USD281234S - Circuit board testing equipment - Google Patents
Circuit board testing equipment Download PDFInfo
- Publication number
- USD281234S USD281234S US06/340,795 US34079582F USD281234S US D281234 S USD281234 S US D281234S US 34079582 F US34079582 F US 34079582F US D281234 S USD281234 S US D281234S
- Authority
- US
- United States
- Prior art keywords
- circuit board
- testing equipment
- board testing
- view
- equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a front elevational view of a circuit board testing equipment showing our new design;
FIG. 2 is a rear elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a right side elevational view thereof, the left side being a mirror image thereof;
FIG. 6 is an enlarged fragmentary view of the grill disclosed in FIG. 1.
Claims (1)
- The ornamental design for an circuit board testing equipment, substantially as shown and described.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE5333 | 1981-07-20 | ||
| DE5333 | 1981-07-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD281234S true USD281234S (en) | 1985-11-05 |
Family
ID=70001130
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US06/340,795 Expired - Lifetime USD281234S (en) | 1981-07-20 | 1982-01-19 | Circuit board testing equipment |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD281234S (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD794034S1 (en) * | 2009-01-07 | 2017-08-08 | Samsung Electronics Co., Ltd. | Memory device |
| USD794641S1 (en) * | 2009-01-07 | 2017-08-15 | Samsung Electronics Co., Ltd. | Memory device |
| USD794643S1 (en) * | 2009-01-07 | 2017-08-15 | Samsung Electronics Co., Ltd. | Memory device |
| USD794644S1 (en) * | 2009-01-07 | 2017-08-15 | Samsung Electronics Co., Ltd. | Memory device |
| USD794642S1 (en) * | 2009-01-07 | 2017-08-15 | Samsung Electronics Co., Ltd. | Memory device |
| USD795262S1 (en) * | 2009-01-07 | 2017-08-22 | Samsung Electronics Co., Ltd. | Memory device |
| USD795261S1 (en) * | 2009-01-07 | 2017-08-22 | Samsung Electronics Co., Ltd. | Memory device |
-
1982
- 1982-01-19 US US06/340,795 patent/USD281234S/en not_active Expired - Lifetime
Non-Patent Citations (1)
| Title |
|---|
| Telephony-1/30/78-p. 19-Electrical Test Equip. at top. |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD794034S1 (en) * | 2009-01-07 | 2017-08-08 | Samsung Electronics Co., Ltd. | Memory device |
| USD794641S1 (en) * | 2009-01-07 | 2017-08-15 | Samsung Electronics Co., Ltd. | Memory device |
| USD794643S1 (en) * | 2009-01-07 | 2017-08-15 | Samsung Electronics Co., Ltd. | Memory device |
| USD794644S1 (en) * | 2009-01-07 | 2017-08-15 | Samsung Electronics Co., Ltd. | Memory device |
| USD794642S1 (en) * | 2009-01-07 | 2017-08-15 | Samsung Electronics Co., Ltd. | Memory device |
| USD795262S1 (en) * | 2009-01-07 | 2017-08-22 | Samsung Electronics Co., Ltd. | Memory device |
| USD795261S1 (en) * | 2009-01-07 | 2017-08-22 | Samsung Electronics Co., Ltd. | Memory device |
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