices used to prevent the resin bleed typically require additional processing steps, therein adding cost and/or valuable manufacturing time. Accordingly, a need exists in the art for an economical device for minimizing the negative impact of resin bleed.
  • SUMMARY OF THE INVENTION
  • The following presents a simplified summary of the invention in order to provide a basic understanding of some aspects of the invention. This summary is not an extensive overview of the invention. It is intended to neither identify key or critical elements of the invention nor delineate the scope of the invention. Its purpose is to present some concepts of the invention in a simplified form as a prelude to the more detailed description that is presented later.
  • The present invention is generally directed toward a resin-bleed control device and method for controlling a bleed of resin on a substrate, wherein conventional processing for forming other electronic devices on the substrate can further incorporate a formation of the resin-bleed control device. In accordance with one exemplary aspect of the invention, the device comprises a substrate having a surface, wherein an interior region, a peripheral region, and an exterior region of the surface are generally defined on the surface of the substrate. One or more electrical devices, such as a flip chip, are further associated with the interior region of the substrate. In order to provide heat dissipation for the one or more electrical devices and/or protect the one or more electrical devices from an external environment, a cap is bonded to the substrate. In one example, the interior region is generally isolated from the external environment by the cap.
  • In accordance with one aspect of the invention, the cap is bonded to one or more of the substrate and one or more electrical devices via an adhesive, wherein the adhesive is comprised of a plurality of components. For example, the adhesive generally resides on the surface of the substrate in the peripheral region, wherein the cap is further placed on the adhesive for bonding to the substrate. A first barrier is further formed over the surface of the substrate, wherein the first barrier generally resides between the adhesive and the exterior region of the surface of the substrate, wherein the first barrier generally prevents one or more of the plurality of components of the adhesive, such as a resin, from bleeding substantially onto the exterior region of the surface of the substrate.
  • A porosity of the first barrier, for example, is less than a porosity of one or more of the interior region and the exterior region of the surface of the substrate, wherein the porosity of the first barrier generally provides a capillary action to prevent the resin from bleeding onto the exterior region of the surface of the substrate. For example, the first barrier is comprised of a metal, wherein the porosity of the metal is substantially less than the porosity of the substrate, and wherein the resin flow is generally confined to a surface of the metal after reaching the first barrier. The first barrier, for example, is further formed on the surface of the substrate during a formation of other components associated with the device, such as a formation of bonding pads or electrical interconnects. Thus, the formation of the first barrier can be performed in a manner that does not require additional steps in processing the device, and can also increase reliability of the device without substantially increasing manufacturing costs. According to another aspect of the invention, the first barrier is formed substantially close to a side of the device, wherein minimal surface real estate is utilized to prevent bleeding of resin onto the exterior region of the substrate.
  • In accordance with another exemplary aspect of the invention, the device comprises a second barrier formed on the surface of the substrate, wherein the second barrier is formed within one or more of the interior region and peripheral region. Consequently, the flow of resin is generally confined between the first barrier and the second barrier. The second barrier, for example, is further formed generally concurrently to the formation of the first barrier.
  • To the accomplishment of the foregoing and related ends, the invention comprises the features hereinafter fully described and particularly pointed out in the claims. The following description and the annexed drawings set forth in detail certain illustrative embodiments of the invention. These embodiments are indicative, however, of a few of the various ways in which the principles of the invention may be employed. Other objects, advantages and novel features of the invention will become apparent from the following detailed description of the invention when considered in conjunction with the drawings.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1A is a prior art plan view of a typical substrate illustrating a bleed of resin onto the substrate.
  • FIG. 1B is a prior art perspective view of a conventional substrate having a cap adhered thereto.
  • FIG. 2A is a plan view of an exemplary device for preventing resin bleed in accordance with one exemplary aspect of the present invention.
  • FIG. 2B is a partial cross-sectional view of the device of FIG. 2A in accordance with another exemplary aspect of the invention.
  • FIG. 3 is an exploded plan view of a portion of the device of FIG. 2A in accordance with yet another exemplary aspect of the present invention.
  • FIG. 4 is a plan view of another exemplary device for preventing resin bleed according to still another exemplary aspect of the present invention.
  • FIG. 5 is a block diagram of an exemplary method for controlling a resin-bleed on a substrate in accordance with another aspect of the present invention.
  • DETAILED DESCRIPTION OF THE INVENTION
  • The present invention is directed towards a device for controlling a bleed of resin on a substrate. More particularly, the present invention provides a cost-effective solution for minimizing resin bleed into one or more regions of the substrate. Accordingly, the present invention will now be described with reference to the drawings, wherein like reference numerals are used to refer to like elements throughout. It should be understood that the description of these aspects are merely illustrative and that they should not be taken in a limiting sense. In the following description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the present invention. It will be evident to one skilled in the art, however, that the present invention may be practiced without these specific details.
  • Referring now to the figures, FIG. 2A illustrates an exemplary electronic device 100, such as an integrated circuit package 102, in accordance with one aspect of the present invention. The device 100, for example, comprises a substrate 105, such as a ceramic or semiconductive substrate or carrier, wherein a surface 107 of the substrate is generally defined. An interior region 108, a peripheral region 110, and an exterior region 112 (e.g., a side surface 113) of the surface 107 are further defined, wherein an integrated circuit 115 generally resides within the interior region. The integrated circuit 115, for example, comprises a flip-chip 117 that is electrically connected to one or more contacts (not shown) associated with the substrate 105. The one or more contacts associated with the substrate 105, for example, are operable to electrically connect the integrated circuit 115 to various other devices (not shown), as will be discussed hereafter. The device 100 may further comprise various other electrical components 118, such as a plurality of capacitors 119, wherein the other electrical components further reside within the interior region 108 of the substrate. The other electrical components 118, for example, are further electrically connected to one or more of the integrated circuit 115 and other devices (not shown) associated with the device 100.
  • FIG. 2B illustrates a partial cross-section of the device 100 of FIG. 2A, wherein a plurality of connectors 120 are illustrated across a bottom surface 121 of the substrate 105. The plurality of connectors 120, for example, may comprise pads, sockets or pins, wherein the plurality of connectors are electrically connected to the integrated circuit 115 and various other components 118, wherein other devices (not shown) may be further electrically connected to the device 100. FIG. 2B further illustrates a cap 122 that generally resides over the interior region 108 of the substrate 105. The cap 122, for example, generally surrounds the integrated circuit 115, and is operable to protect the integrated circuit and/or other electrical components 118 (e.g., the plurality of capacitors 119) that generally reside in the interior region 108 from an external environment 123. For example, the cap 122 generally prevents dust, moisture, or the like, from entering an interior space 124 that is generally defined between the cap 122 and the interior region 108 of the surface 107 of the substrate 105.
  • The cap 122, for example, is comprised of a plastic, ceramic, metal, such as copper or aluminum, or a composite material such as copper tungsten or aluminum nitride. The cap 122, in one example, contacts the integrated circuit 115, wherein the cap is operable to generally dissipate heat associated with the integrated circuit 115. The cap 122 may be further associated with a heat sink (not shown), wherein the heat sink is further operable to conduct heat from the integrated circuit 115 via the cap. The cap 122, in another example, further provides protection to the integrated circuit 115 from contact with physical sources associated with the external environment 123 (e.g., the cap generally prevents objects associated with the external environment from contacting the integrated circuit 115). Alternatively, the cap 122 is operable to provide electrical shielding of the integrated circuit 115 from electrical sources associated with the external environment 123, or an electrical ground to the substrate 105. In still another alternative, the cap 122 comprises any structure, such as a spacer (not shown), or the like, wherein the cap provides a physical separation of the integrated circuit 115 from other physical sources associated with the external environment 123.
  • In accordance with one exemplary aspect of the invention, the cap 122 is generally affixed to the surface 107 of the substrate 105 by an adhesive 125. For example, as illustrated again in FIG. 2A, the adhesive 125 is applied to the peripheral region 110 of the surface 107 of the substrate 105, and the cap 122 is subsequently placed over the adhesive, such that the cap is substantially adhered to the substrate via the adhesive. In another example, the adhesive 125 is further applied to the integrated circuit 115, as illustrated in FIG. 2B, wherein the adhesive generally provides an advantageous thermal conductivity between the integrated circuit and the cap 122 for purposes of heat dissipation. The adhesive 125, for example, is generally comprised of a plurality of components, such as a metal in one or more binders, wherein the adhesive is curable by an application of heat thereto (e.g., at a temperature of approximately 150° C.), and wherein the cap 122 is generally bonded to the substrate 105 upon curing of the adhesive.
  • Again referring to FIG. 2A, the adhesive 125, for example, can comprise a resin 130 that will leech or bleed onto the surface 107 of the substrate 105 prior to curing of the adhesive. For example, over time, the resin 130 will bleed from the adhesive 125 and onto the surface 107 of the substrate 105. Furthermore, the bleed of resin 130 can carry along one or more of the plurality of components of the adhesive 125, such as the trace amounts of the metal, wherein the trace amounts of metal is further bled onto the surface 107. Such a bleed of resin 130, with or without the trace amounts of metal, can have deleterious effects on the device 100 if the bleed of resin extends onto the bottom surface 121 of the substrate and onto the plurality of contacts 120.
  • Therefore, in accordance with the present invention, as illustrated in FIG. 2A, a first barrier 135 is formed over the surface 107 of the substrate 105 within the peripheral region 110 in order to control the bleed of resin 130. The first barrier 135, for example, generally surrounds the interior region 108 of the substrate 105, and further generally isolates the interior region from the exterior region 112 of the substrate. According to another example, the first barrier 135 is formed substantially close to the side surface 113 of the substrate, wherein the first barrier occupies a minimal amount of surface area of the substrate. Accordingly, the first barrier 135 is operable to generally control the flow of resin 130, such that the resin is generally prevented from flowing onto the surface 107 of the substrate 105 in the exterior region 112 thereof.
  • According to another exemplary aspect of the invention, the first barrier 135 has a surface 140 that has a porosity that is less than a porosity of the surface 107 of the substrate 105 in one or more of the interior region 108 and the exterior region 112. For example, the first barrier 135 is comprised of a material having a porosity that is less than a porosity of the substrate 105. The first barrier 135, for example, is comprised of one or more metals such as gold, silver, nickel, copper, and titanium, wherein the one or more metals are plated (e.g., electroplated) on the surface 107 of the substrate 105. Alternatively, the first barrier 135 is formed on the surface 107 of the substrate 105 by silk-screening. The first barrier 135, for example, is formed on the substrate 105 in conjunction with a formation of other metal features (not shown) on the substrate, such as during formation of bonding pads or wiring lines associated with the electrical connection of the integrated circuit 115 to the substrate 105. According to one example, the first barrier 135 comprises silver or gold that is electroplated to a thickness of less than about one micron. Alternatively, the first barrier 135 is comprised of any material that has a porosity that is less than the porosity of the surface 107 of the substrate 105, and any thickness of the first barrier is contemplated as falling within the scope of the present invention.
  • As stated above, the surface 140 of the first barrier 135 is less porous than the surface 107 of the substrate 105. Such a porosity of the surface 140 of the first barrier 135 generally provides a channeling of the bleed, or flow, of resin 130 along the smoother, less porous surface 140 of the first barrier, wherein the resin flow generally follows a path of least resistance. Furthermore, the surface 140 of the first barrier 135 is operable to provide a capillary action, wherein the resin 130 is generally pulled toward the first barrier. Accordingly, the bleed of resin 130 is controlled by the first barrier 135, wherein the surface 140 of the first barrier provides less resistance to flow than the surface 107 of the substrate 105. FIG. 3 illustrates an exploded view 145 of the device 100 of FIG. 2A, wherein the resin bleed 130 flows from the adhesive 125 onto the surface 107 of the substrate 105. Upon encountering the first barrier 135, the resin 130 is generally channeled along the surface 140 of the first barrier. It is believed that the flow of resin 130 is generally controlled by capillary and/or other forces associated with the surface 140 of the first barrier 135, since the surface 140 is less porous than the surface 107 of the substrate 105.
  • Again, since the surface 107 of the substrate 105 in the external region 112 has a greater porosity than the surface 140 of the first barrier 135, the resin 130 is generally deterred from bleeding into the external region after bleeding onto the first barrier. Therefore, the bleed of resin 130 is controlled still further, wherein the resin is generally prevented from bleeding into the external region 112 and bottom surface 121 of the substrate 105, thus preventing a bleed of resin onto the plurality of connectors 120. Such a control of the flow or bleed of resin 130, for example, is highly advantageous if any electrically conductive components of the adhesive 125 are also carried or bled with the resin during its flow. Consequently, since the flow of resin 130 is generally controlled by the first barrier, electrically conductive or insulative components associated with the adhesive 125 are substantially prevented from contacting the connectors 120, and thus providing a more reliable device 100.
  • In accordance with one example, the first barrier 135 comprises a ring 141 formed on the surface 107 of the substrate 105 within the peripheral region 110, wherein the first barrier generally surrounds the interior region 108, thus limiting the resin bleed 130 to within the interior region 108. Alternatively, the first barrier 135 comprises a plurality of barriers (not shown) formed in the peripheral region 110 of the surface 107 of the substrate 105, wherein each barrier controls a particular portion of resin bleed 130 from bleeding into the exterior region 112. Accordingly, the present invention contemplates any configuration of the first barrier 135, wherein the first barrier generally controls the resin bleed 130 from flowing into the exterior region 112 of the substrate 105.
  • In accordance with another exemplary aspect of the present invention, FIG. 4 illustrates another exemplary device 150, wherein a second barrier 155 is formed over the surface 107 of the substrate 105. The second barrier 155, for example, can be formed in a manner similar to the formation of the first barrier 135, and may be comprised of a similar material (e.g., a metal). Again, like the first barrier 135 discussed above, the second barrier 155 has a surface 157 that has a porosity that is less than the porosity of the surface 107 of the substrate 105. Consequently, the second barrier 155 can further control the bleed of resin 130. For example, the second barrier 155 is formed on the surface 107 in one or more the interior region 108 and peripheral region 110 of the substrate 105, wherein the bleed of resin 130 is generally confined between the first barrier 135 and the second barrier 155. It should be noted that further barriers (not shown) can be formed on the substrate 105 in accordance with the present invention (e.g., between the integrated circuit 115 and the various other electrical components 118), wherein the further barriers provide a further control of resin bleed on the substrate, and such further barriers are contemplated as falling within the scope of the present invention.
  • According to still another exemplary aspect of the present invention, FIG. 5 is a schematic block diagram illustrating an exemplary method 200 for controlling a bleed of resin on a substrate. While exemplary methods are illustrated and described herein as a series of acts or events, it will be appreciated that the present invention is not limited by the illustrated ordering of such acts or events, as some steps may occur in different orders and/or concurrently with other steps apart from that shown and described herein, in accordance with the invention. In addition, not all illustrated steps may be required to implement a methodology in accordance with the present invention. Moreover, it will be appreciated that the methods may be implemented in association with the systems illustrated and described herein as well as in association with other systems not illustrated.
  • As illustrated in FIG. 5, the method 200 begins with act 205, wherein a substrate, such as a ceramic substrate, is provided, wherein the substrate has a first surface having a first porosity associated therewith. In accordance with one exemplary aspect of the invention, one or more regions of the first surface are generally defined, wherein an adhesive is operable to be applied to the first surface within one or more regions in order to secure a cap thereto. The adhesive, for example, is comprised of a suspension of metal in a resin, wherein the adhesive is operable to be cured by an application of heat thereto. Furthermore, the resin is operable to bleed or flow from the adhesive onto the first surface
  • In act 210, a first barrier is formed over the first surface of the substrate, wherein the first barrier generally defines a second surface having a second porosity. In accordance with the present invention, the second porosity of the first barrier is less than the first porosity of the substrate. The first barrier, for example, is formed via electroplating a metal onto the first surface of the substrate, wherein the first barrier generally surrounds the one or more regions of the first surface. Since the second porosity of the first barrier is less than the first porosity of the substrate, the second surface is operable to generally provide a capillary effect for any resin that may bleed onto the second surface. Such a capillary action further generally prevents the bleed of resin outside of the one or more regions, therein generally controlling the bleed of resin.
  • Furthermore, since the resin will follow the path of least resistance upon bleeding of the adhesive (e.g., prior to curing of the adhesive), the resin will flow via capillary action on the second surface, but will not substantially flow from the second surface back onto the first surface, because the second porosity of the first barrier is less than the first porosity of the substrate.
  • Although the invention has been shown and described with respect to a certain aspect or various aspects, it is obvious that equivalent alterations and modifications will occur to others skilled in the art upon the reading and understanding of this specification and the annexed drawings. In particular regard to the various functions performed by the above described components (assemblies, devices, circuits, etc.), the terms (including a reference to a “means”) used to describe such components are intended to correspond, unless otherwise indicated, to any component which performs the specified function of the described component (i.e., that is functionally equivalent), even though not structurally equivalent to the disclosed structure which performs the function in the herein illustrated exemplary embodiments of the invention. In addition, while a particular feature of the invention may have been disclosed with respect to only one of several aspects of the invention, such feature may be combined with one or more other features of the other aspects as may be desired and advantageous for any given or particular application. Furthermore, to the extent that the term “includes” is used in either the detailed description or the claims, such term is intended to be inclusive in a manner similar to the term “comprising.”

Claims (16)

1-16. (canceled)
17. A method for controlling resin bleed, the method comprising:
providing a substrate having a first surface, wherein the first surface is generally defined by a first porosity, and wherein a resin resides on the first surface within one or more regions; and
forming a first barrier having a second porosity over the first surface of the substrate, wherein the first barrier is formed around the one or more regions, and wherein first barrier generally prevents a flow of the resin outside of the one or more regions.
18. The method of claim 17, wherein the second porosity is less than the first porosity.
19. The method of claim 17, wherein forming the first barrier comprises electroplating a metal onto the first surface of the substrate.
20. The method of claim 17, further comprising forming a second barrier having a porosity that is less than the first porosity over the first surface of the substrate, wherein the second barrier generally limits the flow of the resin to between the first barrier and the second barrier.
21. A method of forming a electronic circuit device; comprising:
providing a substrate having a surface with an interior region, a peripheral region, and an exterior region, and a first surface porosity;
placing an integrated circuit in the interior region of the substrate;
placing an electronic circuit element in the peripheral region of the substrate;
placing a adhesive between the electronic circuit element and the substrate;
forming a first barrier of a first width and a second surface porosity over the surface of the substrate between the electronic circuit element and the exterior region; and
flowing a portion of the adhesive towards the first barrier without crossing the first width.
22. The method of claim 21, wherein the second surface porosity is less than the first surface porosity.
23. The method of claim 21, wherein the first barrier comprises a metal.
24. The method of claim 21, wherein the metal is gold, silver, nickel, copper, titanium, or their alloy.
25. The method of claim 21, wherein the forming includes electroplating.
26. The method of claim 21, wherein the forming includes silk-screening.
27. The method of claim 21, wherein the first barrier provides an electrical connection to an electrical ground.
28. The method of claim 21, wherein the first barrier has a thickness less than one micron.
29. The method of claim 21, wherein the first barrier is a ring.
30. The method of claim 21, wherein the adhesive includes resin.
31. The method of claim 21, wherein the substrate is ceramic.
US11/624,596 2004-09-23 2007-01-18 Semiconductor Device Having Resin Anti-Bleed Feature Abandoned US20070116862A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US11/624,596 US20070116862A1 (en) 2004-09-23 2007-01-18 Semiconductor Device Having Resin Anti-Bleed Feature

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/947,695 US7183657B2 (en) 2004-09-23 2004-09-23 Semiconductor device having resin anti-bleed feature
US11/624,596 US20070116862A1 (en) 2004-09-23 2007-01-18 Semiconductor Device Having Resin Anti-Bleed Feature

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
US10/947,695 Division US7183657B2 (en) 2004-09-23 2004-09-23 Semiconductor device having resin anti-bleed feature

Publications (1)

Publication Number Publication Date
US20070116862A1 true US20070116862A1 (en) 2007-05-24

Family

ID=36073084

Family Applications (2)

Application Number Title Priority Date Filing Date
US10/947,695 Active US7183657B2 (en) 2004-09-23 2004-09-23 Semiconductor device having resin anti-bleed feature
US11/624,596 Abandoned US20070116862A1 (en) 2004-09-23 2007-01-18 Semiconductor Device Having Resin Anti-Bleed Feature

Family Applications Before (1)

Application Number Title Priority Date Filing Date
US10/947,695 Active US7183657B2 (en) 2004-09-23 2004-09-23 Semiconductor device having resin anti-bleed feature

Country Status (1)

Country Link
US (2) US7183657B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10325826B1 (en) 2018-04-27 2019-06-18 Nxp Usa, Inc. Substrate with reservoir for die attach adhesive

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7281667B2 (en) * 2005-04-14 2007-10-16 International Business Machines Corporation Method and structure for implementing secure multichip modules for encryption applications
JP2007059449A (en) * 2005-08-22 2007-03-08 Fujitsu Ltd Semiconductor device
US7598119B2 (en) * 2007-03-12 2009-10-06 Texas Instruments Incorporated System and method for inhibiting and containing resin bleed-out from adhesive materials used in assembly of semiconductor devices
JP2010212577A (en) * 2009-03-12 2010-09-24 Aisin Aw Co Ltd Semiconductor module
US8476115B2 (en) 2011-05-03 2013-07-02 Stats Chippac, Ltd. Semiconductor device and method of mounting cover to semiconductor die and interposer with adhesive material
US8982577B1 (en) * 2012-02-17 2015-03-17 Amkor Technology, Inc. Electronic component package having bleed channel structure and method
US9054092B2 (en) 2013-10-28 2015-06-09 Texas Instruments Incorporated Method and apparatus for stopping resin bleed and mold flash on integrated circuit lead finishes
DE102020111482A1 (en) * 2019-08-28 2021-03-04 Taiwan Semiconductor Manufacturing Co., Ltd. PACKAGE STRUCTURE AND METHOD FOR MANUFACTURING IT
US11456287B2 (en) * 2019-08-28 2022-09-27 Taiwan Semiconductor Manufacturing Company, Ltd. Package structure and method of fabricating the same
US11302652B2 (en) 2019-12-20 2022-04-12 Texas Instruments Incorporated Semiconductor package substrate with a smooth groove about a perimeter of a semiconductor die

Citations (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5120678A (en) * 1990-11-05 1992-06-09 Motorola Inc. Electrical component package comprising polymer-reinforced solder bump interconnection
US5227663A (en) * 1989-12-19 1993-07-13 Lsi Logic Corporation Integral dam and heat sink for semiconductor device assembly
US5298062A (en) * 1992-08-19 1994-03-29 Videojet Systems International, Inc. Eutectic compositions for hot melt jet inks
US5409863A (en) * 1993-02-19 1995-04-25 Lsi Logic Corporation Method and apparatus for controlling adhesive spreading when attaching an integrated circuit die
US5471027A (en) * 1994-07-22 1995-11-28 International Business Machines Corporation Method for forming chip carrier with a single protective encapsulant
US5737191A (en) * 1995-04-07 1998-04-07 Shinko Electric Industries Co., Ltd. Structure and process for mounting semiconductor chip
US5869356A (en) * 1996-05-29 1999-02-09 International Business Machines Corporation Method and structure for constraining the flow of incapsulant applied to an I/C chip on a substrate
US6025260A (en) * 1998-02-05 2000-02-15 Integrated Device Technology, Inc. Method for fabricating air gap with borderless contact
US6073648A (en) * 1999-04-26 2000-06-13 Watson Grinding And Manufacturing Company Metal element having a laminated coating
US6077405A (en) * 1998-10-28 2000-06-20 International Business Machines Corporation Method and apparatus for making electrical contact to a substrate during electroplating
US6117705A (en) * 1997-04-18 2000-09-12 Amkor Technology, Inc. Method of making integrated circuit package having adhesive bead supporting planar lid above planar substrate
US6118183A (en) * 1996-12-19 2000-09-12 Texas Instruments Incorporated Semiconductor device, manufacturing method thereof, and insulating substrate for same
US6291264B1 (en) * 2000-07-31 2001-09-18 Siliconware Precision Industries Co., Ltd. Flip-chip package structure and method of fabricating the same
US6391683B1 (en) * 2000-06-21 2002-05-21 Siliconware Precision Industries Co., Ltd. Flip-chip semiconductor package structure and process for fabricating the same
US6426290B1 (en) * 2000-08-18 2002-07-30 Advanced Micro Devices, Inc. Electroplating both sides of a workpiece
US20020141160A1 (en) * 2001-01-17 2002-10-03 Bonitz Barry A. Adjusting fillet geometry to couple a heat spreader to a chip carrier
US6491039B1 (en) * 1998-01-23 2002-12-10 Innercool Therapies, Inc. Medical procedure
US20020190354A1 (en) * 2001-06-15 2002-12-19 Park Kye Chan Semiconductor package and fabrication method of the same
US6522018B1 (en) * 2000-05-16 2003-02-18 Micron Technology, Inc. Ball grid array chip packages having improved testing and stacking characteristics
US6528876B2 (en) * 2000-06-26 2003-03-04 Siliconware Precision Industries Co., Ltd. Semiconductor package having heat sink attached to substrate
US20030096493A1 (en) * 2001-11-19 2003-05-22 Mark Vandermeulen Perimeter anchored thick film pad
US6683465B2 (en) * 2001-10-31 2004-01-27 Agere Systems Inc. Integrated circuit having stress migration test structure and method therefor
US20040155329A1 (en) * 2000-08-31 2004-08-12 Intel Corporation Electronic assembly comprising solderable thermal interface and methods of manufacture
US20050074923A1 (en) * 2003-10-03 2005-04-07 Vahid Goudarzi Metallic dam and method of forming therefor

Patent Citations (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5227663A (en) * 1989-12-19 1993-07-13 Lsi Logic Corporation Integral dam and heat sink for semiconductor device assembly
US5120678A (en) * 1990-11-05 1992-06-09 Motorola Inc. Electrical component package comprising polymer-reinforced solder bump interconnection
US5298062A (en) * 1992-08-19 1994-03-29 Videojet Systems International, Inc. Eutectic compositions for hot melt jet inks
US5409863A (en) * 1993-02-19 1995-04-25 Lsi Logic Corporation Method and apparatus for controlling adhesive spreading when attaching an integrated circuit die
US5471027A (en) * 1994-07-22 1995-11-28 International Business Machines Corporation Method for forming chip carrier with a single protective encapsulant
US5737191A (en) * 1995-04-07 1998-04-07 Shinko Electric Industries Co., Ltd. Structure and process for mounting semiconductor chip
US5869356A (en) * 1996-05-29 1999-02-09 International Business Machines Corporation Method and structure for constraining the flow of incapsulant applied to an I/C chip on a substrate
US6118183A (en) * 1996-12-19 2000-09-12 Texas Instruments Incorporated Semiconductor device, manufacturing method thereof, and insulating substrate for same
US6117705A (en) * 1997-04-18 2000-09-12 Amkor Technology, Inc. Method of making integrated circuit package having adhesive bead supporting planar lid above planar substrate
US6491039B1 (en) * 1998-01-23 2002-12-10 Innercool Therapies, Inc. Medical procedure
US6025260A (en) * 1998-02-05 2000-02-15 Integrated Device Technology, Inc. Method for fabricating air gap with borderless contact
US6077405A (en) * 1998-10-28 2000-06-20 International Business Machines Corporation Method and apparatus for making electrical contact to a substrate during electroplating
US6073648A (en) * 1999-04-26 2000-06-13 Watson Grinding And Manufacturing Company Metal element having a laminated coating
US6522018B1 (en) * 2000-05-16 2003-02-18 Micron Technology, Inc. Ball grid array chip packages having improved testing and stacking characteristics
US6391683B1 (en) * 2000-06-21 2002-05-21 Siliconware Precision Industries Co., Ltd. Flip-chip semiconductor package structure and process for fabricating the same
US6528876B2 (en) * 2000-06-26 2003-03-04 Siliconware Precision Industries Co., Ltd. Semiconductor package having heat sink attached to substrate
US6291264B1 (en) * 2000-07-31 2001-09-18 Siliconware Precision Industries Co., Ltd. Flip-chip package structure and method of fabricating the same
US6426290B1 (en) * 2000-08-18 2002-07-30 Advanced Micro Devices, Inc. Electroplating both sides of a workpiece
US20040155329A1 (en) * 2000-08-31 2004-08-12 Intel Corporation Electronic assembly comprising solderable thermal interface and methods of manufacture
US20020141160A1 (en) * 2001-01-17 2002-10-03 Bonitz Barry A. Adjusting fillet geometry to couple a heat spreader to a chip carrier
US20020190354A1 (en) * 2001-06-15 2002-12-19 Park Kye Chan Semiconductor package and fabrication method of the same
US6683465B2 (en) * 2001-10-31 2004-01-27 Agere Systems Inc. Integrated circuit having stress migration test structure and method therefor
US20030096493A1 (en) * 2001-11-19 2003-05-22 Mark Vandermeulen Perimeter anchored thick film pad
US20050074923A1 (en) * 2003-10-03 2005-04-07 Vahid Goudarzi Metallic dam and method of forming therefor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10325826B1 (en) 2018-04-27 2019-06-18 Nxp Usa, Inc. Substrate with reservoir for die attach adhesive

Also Published As

Publication number Publication date
US7183657B2 (en) 2007-02-27
US20060060985A1 (en) 2006-03-23

Similar Documents

Publication Publication Date Title
US20070116862A1 (en) Semiconductor Device Having Resin Anti-Bleed Feature
US7863098B2 (en) Flip chip package with advanced electrical and thermal properties for high current designs
US6396136B2 (en) Ball grid package with multiple power/ground planes
US5784261A (en) Microchip module assemblies
US11145565B2 (en) Method of fabricating a chip package module with improve heat dissipation effect
DE102008028757B4 (en) Method for producing a semiconductor chip arrangement
US20180151461A1 (en) Stiffener for fan-out wafer level packaging and method of manufacturing
US20060226534A1 (en) Structure and assembly method of integrated circuit package
EP1938382B1 (en) High current semiconductor device system having low resistance and inductance
US6573595B1 (en) Ball grid array semiconductor package with resin coated metal core
US5966803A (en) Ball grid array having no through holes or via interconnections
US6543676B2 (en) Pin attachment by a surface mounting method for fabricating organic pin grid array packages
CN102403268A (en) Methods for filling a contact hole in a chip package arrangement and chip package arrangements
KR20180105550A (en) Method of forming a packaged semiconductor device using ganged conductive connective assembly and structure
US5898128A (en) Electronic component
US7358617B2 (en) Bond pad for ball grid array package
CN112714539A (en) Electronic component and method of manufacturing an electronic component
KR100708045B1 (en) Semiconductor package and its manufacturing method
US20180012854A1 (en) Enhanced solder pad
US20040089930A1 (en) Simplified stacked chip assemblies
US11784114B2 (en) Plated metal layer in power packages
JP2000031340A (en) Electronic component
JPH07135203A (en) Semiconductor device
JP2775262B2 (en) Electronic component mounting board and electronic component mounting device
KR100507286B1 (en) Method for adhering semiconductor package

Legal Events

Date Code Title Description
STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION