WO2002031518A3 - Conversion board for dual handlers and single site device interface boards - Google Patents

Conversion board for dual handlers and single site device interface boards Download PDF

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Publication number
WO2002031518A3
WO2002031518A3 PCT/US2001/027607 US0127607W WO0231518A3 WO 2002031518 A3 WO2002031518 A3 WO 2002031518A3 US 0127607 W US0127607 W US 0127607W WO 0231518 A3 WO0231518 A3 WO 0231518A3
Authority
WO
WIPO (PCT)
Prior art keywords
single site
dual
handlers
dib
device interface
Prior art date
Application number
PCT/US2001/027607
Other languages
French (fr)
Other versions
WO2002031518A2 (en
Inventor
Supachai Vesaruch
Kittinan Chanvivatkun
Natthaphong Bunheun
Sutas Panyoo
Original Assignee
Advanced Micro Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Micro Devices Inc filed Critical Advanced Micro Devices Inc
Priority to AU2001287104A priority Critical patent/AU2001287104A1/en
Publication of WO2002031518A2 publication Critical patent/WO2002031518A2/en
Publication of WO2002031518A3 publication Critical patent/WO2002031518A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Abstract

The invention relates to a device, system, and method that permits the use of a dual device handler (110) in conjunction with a single site DIB (122). The device comprises a circuit board (100) that fits between the contactor (112) of a dual device handler (110) and a single site DIB (122) of a device tester (120). The circuit board (100) has connectors on both sides, the connectors being arranged and interconnected so that the board (100) serves as an adapter between the dual device handler contactor (112) and the single site DIB (122). As a result, the invention permits the combination of equipment previously considered incompatible. The invention thereby allows integrated circuit chip manufacturers to expand the versatility of expensive device testing ad handling equipment.
PCT/US2001/027607 2000-10-12 2001-09-05 Conversion board for dual handlers and single site device interface boards WO2002031518A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2001287104A AU2001287104A1 (en) 2000-10-12 2001-09-05 Hifi conversion board for dual handlers and single site device interface boards

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US68951100A 2000-10-12 2000-10-12
US09/689,511 2000-10-12

Publications (2)

Publication Number Publication Date
WO2002031518A2 WO2002031518A2 (en) 2002-04-18
WO2002031518A3 true WO2002031518A3 (en) 2002-06-13

Family

ID=24768777

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2001/027607 WO2002031518A2 (en) 2000-10-12 2001-09-05 Conversion board for dual handlers and single site device interface boards

Country Status (2)

Country Link
AU (1) AU2001287104A1 (en)
WO (1) WO2002031518A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20180012981A (en) * 2016-07-28 2018-02-07 삼성전자주식회사 Common board of an adaptor for a tester, adaptor for a tester including the common board and tester including the common board

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4712062A (en) * 1984-12-20 1987-12-08 Hughes Aircraft Company Ground shield apparatus for giga-hertz test jig
EP0671630A1 (en) * 1994-03-07 1995-09-13 Hitachi Chemical Co., Ltd. Jig for measuring the characteristics of a semiconductor, manufacturing method therefor and use thereof
US5801541A (en) * 1996-09-27 1998-09-01 Altera Corporation Stacked test board apparatus with matched impedance for use in electronic device test equipment

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4712062A (en) * 1984-12-20 1987-12-08 Hughes Aircraft Company Ground shield apparatus for giga-hertz test jig
EP0671630A1 (en) * 1994-03-07 1995-09-13 Hitachi Chemical Co., Ltd. Jig for measuring the characteristics of a semiconductor, manufacturing method therefor and use thereof
US5801541A (en) * 1996-09-27 1998-09-01 Altera Corporation Stacked test board apparatus with matched impedance for use in electronic device test equipment

Also Published As

Publication number Publication date
WO2002031518A2 (en) 2002-04-18
AU2001287104A1 (en) 2002-04-22

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