WO2001001184A1 - Scanning microscope by lcd - Google Patents
Scanning microscope by lcd Download PDFInfo
- Publication number
- WO2001001184A1 WO2001001184A1 PCT/US2000/015773 US0015773W WO0101184A1 WO 2001001184 A1 WO2001001184 A1 WO 2001001184A1 US 0015773 W US0015773 W US 0015773W WO 0101184 A1 WO0101184 A1 WO 0101184A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- microscope
- optically coupled
- liquid crystal
- crystal display
- beam splitter
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
Definitions
- the present innovation provides a method and apparatus for optically coupling a Liquid Crystal Display to a microscope and for scanning with periodic patterns.
- Liquid Crystal Displays require linear polarized light, which is a major drawback for using such displays in scanning microscopy. Imaging of lines and edges with polarized light will appear deferent if the edge is parallel to the polarization or if it is perpendicular thereto.
- a quarter wave plate is added on the optical trail of the light. The quarter wave plate change the linear polarization to circular. Thus the object is illuminated by circular polarization, and therefor the orientation of the edges and other features does not affect the resulting image.
- One more problem solved by the present innovation is the high loses of intensity by the beam splitter, which couples the LCD to the microscope.
- Half of the light intensity is lost when light passes from the LCD to the object and half of the remaining intensity is lost on the way back to the detector.
- the solution offered by the present invention is using polarized beam splitter.
- a polarizing beam splitter directs the whole intensity from the LCD to the object without loses or at least with very minute losses.
- the circularly polarized light is reflected back from the object, it passes through the quarter wave plate once again on its way to the detector. This time, the quarter wave plate acts to change the circular polarization into linear polarization once again.
- the linearly polarized light then passes through the polarizing beam splitter to the detector without intensity losses.
- the improvement provides four times more light intensity.
- the polarizing beam splitter also solves the problem of undesired reflections coming from the surfaces of lenses and other optical components.
- reflections of light which do not pass twice through the quarter wave plate, have a perpendicular polarization, and therefore do not pass through the polarization beam splitter.
- the LED offers a very stable, non-heating light source which considerably improves scanning noise problems. If a system requires a heating light source such as an arc lamp, a solution to hot air disturbances is offered by pumping hot air out, or blowing cooler air, e.g., at room temperature, into the trail of the light next to the light source.
- a heating light source such as an arc lamp
- cooler air e.g., at room temperature
- Scanning with periodic pattern produces amplitude and phase information.
- a calibration of the original phase of the illumination without shifting is required. It is realized that such calibration requires a mirror as a target, because mirrors do not shift the phase. It will be appreciated that replacing the object with a mirror for calibration, and then repositioning the object back to locate the desired targets is cumbersome and inconvenient.
- the present invention offers an easy solution to this problem.
- a mirror is constantly attached to one of the objectives mounted on the turret of the microscope and used specifically for calibration. Whenever a calibration is required, the turret is revolved to the calibration objective. When the calibration is satisfactorily completed, it is revolved back. In this way, a calibration can be performed without moving the object from its location.
- Fig. 1 is a schematic depiction of the scanning microscope according to a preferred embodiment of the present invention.
- Fig. 2 is an image of 0.25 ⁇ m semiconductors lines and their three dimensional topography as obtained using the scanning microscope of the present invention.
- Fig. 3 is an image of the same 0.25 ⁇ m semiconductors lines obtained using a conventional microscope.
- light is originated at a light source, passes through a Liquid Crystal Display and is then directed by a beam splitter to the microscope.
- the microscope projects the image of the Liquid Crystal Display on the object.
- the lens L1 adjusts the magnification of the Liquid Crystal Display to the magnification of the microscope. In case such adjustment is not required, lens L1 may be redundant.
- the quarter wave plate change the polarization of the light from linear to circular or elliptic polarization. Light reflected from the object is projected by the microscope upon the sensor. On the way, the light passes through the quarter wave plate, which changes its polarization from circular to linear again.
- the beam splitter can be a polarizing beam splitter for better light efficiency.
- the Liquid Crystal Display is optically coupled to the microscope by the beam splitter at the location between the microscope and a camera.
- the beam splitter can be in a different location, for example next to the objective. This configuration is more similar to the standard coupling of a microscope to a light source.
- the quarter wave plate can be located at any point on the optical path of the light after passing the Liquid Crystal Display. If the quarter wave plate is placed between the Liquid Crystal Display and the beam splitter, then light will pass it only one way; therefore the image at the sensor will have circular or elliptic polarization. This configuration is also valid according to the present invention.
- Lens L1 may become redundant, if there is no need for magnification adjustment of the Liquid Crystal Display.
- Figure 2 shows an image of 0.25 ⁇ m semiconductors lines and their three dimensional topography.
- Figure 3 shows an image of 0.25 ⁇ m semiconductors lines and their three dimensional topography.
- Figure 3 shows an image of 0.25 ⁇ m semiconductors lines and their three dimensional topography.
- the standard microscopic imaging of the same lines is shown in Figure 3.
- the object was scanned by periodic pattern in two axes x and y with LCD of 640 x 480 pixels.
- the line pitch of the periodic pattern was 0.6 ⁇ at the object plane, and the pixel size projected upon the object was 0.1 ⁇ .
- the pattern was shifted in 6 steps in the x-axis and 6 steps in y, 60 degrees phase shift in each step.
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU56003/00A AU5600300A (en) | 1999-06-25 | 2000-06-09 | Scanning microscope by lcd |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14079699P | 1999-06-25 | 1999-06-25 | |
US60/140,796 | 1999-06-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2001001184A1 true WO2001001184A1 (en) | 2001-01-04 |
Family
ID=22492825
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2000/015773 WO2001001184A1 (en) | 1999-06-25 | 2000-06-09 | Scanning microscope by lcd |
Country Status (2)
Country | Link |
---|---|
AU (1) | AU5600300A (en) |
WO (1) | WO2001001184A1 (en) |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2005062102A1 (en) * | 2003-12-19 | 2005-07-07 | Fraunhofer-Gesellschaft Zur Förderung Der Angewandten Forschung | Device for the confocal optical scanning of an object |
US7315414B2 (en) | 2004-03-31 | 2008-01-01 | Swift Instruments, Inc. | Microscope with adjustable stage |
US7402001B2 (en) | 2003-08-08 | 2008-07-22 | Saipem S.A. | Seafloor-surface coupling device |
US8691594B2 (en) | 1996-04-25 | 2014-04-08 | Bioarray Solutions, Ltd. | Method of making a microbead array with attached biomolecules |
US8691754B2 (en) | 2003-09-22 | 2014-04-08 | Bioarray Solutions, Ltd. | Microparticles with enhanced covalent binding capacity and their uses |
US9147037B2 (en) | 2004-08-02 | 2015-09-29 | Bioarray Solutions, Ltd. | Automated analysis of multiplexed probe-target interaction patterns: pattern matching and allele identification |
US9251583B2 (en) | 2002-11-15 | 2016-02-02 | Bioarray Solutions, Ltd. | Analysis, secure access to, and transmission of array images |
US9436088B2 (en) | 2001-06-21 | 2016-09-06 | Bioarray Solutions, Ltd. | Un-supported polymeric film with embedded microbeads |
US9637777B2 (en) | 2003-10-28 | 2017-05-02 | Bioarray Solutions, Ltd. | Optimization of gene expression analysis using immobilized capture probes |
US9709559B2 (en) | 2000-06-21 | 2017-07-18 | Bioarray Solutions, Ltd. | Multianalyte molecular analysis using application-specific random particle arrays |
WO2018073749A1 (en) * | 2016-10-17 | 2018-04-26 | University Of Ottawa | Apparatus and method for calibrating measuring instruments |
US10415081B2 (en) | 2001-10-15 | 2019-09-17 | Bioarray Solutions Ltd. | Multiplexed analysis of polymorphic loci by concurrent interrogation and enzyme-mediated detection |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5587832A (en) * | 1993-10-20 | 1996-12-24 | Biophysica Technologies, Inc. | Spatially light modulated confocal microscope and method |
US6031661A (en) * | 1997-01-23 | 2000-02-29 | Yokogawa Electric Corporation | Confocal microscopic equipment |
-
2000
- 2000-06-09 AU AU56003/00A patent/AU5600300A/en not_active Abandoned
- 2000-06-09 WO PCT/US2000/015773 patent/WO2001001184A1/en active Application Filing
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5587832A (en) * | 1993-10-20 | 1996-12-24 | Biophysica Technologies, Inc. | Spatially light modulated confocal microscope and method |
US6031661A (en) * | 1997-01-23 | 2000-02-29 | Yokogawa Electric Corporation | Confocal microscopic equipment |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9400259B2 (en) | 1996-04-25 | 2016-07-26 | Bioarray Solutions, Ltd. | Method of making a microbead array with attached biomolecules |
US8691594B2 (en) | 1996-04-25 | 2014-04-08 | Bioarray Solutions, Ltd. | Method of making a microbead array with attached biomolecules |
US9709559B2 (en) | 2000-06-21 | 2017-07-18 | Bioarray Solutions, Ltd. | Multianalyte molecular analysis using application-specific random particle arrays |
US9436088B2 (en) | 2001-06-21 | 2016-09-06 | Bioarray Solutions, Ltd. | Un-supported polymeric film with embedded microbeads |
US10415081B2 (en) | 2001-10-15 | 2019-09-17 | Bioarray Solutions Ltd. | Multiplexed analysis of polymorphic loci by concurrent interrogation and enzyme-mediated detection |
US9251583B2 (en) | 2002-11-15 | 2016-02-02 | Bioarray Solutions, Ltd. | Analysis, secure access to, and transmission of array images |
US7402001B2 (en) | 2003-08-08 | 2008-07-22 | Saipem S.A. | Seafloor-surface coupling device |
US8691754B2 (en) | 2003-09-22 | 2014-04-08 | Bioarray Solutions, Ltd. | Microparticles with enhanced covalent binding capacity and their uses |
US9637777B2 (en) | 2003-10-28 | 2017-05-02 | Bioarray Solutions, Ltd. | Optimization of gene expression analysis using immobilized capture probes |
WO2005062102A1 (en) * | 2003-12-19 | 2005-07-07 | Fraunhofer-Gesellschaft Zur Förderung Der Angewandten Forschung | Device for the confocal optical scanning of an object |
US7315414B2 (en) | 2004-03-31 | 2008-01-01 | Swift Instruments, Inc. | Microscope with adjustable stage |
US9147037B2 (en) | 2004-08-02 | 2015-09-29 | Bioarray Solutions, Ltd. | Automated analysis of multiplexed probe-target interaction patterns: pattern matching and allele identification |
WO2018073749A1 (en) * | 2016-10-17 | 2018-04-26 | University Of Ottawa | Apparatus and method for calibrating measuring instruments |
US10677652B2 (en) | 2016-10-17 | 2020-06-09 | University Of Ottawa | Apparatus and method for calibrating measuring instruments |
Also Published As
Publication number | Publication date |
---|---|
AU5600300A (en) | 2001-01-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5798864A (en) | Projection type image display apparatus | |
TWI247972B (en) | Illuminating method, exposing method, and device for therefor | |
US4911543A (en) | Microscope viewing apparatus for viewing a specimen image and an optical overlay pattern image in a comparison manner | |
JP7153552B2 (en) | Variable focal length lens system including focus reference subsystem | |
WO2001001184A1 (en) | Scanning microscope by lcd | |
JP5101106B2 (en) | Aperture device and / or filter device, particularly for optical instruments such as microscopes, whose position, form and / or optical properties can be changed | |
KR940016475A (en) | Reflective and refractive optical system and projection exposure apparatus using the same | |
JP2007041529A (en) | Method for manufacturing projection optical system and projection optical system | |
KR20080097340A (en) | Laser processing device | |
US20180164562A1 (en) | Confocal microscopy system with vari-focus optical element | |
CN206421129U (en) | A kind of photo orientated device in liquid crystal constituency | |
JP2011107139A (en) | Apparatus and method for measuring surface shape of object and part kit | |
CN106647045B (en) | Light-operated orientation device and method for liquid crystal selected area | |
CN106575030A (en) | Microscope having a beam splitter assembly | |
JP2008210814A (en) | Modulator | |
CN214066973U (en) | Large-depth-of-field display screen defect detection device based on multi-camera structure | |
JP2014083562A (en) | Laser irradiation unit, and laser processing apparatus | |
CN110196232B (en) | Confocal imaging device and confocal imaging method | |
JP2001066124A (en) | Three-dimensional surface shape measuring device | |
CN111913294A (en) | Non-mechanical scanning structured light microscopic three-dimensional imaging device and imaging method | |
JP2010204280A (en) | Illumination optical system and image projection device having the same | |
JP3752935B2 (en) | Pattern defect inspection method and apparatus | |
JP2002090313A (en) | Pattern defect inspection device | |
JP2014056078A (en) | Image acquisition device, image acquisition system, and microscope device | |
JP2576021B2 (en) | Transmission confocal laser microscope |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): AE AL AM AT AU AZ BA BB BG BR BY CA CH CN CR CU CZ DE DK DM EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT TZ UA UG US UZ VN YU ZA ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
REG | Reference to national code |
Ref country code: DE Ref legal event code: 8642 |
|
122 | Ep: pct application non-entry in european phase | ||
NENP | Non-entry into the national phase |
Ref country code: JP |