WO2005010803A3 - Methods for finding and characterizing a deformed pattern in an image - Google Patents

Methods for finding and characterizing a deformed pattern in an image Download PDF

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Publication number
WO2005010803A3
WO2005010803A3 PCT/US2004/023130 US2004023130W WO2005010803A3 WO 2005010803 A3 WO2005010803 A3 WO 2005010803A3 US 2004023130 W US2004023130 W US 2004023130W WO 2005010803 A3 WO2005010803 A3 WO 2005010803A3
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WO
WIPO (PCT)
Prior art keywords
pattern
sub
search
image
deformed
Prior art date
Application number
PCT/US2004/023130
Other languages
French (fr)
Other versions
WO2005010803A2 (en
Inventor
Jason Davis
Original Assignee
Cognex Corp
Jason Davis
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Publication date
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Application filed by Cognex Corp, Jason Davis filed Critical Cognex Corp
Publication of WO2005010803A2 publication Critical patent/WO2005010803A2/en
Publication of WO2005010803A3 publication Critical patent/WO2005010803A3/en

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/74—Image or video pattern matching; Proximity measures in feature spaces
    • G06V10/75—Organisation of the matching processes, e.g. simultaneous or sequential comparisons of image or video features; Coarse-fine approaches, e.g. multi-scale approaches; using context analysis; Selection of dictionaries
    • G06V10/754—Organisation of the matching processes, e.g. simultaneous or sequential comparisons of image or video features; Coarse-fine approaches, e.g. multi-scale approaches; using context analysis; Selection of dictionaries involving a deformation of the sample pattern or of the reference pattern; Elastic matching

Abstract

A method is disclosed for finding a deformed pattern in an image using a plurality of sub-patterns. By advantageously restricting sub-pattern search ranges, search speed is improved, and the incidence of spurious matches is reduced. The method also quickly decides which sub-pattern result, of several potential candidates, is most likely to be the correct match for a deformed sub-pattern Also, a method is provided for characterizing a deformed pattern in an image by using results from feature-based search tools to create a mapping that models the deformation of the pattern. A transform, selectable by a user, is fit to the results from the search tools to create a global deformation mapping. This transformation is fit only to feature points derived from matches resulting from successful sub-pattern search, without including data from areas of the pattern that were blank, not matched, or otherwise didn't contain information about the pattern’s distorted location.
PCT/US2004/023130 2003-07-22 2004-07-19 Methods for finding and characterizing a deformed pattern in an image WO2005010803A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/625,205 US7190834B2 (en) 2003-07-22 2003-07-22 Methods for finding and characterizing a deformed pattern in an image
US10/625,205 2003-07-22

Publications (2)

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WO2005010803A2 WO2005010803A2 (en) 2005-02-03
WO2005010803A3 true WO2005010803A3 (en) 2005-06-23

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PCT/US2004/023130 WO2005010803A2 (en) 2003-07-22 2004-07-19 Methods for finding and characterizing a deformed pattern in an image

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US (3) US7190834B2 (en)
WO (1) WO2005010803A2 (en)

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