WO2006081286A8 - Multi-layer polishing pad for low-pressure polishing - Google Patents

Multi-layer polishing pad for low-pressure polishing

Info

Publication number
WO2006081286A8
WO2006081286A8 PCT/US2006/002599 US2006002599W WO2006081286A8 WO 2006081286 A8 WO2006081286 A8 WO 2006081286A8 US 2006002599 W US2006002599 W US 2006002599W WO 2006081286 A8 WO2006081286 A8 WO 2006081286A8
Authority
WO
WIPO (PCT)
Prior art keywords
polishing
layer
thickness
compressibility
low
Prior art date
Application number
PCT/US2006/002599
Other languages
French (fr)
Other versions
WO2006081286A3 (en
WO2006081286A2 (en
Inventor
Alain Duboust
Shou-Sung Chang
Wei Lu
Siew Neo
Yan Wang
Antoine Manens
Yongsik Moon
Original Assignee
Applied Materials Inc
Alain Duboust
Shou-Sung Chang
Wei Lu
Siew Neo
Yan Wang
Antoine Manens
Yongsik Moon
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc, Alain Duboust, Shou-Sung Chang, Wei Lu, Siew Neo, Yan Wang, Antoine Manens, Yongsik Moon filed Critical Applied Materials Inc
Priority to JP2007553196A priority Critical patent/JP2008528309A/en
Priority to CN2006800030867A priority patent/CN101107095B/en
Publication of WO2006081286A2 publication Critical patent/WO2006081286A2/en
Publication of WO2006081286A3 publication Critical patent/WO2006081286A3/en
Publication of WO2006081286A8 publication Critical patent/WO2006081286A8/en

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/005Control means for lapping machines or devices
    • B24B37/013Devices or means for detecting lapping completion
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/046Lapping machines or devices; Accessories designed for working plane surfaces using electric current
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/205Lapping pads for working plane surfaces provided with a window for inspecting the surface of the work being lapped
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/22Lapping pads for working plane surfaces characterised by a multi-layered structure
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/26Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D11/00Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
    • B24D11/02Backings, e.g. foils, webs, mesh fabrics

Abstract

A polishing pad has a polishing layer and a backing layer secured to the polishing layer. The polishing layer has a polishing surface, a first thickness, a first compressibility, and a hardness between about 40 to 80 Shore D. The backing layer has a second thickness equal to or less than the first thickness and has a second compressibility greater than the first compressibility. The first thickness, first compressibility, second thickness and second compressibility are such that the polishing surface deflects more than the thickness non-uniformity of the polishing layer under an applied pressure of 1.5 psi or less.
PCT/US2006/002599 2005-01-26 2006-01-24 Multi-layer polishing pad for low-pressure polishing WO2006081286A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2007553196A JP2008528309A (en) 2005-01-26 2006-01-26 Multilayer polishing pad for low pressure polishing
CN2006800030867A CN101107095B (en) 2005-01-26 2006-01-26 Multi-layer polishing pad for low-pressure polishing

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/043,361 US8066552B2 (en) 2003-10-03 2005-01-26 Multi-layer polishing pad for low-pressure polishing
US11/043,361 2005-01-26

Publications (3)

Publication Number Publication Date
WO2006081286A2 WO2006081286A2 (en) 2006-08-03
WO2006081286A3 WO2006081286A3 (en) 2006-12-14
WO2006081286A8 true WO2006081286A8 (en) 2007-08-30

Family

ID=36499154

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2006/002599 WO2006081286A2 (en) 2005-01-26 2006-01-24 Multi-layer polishing pad for low-pressure polishing

Country Status (5)

Country Link
US (2) US8066552B2 (en)
JP (1) JP2008528309A (en)
CN (2) CN101143432B (en)
TW (1) TWI321141B (en)
WO (1) WO2006081286A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9156124B2 (en) 2010-07-08 2015-10-13 Nexplanar Corporation Soft polishing pad for polishing a semiconductor substrate

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1715980B1 (en) * 2004-02-17 2011-05-18 SKC Co., Ltd. Base pad polishing pad and multi-layer pad comprising the same
US7189156B2 (en) * 2004-08-25 2007-03-13 Jh Rhodes Company, Inc. Stacked polyurethane polishing pad and method of producing the same
US7261625B2 (en) * 2005-02-07 2007-08-28 Inoac Corporation Polishing pad
US20070128991A1 (en) * 2005-12-07 2007-06-07 Yoon Il-Young Fixed abrasive polishing pad, method of preparing the same, and chemical mechanical polishing apparatus including the same
US20070197145A1 (en) * 2006-02-15 2007-08-23 Applied Materials, Inc. Polishing article with window stripe
JP2007266052A (en) * 2006-03-27 2007-10-11 Nec Electronics Corp Polishing pad, cmp apparatus, and method of manufacturing polishing pad
US8087975B2 (en) * 2007-04-30 2012-01-03 San Fang Chemical Industry Co., Ltd. Composite sheet for mounting a workpiece and the method for making the same
WO2008154185A2 (en) * 2007-06-08 2008-12-18 Applied Materials, Inc. Thin polishing pad with window and molding process
TWI411495B (en) * 2007-08-16 2013-10-11 Cabot Microelectronics Corp Polishing pad
JP5436767B2 (en) * 2007-10-18 2014-03-05 ニッタ・ハース株式会社 Polishing pad
KR101577988B1 (en) * 2007-12-31 2015-12-16 에프엔에스테크 주식회사 Chemical-mechanical planarization pad
CN102089122A (en) * 2008-05-15 2011-06-08 3M创新有限公司 Polishing pad with endpoint window and systems and method using the same
JP5324962B2 (en) * 2009-03-03 2013-10-23 富士紡ホールディングス株式会社 Polishing pad
TWM367052U (en) * 2009-04-24 2009-10-21 Bestac Advanced Material Co Ltd Polishing pad and polishing device
US9056382B2 (en) * 2009-05-27 2015-06-16 Rogers Corporation Polishing pad, composition for the manufacture thereof, and method of making and using
US8524035B2 (en) * 2009-11-30 2013-09-03 Corning Incorporated Method and apparatus for conformable polishing
US9017140B2 (en) 2010-01-13 2015-04-28 Nexplanar Corporation CMP pad with local area transparency
JP5620141B2 (en) * 2010-04-15 2014-11-05 東洋ゴム工業株式会社 Polishing pad
TWI510328B (en) * 2010-05-03 2015-12-01 Iv Technologies Co Ltd Base layer, polishing pad including the same and polishing method
US20110287698A1 (en) * 2010-05-18 2011-11-24 Hitachi Global Storage Technologies Netherlands B.V. System, method and apparatus for elastomer pad for fabricating magnetic recording disks
TWI481470B (en) * 2010-10-13 2015-04-21 San Fang Chemical Industry Co A sheet for mounting a workpiece and a method for making the same
WO2012064886A1 (en) * 2010-11-09 2012-05-18 Applied Ft Composite Solutions Inc. Multi-layered composite cushioning material and method for making the same
MY166716A (en) * 2010-11-18 2018-07-18 Cabot Microelectronics Corp Polishing pad comprising transmissive region
CN102689270B (en) * 2011-03-22 2015-04-01 中芯国际集成电路制造(上海)有限公司 Fixed abrasive polishing pad and method for preparing same
JP5893479B2 (en) * 2011-04-21 2016-03-23 東洋ゴム工業株式会社 Laminated polishing pad
US8920219B2 (en) * 2011-07-15 2014-12-30 Nexplanar Corporation Polishing pad with alignment aperture
JP5789634B2 (en) * 2012-05-14 2015-10-07 株式会社荏原製作所 Polishing pad for polishing a workpiece, chemical mechanical polishing apparatus, and method for polishing a workpiece using the chemical mechanical polishing apparatus
US9597769B2 (en) * 2012-06-04 2017-03-21 Nexplanar Corporation Polishing pad with polishing surface layer having an aperture or opening above a transparent foundation layer
US9238296B2 (en) 2013-05-31 2016-01-19 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Multilayer chemical mechanical polishing pad stack with soft and conditionable polishing layer
US9238295B2 (en) 2013-05-31 2016-01-19 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Soft and conditionable chemical mechanical window polishing pad
US9233451B2 (en) 2013-05-31 2016-01-12 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Soft and conditionable chemical mechanical polishing pad stack
US9102034B2 (en) 2013-08-30 2015-08-11 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Method of chemical mechanical polishing a substrate
TWI556910B (en) * 2013-10-01 2016-11-11 三芳化學工業股份有限公司 Composite polishing pad and method for making the same
JP6399393B2 (en) * 2014-09-26 2018-10-03 富士紡ホールディングス株式会社 Polishing pad
KR20240015167A (en) * 2014-10-17 2024-02-02 어플라이드 머티어리얼스, 인코포레이티드 Cmp pad construction with composite material properties using additive manufacturing processes
US9868185B2 (en) * 2015-11-03 2018-01-16 Cabot Microelectronics Corporation Polishing pad with foundation layer and window attached thereto
CN105500183B (en) * 2015-11-26 2018-08-10 上海集成电路研发中心有限公司 A kind of grinding pad and its service life detection method
US10189143B2 (en) 2015-11-30 2019-01-29 Taiwan Semiconductor Manufacturing Company Limited Polishing pad, method for manufacturing polishing pad, and polishing method
US10213894B2 (en) * 2016-02-26 2019-02-26 Applied Materials, Inc. Method of placing window in thin polishing pad
KR101916119B1 (en) * 2017-02-06 2019-01-30 주식회사 리온에스엠아이 Polishing pad for chemical mechanical polishing
US10451564B2 (en) 2017-10-27 2019-10-22 Applied Materials, Inc. Empirical detection of lens aberration for diffraction-limited optical system
KR20200093925A (en) * 2019-01-29 2020-08-06 삼성전자주식회사 Recycled polishing pad
CN110003426B (en) * 2019-03-08 2021-05-25 合肥宏光研磨科技有限公司 Polyurethane sponge composite polishing disk
US20230090077A1 (en) * 2021-09-17 2023-03-23 Cmc Materials, Inc. Chemical mechanical planarization pad with a release liner comprising a pull tab

Family Cites Families (130)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3504457A (en) 1966-07-05 1970-04-07 Geoscience Instr Corp Polishing apparatus
US3499250A (en) 1967-04-07 1970-03-10 Geoscience Instr Corp Polishing apparatus
US4512113A (en) 1982-09-23 1985-04-23 Budinger William D Workpiece holder for polishing operation
US4839206A (en) * 1987-09-15 1989-06-13 Norton Company Double sided adhesive tape
US4927485A (en) 1988-07-28 1990-05-22 Applied Materials, Inc. Laser interferometer system for monitoring and controlling IC processing
US4879258A (en) 1988-08-31 1989-11-07 Texas Instruments Incorporated Integrated circuit planarization by mechanical polishing
US5020283A (en) 1990-01-22 1991-06-04 Micron Technology, Inc. Polishing pad with uniform abrasion
US5177908A (en) 1990-01-22 1993-01-12 Micron Technology, Inc. Polishing pad
US5257478A (en) 1990-03-22 1993-11-02 Rodel, Inc. Apparatus for interlayer planarization of semiconductor material
US5081796A (en) 1990-08-06 1992-01-21 Micron Technology, Inc. Method and apparatus for mechanical planarization and endpoint detection of a semiconductor wafer
US5196353A (en) 1992-01-03 1993-03-23 Micron Technology, Inc. Method for controlling a semiconductor (CMP) process by measuring a surface temperature and developing a thermal image of the wafer
US5499733A (en) 1992-09-17 1996-03-19 Luxtron Corporation Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment
US6614529B1 (en) 1992-12-28 2003-09-02 Applied Materials, Inc. In-situ real-time monitoring technique and apparatus for endpoint detection of thin films during chemical/mechanical polishing planarization
US5329734A (en) 1993-04-30 1994-07-19 Motorola, Inc. Polishing pads used to chemical-mechanical polish a semiconductor substrate
US5486129A (en) 1993-08-25 1996-01-23 Micron Technology, Inc. System and method for real-time control of semiconductor a wafer polishing, and a polishing head
WO1995006544A1 (en) 1993-09-01 1995-03-09 Speedfam Corporation Backing pad for machining operations
US5433651A (en) 1993-12-22 1995-07-18 International Business Machines Corporation In-situ endpoint detection and process monitoring method and apparatus for chemical-mechanical polishing
US5413941A (en) 1994-01-06 1995-05-09 Micron Technology, Inc. Optical end point detection methods in semiconductor planarizing polishing processes
US5489233A (en) 1994-04-08 1996-02-06 Rodel, Inc. Polishing pads and methods for their use
JP3313505B2 (en) 1994-04-14 2002-08-12 株式会社日立製作所 Polishing method
US5791969A (en) 1994-11-01 1998-08-11 Lund; Douglas E. System and method of automatically polishing semiconductor wafers
JPH08174411A (en) 1994-12-22 1996-07-09 Ebara Corp Polishing device
US6676717B1 (en) 1995-03-28 2004-01-13 Applied Materials Inc Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations
US6537133B1 (en) 1995-03-28 2003-03-25 Applied Materials, Inc. Method for in-situ endpoint detection for chemical mechanical polishing operations
US6719818B1 (en) 1995-03-28 2004-04-13 Applied Materials, Inc. Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations
US5893796A (en) 1995-03-28 1999-04-13 Applied Materials, Inc. Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus
US5964643A (en) 1995-03-28 1999-10-12 Applied Materials, Inc. Apparatus and method for in-situ monitoring of chemical mechanical polishing operations
US5559428A (en) 1995-04-10 1996-09-24 International Business Machines Corporation In-situ monitoring of the change in thickness of films
US5838447A (en) 1995-07-20 1998-11-17 Ebara Corporation Polishing apparatus including thickness or flatness detector
US5605760A (en) 1995-08-21 1997-02-25 Rodel, Inc. Polishing pads
US5738574A (en) 1995-10-27 1998-04-14 Applied Materials, Inc. Continuous processing system for chemical mechanical polishing
US6135856A (en) 1996-01-19 2000-10-24 Micron Technology, Inc. Apparatus and method for semiconductor planarization
US5663797A (en) 1996-05-16 1997-09-02 Micron Technology, Inc. Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers
US5872633A (en) 1996-07-26 1999-02-16 Speedfam Corporation Methods and apparatus for detecting removal of thin film layers during planarization
US6328642B1 (en) 1997-02-14 2001-12-11 Lam Research Corporation Integrated pad and belt for chemical mechanical polishing
US5807165A (en) 1997-03-26 1998-09-15 International Business Machines Corporation Method of electrochemical mechanical planarization
US5921855A (en) 1997-05-15 1999-07-13 Applied Materials, Inc. Polishing pad having a grooved pattern for use in a chemical mechanical polishing system
US6146248A (en) 1997-05-28 2000-11-14 Lam Research Corporation Method and apparatus for in-situ end-point detection and optimization of a chemical-mechanical polishing process using a linear polisher
US6033293A (en) 1997-10-08 2000-03-07 Lucent Technologies Inc. Apparatus for performing chemical-mechanical polishing
JPH11277408A (en) 1998-01-29 1999-10-12 Shin Etsu Handotai Co Ltd Cloth, method and device for polishing mirror finished surface of semi-conductor wafer
US6068539A (en) 1998-03-10 2000-05-30 Lam Research Corporation Wafer polishing device with movable window
US6210257B1 (en) 1998-05-29 2001-04-03 Micron Technology, Inc. Web-format polishing pads and methods for manufacturing and using web-format polishing pads in mechanical and chemical-mechanical planarization of microelectronic substrates
EP1108500B1 (en) 1998-08-28 2007-10-17 Toray Industries, Inc. Polishing pad
US6093085A (en) * 1998-09-08 2000-07-25 Advanced Micro Devices, Inc. Apparatuses and methods for polishing semiconductor wafers
US6159073A (en) 1998-11-02 2000-12-12 Applied Materials, Inc. Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing
US6206759B1 (en) 1998-11-30 2001-03-27 Micron Technology, Inc. Polishing pads and planarizing machines for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies, and methods for making and using such pads and machines
US6497800B1 (en) 2000-03-17 2002-12-24 Nutool Inc. Device providing electrical contact to the surface of a semiconductor workpiece during metal plating
US6422927B1 (en) 1998-12-30 2002-07-23 Applied Materials, Inc. Carrier head with controllable pressure and loading area for chemical mechanical polishing
CN1137013C (en) 1999-01-21 2004-02-04 罗德尔控股公司 Improved polishing pads and methods relating thereto
US6832950B2 (en) 2002-10-28 2004-12-21 Applied Materials, Inc. Polishing pad with window
US6179709B1 (en) 1999-02-04 2001-01-30 Applied Materials, Inc. In-situ monitoring of linear substrate polishing operations
KR100435246B1 (en) 1999-03-31 2004-06-11 가부시키가이샤 니콘 Polishing body, polisher, method for adjusting polisher, method for measuring thickness of polished film or end point of polishing, method for producing semiconductor device
US6217426B1 (en) 1999-04-06 2001-04-17 Applied Materials, Inc. CMP polishing pad
US6261168B1 (en) 1999-05-21 2001-07-17 Lam Research Corporation Chemical mechanical planarization or polishing pad with sections having varied groove patterns
US6776692B1 (en) 1999-07-09 2004-08-17 Applied Materials Inc. Closed-loop control of wafer polishing in a chemical mechanical polishing system
US6406591B1 (en) 1999-07-30 2002-06-18 Pitney Bowes Inc. Mailing machine including a stripper blade having a raise edge
US6331135B1 (en) 1999-08-31 2001-12-18 Micron Technology, Inc. Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates with metal compound abrasives
US6464576B1 (en) 1999-08-31 2002-10-15 Rodel Holdings Inc. Stacked polishing pad having sealed edge
US6406363B1 (en) 1999-08-31 2002-06-18 Lam Research Corporation Unsupported chemical mechanical polishing belt
US6524164B1 (en) 1999-09-14 2003-02-25 Applied Materials, Inc. Polishing pad with transparent window having reduced window leakage for a chemical mechanical polishing apparatus
US6358130B1 (en) 1999-09-29 2002-03-19 Rodel Holdings, Inc. Polishing pad
US6520843B1 (en) 1999-10-27 2003-02-18 Strasbaugh High planarity chemical mechanical planarization
US6551179B1 (en) 1999-11-05 2003-04-22 Strasbaugh Hard polishing pad for chemical mechanical planarization
US6497806B1 (en) 2000-04-25 2002-12-24 Nippon Denkai, Ltd. Method of producing a roughening-treated copper foil
US6399501B2 (en) 1999-12-13 2002-06-04 Applied Materials, Inc. Method and apparatus for detecting polishing endpoint with optical monitoring
US6638143B2 (en) 1999-12-22 2003-10-28 Applied Materials, Inc. Ion exchange materials for chemical mechanical polishing
US6626740B2 (en) 1999-12-23 2003-09-30 Rodel Holdings, Inc. Self-leveling pads and methods relating thereto
US6569004B1 (en) 1999-12-30 2003-05-27 Lam Research Polishing pad and method of manufacture
US6368184B1 (en) 2000-01-06 2002-04-09 Advanced Micro Devices, Inc. Apparatus for determining metal CMP endpoint using integrated polishing pad electrodes
US6630059B1 (en) 2000-01-14 2003-10-07 Nutool, Inc. Workpeice proximity plating apparatus
US7303662B2 (en) 2000-02-17 2007-12-04 Applied Materials, Inc. Contacts for electrochemical processing
US7374644B2 (en) 2000-02-17 2008-05-20 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US7678245B2 (en) 2000-02-17 2010-03-16 Applied Materials, Inc. Method and apparatus for electrochemical mechanical processing
US7059948B2 (en) 2000-12-22 2006-06-13 Applied Materials Articles for polishing semiconductor substrates
US20040020789A1 (en) 2000-02-17 2004-02-05 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US7125477B2 (en) 2000-02-17 2006-10-24 Applied Materials, Inc. Contacts for electrochemical processing
US6884153B2 (en) 2000-02-17 2005-04-26 Applied Materials, Inc. Apparatus for electrochemical processing
US7077721B2 (en) 2000-02-17 2006-07-18 Applied Materials, Inc. Pad assembly for electrochemical mechanical processing
US20030213703A1 (en) 2002-05-16 2003-11-20 Applied Materials, Inc. Method and apparatus for substrate polishing
US6979248B2 (en) 2002-05-07 2005-12-27 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US7066800B2 (en) 2000-02-17 2006-06-27 Applied Materials Inc. Conductive polishing article for electrochemical mechanical polishing
US6537144B1 (en) 2000-02-17 2003-03-25 Applied Materials, Inc. Method and apparatus for enhanced CMP using metals having reductive properties
US7029365B2 (en) 2000-02-17 2006-04-18 Applied Materials Inc. Pad assembly for electrochemical mechanical processing
US6962524B2 (en) 2000-02-17 2005-11-08 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US6991528B2 (en) 2000-02-17 2006-01-31 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US6797623B2 (en) 2000-03-09 2004-09-28 Sony Corporation Methods of producing and polishing semiconductor device and polishing apparatus
US6482307B2 (en) 2000-05-12 2002-11-19 Nutool, Inc. Method of and apparatus for making electrical contact to wafer surface for full-face electroplating or electropolishing
US6450868B1 (en) 2000-03-27 2002-09-17 Applied Materials, Inc. Carrier head with multi-part flexible membrane
US6428394B1 (en) 2000-03-31 2002-08-06 Lam Research Corporation Method and apparatus for chemical mechanical planarization and polishing of semiconductor wafers using a continuous polishing member feed
US6261959B1 (en) 2000-03-31 2001-07-17 Lam Research Corporation Method and apparatus for chemically-mechanically polishing semiconductor wafers
US6402591B1 (en) 2000-03-31 2002-06-11 Lam Research Corporation Planarization system for chemical-mechanical polishing
US6390891B1 (en) 2000-04-26 2002-05-21 Speedfam-Ipec Corporation Method and apparatus for improved stability chemical mechanical polishing
US6924641B1 (en) 2000-05-19 2005-08-02 Applied Materials, Inc. Method and apparatus for monitoring a metal layer during chemical mechanical polishing
US6878038B2 (en) 2000-07-10 2005-04-12 Applied Materials Inc. Combined eddy current sensing and optical monitoring for chemical mechanical polishing
US6857945B1 (en) 2000-07-25 2005-02-22 Applied Materials, Inc. Multi-chamber carrier head with a flexible membrane
US6602724B2 (en) 2000-07-27 2003-08-05 Applied Materials, Inc. Chemical mechanical polishing of a metal layer with polishing rate monitoring
US7112121B2 (en) 2000-08-30 2006-09-26 Micron Technology, Inc. Methods and apparatus for electrical, mechanical and/or chemical removal of conductive material from a microelectronic substrate
US6475332B1 (en) 2000-10-05 2002-11-05 Lam Research Corporation Interlocking chemical mechanical polishing system
CN1224499C (en) 2000-12-01 2005-10-26 东洋橡膠工业株式会社 Polishing pad, method of mfg. polishing pad, and cushion layer polishing pad
US6572463B1 (en) 2000-12-27 2003-06-03 Lam Research Corp. Methods for making reinforced wafer polishing pads utilizing direct casting and apparatuses implementing the same
US6561889B1 (en) 2000-12-27 2003-05-13 Lam Research Corporation Methods for making reinforced wafer polishing pads and apparatuses implementing the same
US6612917B2 (en) 2001-02-07 2003-09-02 3M Innovative Properties Company Abrasive article suitable for modifying a semiconductor wafer
US6736952B2 (en) 2001-02-12 2004-05-18 Speedfam-Ipec Corporation Method and apparatus for electrochemical planarization of a workpiece
US6632129B2 (en) 2001-02-15 2003-10-14 3M Innovative Properties Company Fixed abrasive article for use in modifying a semiconductor wafer
US6811680B2 (en) 2001-03-14 2004-11-02 Applied Materials Inc. Planarization of substrates using electrochemical mechanical polishing
US6517426B2 (en) * 2001-04-05 2003-02-11 Lam Research Corporation Composite polishing pad for chemical-mechanical polishing
JP2002307293A (en) * 2001-04-09 2002-10-23 Rodel Nitta Co Polishing cloth
US6572755B2 (en) 2001-04-11 2003-06-03 Speedfam-Ipec Corporation Method and apparatus for electrochemically depositing a material onto a workpiece surface
DE60228784D1 (en) 2001-04-25 2008-10-23 Jsr Corp Light-permeable polishing pad for a semiconductor loop
US6966816B2 (en) 2001-05-02 2005-11-22 Applied Materials, Inc. Integrated endpoint detection system with optical and eddy current monitoring
US6887136B2 (en) 2001-05-09 2005-05-03 Applied Materials, Inc. Apparatus and methods for multi-step chemical mechanical polishing
JP4570286B2 (en) 2001-07-03 2010-10-27 ニッタ・ハース株式会社 Polishing pad
US6790768B2 (en) 2001-07-11 2004-09-14 Applied Materials Inc. Methods and apparatus for polishing substrates comprising conductive and dielectric materials with reduced topographical defects
JP2003100682A (en) 2001-09-25 2003-04-04 Jsr Corp Polishing pad for semiconductor wafer
JP2003163191A (en) * 2001-11-28 2003-06-06 Tokyo Seimitsu Co Ltd Polishing pad for mechanochemical polishing device
US6802955B2 (en) 2002-01-11 2004-10-12 Speedfam-Ipec Corporation Method and apparatus for the electrochemical deposition and planarization of a material on a workpiece surface
US6913517B2 (en) 2002-05-23 2005-07-05 Cabot Microelectronics Corporation Microporous polishing pads
JP2004025407A (en) * 2002-06-27 2004-01-29 Jsr Corp Polishing pad for chemicomechanical polishing
JP2004074310A (en) * 2002-08-12 2004-03-11 Nikon Corp Polishing body, polishing device equipped therewith, semiconductor device manufacturing method using the same, and semiconductor device manufactured thereby
EP1542831A1 (en) 2002-09-25 2005-06-22 PPG Industries Ohio, Inc. Polishing pad for planarization
US7311862B2 (en) 2002-10-28 2007-12-25 Cabot Microelectronics Corporation Method for manufacturing microporous CMP materials having controlled pore size
TW592894B (en) 2002-11-19 2004-06-21 Iv Technologies Co Ltd Method of fabricating a polishing pad
US6960120B2 (en) 2003-02-10 2005-11-01 Cabot Microelectronics Corporation CMP pad with composite transparent window
US6884156B2 (en) * 2003-06-17 2005-04-26 Cabot Microelectronics Corporation Multi-layer polishing pad material for CMP
CN1565824A (en) * 2003-06-30 2005-01-19 智胜科技股份有限公司 Electroconductive grinding cushion and manufacturing method thereof
US20070015448A1 (en) 2003-08-07 2007-01-18 Ppg Industries Ohio, Inc. Polishing pad having edge surface treatment
US7264536B2 (en) 2003-09-23 2007-09-04 Applied Materials, Inc. Polishing pad with window
US7654885B2 (en) 2003-10-03 2010-02-02 Applied Materials, Inc. Multi-layer polishing pad
US20050173259A1 (en) 2004-02-06 2005-08-11 Applied Materials, Inc. Endpoint system for electro-chemical mechanical polishing
CN101022920A (en) 2004-05-13 2007-08-22 应用材料股份有限公司 Retaining ring with conductive portion

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9156124B2 (en) 2010-07-08 2015-10-13 Nexplanar Corporation Soft polishing pad for polishing a semiconductor substrate

Also Published As

Publication number Publication date
CN101107095B (en) 2011-07-20
CN101107095A (en) 2008-01-16
CN101143432B (en) 2011-09-21
CN101143432A (en) 2008-03-19
US20100267318A1 (en) 2010-10-21
WO2006081286A3 (en) 2006-12-14
JP2008528309A (en) 2008-07-31
WO2006081286A2 (en) 2006-08-03
TW200628518A (en) 2006-08-16
US8066552B2 (en) 2011-11-29
TWI321141B (en) 2010-03-01
US20050221723A1 (en) 2005-10-06

Similar Documents

Publication Publication Date Title
WO2006081286A3 (en) Multi-layer polishing pad for low-pressure polishing
WO2009041422A1 (en) Polishing pad
JP2007501716A5 (en)
TW200603946A (en) Polishing pad for electrochemical mechanical polishing
WO2008120578A1 (en) Metal film polishing pad and method for polishing metal film using the same
MX2009000576A (en) Backingless abrasive article.
TW200628262A (en) Polishing pad
TW200732088A (en) Multilayered polishing pads having improved defectivity and methods of manufacture
WO2009115192A3 (en) Ni-p layer system and process for its preparation
JP2008528309A5 (en)
MX2010001198A (en) Abrasive article with adhesion promoting layer.
TW200736654A (en) Optical laminated body
MY137517A (en) Polishing pad comprising hydrophobic region and endpoint detection port
TW200720021A (en) Self-contained conditioning abrasive article
WO2009137290A3 (en) 3-dimensional curved substrate lamination
WO2007118989A3 (en) Embossing device, such as a cylinder or a sleeve
WO2007082645A3 (en) Object comprising a relatively soft carrier material and a relatively hard decorative layer, and method for the production thereof
WO2005070059A3 (en) Layered support and method for laminating cmp pads
TW200738449A (en) Metallic laminate and method for preparing the same
TW200619364A (en) Slurry, chemical mechanical polishing method using the slurry, and method of forming metal wiring using the slurry
WO2008081561A1 (en) Perforated support plate
WO2009063899A1 (en) Shaft portion finishing device
WO2007008402A3 (en) Multi-layer diffusion medium substrate
MY127146A (en) Self-adhesive tape and method of use thereof
EP2189243A3 (en) Pressure shoe layer

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 200680003086.7

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application
WWE Wipo information: entry into national phase

Ref document number: 2007553196

Country of ref document: JP

122 Ep: pct application non-entry in european phase

Ref document number: 06719455

Country of ref document: EP

Kind code of ref document: A2