WO2008123432A1 - 測定により場を取得する装置および方法 - Google Patents

測定により場を取得する装置および方法 Download PDF

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Publication number
WO2008123432A1
WO2008123432A1 PCT/JP2008/056137 JP2008056137W WO2008123432A1 WO 2008123432 A1 WO2008123432 A1 WO 2008123432A1 JP 2008056137 W JP2008056137 W JP 2008056137W WO 2008123432 A1 WO2008123432 A1 WO 2008123432A1
Authority
WO
WIPO (PCT)
Prior art keywords
magnetic force
tertiary
expression
tertiary field
image
Prior art date
Application number
PCT/JP2008/056137
Other languages
English (en)
French (fr)
Inventor
Kenjiro Kimura
Kei Kobayashi
Hirofumi Yamada
Kazumi Matsushige
Takashi Horiuchi
Nobuo Satoh
Akifumi Nakai
Original Assignee
Kyoto University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyoto University filed Critical Kyoto University
Priority to JP2009509223A priority Critical patent/JP4878063B2/ja
Priority to US12/594,050 priority patent/US8536862B2/en
Priority to EP08739255A priority patent/EP2141481B1/en
Publication of WO2008123432A1 publication Critical patent/WO2008123432A1/ja

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/10—Plotting field distribution ; Measuring field distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/04—Display or data processing devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/50—MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/12—Measuring electrostatic fields or voltage-potential
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/0206—Three-component magnetometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/038—Measuring direction or magnitude of magnetic fields or magnetic flux using permanent magnets, e.g. balances, torsion devices
    • G01R33/0385—Measuring direction or magnitude of magnetic fields or magnetic flux using permanent magnets, e.g. balances, torsion devices in relation with magnetic force measurements

Abstract

　磁区を有する試料（９）の上方において、ＭＦＭを用いて測定面（９１）での磁気力の分布が磁気力画像として取得され、測定面（９１）から微小距離ｄだけ離れた測定面（９２）にて測定を行って補助磁気力画像が取得され、これらの差分を微小距離ｄで除算して磁気力勾配画像が取得される。磁気力画像および補助磁気力画像はフーリエ変換されてラプラス方程式の一般解から導かれる３次元場取得式に代入され、磁気力を示す３次元場が高精度に取得される。３次元場の取得により、試料（９）の表面９３における磁区の様子も高精度に得ることができる。３次元場取得式を利用する３次元場取得方法は、ラプラス方程式を満たす磁位、電位、温度、重力ポテンシャル等の様々な場に利用することができる。また、３次元場の取得は高次のｎ次元場の取得に拡張することができる。
PCT/JP2008/056137 2007-03-30 2008-03-28 測定により場を取得する装置および方法 WO2008123432A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009509223A JP4878063B2 (ja) 2007-03-30 2008-03-28 測定により場を取得する装置および方法
US12/594,050 US8536862B2 (en) 2007-03-30 2008-03-28 Apparatus and method of obtaining field by measurement
EP08739255A EP2141481B1 (en) 2007-03-30 2008-03-28 Device and method for acquiring a field by measurement

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007-091856 2007-03-30
JP2007091856 2007-03-30

Publications (1)

Publication Number Publication Date
WO2008123432A1 true WO2008123432A1 (ja) 2008-10-16

Family

ID=39830917

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/056137 WO2008123432A1 (ja) 2007-03-30 2008-03-28 測定により場を取得する装置および方法

Country Status (5)

Country Link
US (1) US8536862B2 (ja)
EP (1) EP2141481B1 (ja)
JP (1) JP4878063B2 (ja)
KR (1) KR101127682B1 (ja)
WO (1) WO2008123432A1 (ja)

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WO2011108543A1 (ja) 2010-03-01 2011-09-09 国立大学法人神戸大学 ポテンシャル取得装置、磁場顕微鏡、検査装置およびポテンシャル取得方法
JP2012110470A (ja) * 2010-11-24 2012-06-14 Kobe Univ 磁場分布取得装置
WO2012153496A1 (ja) 2011-05-09 2012-11-15 国立大学法人神戸大学 分布解析装置
WO2014129151A1 (ja) 2013-02-25 2014-08-28 国立大学法人神戸大学 分布解析装置および分布解析方法
CN105653880A (zh) * 2016-03-03 2016-06-08 南京邮电大学 一种基于心音的心脏发声场溯源方法
WO2017187791A1 (ja) * 2016-04-28 2017-11-02 国立大学法人神戸大学 計測装置および計測方法
US10254352B2 (en) 2014-03-12 2019-04-09 National University Corporation Kobe University Conductivity distribution derivation method and conductivity distribution derivation device
US11041826B2 (en) 2015-11-16 2021-06-22 National University Corporation Kobe University Observation method and observation device
CN113553743A (zh) * 2021-07-29 2021-10-26 西安西电变压器有限责任公司 一种变压器铁心接缝磁致伸缩特性等效计算方法和装置
JP2022063163A (ja) * 2020-10-09 2022-04-21 株式会社島津製作所 走査型プローブ顕微鏡
KR20220106132A (ko) 2019-11-28 2022-07-28 고쿠리츠다이가쿠호진 고베다이가쿠 외부장 응답 분포 가시화 장치 및 외부장 응답 분포 가시화 방법
WO2022190753A1 (ja) * 2021-03-09 2022-09-15 株式会社 Integral Geometry Science 検査装置及び検査方法
JP7457239B2 (ja) 2020-04-16 2024-03-28 日本製鉄株式会社 磁区構造の解析方法及び解析システム

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US8553517B2 (en) * 2002-10-14 2013-10-08 Samsung Electronics Co., Ltd. Magnetic medium using spin-polarized electrons and apparatus and method of recording data on the magnetic medium
US8593141B1 (en) 2009-11-24 2013-11-26 Hypres, Inc. Magnetic resonance system and method employing a digital squid
US8970217B1 (en) 2010-04-14 2015-03-03 Hypres, Inc. System and method for noise reduction in magnetic resonance imaging
US8726410B2 (en) * 2010-07-30 2014-05-13 The United States Of America As Represented By The Secretary Of The Air Force Atomic force microscopy system and method for nanoscale measurement
US9982525B2 (en) 2011-12-12 2018-05-29 Schlumberger Technology Corporation Utilization of dynamic downhole surveying measurements
US9273547B2 (en) * 2011-12-12 2016-03-01 Schlumberger Technology Corporation Dynamic borehole azimuth measurements
JP2014045869A (ja) * 2012-08-30 2014-03-17 Canon Inc 撮影装置、画像処理装置、及び画像処理方法
US9689934B2 (en) * 2013-02-26 2017-06-27 Mir Behrad KHAMESEE Method for providing force information in a magnetic field environment using remote measurement of flux
US10227864B2 (en) 2013-12-12 2019-03-12 Halliburton Energy Services, Inc. Magnetic monopole ranging system and methodology
WO2015100424A1 (en) * 2013-12-25 2015-07-02 Amber Precision Instruments, Inc. Emission source microscopy for electromagnetic interference applications
US10073057B2 (en) * 2016-06-14 2018-09-11 Universidad De Santiago De Chile Micro magnetic trap and process for evaluating forces with pico Newton resolution
US11051737B2 (en) * 2017-05-19 2021-07-06 Ricoh Company, Ltd. Biomagnetic measurement method, biomagnetic measuring device, and biomagnetic measuring system
CN111625952B (zh) * 2020-05-21 2022-08-16 中国石油大学(华东) 温度和应力三维分布检测方法、系统、存储介质
CN112730994B (zh) * 2020-12-22 2022-10-04 国网天津市电力公司电力科学研究院 基于matlab获取高压交流线路电场的方法及系统
CN113009242B (zh) * 2021-02-25 2022-10-04 西安理工大学 一种阵列式磁通门表面电势分布及衰减的测量装置及方法

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Cited By (24)

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Publication number Priority date Publication date Assignee Title
WO2011108543A1 (ja) 2010-03-01 2011-09-09 国立大学法人神戸大学 ポテンシャル取得装置、磁場顕微鏡、検査装置およびポテンシャル取得方法
JPWO2011108543A1 (ja) * 2010-03-01 2013-06-27 国立大学法人神戸大学 ポテンシャル取得装置、磁場顕微鏡、検査装置およびポテンシャル取得方法
KR101346523B1 (ko) 2010-03-01 2013-12-31 고쿠리츠다이가쿠호진 고베다이가쿠 포텐셜 취득 장치, 자장 현미경, 검사 장치 및 포텐셜 취득 방법
JP5713246B2 (ja) * 2010-03-01 2015-05-07 国立大学法人神戸大学 ポテンシャル取得装置、磁場顕微鏡、検査装置およびポテンシャル取得方法
JP2012110470A (ja) * 2010-11-24 2012-06-14 Kobe Univ 磁場分布取得装置
WO2012153496A1 (ja) 2011-05-09 2012-11-15 国立大学法人神戸大学 分布解析装置
US9568567B2 (en) 2011-05-09 2017-02-14 National University Corporation Kobe University Distribution analysis device
WO2014129151A1 (ja) 2013-02-25 2014-08-28 国立大学法人神戸大学 分布解析装置および分布解析方法
KR20150125931A (ko) 2013-02-25 2015-11-10 고쿠리츠다이가쿠호진 고베다이가쿠 분포 해석 장치 및 분포 해석 방법
US10295617B2 (en) 2013-02-25 2019-05-21 Kenjiro Kimura Distribution analyzing device and distribution analyzing method
US10254352B2 (en) 2014-03-12 2019-04-09 National University Corporation Kobe University Conductivity distribution derivation method and conductivity distribution derivation device
US11041826B2 (en) 2015-11-16 2021-06-22 National University Corporation Kobe University Observation method and observation device
US11422110B2 (en) 2015-11-16 2022-08-23 National University Corporation Kobe University Observation method and observation device
CN105653880A (zh) * 2016-03-03 2016-06-08 南京邮电大学 一种基于心音的心脏发声场溯源方法
US11366079B2 (en) 2016-04-28 2022-06-21 National University Corporation Kobe University Measurement device and measurement method
JPWO2017187791A1 (ja) * 2016-04-28 2019-02-28 国立大学法人神戸大学 計測装置および計測方法
WO2017187791A1 (ja) * 2016-04-28 2017-11-02 国立大学法人神戸大学 計測装置および計測方法
KR20220106132A (ko) 2019-11-28 2022-07-28 고쿠리츠다이가쿠호진 고베다이가쿠 외부장 응답 분포 가시화 장치 및 외부장 응답 분포 가시화 방법
JP7457239B2 (ja) 2020-04-16 2024-03-28 日本製鉄株式会社 磁区構造の解析方法及び解析システム
JP2022063163A (ja) * 2020-10-09 2022-04-21 株式会社島津製作所 走査型プローブ顕微鏡
JP7444017B2 (ja) 2020-10-09 2024-03-06 株式会社島津製作所 走査型プローブ顕微鏡
WO2022190753A1 (ja) * 2021-03-09 2022-09-15 株式会社 Integral Geometry Science 検査装置及び検査方法
CN113553743A (zh) * 2021-07-29 2021-10-26 西安西电变压器有限责任公司 一种变压器铁心接缝磁致伸缩特性等效计算方法和装置
CN113553743B (zh) * 2021-07-29 2023-08-11 西安西电变压器有限责任公司 一种变压器铁心接缝磁致伸缩特性等效计算方法和装置

Also Published As

Publication number Publication date
JPWO2008123432A1 (ja) 2010-07-15
US8536862B2 (en) 2013-09-17
KR101127682B1 (ko) 2012-06-05
JP4878063B2 (ja) 2012-02-15
US20100219819A1 (en) 2010-09-02
EP2141481B1 (en) 2012-05-23
EP2141481A1 (en) 2010-01-06
KR20090130369A (ko) 2009-12-23
EP2141481A4 (en) 2011-03-23

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