WO2001052320A3 - A method for requesting trace data reports from fault detection controlled semiconductor fabrication processes - Google Patents

A method for requesting trace data reports from fault detection controlled semiconductor fabrication processes Download PDF

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Publication number
WO2001052320A3
WO2001052320A3 PCT/US2000/025736 US0025736W WO0152320A3 WO 2001052320 A3 WO2001052320 A3 WO 2001052320A3 US 0025736 W US0025736 W US 0025736W WO 0152320 A3 WO0152320 A3 WO 0152320A3
Authority
WO
WIPO (PCT)
Prior art keywords
trace data
report
fault detection
data
specified
Prior art date
Application number
PCT/US2000/025736
Other languages
French (fr)
Other versions
WO2001052320A2 (en
Inventor
Efido Coss Jr
Michael R Conboy
Bryce A Hendrix
Original Assignee
Advanced Micro Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Micro Devices Inc filed Critical Advanced Micro Devices Inc
Priority to EP00965181A priority Critical patent/EP1245042A2/en
Priority to JP2001552442A priority patent/JP2003520435A/en
Publication of WO2001052320A2 publication Critical patent/WO2001052320A2/en
Publication of WO2001052320A3 publication Critical patent/WO2001052320A3/en

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Abstract

The invention is, in its various aspects, a method and apparatus for dynamically generating trace data reports in a semiconductor fabrication process employing fault detection control. The method comprises specifying data for a trace data report, the specified data including at least one of a parameter, a trigger, and a freqeuncy for the trace data report; automatically generating from a fault detection controller (250) a request to a report generator (260) for the trace data report, the request including the specified data; formulating the trace data report responsive to the request; and returning the formulated trace data report from the report generator (260) based on the request. In other aspects, the invention comprises a computer programmed to perform this method and a computer-readable, program storage medium encoded with instructions that perform this method when executed by a computer. The apparatus is a semiconductor fabrication processing system, comprising: a fabrication tool (110) capable of providing at least one of specified data and a trace data report; a fault detection controller (250) implementing a fault detection control, the fault detection controller (250) being capable of automatically generating a request for the trace data report, the request including the specified data; a report generator (260) capable of requesting at least one of the specified data and the trace data report from the fabrication tool (110) and capable of, if the specified data is requested from the fabrication tool (110), providing the trace data report; and an operator interface (230) for receiving data specified for the trace data report, the specified data including at least one of a parameter, a trigger, and a frequency for the trace data report, and to which the trace data report may be returned from at least one of the report generator (260) and the fabrication tool (110).
PCT/US2000/025736 2000-01-07 2000-09-20 A method for requesting trace data reports from fault detection controlled semiconductor fabrication processes WO2001052320A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP00965181A EP1245042A2 (en) 2000-01-07 2000-09-20 A method for requesting trace data reports from fault detection controlled semiconductor fabrication processes
JP2001552442A JP2003520435A (en) 2000-01-07 2000-09-20 Method for requesting trace data report from FDC semiconductor manufacturing process

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/479,852 2000-01-07
US09/479,852 US6871112B1 (en) 2000-01-07 2000-01-07 Method for requesting trace data reports from FDC semiconductor fabrication processes

Publications (2)

Publication Number Publication Date
WO2001052320A2 WO2001052320A2 (en) 2001-07-19
WO2001052320A3 true WO2001052320A3 (en) 2002-01-17

Family

ID=23905702

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2000/025736 WO2001052320A2 (en) 2000-01-07 2000-09-20 A method for requesting trace data reports from fault detection controlled semiconductor fabrication processes

Country Status (5)

Country Link
US (1) US6871112B1 (en)
EP (1) EP1245042A2 (en)
JP (1) JP2003520435A (en)
KR (1) KR100734531B1 (en)
WO (1) WO2001052320A2 (en)

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US7110918B2 (en) 2003-11-05 2006-09-19 Shoplogix Inc. Self-contained system and method for remotely monitoring machines
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US8112400B2 (en) * 2003-12-23 2012-02-07 Texas Instruments Incorporated Method for collecting data from semiconductor equipment
US7146237B2 (en) * 2004-04-07 2006-12-05 Mks Instruments, Inc. Controller and method to mediate data collection from smart sensors for fab applications
US7680556B2 (en) 2004-11-15 2010-03-16 Tech Semiconductor Singapore Pte. Ltd. Method for data collection during manufacturing processes
US7787477B2 (en) * 2005-07-11 2010-08-31 Mks Instruments, Inc. Address-transparent device and method
KR100702843B1 (en) * 2005-08-12 2007-04-03 삼성전자주식회사 Semiconductor prodution device can processing batch of variable lot and method for processing variable lot
JP5177958B2 (en) * 2006-03-31 2013-04-10 Ｈｏｙａ株式会社 Processing data management system, processing system for magnetic disk manufacturing apparatus, and data management method for magnetic disk manufacturing apparatus
US20070240122A1 (en) * 2006-04-05 2007-10-11 Chiahong Chen Method, system and program storage device for providing request trace data in a user mode device interface
JP2008077286A (en) * 2006-09-20 2008-04-03 Dainippon Screen Mfg Co Ltd Apparatus, method and program for evaluating industrial process
US20080228863A1 (en) * 2007-03-12 2008-09-18 Timothy Mackey Systems and Methods for End-User Experience Monitoring Using A Script
US9021140B2 (en) * 2007-03-12 2015-04-28 Citrix Systems, Inc. Systems and methods for error detection
US8572160B2 (en) 2007-03-12 2013-10-29 Citrix Systems, Inc. Systems and methods for script injection
ES2368366T3 (en) 2007-05-07 2011-11-16 Vorne Industries, Inc. METHOD AND SYSTEM TO EXPAND THE CAPACITIES OF INTEGRATED DEVICES THROUGH NETWORK CUSTOMERS.
JP6220783B2 (en) * 2012-07-04 2017-10-25 株式会社日立国際電気 Substrate processing system, substrate processing apparatus, and data processing method
KR20230162280A (en) 2022-05-20 2023-11-28 (주)미소정보기술 FDC system equipped with a workflow connected by modularizing the entire process and its processing method

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Also Published As

Publication number Publication date
EP1245042A2 (en) 2002-10-02
JP2003520435A (en) 2003-07-02
KR20020063270A (en) 2002-08-01
KR100734531B1 (en) 2007-07-04
WO2001052320A2 (en) 2001-07-19
US6871112B1 (en) 2005-03-22

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