USD510043S1 - Continuously profiled probe beam - Google Patents

Continuously profiled probe beam Download PDF

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Publication number
USD510043S1
USD510043S1 US29/183,540 US18354003F USD510043S US D510043 S1 USD510043 S1 US D510043S1 US 18354003 F US18354003 F US 18354003F US D510043 S USD510043 S US D510043S
Authority
US
United States
Prior art keywords
probe beam
continuously profiled
profiled probe
continuously
ornamental design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/183,540
Inventor
January Kister
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SV Probe Pte Ltd
Original Assignee
K&S Interconnect Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by K&S Interconnect Inc filed Critical K&S Interconnect Inc
Priority to US29/183,540 priority Critical patent/USD510043S1/en
Assigned to KULICKE & SOFFIA INTERCONNECT, INC. reassignment KULICKE & SOFFIA INTERCONNECT, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KISTER, JANUARY
Priority to US29/190,399 priority patent/USD507198S1/en
Assigned to K&S INTERCONNECT, INC. reassignment K&S INTERCONNECT, INC. REQUEST FOR CORRECTED NOTICE OF RECORDATON OF ASSIGNMENT DOCUMENT CORRECTING ASSIGNEE'S NAME REEL/FRAME 014478/0606 Assignors: KISTER, JANUARY
Application granted granted Critical
Publication of USD510043S1 publication Critical patent/USD510043S1/en
Assigned to SV PROBE PTE LTD. reassignment SV PROBE PTE LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: K&S INTERCONNECT, INC., KULICKE AND SOFFA INDUSTRIES, INC.
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/0675—Needle-like

Description

FIG. 1 shows the continuously profiled probe beam in profile direction.
FIG. 2 is a top view.
FIG. 3 is a side view.
FIG. 4 is an enlarged cross section view indicated in FIG. 1 by section line 4—4.
FIG. 5 is an enlarged cross section view indicated in FIG. 1 by section line 5—5; and,
FIG. 6 is an enlarged cross section view indicated in FIG. 1 by section line 6—6.

Claims (1)

  1. The ornamental design for a continuously profiled probe beam, as shown and described.
US29/183,540 2003-06-11 2003-06-11 Continuously profiled probe beam Expired - Lifetime USD510043S1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US29/183,540 USD510043S1 (en) 2003-06-11 2003-06-11 Continuously profiled probe beam
US29/190,399 USD507198S1 (en) 2003-06-11 2003-09-19 Straight protruding probe beam contour surfaces

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/183,540 USD510043S1 (en) 2003-06-11 2003-06-11 Continuously profiled probe beam

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US29/190,399 Continuation USD507198S1 (en) 2003-06-11 2003-09-19 Straight protruding probe beam contour surfaces

Publications (1)

Publication Number Publication Date
USD510043S1 true USD510043S1 (en) 2005-09-27

Family

ID=34709773

Family Applications (2)

Application Number Title Priority Date Filing Date
US29/183,540 Expired - Lifetime USD510043S1 (en) 2003-06-11 2003-06-11 Continuously profiled probe beam
US29/190,399 Expired - Lifetime USD507198S1 (en) 2003-06-11 2003-09-19 Straight protruding probe beam contour surfaces

Family Applications After (1)

Application Number Title Priority Date Filing Date
US29/190,399 Expired - Lifetime USD507198S1 (en) 2003-06-11 2003-09-19 Straight protruding probe beam contour surfaces

Country Status (1)

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US (2) USD510043S1 (en)

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080001612A1 (en) * 2004-05-21 2008-01-03 January Kister Probes with self-cleaning blunt skates for contacting conductive pads
US20090096474A1 (en) * 2003-11-14 2009-04-16 Rogers Robert L Die design with integrated assembly aid
US7659739B2 (en) 2006-09-14 2010-02-09 Micro Porbe, Inc. Knee probe having reduced thickness section for control of scrub motion
US7671610B2 (en) 2007-10-19 2010-03-02 Microprobe, Inc. Vertical guided probe array providing sideways scrub motion
US7733101B2 (en) 2004-05-21 2010-06-08 Microprobe, Inc. Knee probe having increased scrub motion
US7786740B2 (en) 2006-10-11 2010-08-31 Astria Semiconductor Holdings, Inc. Probe cards employing probes having retaining portions for potting in a potting region
US7944224B2 (en) 2005-12-07 2011-05-17 Microprobe, Inc. Low profile probe having improved mechanical scrub and reduced contact inductance
US7952377B2 (en) 2007-04-10 2011-05-31 Microprobe, Inc. Vertical probe array arranged to provide space transformation
USRE43503E1 (en) 2006-06-29 2012-07-10 Microprobe, Inc. Probe skates for electrical testing of convex pad topologies
US8230593B2 (en) 2008-05-29 2012-07-31 Microprobe, Inc. Probe bonding method having improved control of bonding material
USRE44407E1 (en) 2006-03-20 2013-08-06 Formfactor, Inc. Space transformers employing wire bonds for interconnections with fine pitch contacts
US8723546B2 (en) 2007-10-19 2014-05-13 Microprobe, Inc. Vertical guided layered probe
US8907689B2 (en) 2006-10-11 2014-12-09 Microprobe, Inc. Probe retention arrangement
US8988091B2 (en) 2004-05-21 2015-03-24 Microprobe, Inc. Multiple contact probes
US9097740B2 (en) 2004-05-21 2015-08-04 Formfactor, Inc. Layered probes with core
US9476911B2 (en) 2004-05-21 2016-10-25 Microprobe, Inc. Probes with high current carrying capability and laser machining methods
USD894025S1 (en) * 2018-05-16 2020-08-25 Nidec-Read Corporation Electric characteristic measuring probe

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4823617B2 (en) * 2005-09-09 2011-11-24 日本発條株式会社 Conductive contact and method for manufacturing conductive contact
DE102008023761B9 (en) * 2008-05-09 2012-11-08 Feinmetall Gmbh Electrical contact element for contact contacting of electrical specimens and corresponding contacting arrangement
US11768227B1 (en) 2019-02-22 2023-09-26 Microfabrica Inc. Multi-layer probes having longitudinal axes and preferential probe bending axes that lie in planes that are nominally parallel to planes of probe layers
US11761982B1 (en) 2019-12-31 2023-09-19 Microfabrica Inc. Probes with planar unbiased spring elements for electronic component contact and methods for making such probes
US11867721B1 (en) 2019-12-31 2024-01-09 Microfabrica Inc. Probes with multiple springs, methods for making, and methods for using
US11774467B1 (en) 2020-09-01 2023-10-03 Microfabrica Inc. Method of in situ modulation of structural material properties and/or template shape

Cited By (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7649372B2 (en) 2003-11-14 2010-01-19 Wentworth Laboratories, Inc. Die design with integrated assembly aid
US20090096474A1 (en) * 2003-11-14 2009-04-16 Rogers Robert L Die design with integrated assembly aid
US7759949B2 (en) 2004-05-21 2010-07-20 Microprobe, Inc. Probes with self-cleaning blunt skates for contacting conductive pads
US9476911B2 (en) 2004-05-21 2016-10-25 Microprobe, Inc. Probes with high current carrying capability and laser machining methods
US9316670B2 (en) 2004-05-21 2016-04-19 Formfactor, Inc. Multiple contact probes
US7733101B2 (en) 2004-05-21 2010-06-08 Microprobe, Inc. Knee probe having increased scrub motion
US9097740B2 (en) 2004-05-21 2015-08-04 Formfactor, Inc. Layered probes with core
US8988091B2 (en) 2004-05-21 2015-03-24 Microprobe, Inc. Multiple contact probes
US8111080B2 (en) 2004-05-21 2012-02-07 Microprobe, Inc. Knee probe having reduced thickness section for control of scrub motion
US20080001612A1 (en) * 2004-05-21 2008-01-03 January Kister Probes with self-cleaning blunt skates for contacting conductive pads
US8203353B2 (en) 2004-07-09 2012-06-19 Microprobe, Inc. Probes with offset arm and suspension structure
US8415963B2 (en) 2005-12-07 2013-04-09 Microprobe, Inc. Low profile probe having improved mechanical scrub and reduced contact inductance
US7944224B2 (en) 2005-12-07 2011-05-17 Microprobe, Inc. Low profile probe having improved mechanical scrub and reduced contact inductance
USRE44407E1 (en) 2006-03-20 2013-08-06 Formfactor, Inc. Space transformers employing wire bonds for interconnections with fine pitch contacts
USRE43503E1 (en) 2006-06-29 2012-07-10 Microprobe, Inc. Probe skates for electrical testing of convex pad topologies
US7659739B2 (en) 2006-09-14 2010-02-09 Micro Porbe, Inc. Knee probe having reduced thickness section for control of scrub motion
US8907689B2 (en) 2006-10-11 2014-12-09 Microprobe, Inc. Probe retention arrangement
US7786740B2 (en) 2006-10-11 2010-08-31 Astria Semiconductor Holdings, Inc. Probe cards employing probes having retaining portions for potting in a potting region
US9310428B2 (en) 2006-10-11 2016-04-12 Formfactor, Inc. Probe retention arrangement
US8324923B2 (en) 2007-04-10 2012-12-04 Microprobe, Inc. Vertical probe array arranged to provide space transformation
US7952377B2 (en) 2007-04-10 2011-05-31 Microprobe, Inc. Vertical probe array arranged to provide space transformation
US9274143B2 (en) 2007-04-10 2016-03-01 Formfactor, Inc. Vertical probe array arranged to provide space transformation
US8723546B2 (en) 2007-10-19 2014-05-13 Microprobe, Inc. Vertical guided layered probe
US7671610B2 (en) 2007-10-19 2010-03-02 Microprobe, Inc. Vertical guided probe array providing sideways scrub motion
US8230593B2 (en) 2008-05-29 2012-07-31 Microprobe, Inc. Probe bonding method having improved control of bonding material
USD894025S1 (en) * 2018-05-16 2020-08-25 Nidec-Read Corporation Electric characteristic measuring probe

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Publication number Publication date
USD507198S1 (en) 2005-07-12

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