US8122185B2 - Systems and methods for measuring the useful life of solid-state storage devices - Google Patents
Systems and methods for measuring the useful life of solid-state storage devices Download PDFInfo
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- US8122185B2 US8122185B2 US12/688,815 US68881510A US8122185B2 US 8122185 B2 US8122185 B2 US 8122185B2 US 68881510 A US68881510 A US 68881510A US 8122185 B2 US8122185 B2 US 8122185B2
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/349—Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/02—Addressing or allocation; Relocation
- G06F12/0223—User address space allocation, e.g. contiguous or non contiguous base addressing
- G06F12/023—Free address space management
- G06F12/0238—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
- G06F12/0246—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/349—Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles
- G11C16/3495—Circuits or methods to detect or delay wearout of nonvolatile EPROM or EEPROM memory devices, e.g. by counting numbers of erase or reprogram cycles, by using multiple memory areas serially or cyclically
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2212/00—Indexing scheme relating to accessing, addressing or allocation within memory systems or architectures
- G06F2212/10—Providing a specific technical effect
- G06F2212/1032—Reliability improvement, data loss prevention, degraded operation etc
- G06F2212/1036—Life time enhancement
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2212/00—Indexing scheme relating to accessing, addressing or allocation within memory systems or architectures
- G06F2212/72—Details relating to flash memory management
- G06F2212/7211—Wear leveling
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
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Claims (17)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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US12/688,815 US8122185B2 (en) | 2006-05-08 | 2010-01-15 | Systems and methods for measuring the useful life of solid-state storage devices |
US13/399,907 US8312207B2 (en) | 2006-05-08 | 2012-02-17 | Systems and methods for measuring the useful life of solid-state storage devices |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/429,936 US7653778B2 (en) | 2006-05-08 | 2006-05-08 | Systems and methods for measuring the useful life of solid-state storage devices |
US12/688,815 US8122185B2 (en) | 2006-05-08 | 2010-01-15 | Systems and methods for measuring the useful life of solid-state storage devices |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
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US11/429,936 Continuation US7653778B2 (en) | 2006-05-08 | 2006-05-08 | Systems and methods for measuring the useful life of solid-state storage devices |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
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US13/399,907 Continuation US8312207B2 (en) | 2006-05-08 | 2012-02-17 | Systems and methods for measuring the useful life of solid-state storage devices |
Publications (2)
Publication Number | Publication Date |
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US20100122200A1 US20100122200A1 (en) | 2010-05-13 |
US8122185B2 true US8122185B2 (en) | 2012-02-21 |
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Application Number | Title | Priority Date | Filing Date |
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US11/429,936 Active 2027-10-28 US7653778B2 (en) | 2006-05-08 | 2006-05-08 | Systems and methods for measuring the useful life of solid-state storage devices |
US12/688,815 Active 2026-06-12 US8122185B2 (en) | 2006-05-08 | 2010-01-15 | Systems and methods for measuring the useful life of solid-state storage devices |
US13/399,907 Active US8312207B2 (en) | 2006-05-08 | 2012-02-17 | Systems and methods for measuring the useful life of solid-state storage devices |
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US11/429,936 Active 2027-10-28 US7653778B2 (en) | 2006-05-08 | 2006-05-08 | Systems and methods for measuring the useful life of solid-state storage devices |
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US13/399,907 Active US8312207B2 (en) | 2006-05-08 | 2012-02-17 | Systems and methods for measuring the useful life of solid-state storage devices |
Country Status (3)
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US (3) | US7653778B2 (en) |
EP (1) | EP2021852B1 (en) |
WO (1) | WO2007134065A2 (en) |
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WO2007134065A2 (en) | 2007-11-22 |
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