WO2007127861A3 - Wideband circuit characterization - Google Patents

Wideband circuit characterization Download PDF

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Publication number
WO2007127861A3
WO2007127861A3 PCT/US2007/067536 US2007067536W WO2007127861A3 WO 2007127861 A3 WO2007127861 A3 WO 2007127861A3 US 2007067536 W US2007067536 W US 2007067536W WO 2007127861 A3 WO2007127861 A3 WO 2007127861A3
Authority
WO
WIPO (PCT)
Prior art keywords
terms
circuit
corresponds
transfer function
wideband circuit
Prior art date
Application number
PCT/US2007/067536
Other languages
French (fr)
Other versions
WO2007127861A2 (en
Inventor
Aliazam Abbasfar
Amir Amirkhany
Jafar Savoj
Original Assignee
Rambus Inc
Univ Leland Stanford Junior
Aliazam Abbasfar
Amir Amirkhany
Jafar Savoj
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rambus Inc, Univ Leland Stanford Junior, Aliazam Abbasfar, Amir Amirkhany, Jafar Savoj filed Critical Rambus Inc
Publication of WO2007127861A2 publication Critical patent/WO2007127861A2/en
Publication of WO2007127861A3 publication Critical patent/WO2007127861A3/en

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/36—Circuit design at the analogue level
    • G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods

Abstract

In a method of characterizing a circuit, a test sequence is provided A response of the circuit to the test sequence is determined A transfer function that corresponds to the response is determined The transfer function is decomposed into a plurality of terms A respective term corresponds to an nth-order term in an expansion of at least 3rd order that corresponds to the transfer function A characteristic associated with the circuit is simulated using at least one of the terms in the plurality of terms Figure 1 is a block diagram illustrating an embodiment of a system.
PCT/US2007/067536 2006-04-28 2007-04-26 Wideband circuit characterization WO2007127861A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US79627606P 2006-04-28 2006-04-28
US60/796,276 2006-04-28

Publications (2)

Publication Number Publication Date
WO2007127861A2 WO2007127861A2 (en) 2007-11-08
WO2007127861A3 true WO2007127861A3 (en) 2008-07-17

Family

ID=38656385

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/067536 WO2007127861A2 (en) 2006-04-28 2007-04-26 Wideband circuit characterization

Country Status (1)

Country Link
WO (1) WO2007127861A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2932292B1 (en) * 2008-06-10 2011-02-25 Asygn METHOD FOR SIMULATING AN ELECTRONIC CIRCUIT COMPRISING AT LEAST ONE ANALOG PART WITH A SPECTRAL POWER DENSITY.

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040264615A1 (en) * 2003-05-20 2004-12-30 Andrew Ho Margin test methods and circuits
US6850871B1 (en) * 1999-10-18 2005-02-01 Agilent Technologies, Inc. Method and apparatus for extraction of nonlinear black-box behavioral models from embeddings of the time-domain measurements

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6850871B1 (en) * 1999-10-18 2005-02-01 Agilent Technologies, Inc. Method and apparatus for extraction of nonlinear black-box behavioral models from embeddings of the time-domain measurements
US20040264615A1 (en) * 2003-05-20 2004-12-30 Andrew Ho Margin test methods and circuits

Non-Patent Citations (8)

* Cited by examiner, † Cited by third party
Title
BELL D. ET AL.: "Modern Control Theory and computing", 1969, MCGRAW-HILL, pages: 138 - 163 *
DUMLUGOL D. ET AL.: "Analog Modeling Using Event-Driven HDL's", PROCEEDINGS OF THE SEVENTH INTERNATIONAL CONFERENCE ON VLSI DESIGN, 1994, pages 53 - 56, XP002152184 *
HARRIS F.J. ET AL.: "Digital receivers and transmitters using polyphase filter banks for wireless communications", IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, vol. 51, no. 4, April 2003 (2003-04-01), pages 1395 - 1412, XP001145344 *
LOYKA S.L.: "Method for nonlinear transfer function approximation", ELECTRONICS LETTERS, vol. 35, no. 10, May 1999 (1999-05-01), pages 789 - 791, XP006012129 *
NEITOLA M. ET AL.: "Design of a wideband transmit delta-sigma DAC", 8TH INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS, 2001, pages 1053 - 1056, XP010563172 *
SHEN Y. ET AL.: "On the implementation of AM/AM AM/PM behavioral models in system level simulation", ARFTG CONFERENCE DIGEST, June 2003 (2003-06-01), pages 111 - 115, XP032412922, DOI: doi:10.1109/ARFTGS.2003.1216874 *
SUNTER S.K. ET AL.: "A simplified polynomal-fitting algorithm for DAC and ADC BIST", PROCEEDINGS OF INTERNATIONAL TEST CONFERENCE, 1997, pages 389 - 395, XP000800335 *
VARMA A. ET AL.: "The development of a Macro-modeling tool to develop IBIS models", ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING, October 2003 (2003-10-01), pages 277 - 280, XP010671998 *

Also Published As

Publication number Publication date
WO2007127861A2 (en) 2007-11-08

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