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Zitiert von PatentEingetragenAusgestelltUrsprünglich Bevollmächtigter Titel
US634812611. Aug. 200019. Febr. 2002Applied Materials, Inc.Externally excited torroidal plasma source
US641044911. Aug. 200025. Juni 2002Applied Materials, Inc.Method of processing a workpiece using an externally excited torroidal plasma source
US641887425. Mai 200016. Juli 2002Applied Materials, Inc.Toroidal plasma source for plasma processing
US645384211. Aug. 200024. Sept. 2002Applied Materials Inc.Externally excited torroidal plasma source using a gas distribution plate
US646838811. Aug. 200022. Okt. 2002Applied Materials, Inc.Reactor chamber for an externally excited torroidal plasma source with a gas distribution plate
US649498611. Aug. 200017. Dez. 2002Applied Materials, Inc.Externally excited multiple torroidal plasma source
US655144611. Aug. 200022. Apr. 2003Applied Materials Inc.Externally excited torroidal plasma source with a gas distribution plate
US663431313. Febr. 200121. Okt. 2003Applied Materials, Inc.High-frequency electrostatically shielded toroidal plasma and radical source
US667998111. Mai 200020. Jan. 2004Applied Materials, Inc.Inductive plasma loop enhancing magnetron sputtering
US671202012. Juni 200230. März 2004Applied Materials Inc.Toroidal plasma source for plasma processing
US689390724. Febr. 200417. Mai 2005Applied Materials, Inc.Fabrication of silicon-on-insulator structure using plasma immersion ion implantation
US69394345. Juni 20026. Sept. 2005Applied Materials, Inc.Externally excited torroidal plasma source with magnetic control of ion distribution
US703781322. Aug. 20032. Mai 2006Applied Materials, Inc.Plasma immersion ion implantation process using a capacitively coupled plasma source having low dissociation and low minimum plasma voltage
US709431611. Aug. 200022. Aug. 2006Applied Materials, Inc.Externally excited torroidal plasma source
US709467028. Jan. 200522. Aug. 2006Applied Materials, Inc.Plasma immersion ion implantation process
US710909817. Mai 200519. Sept. 2006Applied Materials, Inc.Semiconductor junction formation process including low temperature plasma deposition of an optical absorption layer and high speed optical annealing
US713735422. Aug. 200321. Nov. 2006Applied Materials, Inc.Plasma immersion ion implantation apparatus including a plasma source having low dissociation and low minimum plasma voltage
US71665241. Dez. 200423. Jan. 2007Applied Materials, Inc.Method for ion implanting insulator material to reduce dielectric constant
US718317716. Nov. 200427. Febr. 2007Applied Materials, Inc.Silicon-on-insulator wafer transfer method using surface activation plasma immersion ion implantation for wafer-to-wafer adhesion enhancement
US72236763. Mai 200429. Mai 2007Applied Materials, Inc.Very low temperature CVD process with independently variable conformality, stress and composition of the CVD layer
US724447422. Juni 200417. Juli 2007Applied Materials, Inc.Chemical vapor deposition plasma process using an ion shower grid
US728849128. Jan. 200530. Okt. 2007Applied Materials, Inc.Plasma immersion ion implantation process
US729136022. Juni 20046. Nov. 2007Applied Materials, Inc.Chemical vapor deposition plasma process using plural ion shower grids
US729154521. Nov. 20056. Nov. 2007Applied Materials, Inc.Plasma immersion ion implantation process using a capacitively couple plasma source having low dissociation and low minimum plasma voltage
US72945631. Dez. 200413. Nov. 2007Applied Materials, Inc.Semiconductor on insulator vertical transistor fabrication and doping process
US730398222. Aug. 20034. Dez. 2007Applied Materials, Inc.Plasma immersion ion implantation process using an inductively coupled plasma source having low dissociation and low minimum plasma voltage
US73121488. Aug. 200525. Dez. 2007Applied Materials, Inc.Copper barrier reflow process employing high speed optical annealing
US731216217. Mai 200525. Dez. 2007Applied Materials, Inc.Low temperature plasma deposition process for carbon layer deposition
US732073422. Aug. 200322. Jan. 2008Applied Materials, Inc.Plasma immersion ion implantation system including a plasma source having low dissociation and low minimum plasma voltage
US73234018. Aug. 200529. Jan. 2008Applied Materials, Inc.Semiconductor substrate process using a low temperature deposited carbon-containing hard mask
US73356118. Aug. 200526. Febr. 2008Applied Materials, Inc.Copper conductor annealing process employing high speed optical annealing with a low temperature-deposited optical absorber layer
US73581928. Apr. 200415. Apr. 2008Applied Materials, Inc.Method and apparatus for in-situ film stack processing
US739376519. Apr. 20071. Juli 2008Applied Materials, Inc.Low temperature CVD process with selected stress of the CVD layer on CMOS devices
US742277517. Mai 20059. Sept. 2008Applied Materials, Inc.Process for low temperature plasma deposition of an optical absorption layer and high speed optical annealing
US742891526. Apr. 200530. Sept. 2008Applied Materials, Inc.O-ringless tandem throttle valve for a plasma reactor chamber
US74295328. Aug. 200530. Sept. 2008Applied Materials, Inc.Semiconductor substrate process using an optically writable carbon-containing mask
US743098430. Okt. 20027. Okt. 2008Applied Materials, Inc.Method to drive spatially separate resonant structure with spatially distinct plasma secondaries using a single generator and switching elements
US746547828. Jan. 200516. Dez. 2008Applied Materials, Inc.Plasma immersion ion implantation process
US747945626. Aug. 200420. Jan. 2009Applied Materials, Inc.Gasless high voltage high contact force wafer contact-cooling electrostatic chuck
US766646423. Okt. 200423. Febr. 2010Applied Materials, Inc.RF measurement feedback control and diagnostics for a plasma immersion ion implantation reactor
US769559022. Juni 200413. Apr. 2010Applied Materials, Inc.Chemical vapor deposition plasma reactor having plural ion shower grids
US770046522. Aug. 200320. Apr. 2010Applied Materials, Inc.Plasma immersion ion implantation process using a plasma source having low dissociation and low minimum plasma voltage
US776756120. Juli 20043. Aug. 2010Applied Materials, Inc.Plasma immersion ion implantation reactor having an ion shower grid
US805815620. Juli 200415. Nov. 2011Applied Materials, Inc.Plasma immersion ion implantation reactor having multiple ion shower grids

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