US9217772B2 - Systems and methods for characterizing devices - Google Patents
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- US9217772B2 US9217772B2 US13/562,485 US201213562485A US9217772B2 US 9217772 B2 US9217772 B2 US 9217772B2 US 201213562485 A US201213562485 A US 201213562485A US 9217772 B2 US9217772 B2 US 9217772B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318314—Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
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- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
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- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
- Y02T10/00—Road transport of goods or passengers
- Y02T10/80—Technologies aiming to reduce greenhouse gasses emissions common to all road transportation technologies
- Y02T10/82—Elements for improving aerodynamics
Definitions
- testing circuits can be time consuming and costly.
- the benefits obtained by testing can be outweighed by the costs of performing the testing.
- FIG. 1 is a block diagram illustrating an automatic test characterization system.
- FIG. 2 is a block diagram illustrating a test flow generator system in accordance with an embodiment of the invention.
- FIG. 4 is a block diagram illustrating a test data arrangement for a product device in accordance with an embodiment.
- FIG. 5 is a block diagram illustrating a data processing system in accordance with an embodiment.
- FIG. 6 is a flow diagram illustrating a method of performing characterization testing on a product device in accordance with an embodiment.
- the present invention includes embodiments that provide automatic characterization of integrated circuits.
- the embodiments include, for example, systems and methods for generating test flows and automatically testing integrated circuits and devices.
- Circuits can encounter a variety of operating conditions during their lifetime.
- the operating conditions or characteristics can include voltage inputs, power inputs, voltage values, DC levels, AC values, frequencies, temperature and the like. It can be difficult to design devices for all possible scenarios.
- FIG. 1 is a block diagram illustrating an automatic characterization test system 100 in accordance with an embodiment.
- the system 100 automatically tests and processes test data for an integrated circuit without requiring interactive input throughout the testing.
- the system 100 includes a test development flow generator 102 , a characterization tool 104 , a product device 106 , and a data processing component 108 .
- the product device 106 is an integrated circuit that has been fabricated according to specifications including design specifications and/or operating condition specifications. The specifications can include input signals, temperature conditions, power inputs, power variations, and the like. In one example, the product device 106 is an integrated circuit for automotive applications.
- the characterization tool 104 is configured to selectively perform a variety of tests on integrated circuits.
- the characterization tool 104 is configured to selective perform tests on the product device 106 .
- the characterization tool 104 is configured to supply a variety of input signals and power signals, including but not limited to, Vdd, ground, bias voltages, varied frequencies, and the like.
- the characterization tool 104 is also configured to subject the product device 106 to a variety of conditions, such as temperatures, pressures, humidity levels, and the like.
- the characterization tool 104 is configured to obtain test data by measuring nodes and/or connections on the product device 106 .
- the measurements can include output signals, output power levels, temperatures, and the like.
- the test data can also include the applied input signals.
- the characterization tool 104 includes probes and/or interconnects to provide the signals and obtain the measurements. These can include, for example, a socket to place an integrated circuit on.
- the characterization tool 104 is controlled to perform the tests on the product device 106 .
- the characterization tool 104 operates in response to a test flow, which specifies tests to perform and includes input values, power levels, timings, frequency values, and items to measure.
- the data processing component 108 analyzes the test data and can automatically generate reports.
- the data processing component 108 can provide the test data in raw form for further analysis. Additionally, the data processing component 108 can generate graphs or plots, compare different test instances with each other, identify faults, and the like.
- the test development flow generator 102 develops the test flow utilized by the characterization tool 104 .
- the test development flow generator 102 receives several inputs including the specifications for the device 106 , specific tests to perform (referred to as test instances), setups, and categories of testing. Based on the inputs, the test development flow generator 102 generates the test flow, which can encompass a wide variety and large number of test instances. This enables the wide variety and large number of test instances to be performed automatically without reconfiguring the characterization tool 104 in between. Further, user interaction is not required between tests.
- FIG. 2 is a block diagram illustrating a test flow generator system 200 in accordance with an embodiment of the invention.
- the system 200 generates a test flow that can be utilized by a characterization tool, such as described with regard to FIG. 1 .
- the system 200 includes a test flow generator 202 , a user interface 212 and inputs or parameters including specifications 204 , test instances 206 , setups 208 and categories 210 .
- the user interface 212 is configured to interactively obtain parameters for generating a test flow.
- the parameters include the specifications 204 , the test instances 206 , the setups 208 and the categories 210 .
- the user interface 212 can include lists and permit selection of one or more items in the lists in order to obtain the parameters.
- the specifications 204 include specification values, also referred to as parameters or parameter values, that can be varied.
- the values can include minimum, maximum values and step values.
- the step values specify or determine the number of values to be tested for a range of values.
- the values can specify DC or AC. Specification values can be removed if not needed. Variations in values can be specified as linear or non-linear and provided with a formula.
- the specifications conform to ratings provided in a specification data sheet for a product device to be tested.
- the specifications exceed ratings provided in the specification data sheet for the product to be tested. This can be done to identify areas where the product device exceeds the specification data sheet.
- the test instances 206 include a list of test instances available for the product device according to the specifications 204 .
- the user interface 212 generates or provides a list of available test instances according to the specifications 204 .
- the test instances 206 can include, for example, increasing a supply voltage Vdd from a minimum value to a maximum value according to a step value.
- the test instances 206 include increasing an input frequency from a minimum value to a maximum value according to a step value.
- the setups 208 include a list of selected test instances to be performed on the product device.
- the setups 208 include a list of available setups according to the specifications 204 and the test instances 206 .
- the available setups can include, for example,
- the setups 208 and the specifications 204 are provided to the test flow generator 202 as parameters for characterization.
- the parameters are utilized by the test flow generator 202 to generate the test flow.
- FIG. 3A is a block diagram illustrating a first portion 300 of a user interface in accordance with an embodiment.
- the user interface facilitates obtaining parameters that can be utilized to generate a test flow for testing a product device with a characterization tool.
- the user interface is provided as an example to facilitate understanding of the invention and this disclosure and can be utilized for component 212 of FIG. 2 .
- the first portion 300 includes a parameter select input 302 , a max value input 304 , a min value input 306 , steps 308 , and a generated list of parameter values 310 .
- the parameter select input 302 permits a user to select a parameter for testing.
- the select input 302 is utilized to select a particular supply voltage (VDD33) for testing.
- the input 302 may display a list of available parameters. Additionally, the input 302 may also permit entering parameters.
- the max value input 304 permits specifying a maximum value for the selected parameter. In one example, the max value is set at 1.7 volts.
- the min value input 306 permits specifying a minimum value for the selected parameter. In one example, the min value is set at 0.9 volts.
- the steps input 308 permits specifying a number of steps between the max value and the min value. In one example, the steps are set to 10.
- the specified steps are utilized to generate the list of parameter values 310 . In one example, the generated list includes 0.9, 0.98, 1.06, 1.14, . . . 1.7. The generated list specifies values that will be tested by the characterization tool.
- the first portion 300 also includes a test instance select input 312 , a max value input 314 , a min value input 316 , steps 318 , and a generated list of test instances 320 .
- the select input 312 permits a user to select a test instance for testing.
- the input 312 is utilized to select a particular test instance for testing.
- the input 312 may display a list of available instances. Additionally, the input 312 may also permit entering parameters.
- the OK element 330 is activated to close the user interface, but saves any changes, for example, to the specifications 204 , test instances 206 , setups 208 and categories 210 , collectively the parameters for the test flow. Then, if this particular test flow is opened again, the previous settings are maintained.
- the cancel element 332 exits the user interface without saving any changes. Thus, if a user made selections and didn't like them, the user could activate the cancel element 332 to effectively erase them.
- the apply element 334 is similar to the OK element 330 , in that the apply element 334 saves changes when activated, however the apply element 334 keeps the user interface open.
- the arrangement 400 is the output generated by a characterization tool performing tests in accordance with a test flow generated as described above.
- the test flow includes the selected test instances and parameters involved to test specifications for a product device.
- the arrangement 400 is specific to the product device.
- the arrangement includes test values for three test instances, VDD13 vs VDD33 (2D), VDD13 vs tp (2D), and tp (1D)).
- FIG. 5 is a block diagram illustrating a data processing system 500 in accordance with an embodiment.
- the system 500 processes and analyzes test data to facilitate analysis.
- the system 500 includes a test data arrangement 400 , a data processing component 508 , and analysis reports 504 for a product device.
- the arrangement 400 is the output generated by a characterization tool performing tests in accordance with a test flow generated.
- the test flow includes the selected test instances and parameters involved to test specifications for the product device.
- the arrangement 400 includes a plurality of test instance data 402 .
- Each includes test values particular to a selected test instance.
- the test values can include, for example, file name, a plot (shmoo plot), setup (shmoo setup), test name, pattern name, data, user, job name, test mode, temperature, horizontal axis specs, vertical axis specs, site number, device number, and/or the like.
- the data processing component 508 can be utilized in system 100 for the data processing component 108 , described above.
- the data processing component 508 analyzes the test data and automatically generates analysis reports 504 .
- the data processing component 508 can also provide the test data in raw form with the reports for further analysis. Additionally, the data processing component 508 can generate graphs or plots, compare different test instances with each other, identify faults, and the like.
- the data processing component 508 includes a data cruncher in one example.
- the data cruncher also referred to as a robustness data cruncher, facilitates viewing of test data.
- the data cruncher can be utilized to compare data from varied test instances and/or test data from multiple product devices.
- the analysis reports component 504 include one or more individual reports 502 .
- the individual reports 502 include tests data and/or analysis for one or more test instances. Thus, the individual reports 502 can compare and contrast data from multiple test instances.
- the individual reports 502 can include raw data, graphs, plots, and the like.
- the individual reports 502 can also include pass/fail information by comparing test data with specifications for the product device.
- the individual reports 502 can be generated automatically or in response to a user action, such as activation of a butt on a user interface.
- the type and content of the individual reports 502 can be selected to include or exclude information and/or analysis.
- the individual reports 502 are selected to provide only raw data.
- the individual reports 502 have additional content selected to provide graphs, pass/fail information, analysis, and the like.
- the analysis reports component 504 also includes a summary 506 .
- the summary 506 includes qualitative and/or quantitative information about the product device.
- the summary 506 can include graphs or plots and conveys an overall picture of the testing performed according to the test flow.
- the summary 506 can include information on whether the device meets or exceeds requires specifications for the product device. Additionally, the summary 506 can identify areas or aspects of the device that require modification in order to meet the specifications for the product device.
- the summary 506 can be provided to a user via a suitable mechanism.
- the summary 506 can be printed, displayed on a screen, saved to a file, and the like.
- the summary 506 is saved in HTML format.
- the summary 506 is stored in XML formal.
- a summary 506 includes test instances performed, plots analyzed, plots failing, plots or items with insufficient margin, plots with sufficient margin, duration of test, margin percentage or margin amount, values tested or input, ranges, and date of testing.
- the margin is a percentage or amount of margin required from threshold or limit values.
- FIG. 6 is a flow diagram illustrating a method 600 of performing characterization testing on a product device in accordance with an embodiment.
- the method 600 can be utilized to identify characteristics of the product device, such as failure to comply with device or operational specifications.
- the method 600 begins at block 602 , wherein specifications for a product device are obtained.
- the specifications include designs and/or design specifications for which the product device was designed or fabricated.
- the specifications can include, for example, input signals, temperature conditions, power inputs, power variations, and the like.
- the product device is typically an integrated circuit. In one example, the integrated circuit is for automotive applications and is required by its specifications to operate in a relatively wide variety of temperature conditions, power inputs, power variations, and the like.
- a list of test instances for a characterization tool is obtained at block 604 .
- the list of test instances includes tests, such as power, frequency, and temperature tests, that the characterization tool is capable of performing. In one example, the list is limited to only those tests applicable to the product device. In one example, one of the test instances is an output as a variation of frequency and a supply voltage.
- the selected test instances can be obtained in a variety of suitable ways.
- Selectable setups according to devices can be available to guide the selections. For example, one or more setups particular to automotive integrated circuits can identify or pre-select a portion of the available test instances.
- Test ranges or values are assigned to the test instances according to the specifications at block 608 .
- the test ranges can include max values, min values, and step values for variable parameters and test conditions.
- the test ranges are typically set according to the specifications so as to determine whether the product device meets or exceeds the specifications.
- a test flow is generated at block 610 according to the assigned test ranges and the selected test instances.
- the test flow is generated by combining the test instances in a suitable order, including repeating selected test instances with varied test ranges.
- test data can be analyzed and/or aggregated to generate reports and the like regarding the characterization.
- the test data is compared with the specifications to determine whether the product device meets the specifications.
- the system includes a specifications component, a test instances component, a test setups component, and a categories component.
- the specifications component is configured to have a list of parameter values that can be varied.
- the test instances component is configured to have a list of test instances available for a product device.
- the test setups component is configured to have a list of available setups according to the list of test instances and the specifications values.
- the categories component is configured to have a list of selectable categories derived from the setups and the test instances.
- the user interface is configured to generate selected test instances from the list of available test instances and selected parameters.
- the test flow generator s configured to provide a test flow according to the selected test instances and the selected parameters.
- Yet another embodiment includes a method of characterizing a device, such as an integrated circuit.
- Specifications are obtained for a product device.
- the specifications can include design specifications and/or operating requirement specifications.
- a list of available test instances are obtained for a characterization tool.
- Test instances are selected from the list of available test instances according to the specifications for the product device.
- Test ranges are assigned for the test instances according to the specifications.
- a test flow is generated according to the assigned test ranges and the selected test instances.
- the product device is characterized by the characterization tool according to the generated test flow.
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