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Patente

  1. Erweiterte Patentsuche
VeröffentlichungsnummerUSD510043 S1
PublikationstypErteilung
AnmeldenummerUS 29/183,540
Veröffentlichungsdatum27. Sept. 2005
Eingetragen11. Juni 2003
Prioritätsdatum11. Juni 2003
Auch veröffentlicht unterUSD507198
Veröffentlichungsnummer183540, 29183540, US D510043 S1, US D510043S1, US-S1-D510043, USD510043 S1, USD510043S1
ErfinderJanuary Kister
Ursprünglich BevollmächtigterK&S Interconnect, Inc.
Zitat exportierenBiBTeX, EndNote, RefMan
Externe Links: USPTO, USPTO-Zuordnung, Espacenet
Continuously profiled probe beam
US D510043 S1
Zusammenfassung  auf verfügbar
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Ansprüche(1)
  1. The ornamental design for a continuously profiled probe beam, as shown and described.
Beschreibung

FIG. 1 shows the continuously profiled probe beam in profile direction.

FIG. 2 is a top view.

FIG. 3 is a side view.

FIG. 4 is an enlarged cross section view indicated in FIG. 1 by section line 4—4.

FIG. 5 is an enlarged cross section view indicated in FIG. 1 by section line 5—5; and,

FIG. 6 is an enlarged cross section view indicated in FIG. 1 by section line 6—6.

Referenziert von
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US20080001612 *29. Juni 20063. Jan. 2008January KisterProbes with self-cleaning blunt skates for contacting conductive pads
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USRE4350313. Okt. 201010. Juli 2012Microprobe, Inc.Probe skates for electrical testing of convex pad topologies
USRE4440723. Dez. 20096. Aug. 2013Formfactor, Inc.Space transformers employing wire bonds for interconnections with fine pitch contacts
Klassifizierungen
US-KlassifikationD10/78