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Patente

Referenziert von

Zitiert von PatentEingetragenAusgestelltUrsprünglich Bevollmächtigter Titel
US549088230. Nov. 199213. Febr. 1996Massachusetts Institute of TechnologyProcess for removing loose powder particles from interior passages of a body
US566062129. Dez. 199526. Aug. 1997Massachusetts Institute of TechnologyBinder composition for use in three dimensional printing
US577540231. Okt. 19957. Juli 1998Massachusetts Institute of TechnologyEnhancement of thermal properties of tooling made by solid free form fabrication techniques
US581416112. Febr. 199629. Sept. 1998Massachusetts Institute of TechnologyCeramic mold finishing techniques for removing powder
US585146521. Aug. 199722. Dez. 1998Massachusetts Institute of TechnologyBinder composition for use in three dimensional printing
US603677714. Apr. 199514. März 2000Massachusetts Institute of TechnologyPowder dispensing apparatus using vibration
US610933228. Sept. 199829. Aug. 2000Massachusetts Institute of TechnologyCeramic mold finishing
US61128042. Juli 19985. Sept. 2000Massachusetts Institute of TechnologyTooling made by solid free form fabrication techniques having enhanced thermal properties
US62618537. Febr. 200017. Juli 2001Therma-Wave, Inc.Method and apparatus for preparing semiconductor wafers for measurement
US63543611. Sept. 200012. März 2002Massachusetts Institute of TechnologyTooling having advantageously located heat transfer channels
US662439317. Mai 200123. Sept. 2003Therma-Wave, Inc.Method and apparatus for preparing semiconductor wafers for measurement
US671430020. Apr. 199930. März 2004Therma-Wave, Inc.Optical inspection equipment for semiconductor wafers with precleaning
US686161923. Juli 20031. März 2005Therma-Wave, Inc.Method and apparatus for preparing semiconductor wafers for measurement
US68657624. Febr. 200215. März 2005Method for cleaning carpet and other surfaces
US693077119. Nov. 200316. Aug. 2005Therma-Wave, Inc.Optical inspection equipment for semiconductor wafers with precleaning
US706837013. Juni 200527. Juni 2006Therma-Wave, Inc.Optical inspection equipment for semiconductor wafers with precleaning