US4714826A - Apparatus and method for testing outputs of logic circuits by modulating optical sequals - Google Patents
Apparatus and method for testing outputs of logic circuits by modulating optical sequals Download PDFInfo
- Publication number
- US4714826A US4714826A US06/897,673 US89767386A US4714826A US 4714826 A US4714826 A US 4714826A US 89767386 A US89767386 A US 89767386A US 4714826 A US4714826 A US 4714826A
- Authority
- US
- United States
- Prior art keywords
- optical
- signals
- logic
- light
- modulators
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 91
- 238000012360 testing method Methods 0.000 title claims abstract description 81
- 238000000034 method Methods 0.000 title claims description 7
- 230000000295 complement effect Effects 0.000 claims abstract description 20
- 230000023077 detection of light stimulus Effects 0.000 claims abstract description 3
- 239000000835 fiber Substances 0.000 claims description 16
- 230000001419 dependent effect Effects 0.000 claims 1
- 239000013307 optical fiber Substances 0.000 claims 1
- 238000010998 test method Methods 0.000 claims 1
- 230000015572 biosynthetic process Effects 0.000 abstract 3
- 239000013598 vector Substances 0.000 description 9
- 238000010586 diagram Methods 0.000 description 7
- 238000001514 detection method Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 3
- 239000013078 crystal Substances 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000012956 testing procedure Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16557—Logic probes, i.e. circuits indicating logic state (high, low, O)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31935—Storing data, e.g. failure memory
Abstract
Description
Claims (23)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/897,673 US4714826A (en) | 1986-08-18 | 1986-08-18 | Apparatus and method for testing outputs of logic circuits by modulating optical sequals |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/897,673 US4714826A (en) | 1986-08-18 | 1986-08-18 | Apparatus and method for testing outputs of logic circuits by modulating optical sequals |
Publications (1)
Publication Number | Publication Date |
---|---|
US4714826A true US4714826A (en) | 1987-12-22 |
Family
ID=25408239
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US06/897,673 Expired - Fee Related US4714826A (en) | 1986-08-18 | 1986-08-18 | Apparatus and method for testing outputs of logic circuits by modulating optical sequals |
Country Status (1)
Country | Link |
---|---|
US (1) | US4714826A (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5034334A (en) * | 1989-10-13 | 1991-07-23 | At&T Bell Laboratories | Method of producing a semiconductor laser adapted for use in an analog optical communications system |
US5216359A (en) * | 1991-01-18 | 1993-06-01 | University Of North Carolina | Electro-optical method and apparatus for testing integrated circuits |
US6512385B1 (en) | 1999-07-26 | 2003-01-28 | Paul Pfaff | Method for testing a device under test including the interference of two beams |
US20050231733A1 (en) * | 2002-05-03 | 2005-10-20 | Paul Pfaff | Non-destructive testing system |
US20060244974A1 (en) * | 2001-12-06 | 2006-11-02 | Attofemto, Inc. | Non-destructive testing system |
US7733499B2 (en) | 2001-12-06 | 2010-06-08 | Attofemto, Inc. | Method for optically testing semiconductor devices |
US8462350B2 (en) | 2001-12-06 | 2013-06-11 | Attofemto, Inc. | Optically enhanced holographic interferometric testing methods for the development and evaluation of semiconductor devices, materials, wafers, and for monitoring all phases of development and manufacture |
US9952161B2 (en) | 2001-12-06 | 2018-04-24 | Attofemto, Inc. | Methods for obtaining and analyzing digital interferometric data for computer testing and developing semiconductor and anisotropic devices and materials |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3944921A (en) * | 1970-12-11 | 1976-03-16 | Canon Kabushiki Kaisha | Logic level test probe with grated oscillator |
US4218142A (en) * | 1978-03-08 | 1980-08-19 | Aerodyne Research, Inc. | Mask analysis |
US4242635A (en) * | 1979-01-26 | 1980-12-30 | The United States Of America As Represented By The Secretary Of The Air Force | Apparatus and method for integrated circuit test analysis |
US4408884A (en) * | 1981-06-29 | 1983-10-11 | Rca Corporation | Optical measurements of fine line parameters in integrated circuit processes |
US4523143A (en) * | 1982-06-18 | 1985-06-11 | Fairchild Camera And Instrument Corporation | Digital logic level comparator particularly for digital test systems |
US4625815A (en) * | 1983-06-22 | 1986-12-02 | Klaus Spies | Drilling equipment, especially for use in underground mining |
-
1986
- 1986-08-18 US US06/897,673 patent/US4714826A/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3944921A (en) * | 1970-12-11 | 1976-03-16 | Canon Kabushiki Kaisha | Logic level test probe with grated oscillator |
US4218142A (en) * | 1978-03-08 | 1980-08-19 | Aerodyne Research, Inc. | Mask analysis |
US4242635A (en) * | 1979-01-26 | 1980-12-30 | The United States Of America As Represented By The Secretary Of The Air Force | Apparatus and method for integrated circuit test analysis |
US4408884A (en) * | 1981-06-29 | 1983-10-11 | Rca Corporation | Optical measurements of fine line parameters in integrated circuit processes |
US4523143A (en) * | 1982-06-18 | 1985-06-11 | Fairchild Camera And Instrument Corporation | Digital logic level comparator particularly for digital test systems |
US4625815A (en) * | 1983-06-22 | 1986-12-02 | Klaus Spies | Drilling equipment, especially for use in underground mining |
Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5034334A (en) * | 1989-10-13 | 1991-07-23 | At&T Bell Laboratories | Method of producing a semiconductor laser adapted for use in an analog optical communications system |
US5216359A (en) * | 1991-01-18 | 1993-06-01 | University Of North Carolina | Electro-optical method and apparatus for testing integrated circuits |
US8040521B2 (en) | 1999-07-26 | 2011-10-18 | Attofemto, Inc. | Holographic condition assessment system for a structure including a semiconductor material |
US6512385B1 (en) | 1999-07-26 | 2003-01-28 | Paul Pfaff | Method for testing a device under test including the interference of two beams |
US20050156609A1 (en) * | 1999-07-26 | 2005-07-21 | Paul Pfaff | Voltage testing and measurement |
US9366719B2 (en) | 1999-07-26 | 2016-06-14 | Attofemto, Inc. | Optical to optical methods enhancing the sensitivity and resolution of ultraviolet, electron beam and ion beam devices |
US8736823B2 (en) | 1999-07-26 | 2014-05-27 | Attofemto, Inc. | Methods and processes for optical interferometric or holographic test in the development, evaluation, and manufacture of semiconductor and free-metal devices utilizing anisotropic and isotropic materials |
US7323889B2 (en) | 1999-07-26 | 2008-01-29 | Attofemto, Inc. | Voltage testing and measurement |
US8139228B2 (en) | 2001-12-06 | 2012-03-20 | Attofemto, Inc. | Methods for optically enhanced holographic interferometric testing for test and evaluation of semiconductor devices and materials |
US7733499B2 (en) | 2001-12-06 | 2010-06-08 | Attofemto, Inc. | Method for optically testing semiconductor devices |
US20110122415A1 (en) * | 2001-12-06 | 2011-05-26 | Attofemto, Inc. | Method for optically enhanced holograhic interferometric testing for test and evaluation of semiconductor devices and materials |
US7400411B2 (en) | 2001-12-06 | 2008-07-15 | Attofemto, Inc. | Method for optically testing semiconductor devices |
US8462350B2 (en) | 2001-12-06 | 2013-06-11 | Attofemto, Inc. | Optically enhanced holographic interferometric testing methods for the development and evaluation of semiconductor devices, materials, wafers, and for monitoring all phases of development and manufacture |
US20060244974A1 (en) * | 2001-12-06 | 2006-11-02 | Attofemto, Inc. | Non-destructive testing system |
US8879071B2 (en) | 2001-12-06 | 2014-11-04 | Attofemto, Inc. | Multiple optical wavelength interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor devices and materials, wafers, and monitoring all phases of development and manufacture |
US9250064B2 (en) | 2001-12-06 | 2016-02-02 | Attofemto, Inc. | Multiple beam transmission interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor and anisotropic devices |
US9952161B2 (en) | 2001-12-06 | 2018-04-24 | Attofemto, Inc. | Methods for obtaining and analyzing digital interferometric data for computer testing and developing semiconductor and anisotropic devices and materials |
US7206078B2 (en) | 2002-05-03 | 2007-04-17 | Attofemto, Inc. | Non-destructive testing system using a laser beam |
US20050231733A1 (en) * | 2002-05-03 | 2005-10-20 | Paul Pfaff | Non-destructive testing system |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: WESTINGHOUSE ELECTRIC CORPORATION, WESTINGHOUSE BL Free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNOR:GOUTZOULIS, ANASTASIOS P.;REEL/FRAME:004601/0202 Effective date: 19860815 Owner name: WESTINGHOUSE ELECTRIC CORPORATION, A CORP PA, PENN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:GOUTZOULIS, ANASTASIOS P.;REEL/FRAME:004601/0202 Effective date: 19860815 |
|
FPAY | Fee payment |
Year of fee payment: 4 |
|
FPAY | Fee payment |
Year of fee payment: 8 |
|
AS | Assignment |
Owner name: NORTHROP GRUMMAN CORPORATION, CALIFORNIA Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:WESTINGHOUSE ELECTRIC CORPORATION;REEL/FRAME:008104/0190 Effective date: 19960301 |
|
FEPP | Fee payment procedure |
Free format text: PAYER NUMBER DE-ASSIGNED (ORIGINAL EVENT CODE: RMPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
REMI | Maintenance fee reminder mailed | ||
LAPS | Lapse for failure to pay maintenance fees | ||
FP | Lapsed due to failure to pay maintenance fee |
Effective date: 19991222 |
|
STCH | Information on status: patent discontinuation |
Free format text: PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362 |