USD507198S1 - Straight protruding probe beam contour surfaces - Google Patents

Straight protruding probe beam contour surfaces Download PDF

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Publication number
USD507198S1
USD507198S1 US29/190,399 US19039903F USD507198S US D507198 S1 USD507198 S1 US D507198S1 US 19039903 F US19039903 F US 19039903F US D507198 S USD507198 S US D507198S
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US
United States
Prior art keywords
probe beam
contour surfaces
straight protruding
protruding probe
beam contour
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/190,399
Inventor
January Kister
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SV Probe Pte Ltd
Original Assignee
K&S Interconnect Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by K&S Interconnect Inc filed Critical K&S Interconnect Inc
Priority to US29/190,399 priority Critical patent/USD507198S1/en
Application granted granted Critical
Publication of USD507198S1 publication Critical patent/USD507198S1/en
Assigned to SV PROBE PTE LTD. reassignment SV PROBE PTE LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: K&S INTERCONNECT, INC., KULICKE AND SOFFA INDUSTRIES, INC.
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/0675—Needle-like

Description

FIG. 1 is a perspective view of an exemplary environmental structure of a probe beam having straight protruding probe beam contour surfaces.
FIG. 2 is a plan view of an exemplary environmental structure of a probe beam in protruding direction of the straight protruding probe beam contour surfaces. Section lines indicate the position of the corresponding cross sections of FIGS. 8, 9, 10 with respect to the exemplary environmental structure of a probe beam. The section line arrows on both ends of each section line indicate the view direction of the corresponding cross section views.
FIG. 3 is a plan view of an exemplary environmental structure of a probe beam in protruding direction of the straight protruding probe beam contour surfaces without section lines.
FIG. 4 is a top view in direction from above with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.
FIG. 5 is a side view in direction from right with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.
FIG. 6 is a bottom view in direction from below with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.
FIG. 7 is a side view in direction from left with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.
FIG. 8 is an enlarged cross section view indicated in FIG. 2 by section line 8—8. The cross hatching indicates the contour with respect to the section line 8—8. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.
FIG. 9 is an enlarged cross section view indicated in FIG. 2 by section line 9—9. The cross hatching indicates the contour with respect to the section line 9—9. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam; and,
FIG. 10 is an enlarged cross section view indicated in FIG. 2 by section line 10—10. The cross hatching indicates the contour with respect to the section line 10—10. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.
The broken lines shown in FIGS. 1-10 are for illustrative purposes only and form no part of the claimed design.

Claims (1)

  1. The ornamental design for straight protruding probe beam contour surfaces, as shown and described.
US29/190,399 2003-06-11 2003-09-19 Straight protruding probe beam contour surfaces Expired - Lifetime USD507198S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/190,399 USD507198S1 (en) 2003-06-11 2003-09-19 Straight protruding probe beam contour surfaces

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US29/183,540 USD510043S1 (en) 2003-06-11 2003-06-11 Continuously profiled probe beam
US29/190,399 USD507198S1 (en) 2003-06-11 2003-09-19 Straight protruding probe beam contour surfaces

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
US29/183,540 Continuation USD510043S1 (en) 2003-06-11 2003-06-11 Continuously profiled probe beam

Publications (1)

Publication Number Publication Date
USD507198S1 true USD507198S1 (en) 2005-07-12

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Application Number Title Priority Date Filing Date
US29/183,540 Expired - Lifetime USD510043S1 (en) 2003-06-11 2003-06-11 Continuously profiled probe beam
US29/190,399 Expired - Lifetime USD507198S1 (en) 2003-06-11 2003-09-19 Straight protruding probe beam contour surfaces

Family Applications Before (1)

Application Number Title Priority Date Filing Date
US29/183,540 Expired - Lifetime USD510043S1 (en) 2003-06-11 2003-06-11 Continuously profiled probe beam

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Country Link
US (2) USD510043S1 (en)

Cited By (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070152686A1 (en) * 2004-05-21 2007-07-05 January Kister Knee probe having increased scrub motion
US20080001612A1 (en) * 2004-05-21 2008-01-03 January Kister Probes with self-cleaning blunt skates for contacting conductive pads
US20080068035A1 (en) * 2006-09-14 2008-03-20 Microprobe, Inc. Knee probe having reduced thickness section for control of scrub motion
EP1923708A1 (en) * 2005-09-09 2008-05-21 NHK Spring Company Limited Conductive contact and method for manufacturing conductive contact
US20090096474A1 (en) * 2003-11-14 2009-04-16 Rogers Robert L Die design with integrated assembly aid
US20090102495A1 (en) * 2007-10-19 2009-04-23 January Kister Vertical guided probe array providing sideways scrub motion
US20090280676A1 (en) * 2008-05-09 2009-11-12 Feinmetall Gmbh Electrical contact element for contacting an electrical test sample and contacting apparatus
US7786740B2 (en) 2006-10-11 2010-08-31 Astria Semiconductor Holdings, Inc. Probe cards employing probes having retaining portions for potting in a potting region
US7944224B2 (en) 2005-12-07 2011-05-17 Microprobe, Inc. Low profile probe having improved mechanical scrub and reduced contact inductance
US7952377B2 (en) 2007-04-10 2011-05-31 Microprobe, Inc. Vertical probe array arranged to provide space transformation
USRE43503E1 (en) 2006-06-29 2012-07-10 Microprobe, Inc. Probe skates for electrical testing of convex pad topologies
US8230593B2 (en) 2008-05-29 2012-07-31 Microprobe, Inc. Probe bonding method having improved control of bonding material
USRE44407E1 (en) 2006-03-20 2013-08-06 Formfactor, Inc. Space transformers employing wire bonds for interconnections with fine pitch contacts
US8723546B2 (en) 2007-10-19 2014-05-13 Microprobe, Inc. Vertical guided layered probe
US8907689B2 (en) 2006-10-11 2014-12-09 Microprobe, Inc. Probe retention arrangement
US8988091B2 (en) 2004-05-21 2015-03-24 Microprobe, Inc. Multiple contact probes
US9097740B2 (en) 2004-05-21 2015-08-04 Formfactor, Inc. Layered probes with core
US9476911B2 (en) 2004-05-21 2016-10-25 Microprobe, Inc. Probes with high current carrying capability and laser machining methods
USD894025S1 (en) * 2018-05-16 2020-08-25 Nidec-Read Corporation Electric characteristic measuring probe
US11761982B1 (en) 2019-12-31 2023-09-19 Microfabrica Inc. Probes with planar unbiased spring elements for electronic component contact and methods for making such probes
US11768227B1 (en) 2019-02-22 2023-09-26 Microfabrica Inc. Multi-layer probes having longitudinal axes and preferential probe bending axes that lie in planes that are nominally parallel to planes of probe layers
US11774467B1 (en) 2020-09-01 2023-10-03 Microfabrica Inc. Method of in situ modulation of structural material properties and/or template shape
US11802891B1 (en) 2019-12-31 2023-10-31 Microfabrica Inc. Compliant pin probes with multiple spring segments and compression spring deflection stabilization structures, methods for making, and methods for using
US11973301B2 (en) 2022-02-24 2024-04-30 Microfabrica Inc. Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making

Cited By (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090096474A1 (en) * 2003-11-14 2009-04-16 Rogers Robert L Die design with integrated assembly aid
US7649372B2 (en) 2003-11-14 2010-01-19 Wentworth Laboratories, Inc. Die design with integrated assembly aid
US9316670B2 (en) 2004-05-21 2016-04-19 Formfactor, Inc. Multiple contact probes
US7759949B2 (en) 2004-05-21 2010-07-20 Microprobe, Inc. Probes with self-cleaning blunt skates for contacting conductive pads
US8111080B2 (en) 2004-05-21 2012-02-07 Microprobe, Inc. Knee probe having reduced thickness section for control of scrub motion
US9476911B2 (en) 2004-05-21 2016-10-25 Microprobe, Inc. Probes with high current carrying capability and laser machining methods
US20070152686A1 (en) * 2004-05-21 2007-07-05 January Kister Knee probe having increased scrub motion
US20080001612A1 (en) * 2004-05-21 2008-01-03 January Kister Probes with self-cleaning blunt skates for contacting conductive pads
US9097740B2 (en) 2004-05-21 2015-08-04 Formfactor, Inc. Layered probes with core
US7733101B2 (en) 2004-05-21 2010-06-08 Microprobe, Inc. Knee probe having increased scrub motion
US8988091B2 (en) 2004-05-21 2015-03-24 Microprobe, Inc. Multiple contact probes
US8203353B2 (en) 2004-07-09 2012-06-19 Microprobe, Inc. Probes with offset arm and suspension structure
EP1923708A1 (en) * 2005-09-09 2008-05-21 NHK Spring Company Limited Conductive contact and method for manufacturing conductive contact
EP1923708A4 (en) * 2005-09-09 2012-05-09 Nhk Spring Co Ltd Conductive contact and method for manufacturing conductive contact
US8415963B2 (en) 2005-12-07 2013-04-09 Microprobe, Inc. Low profile probe having improved mechanical scrub and reduced contact inductance
US7944224B2 (en) 2005-12-07 2011-05-17 Microprobe, Inc. Low profile probe having improved mechanical scrub and reduced contact inductance
USRE44407E1 (en) 2006-03-20 2013-08-06 Formfactor, Inc. Space transformers employing wire bonds for interconnections with fine pitch contacts
USRE43503E1 (en) 2006-06-29 2012-07-10 Microprobe, Inc. Probe skates for electrical testing of convex pad topologies
US7659739B2 (en) 2006-09-14 2010-02-09 Micro Porbe, Inc. Knee probe having reduced thickness section for control of scrub motion
US20080068035A1 (en) * 2006-09-14 2008-03-20 Microprobe, Inc. Knee probe having reduced thickness section for control of scrub motion
US7786740B2 (en) 2006-10-11 2010-08-31 Astria Semiconductor Holdings, Inc. Probe cards employing probes having retaining portions for potting in a potting region
US9310428B2 (en) 2006-10-11 2016-04-12 Formfactor, Inc. Probe retention arrangement
US8907689B2 (en) 2006-10-11 2014-12-09 Microprobe, Inc. Probe retention arrangement
US9274143B2 (en) 2007-04-10 2016-03-01 Formfactor, Inc. Vertical probe array arranged to provide space transformation
US8324923B2 (en) 2007-04-10 2012-12-04 Microprobe, Inc. Vertical probe array arranged to provide space transformation
US7952377B2 (en) 2007-04-10 2011-05-31 Microprobe, Inc. Vertical probe array arranged to provide space transformation
US20090102495A1 (en) * 2007-10-19 2009-04-23 January Kister Vertical guided probe array providing sideways scrub motion
US8723546B2 (en) 2007-10-19 2014-05-13 Microprobe, Inc. Vertical guided layered probe
US7671610B2 (en) 2007-10-19 2010-03-02 Microprobe, Inc. Vertical guided probe array providing sideways scrub motion
US20090280676A1 (en) * 2008-05-09 2009-11-12 Feinmetall Gmbh Electrical contact element for contacting an electrical test sample and contacting apparatus
US7850460B2 (en) * 2008-05-09 2010-12-14 Feinmetall Gmbh Electrical contact element for contacting an electrical component under test and contacting apparatus
US8230593B2 (en) 2008-05-29 2012-07-31 Microprobe, Inc. Probe bonding method having improved control of bonding material
USD894025S1 (en) * 2018-05-16 2020-08-25 Nidec-Read Corporation Electric characteristic measuring probe
US11768227B1 (en) 2019-02-22 2023-09-26 Microfabrica Inc. Multi-layer probes having longitudinal axes and preferential probe bending axes that lie in planes that are nominally parallel to planes of probe layers
US11761982B1 (en) 2019-12-31 2023-09-19 Microfabrica Inc. Probes with planar unbiased spring elements for electronic component contact and methods for making such probes
US11802891B1 (en) 2019-12-31 2023-10-31 Microfabrica Inc. Compliant pin probes with multiple spring segments and compression spring deflection stabilization structures, methods for making, and methods for using
US11867721B1 (en) 2019-12-31 2024-01-09 Microfabrica Inc. Probes with multiple springs, methods for making, and methods for using
US11906549B1 (en) 2019-12-31 2024-02-20 Microfabrica Inc. Compliant pin probes with flat extension springs, methods for making, and methods for using
US11774467B1 (en) 2020-09-01 2023-10-03 Microfabrica Inc. Method of in situ modulation of structural material properties and/or template shape
US11973301B2 (en) 2022-02-24 2024-04-30 Microfabrica Inc. Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making

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Publication number Publication date
USD510043S1 (en) 2005-09-27

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