WO2007134301A3 - Iterative memory cell charging based on reference cell value - Google Patents
Iterative memory cell charging based on reference cell value Download PDFInfo
- Publication number
- WO2007134301A3 WO2007134301A3 PCT/US2007/068903 US2007068903W WO2007134301A3 WO 2007134301 A3 WO2007134301 A3 WO 2007134301A3 US 2007068903 W US2007068903 W US 2007068903W WO 2007134301 A3 WO2007134301 A3 WO 2007134301A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- memory cell
- voltage level
- target voltage
- charging based
- data value
- Prior art date
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5628—Programming or writing circuits; Data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2211/00—Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C2211/56—Indexing scheme relating to G11C11/56 and sub-groups for features not covered by these groups
- G11C2211/562—Multilevel memory programming aspects
- G11C2211/5621—Multilevel programming verification
Abstract
Systems and methods, including computer software for writing (700) to a memory device include applying charge (730) to each of multiple memory cells for storage of a selected data value in each memory cell. The memory cells include a first reference memory cell (130a), and each data value is selected from a group of possible data values. Each possible data value has a corresponding target voltage level, and the first reference memory cell has a corresponding predetermined first reference target voltage level. The voltage level in the first reference memory cell is detected (735). A determination is made whether the voltage level in the first reference memory cell is less than the first reference target voltage level (740). Additional charge is applied to the memory cells (730) upon the determination that the voltage level in the first reference memory cell is less than the first reference target voltage.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
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US80035706P | 2006-05-15 | 2006-05-15 | |
US60/800,357 | 2006-05-15 | ||
US11/694,742 US7551486B2 (en) | 2006-05-15 | 2007-03-30 | Iterative memory cell charging based on reference cell value |
US11/694,742 | 2007-03-30 |
Publications (2)
Publication Number | Publication Date |
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WO2007134301A2 WO2007134301A2 (en) | 2007-11-22 |
WO2007134301A3 true WO2007134301A3 (en) | 2008-03-13 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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PCT/US2007/068903 WO2007134301A2 (en) | 2006-05-15 | 2007-05-14 | Iterative memory cell charging based on reference cell value |
Country Status (2)
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US (2) | US7551486B2 (en) |
WO (1) | WO2007134301A2 (en) |
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2009
- 2009-05-20 US US12/469,604 patent/US7859908B2/en not_active Expired - Fee Related
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Also Published As
Publication number | Publication date |
---|---|
US7551486B2 (en) | 2009-06-23 |
US7859908B2 (en) | 2010-12-28 |
WO2007134301A2 (en) | 2007-11-22 |
US20090237994A1 (en) | 2009-09-24 |
US20070263455A1 (en) | 2007-11-15 |
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