WO2008151266A3 - Interferometry for determining characteristics of an object surface, with spatially coherent illumination - Google Patents
Interferometry for determining characteristics of an object surface, with spatially coherent illumination Download PDFInfo
- Publication number
- WO2008151266A3 WO2008151266A3 PCT/US2008/065863 US2008065863W WO2008151266A3 WO 2008151266 A3 WO2008151266 A3 WO 2008151266A3 US 2008065863 W US2008065863 W US 2008065863W WO 2008151266 A3 WO2008151266 A3 WO 2008151266A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- test
- light
- spatially coherent
- interferometry
- object surface
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02041—Interferometers characterised by particular imaging or detection techniques
- G01B9/02043—Imaging of the Fourier or pupil or back focal plane, i.e. angle resolved imaging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02056—Passive reduction of errors
- G01B9/02057—Passive reduction of errors by using common path configuration, i.e. reference and object path almost entirely overlapping
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
- G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02083—Interferometers characterised by particular signal processing and presentation
- G01B9/02084—Processing in the Fourier or frequency domain when not imaged in the frequency domain
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02083—Interferometers characterised by particular signal processing and presentation
- G01B9/02088—Matching signals with a database
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Abstract
Disclosed is an apparatus which includes: an interferometer configured to direct broadband spatially coherent test light to a test surface of a test object over a range of illumination angles and subsequently combine it with reference light to form an interference pattern, the test and reference light being derived from a common source; a multi-element detector; and one or more optics configured to direct at least a portion of the combined light to the detector so that different elements of the detector correspond to different illumination angles of a region of the test surface illuminated by the test light.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US94200107P | 2007-06-05 | 2007-06-05 | |
US11/758,252 | 2007-06-05 | ||
US11/758,252 US7884947B2 (en) | 2005-01-20 | 2007-06-05 | Interferometry for determining characteristics of an object surface, with spatially coherent illumination |
US60/942,001 | 2007-06-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2008151266A2 WO2008151266A2 (en) | 2008-12-11 |
WO2008151266A3 true WO2008151266A3 (en) | 2010-01-14 |
Family
ID=40094417
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2008/065863 WO2008151266A2 (en) | 2007-06-05 | 2008-06-05 | Interferometry for determining characteristics of an object surface, with spatially coherent illumination |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2008151266A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8649024B2 (en) | 2010-12-03 | 2014-02-11 | Zygo Corporation | Non-contact surface characterization using modulated illumination |
WO2013105922A2 (en) * | 2011-12-12 | 2013-07-18 | Zygo Corporation | Non-contact surface characterization using modulated illumination |
US8896827B2 (en) | 2012-06-26 | 2014-11-25 | Kla-Tencor Corporation | Diode laser based broad band light sources for wafer inspection tools |
CN109828365B (en) * | 2019-02-25 | 2021-05-04 | 南京理工大学 | Mirau type super-resolution interference microscope objective |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020148955A1 (en) * | 2000-07-27 | 2002-10-17 | Hill Henry A. | Multiple-source arrays with optical transmission enhanced by resonant cavities |
US20040085544A1 (en) * | 2002-09-09 | 2004-05-06 | De Groot Peter J. | Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures |
US20050068540A1 (en) * | 2003-09-15 | 2005-03-31 | De Groot Peter J. | Triangulation methods and systems for profiling surfaces through a thin film coating |
US20050073692A1 (en) * | 2003-03-06 | 2005-04-07 | De Groot Peter J. | Profiling complex surface structures using scanning interferometry |
US20060072104A1 (en) * | 2003-06-12 | 2006-04-06 | Thomas Engel | Method for determining the image quality of an optical imaging system |
US20070091940A1 (en) * | 2005-10-11 | 2007-04-26 | Jameson Ralph S | Apparatus and method for generating short optical pulses |
-
2008
- 2008-06-05 WO PCT/US2008/065863 patent/WO2008151266A2/en active Application Filing
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020148955A1 (en) * | 2000-07-27 | 2002-10-17 | Hill Henry A. | Multiple-source arrays with optical transmission enhanced by resonant cavities |
US20040085544A1 (en) * | 2002-09-09 | 2004-05-06 | De Groot Peter J. | Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures |
US20050073692A1 (en) * | 2003-03-06 | 2005-04-07 | De Groot Peter J. | Profiling complex surface structures using scanning interferometry |
US20060072104A1 (en) * | 2003-06-12 | 2006-04-06 | Thomas Engel | Method for determining the image quality of an optical imaging system |
US20050068540A1 (en) * | 2003-09-15 | 2005-03-31 | De Groot Peter J. | Triangulation methods and systems for profiling surfaces through a thin film coating |
WO2005029192A2 (en) * | 2003-09-15 | 2005-03-31 | Zygo Corporation | Surface triangulation and profiling through a thin film coating |
US20070091940A1 (en) * | 2005-10-11 | 2007-04-26 | Jameson Ralph S | Apparatus and method for generating short optical pulses |
Also Published As
Publication number | Publication date |
---|---|
WO2008151266A2 (en) | 2008-12-11 |
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