USD507198S1 - Straight protruding probe beam contour surfaces - Google Patents
Straight protruding probe beam contour surfaces Download PDFInfo
- Publication number
- USD507198S1 USD507198S1 US29/190,399 US19039903F USD507198S US D507198 S1 USD507198 S1 US D507198S1 US 19039903 F US19039903 F US 19039903F US D507198 S USD507198 S US D507198S
- Authority
- US
- United States
- Prior art keywords
- probe beam
- contour surfaces
- straight protruding
- protruding probe
- beam contour
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/0675—Needle-like
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
Description
FIG. 1 is a perspective view of an exemplary environmental structure of a probe beam having straight protruding probe beam contour surfaces.
FIG. 2 is a plan view of an exemplary environmental structure of a probe beam in protruding direction of the straight protruding probe beam contour surfaces. Section lines indicate the position of the corresponding cross sections of FIGS. 8, 9, 10 with respect to the exemplary environmental structure of a probe beam. The section line arrows on both ends of each section line indicate the view direction of the corresponding cross section views.
FIG. 3 is a plan view of an exemplary environmental structure of a probe beam in protruding direction of the straight protruding probe beam contour surfaces without section lines.
FIG. 4 is a top view in direction from above with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.
FIG. 5 is a side view in direction from right with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.
FIG. 6 is a bottom view in direction from below with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.
FIG. 7 is a side view in direction from left with respect to FIG. 3. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.
FIG. 8 is an enlarged cross section view indicated in FIG. 2 by section line 8—8. The cross hatching indicates the contour with respect to the section line 8—8. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.
FIG. 9 is an enlarged cross section view indicated in FIG. 2 by section line 9—9. The cross hatching indicates the contour with respect to the section line 9—9. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam; and,
FIG. 10 is an enlarged cross section view indicated in FIG. 2 by section line 10—10. The cross hatching indicates the contour with respect to the section line 10—10. The solid lines depict the straight protruding probe beam contour surfaces. The dashed lines illustrate the environmental structure of an exemplary buckling beam.
The broken lines shown in FIGS. 1-10 are for illustrative purposes only and form no part of the claimed design.
Claims (1)
- The ornamental design for straight protruding probe beam contour surfaces, as shown and described.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/190,399 USD507198S1 (en) | 2003-06-11 | 2003-09-19 | Straight protruding probe beam contour surfaces |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/183,540 USD510043S1 (en) | 2003-06-11 | 2003-06-11 | Continuously profiled probe beam |
US29/190,399 USD507198S1 (en) | 2003-06-11 | 2003-09-19 | Straight protruding probe beam contour surfaces |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/183,540 Continuation USD510043S1 (en) | 2003-06-11 | 2003-06-11 | Continuously profiled probe beam |
Publications (1)
Publication Number | Publication Date |
---|---|
USD507198S1 true USD507198S1 (en) | 2005-07-12 |
Family
ID=34709773
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/183,540 Expired - Lifetime USD510043S1 (en) | 2003-06-11 | 2003-06-11 | Continuously profiled probe beam |
US29/190,399 Expired - Lifetime USD507198S1 (en) | 2003-06-11 | 2003-09-19 | Straight protruding probe beam contour surfaces |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/183,540 Expired - Lifetime USD510043S1 (en) | 2003-06-11 | 2003-06-11 | Continuously profiled probe beam |
Country Status (1)
Country | Link |
---|---|
US (2) | USD510043S1 (en) |
Cited By (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070152686A1 (en) * | 2004-05-21 | 2007-07-05 | January Kister | Knee probe having increased scrub motion |
US20080001612A1 (en) * | 2004-05-21 | 2008-01-03 | January Kister | Probes with self-cleaning blunt skates for contacting conductive pads |
US20080068035A1 (en) * | 2006-09-14 | 2008-03-20 | Microprobe, Inc. | Knee probe having reduced thickness section for control of scrub motion |
EP1923708A1 (en) * | 2005-09-09 | 2008-05-21 | NHK Spring Company Limited | Conductive contact and method for manufacturing conductive contact |
US20090096474A1 (en) * | 2003-11-14 | 2009-04-16 | Rogers Robert L | Die design with integrated assembly aid |
US20090102495A1 (en) * | 2007-10-19 | 2009-04-23 | January Kister | Vertical guided probe array providing sideways scrub motion |
US20090280676A1 (en) * | 2008-05-09 | 2009-11-12 | Feinmetall Gmbh | Electrical contact element for contacting an electrical test sample and contacting apparatus |
US7786740B2 (en) | 2006-10-11 | 2010-08-31 | Astria Semiconductor Holdings, Inc. | Probe cards employing probes having retaining portions for potting in a potting region |
US7944224B2 (en) | 2005-12-07 | 2011-05-17 | Microprobe, Inc. | Low profile probe having improved mechanical scrub and reduced contact inductance |
US7952377B2 (en) | 2007-04-10 | 2011-05-31 | Microprobe, Inc. | Vertical probe array arranged to provide space transformation |
USRE43503E1 (en) | 2006-06-29 | 2012-07-10 | Microprobe, Inc. | Probe skates for electrical testing of convex pad topologies |
US8230593B2 (en) | 2008-05-29 | 2012-07-31 | Microprobe, Inc. | Probe bonding method having improved control of bonding material |
USRE44407E1 (en) | 2006-03-20 | 2013-08-06 | Formfactor, Inc. | Space transformers employing wire bonds for interconnections with fine pitch contacts |
US8723546B2 (en) | 2007-10-19 | 2014-05-13 | Microprobe, Inc. | Vertical guided layered probe |
US8907689B2 (en) | 2006-10-11 | 2014-12-09 | Microprobe, Inc. | Probe retention arrangement |
US8988091B2 (en) | 2004-05-21 | 2015-03-24 | Microprobe, Inc. | Multiple contact probes |
US9097740B2 (en) | 2004-05-21 | 2015-08-04 | Formfactor, Inc. | Layered probes with core |
US9476911B2 (en) | 2004-05-21 | 2016-10-25 | Microprobe, Inc. | Probes with high current carrying capability and laser machining methods |
USD894025S1 (en) * | 2018-05-16 | 2020-08-25 | Nidec-Read Corporation | Electric characteristic measuring probe |
US11761982B1 (en) | 2019-12-31 | 2023-09-19 | Microfabrica Inc. | Probes with planar unbiased spring elements for electronic component contact and methods for making such probes |
US11768227B1 (en) | 2019-02-22 | 2023-09-26 | Microfabrica Inc. | Multi-layer probes having longitudinal axes and preferential probe bending axes that lie in planes that are nominally parallel to planes of probe layers |
US11774467B1 (en) | 2020-09-01 | 2023-10-03 | Microfabrica Inc. | Method of in situ modulation of structural material properties and/or template shape |
US11802891B1 (en) | 2019-12-31 | 2023-10-31 | Microfabrica Inc. | Compliant pin probes with multiple spring segments and compression spring deflection stabilization structures, methods for making, and methods for using |
US11973301B2 (en) | 2022-02-24 | 2024-04-30 | Microfabrica Inc. | Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making |
-
2003
- 2003-06-11 US US29/183,540 patent/USD510043S1/en not_active Expired - Lifetime
- 2003-09-19 US US29/190,399 patent/USD507198S1/en not_active Expired - Lifetime
Cited By (40)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20090096474A1 (en) * | 2003-11-14 | 2009-04-16 | Rogers Robert L | Die design with integrated assembly aid |
US7649372B2 (en) | 2003-11-14 | 2010-01-19 | Wentworth Laboratories, Inc. | Die design with integrated assembly aid |
US9316670B2 (en) | 2004-05-21 | 2016-04-19 | Formfactor, Inc. | Multiple contact probes |
US7759949B2 (en) | 2004-05-21 | 2010-07-20 | Microprobe, Inc. | Probes with self-cleaning blunt skates for contacting conductive pads |
US8111080B2 (en) | 2004-05-21 | 2012-02-07 | Microprobe, Inc. | Knee probe having reduced thickness section for control of scrub motion |
US9476911B2 (en) | 2004-05-21 | 2016-10-25 | Microprobe, Inc. | Probes with high current carrying capability and laser machining methods |
US20070152686A1 (en) * | 2004-05-21 | 2007-07-05 | January Kister | Knee probe having increased scrub motion |
US20080001612A1 (en) * | 2004-05-21 | 2008-01-03 | January Kister | Probes with self-cleaning blunt skates for contacting conductive pads |
US9097740B2 (en) | 2004-05-21 | 2015-08-04 | Formfactor, Inc. | Layered probes with core |
US7733101B2 (en) | 2004-05-21 | 2010-06-08 | Microprobe, Inc. | Knee probe having increased scrub motion |
US8988091B2 (en) | 2004-05-21 | 2015-03-24 | Microprobe, Inc. | Multiple contact probes |
US8203353B2 (en) | 2004-07-09 | 2012-06-19 | Microprobe, Inc. | Probes with offset arm and suspension structure |
EP1923708A1 (en) * | 2005-09-09 | 2008-05-21 | NHK Spring Company Limited | Conductive contact and method for manufacturing conductive contact |
EP1923708A4 (en) * | 2005-09-09 | 2012-05-09 | Nhk Spring Co Ltd | Conductive contact and method for manufacturing conductive contact |
US8415963B2 (en) | 2005-12-07 | 2013-04-09 | Microprobe, Inc. | Low profile probe having improved mechanical scrub and reduced contact inductance |
US7944224B2 (en) | 2005-12-07 | 2011-05-17 | Microprobe, Inc. | Low profile probe having improved mechanical scrub and reduced contact inductance |
USRE44407E1 (en) | 2006-03-20 | 2013-08-06 | Formfactor, Inc. | Space transformers employing wire bonds for interconnections with fine pitch contacts |
USRE43503E1 (en) | 2006-06-29 | 2012-07-10 | Microprobe, Inc. | Probe skates for electrical testing of convex pad topologies |
US7659739B2 (en) | 2006-09-14 | 2010-02-09 | Micro Porbe, Inc. | Knee probe having reduced thickness section for control of scrub motion |
US20080068035A1 (en) * | 2006-09-14 | 2008-03-20 | Microprobe, Inc. | Knee probe having reduced thickness section for control of scrub motion |
US7786740B2 (en) | 2006-10-11 | 2010-08-31 | Astria Semiconductor Holdings, Inc. | Probe cards employing probes having retaining portions for potting in a potting region |
US9310428B2 (en) | 2006-10-11 | 2016-04-12 | Formfactor, Inc. | Probe retention arrangement |
US8907689B2 (en) | 2006-10-11 | 2014-12-09 | Microprobe, Inc. | Probe retention arrangement |
US9274143B2 (en) | 2007-04-10 | 2016-03-01 | Formfactor, Inc. | Vertical probe array arranged to provide space transformation |
US8324923B2 (en) | 2007-04-10 | 2012-12-04 | Microprobe, Inc. | Vertical probe array arranged to provide space transformation |
US7952377B2 (en) | 2007-04-10 | 2011-05-31 | Microprobe, Inc. | Vertical probe array arranged to provide space transformation |
US20090102495A1 (en) * | 2007-10-19 | 2009-04-23 | January Kister | Vertical guided probe array providing sideways scrub motion |
US8723546B2 (en) | 2007-10-19 | 2014-05-13 | Microprobe, Inc. | Vertical guided layered probe |
US7671610B2 (en) | 2007-10-19 | 2010-03-02 | Microprobe, Inc. | Vertical guided probe array providing sideways scrub motion |
US20090280676A1 (en) * | 2008-05-09 | 2009-11-12 | Feinmetall Gmbh | Electrical contact element for contacting an electrical test sample and contacting apparatus |
US7850460B2 (en) * | 2008-05-09 | 2010-12-14 | Feinmetall Gmbh | Electrical contact element for contacting an electrical component under test and contacting apparatus |
US8230593B2 (en) | 2008-05-29 | 2012-07-31 | Microprobe, Inc. | Probe bonding method having improved control of bonding material |
USD894025S1 (en) * | 2018-05-16 | 2020-08-25 | Nidec-Read Corporation | Electric characteristic measuring probe |
US11768227B1 (en) | 2019-02-22 | 2023-09-26 | Microfabrica Inc. | Multi-layer probes having longitudinal axes and preferential probe bending axes that lie in planes that are nominally parallel to planes of probe layers |
US11761982B1 (en) | 2019-12-31 | 2023-09-19 | Microfabrica Inc. | Probes with planar unbiased spring elements for electronic component contact and methods for making such probes |
US11802891B1 (en) | 2019-12-31 | 2023-10-31 | Microfabrica Inc. | Compliant pin probes with multiple spring segments and compression spring deflection stabilization structures, methods for making, and methods for using |
US11867721B1 (en) | 2019-12-31 | 2024-01-09 | Microfabrica Inc. | Probes with multiple springs, methods for making, and methods for using |
US11906549B1 (en) | 2019-12-31 | 2024-02-20 | Microfabrica Inc. | Compliant pin probes with flat extension springs, methods for making, and methods for using |
US11774467B1 (en) | 2020-09-01 | 2023-10-03 | Microfabrica Inc. | Method of in situ modulation of structural material properties and/or template shape |
US11973301B2 (en) | 2022-02-24 | 2024-04-30 | Microfabrica Inc. | Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making |
Also Published As
Publication number | Publication date |
---|---|
USD510043S1 (en) | 2005-09-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
USD507198S1 (en) | Straight protruding probe beam contour surfaces | |
USD556689S1 (en) | Travel power strip | |
USD580894S1 (en) | Wafer boat | |
USD567075S1 (en) | Screw | |
USD567376S1 (en) | Dental pliers | |
USD536799S1 (en) | Stairway bench | |
USD530887S1 (en) | Car bib | |
USD544418S1 (en) | Front bumper of automobiles | |
USD604850S1 (en) | Orthopedic bone block assembly | |
USD559548S1 (en) | Paint brush head | |
USD513546S1 (en) | Cat toy | |
USD552686S1 (en) | Pen clip | |
USD461027S1 (en) | Pet feces collector | |
USD485621S1 (en) | Decking member | |
USD933155S1 (en) | Inflatable dog float | |
USD547993S1 (en) | Activity mat | |
USD492455S1 (en) | Toy ball | |
USD537958S1 (en) | Ladder side rail top extension set | |
USD539972S1 (en) | Pendant light | |
USD546630S1 (en) | Serving platter | |
USD577415S1 (en) | Water filtration device | |
USD561017S1 (en) | Pivoting connector | |
USD527932S1 (en) | Top portion of a spring core | |
USD497838S1 (en) | Railroad car brake beam wear plate having one or more tapered walls | |
USD511133S1 (en) | Automobile tire |