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Patente

VeröffentlichungsnummerUSD510043 S1
PublikationstypErteilung
Anmeldenummer29/183,540
Veröffentlichungsdatum27. Sept. 2005
Eingetragen11. Juni 2003
Prioritätsdatum11. Juni 2003
Auch veröffentlicht unterUSD507198
Veröffentlichungsnummer183540, 29183540, US D510043 S1, US D510043S1, US-S1-D510043, USD510043 S1, USD510043S1
ErfinderJanuary Kister
Ursprünglich BevollmächtigterK&S Interconnect, Inc.
Externe Links: USPTO, USPTO-Zuordnung, Espacenet
Continuously profiled probe beam
US D510043 S1
Bilder(2)
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Ansprüche
  1. The ornamental design for a continuously profiled probe beam, as shown and described.
Beschreibung

FIG. 1 shows the continuously profiled probe beam in profile direction.

FIG. 2 is a top view.

FIG. 3 is a side view.

FIG. 4 is an enlarged cross section view indicated in FIG. 1 by section line 4—4.

FIG. 5 is an enlarged cross section view indicated in FIG. 1 by section line 5—5; and,

FIG. 6 is an enlarged cross section view indicated in FIG. 1 by section line 6—6.

Referenziert von
Zitiert von PatentEingetragen Veröffentlichungsdatum Antragsteller Titel
US76493727. Febr. 200819. Jan. 2010Wentworth Laboratories, Inc.Die design with integrated assembly aid
US765973914. Sept. 20069. Febr. 2010Micro Porbe, Inc.Knee probe having reduced thickness section for control of scrub motion
US77331019. Juni 20068. Juni 2010Microprobe, Inc.Knee probe having increased scrub motion
US775994929. Juni 200620. Juli 2010Microprobe, Inc.Probes with self-cleaning blunt skates for contacting conductive pads
Klassifizierungen
US-KlassifikationD10/78