WO2004061863A3 - Programmable memory array structure incorporating series-connected transistor strings and methods for fabrication and operation of same - Google Patents
Programmable memory array structure incorporating series-connected transistor strings and methods for fabrication and operation of same Download PDFInfo
- Publication number
- WO2004061863A3 WO2004061863A3 PCT/US2003/041446 US0341446W WO2004061863A3 WO 2004061863 A3 WO2004061863 A3 WO 2004061863A3 US 0341446 W US0341446 W US 0341446W WO 2004061863 A3 WO2004061863 A3 WO 2004061863A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- global bit
- memory array
- block select
- nand strings
- select devices
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
- G11C16/16—Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B43/00—EEPROM devices comprising charge-trapping gate insulators
- H10B43/10—EEPROM devices comprising charge-trapping gate insulators characterised by the top-view layout
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B43/00—EEPROM devices comprising charge-trapping gate insulators
- H10B43/20—EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B43/00—EEPROM devices comprising charge-trapping gate insulators
- H10B43/30—EEPROM devices comprising charge-trapping gate insulators characterised by the memory core region
- H10B43/35—EEPROM devices comprising charge-trapping gate insulators characterised by the memory core region with cell select transistors, e.g. NAND
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2003300007A AU2003300007A1 (en) | 2002-12-31 | 2003-12-29 | Programmable memory array structure incorporating series-connected transistor strings and methods for fabrication and operation of same |
JP2004565772A JP2006512776A (en) | 2002-12-31 | 2003-12-29 | Programmable memory array structure incorporating transistor strings connected in series and method for manufacturing and operating this structure |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/335,078 US7505321B2 (en) | 2002-12-31 | 2002-12-31 | Programmable memory array structure incorporating series-connected transistor strings and methods for fabrication and operation of same |
US10/335,089 | 2002-12-31 | ||
US10/335,089 US7005350B2 (en) | 2002-12-31 | 2002-12-31 | Method for fabricating programmable memory array structures incorporating series-connected transistor strings |
US10/335,078 | 2002-12-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2004061863A2 WO2004061863A2 (en) | 2004-07-22 |
WO2004061863A3 true WO2004061863A3 (en) | 2004-12-16 |
Family
ID=32716876
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2003/041446 WO2004061863A2 (en) | 2002-12-31 | 2003-12-29 | Programmable memory array structure incorporating series-connected transistor strings and methods for fabrication and operation of same |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2006512776A (en) |
AU (1) | AU2003300007A1 (en) |
WO (1) | WO2004061863A2 (en) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100657910B1 (en) * | 2004-11-10 | 2006-12-14 | 삼성전자주식회사 | Multi-bit flash memory device, method of working the same, and method of fabricating the same |
DE102005017072A1 (en) * | 2004-12-29 | 2006-07-13 | Hynix Semiconductor Inc., Ichon | Charge trap insulator memory device, has float channel, where data are read based on different channel resistance induced to channel depending on polarity states of charges stored in insulator |
US7709334B2 (en) * | 2005-12-09 | 2010-05-04 | Macronix International Co., Ltd. | Stacked non-volatile memory device and methods for fabricating the same |
US7473589B2 (en) * | 2005-12-09 | 2009-01-06 | Macronix International Co., Ltd. | Stacked thin film transistor, non-volatile memory devices and methods for fabricating the same |
US7764549B2 (en) | 2005-06-20 | 2010-07-27 | Sandisk 3D Llc | Floating body memory cell system and method of manufacture |
US7317641B2 (en) | 2005-06-20 | 2008-01-08 | Sandisk Corporation | Volatile memory cell two-pass writing method |
US7489546B2 (en) | 2005-12-20 | 2009-02-10 | Micron Technology, Inc. | NAND architecture memory devices and operation |
US8759915B2 (en) | 2006-03-20 | 2014-06-24 | Micron Technology, Inc. | Semiconductor field-effect transistor, memory cell and memory device |
KR100806339B1 (en) * | 2006-10-11 | 2008-02-27 | 삼성전자주식회사 | Nand flash memory devices having 3-dimensionally arranged memory cells and methods of fabricating the same |
US7675783B2 (en) * | 2007-02-27 | 2010-03-09 | Samsung Electronics Co., Ltd. | Nonvolatile memory device and driving method thereof |
JP5175526B2 (en) | 2007-11-22 | 2013-04-03 | 株式会社東芝 | Nonvolatile semiconductor memory device and manufacturing method thereof |
JP5288933B2 (en) * | 2008-08-08 | 2013-09-11 | 株式会社東芝 | Semiconductor memory device and manufacturing method thereof |
JP5322533B2 (en) | 2008-08-13 | 2013-10-23 | 株式会社東芝 | Nonvolatile semiconductor memory device and manufacturing method thereof |
JP4945609B2 (en) | 2009-09-02 | 2012-06-06 | 株式会社東芝 | Semiconductor integrated circuit device |
KR101547328B1 (en) * | 2009-09-25 | 2015-08-25 | 삼성전자주식회사 | Ferroelectric memory devices and operating method of the same |
JP5395738B2 (en) | 2010-05-17 | 2014-01-22 | 株式会社東芝 | Semiconductor device |
US8755227B2 (en) | 2012-01-30 | 2014-06-17 | Phison Electronics Corp. | NAND flash memory unit, NAND flash memory array, and methods for operating them |
JP2013161878A (en) * | 2012-02-02 | 2013-08-19 | Renesas Electronics Corp | Semiconductor device and semiconductor device manufacturing method |
JP2021141283A (en) | 2020-03-09 | 2021-09-16 | キオクシア株式会社 | Semiconductor storage device |
WO2022082732A1 (en) * | 2020-10-23 | 2022-04-28 | Yangtze Advanced Memory Industrial Innovation Center Co., Ltd. | A program and read bias and access scheme to improve data throughput for 2 stack 3d pcm memory |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5923587A (en) * | 1996-09-21 | 1999-07-13 | Samsung Electronics, Co., Ltd. | Multi-bit memory cell array of a non-volatile semiconductor memory device and method for driving the same |
US5940321A (en) * | 1994-06-29 | 1999-08-17 | Kabushiki Kaisha Toshiba | Nonvolatile semiconductor memory device |
US6163048A (en) * | 1995-10-25 | 2000-12-19 | Cypress Semiconductor Corporation | Semiconductor non-volatile memory device having a NAND cell structure |
US20010055838A1 (en) * | 2000-04-28 | 2001-12-27 | Matrix Semiconductor Inc. | Nonvolatile memory on SOI and compound semiconductor substrates and method of fabrication |
-
2003
- 2003-12-29 WO PCT/US2003/041446 patent/WO2004061863A2/en active Application Filing
- 2003-12-29 AU AU2003300007A patent/AU2003300007A1/en not_active Abandoned
- 2003-12-29 JP JP2004565772A patent/JP2006512776A/en not_active Withdrawn
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5940321A (en) * | 1994-06-29 | 1999-08-17 | Kabushiki Kaisha Toshiba | Nonvolatile semiconductor memory device |
US6163048A (en) * | 1995-10-25 | 2000-12-19 | Cypress Semiconductor Corporation | Semiconductor non-volatile memory device having a NAND cell structure |
US5923587A (en) * | 1996-09-21 | 1999-07-13 | Samsung Electronics, Co., Ltd. | Multi-bit memory cell array of a non-volatile semiconductor memory device and method for driving the same |
US20010055838A1 (en) * | 2000-04-28 | 2001-12-27 | Matrix Semiconductor Inc. | Nonvolatile memory on SOI and compound semiconductor substrates and method of fabrication |
Also Published As
Publication number | Publication date |
---|---|
JP2006512776A (en) | 2006-04-13 |
WO2004061863A2 (en) | 2004-07-22 |
AU2003300007A1 (en) | 2004-07-29 |
AU2003300007A8 (en) | 2004-07-29 |
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