|
| US4774760 | 9. Okt. 1987 | 4. Okt. 1988 | International Business Machines Corporation | Method of making a multipad solder preform |
| US4954878 | 29. Juni 1989 | 4. Sept. 1990 | Digital Equipment Corp. | Method of packaging and powering integrated circuit chips and the chip assembly formed thereby |
| US5105537 | 12. Okt. 1990 | 21. Apr. 1992 | International Business Machines Corporation | Method for making a detachable electrical contact |
| US5118299 | 7. Mai 1990 | 2. Juni 1992 | International Business Machines Corporation | Cone electrical contact |
| US5137461 | 30. Okt. 1990 | 11. Aug. 1992 | International Business Machines Corporation | Separable electrical connection technology |
| US5163834 | 23. Juli 1991 | 17. Nov. 1992 | International Business Machines Corporation | High density connector |
| US5185073 | 29. Apr. 1991 | 9. Febr. 1993 | International Business Machines Corporation | Method of fabricating nendritic materials |
| US5190463 | 25. Nov. 1991 | 2. März 1993 | International Business Machines Corporation | High performance metal cone contact |
| US5207585 | 31. Okt. 1990 | 4. Mai 1993 | International Business Machines Corporation | Thin interface pellicle for dense arrays of electrical interconnects |
| US5252882 | 27. Juni 1991 | 12. Okt. 1993 | Japan Radio Co., Ltd. | Surface acoustic wave device and its manufacturing method |
| US5281883 | 4. Nov. 1991 | 25. Jan. 1994 | Fujitsu Limited | Surface acoustic wave device with improved junction bonding and package miniaturization |
| US5297967 | 13. Okt. 1992 | 29. März 1994 | International Business Machines Corporation | Electrical interconnector with helical contacting portion and assembly using same |
| US5321583 | 2. Dez. 1992 | 14. Juni 1994 | Intel Corporation | Electrically conductive interposer and array package concept for interconnecting to a circuit board |
| US5363038 | 12. Aug. 1992 | 8. Nov. 1994 | Fujitsu Limited | Method and apparatus for testing an unpopulated chip carrier using a module test card |
| US5477160 | 6. Aug. 1993 | 19. Dez. 1995 | Fujitsu Limited | Module test card |
| US5949246 | 28. Jan. 1997 | 7. Sept. 1999 | International Business Machines | Test head for applying signals in a burn-in test of an integrated circuit |
| US6027346 | 29. Juni 1998 | 22. Febr. 2000 | Xandex, Inc. | Membrane-supported contactor for semiconductor test |
| US6094059 | 1. Febr. 1999 | 25. Juli 2000 | International Business Machines Corporation | Apparatus and method for burn-in/testing of integrated circuit devices |
| US6094060 | 1. Febr. 1999 | 25. Juli 2000 | International Business Machines Corporation | Test head for applying signals in a burn-in test of an integrated circuit |
| US6194669 | 5. Febr. 1999 | 27. Febr. 2001 | TRW Inc. | Solder ball grid array for connecting multiple millimeter wave assemblies |
| US6345989 | 4. Jan. 2000 | 12. Febr. 2002 | Thomas & Betts International, Inc. | Circuit board side interconnect |
| US6437584 | 10. Okt. 2000 | 20. Aug. 2002 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
| US6578264 | 11. Apr. 2000 | 17. Juni 2003 | Cascade Microtech, Inc. | Method for constructing a membrane probe using a depression |
| US6672907 | 2. Mai 2001 | 6. Jan. 2004 | FCI Americas Technology, Inc. | Connector |
| US6708386 | 22. März 2001 | 23. März 2004 | Cascade Microtech, Inc. | Method for probing an electrical device having a layer of oxide thereon |
| US6825677 | 22. März 2001 | 30. Nov. 2004 | Cascade Microtech, Inc. | Membrane probing system |
| US6838890 | 29. Nov. 2000 | 4. Jan. 2005 | Cascade Microtech, Inc. | Membrane probing system |
| US6860009 | 22. März 2001 | 1. März 2005 | Cascade Microtech, Inc. | Probe construction using a recess |
| US6869290 | 26. Mai 2004 | 22. März 2005 | Neoconix, Inc. | Circuitized connector for land grid array |
| US6916181 | 11. Juni 2003 | 12. Juli 2005 | Neoconix, Inc. | Remountable connector for land grid array packages |
| US6927585 | 20. Mai 2002 | 9. Aug. 2005 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
| US6930498 | 29. Juli 2004 | 16. Aug. 2005 | Cascade Microtech, Inc. | Membrane probing system |
| US7014479 | 14. Sept. 2004 | 21. März 2006 | | Electrical contact and connector and method of manufacture |
| US7025601 | 2. Juli 2004 | 11. Apr. 2006 | Neoconix, Inc. | Interposer and method for making same |
| US7056131 | 11. Apr. 2003 | 6. Juni 2006 | Neoconix, Inc. | Contact grid array system |
| US7070419 | 26. Mai 2004 | 4. Juli 2006 | Neoconix Inc. | Land grid array connector including heterogeneous contact elements |
| US7090503 | 20. Juli 2004 | 15. Aug. 2006 | Neoconix, Inc. | Interposer with compliant pins |
| US7109731 | 17. Juni 2005 | 19. Sept. 2006 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
| US7113408 | 11. Juni 2003 | 26. Sept. 2006 | Neoconix, Inc. | Contact grid array formed on a printed circuit board |
| US7148711 | 3. Juni 2005 | 12. Dez. 2006 | Cascade Microtech, Inc. | Membrane probing system |
| US7161363 | 18. Mai 2004 | 9. Jan. 2007 | Cascade Microtech, Inc. | Probe for testing a device under test |
| US7178236 | 16. Apr. 2003 | 20. Febr. 2007 | Cascade Microtech, Inc. | Method for constructing a membrane probe using a depression |
| US7233160 | 19. Nov. 2001 | 19. Juni 2007 | Cascade Microtech, Inc. | Wafer probe |
| US7244125 | 8. Dez. 2003 | 17. Juli 2007 | Neoconix, Inc. | Connector for making electrical contact at semiconductor scales |
| US7244125 | 8. Dez. 2003 | 17. Juli 2007 | Neoconix, Inc. | Connector for making electrical contact at semiconductor scales |
| US7266889 | 14. Jan. 2005 | 11. Sept. 2007 | Cascade Microtech, Inc. | Membrane probing system |
| US7271603 | 28. März 2006 | 18. Sept. 2007 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7285969 | 5. März 2007 | 23. Okt. 2007 | Cascade Microtech, Inc. | Probe for combined signals |
| US7304488 | 1. Dez. 2006 | 4. Dez. 2007 | Cascade Microtech, Inc. | Shielded probe for high-frequency testing of a device under test |
| US7347698 | 16. Juli 2004 | 25. März 2008 | Neoconix, Inc. | Deep drawn electrical contacts and method for making |
| US7354276 | 17. Juli 2006 | 8. Apr. 2008 | Neoconix, Inc. | Interposer with compliant pins |
| US7355420 | 19. Aug. 2002 | 8. Apr. 2008 | Cascade Microtech, Inc. | Membrane probing system |
| US7357644 | 12. Dez. 2005 | 15. Apr. 2008 | Neoconix, Inc. | Connector having staggered contact architecture for enhanced working range |
| US7368927 | 5. Juli 2005 | 6. Mai 2008 | Cascade Microtech, Inc. | Probe head having a membrane suspended probe |
| US7371073 | 3. Jan. 2007 | 13. Mai 2008 | Neoconix, Inc. | Contact grid array system |
| US7383632 | 18. März 2005 | 10. Juni 2008 | Neoconix, Inc. | Method for fabricating a connector |
| US7400155 | 3. Febr. 2004 | 15. Juli 2008 | Cascade Microtech, Inc. | Membrane probing system |
| US7403025 | 23. Aug. 2006 | 22. Juli 2008 | Cascade Microtech, Inc. | Membrane probing system |
| US7403028 | 22. Febr. 2007 | 22. Juli 2008 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
| US7417446 | 22. Okt. 2007 | 26. Aug. 2008 | Cascade Microtech, Inc. | Probe for combined signals |
| US7420381 | 8. Sept. 2005 | 2. Sept. 2008 | Cascade Microtech, Inc. | Double sided probing structures |
| US7427868 | 21. Dez. 2004 | 23. Sept. 2008 | Cascade Microtech, Inc. | Active wafer probe |
| US7436194 | 24. Okt. 2007 | 14. Okt. 2008 | Cascade Microtech, Inc. | Shielded probe with low contact resistance for testing a device under test |
| US7443186 | 9. März 2007 | 28. Okt. 2008 | Cascade Microtech, Inc. | On-wafer test structures for differential signals |
| US7449899 | 24. Apr. 2006 | 11. Nov. 2008 | Cascade Microtech, Inc. | Probe for high frequency signals |
| US7453276 | 18. Sept. 2007 | 18. Nov. 2008 | Cascade Microtech, Inc. | Probe for combined signals |
| US7456646 | 18. Okt. 2007 | 25. Nov. 2008 | Cascade Microtech, Inc. | Wafer probe |
| US7482823 | 24. Okt. 2007 | 27. Jan. 2009 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7489149 | 24. Okt. 2007 | 10. Febr. 2009 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7492175 | 10. Jan. 2008 | 17. Febr. 2009 | Cascade Microtech, Inc. | Membrane probing system |
| US7495461 | 18. Okt. 2007 | 24. Febr. 2009 | Cascade Microtech, Inc. | Wafer probe |
| US7498829 | 19. Okt. 2007 | 3. März 2009 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7501842 | 19. Okt. 2007 | 10. März 2009 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7504842 | 11. Apr. 2007 | 17. März 2009 | Cascade Microtech, Inc. | Probe holder for testing of a test device |
| US7514944 | 10. März 2008 | 7. Apr. 2009 | Cascade Microtech, Inc. | Probe head having a membrane suspended probe |
| US7518387 | 27. Sept. 2007 | 14. Apr. 2009 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7533462 | 1. Dez. 2006 | 19. Mai 2009 | Cascade Microtech, Inc. | Method of constructing a membrane probe |
| US7535247 | 18. Jan. 2006 | 19. Mai 2009 | Cascade Microtech, Inc. | Interface for testing semiconductors |
| US7541821 | 29. Aug. 2007 | 2. Juni 2009 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
| US7587817 | 24. Juli 2006 | 15. Sept. 2009 | Neoconix, Inc. | Method of making electrical connector on a flexible carrier |
| US7597561 | 18. März 2005 | 6. Okt. 2009 | Neoconix, Inc. | Method and system for batch forming spring elements in three dimensions |
| US7609077 | 11. Juni 2007 | 27. Okt. 2009 | Cascade Microtech, Inc. | Differential signal probe with integral balun |
| US7619419 | 28. Apr. 2006 | 17. Nov. 2009 | Cascade Microtech, Inc. | Wideband active-passive differential signal probe |
| US7621756 | 29. Okt. 2007 | 24. Nov. 2009 | Neoconix, Inc. | Contact and method for making same |
| US7625220 | 21. Apr. 2006 | 1. Dez. 2009 | | System for connecting a camera module, or like device, using flat flex cables |
| US7628617 | 22. Sept. 2006 | 8. Dez. 2009 | Neoconix, Inc. | Structure and process for a contact grid array formed in a circuitized substrate |
| US7645147 | 5. Apr. 2006 | 12. Jan. 2010 | Neoconix, Inc. | Electrical connector having a flexible sheet and one or more conductive connectors |
| US7656172 | 18. Jan. 2006 | 2. Febr. 2010 | Cascade Microtech, Inc. | System for testing semiconductors |
| US7681312 | 31. Juli 2007 | 23. März 2010 | Cascade Microtech, Inc. | Membrane probing system |
| US7688097 | 26. Apr. 2007 | 30. März 2010 | Cascade Microtech, Inc. | Wafer probe |
| US7723999 | 22. Febr. 2007 | 25. Mai 2010 | Cascade Microtech, Inc. | Calibration structures for differential signal probing |
| US7737709 | 28. Aug. 2007 | 15. Juni 2010 | FormFactor, Inc. | Methods for planarizing a semiconductor contactor |
| US7750652 | 11. Juni 2008 | 6. Juli 2010 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
| US7758351 | 18. Apr. 2007 | 20. Juli 2010 | Neoconix, Inc. | Method and system for batch manufacturing of spring elements |
| US7759953 | 14. Aug. 2008 | 20. Juli 2010 | Cascade Microtech, Inc. | Active wafer probe |
| US7761983 | 18. Okt. 2007 | 27. Juli 2010 | Cascade Microtech, Inc. | Method of assembling a wafer probe |
| US7761986 | 10. Nov. 2003 | 27. Juli 2010 | Cascade Microtech, Inc. | Membrane probing method using improved contact |
| US7764072 | 22. Febr. 2007 | 27. Juli 2010 | Cascade Microtech, Inc. | Differential signal probing system |
| US7876114 | 7. Aug. 2008 | 25. Jan. 2011 | Cascade Microtech, Inc. | Differential waveguide probe |
| US7888957 | 6. Okt. 2008 | 15. Febr. 2011 | Cascade Microtech, Inc. | Probing apparatus with impedance optimized interface |
| US7891988 | 6. Nov. 2009 | 22. Febr. 2011 | Neoconix, Inc. | System and method for connecting flat flex cable with an integrated circuit, such as a camera module |
| US7893704 | 20. März 2009 | 22. Febr. 2011 | Cascade Microtech, Inc. | Membrane probing structure with laterally scrubbing contacts |
| US7898273 | 17. Febr. 2009 | 1. März 2011 | Cascade Microtech, Inc. | Probe for testing a device under test |
| US7898281 | 12. Dez. 2008 | 1. März 2011 | Cascade Mircotech, Inc. | Interface for testing semiconductors |
| US7940069 | 15. Dez. 2009 | 10. Mai 2011 | Cascade Microtech, Inc. | System for testing semiconductors |
| US7989945 | 14. Febr. 2007 | 2. Aug. 2011 | Neoconix, Inc. | Spring connector for making electrical contact at semiconductor scales |
| US8013623 | 3. Juli 2008 | 6. Sept. 2011 | Cascade Microtech, Inc. | Double sided probing structures |
