WO2009108422A3 - Magnetic field sensor with automatic sensitivity adjustment - Google Patents
Magnetic field sensor with automatic sensitivity adjustment Download PDFInfo
- Publication number
- WO2009108422A3 WO2009108422A3 PCT/US2009/031776 US2009031776W WO2009108422A3 WO 2009108422 A3 WO2009108422 A3 WO 2009108422A3 US 2009031776 W US2009031776 W US 2009031776W WO 2009108422 A3 WO2009108422 A3 WO 2009108422A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- magnetic field
- feedback circuit
- arrangements
- sensing element
- field sensor
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
- G01R33/0041—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration using feed-back or modulation techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
Abstract
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020107019498A KR101518241B1 (en) | 2008-02-26 | 2009-01-23 | Magnetic field sensor with automatic sensitivity adjustment |
CN200980106535.4A CN101960319B (en) | 2008-02-26 | 2009-01-23 | Magnetic field sensor with automatic sensitivity adjustment |
DE112009000448T DE112009000448T5 (en) | 2008-02-26 | 2009-01-23 | Magnetic field sensor with automatic sensitivity adjustment |
JP2010547666A JP5769423B2 (en) | 2008-02-26 | 2009-01-23 | Magnetic field sensor with automatic sensitivity adjustment |
KR1020147033792A KR101556587B1 (en) | 2008-02-26 | 2009-01-23 | Magnetic field sensor with automatic sensitivity adjustment |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/037,393 US7923996B2 (en) | 2008-02-26 | 2008-02-26 | Magnetic field sensor with automatic sensitivity adjustment |
US12/037,393 | 2008-02-26 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2009108422A2 WO2009108422A2 (en) | 2009-09-03 |
WO2009108422A3 true WO2009108422A3 (en) | 2009-12-10 |
Family
ID=40790777
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2009/031776 WO2009108422A2 (en) | 2008-02-26 | 2009-01-23 | Magnetic field sensor with automatic sensitivity adjustment |
Country Status (6)
Country | Link |
---|---|
US (2) | US7923996B2 (en) |
JP (4) | JP5769423B2 (en) |
KR (2) | KR101518241B1 (en) |
CN (1) | CN101960319B (en) |
DE (1) | DE112009000448T5 (en) |
WO (1) | WO2009108422A2 (en) |
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US8818749B2 (en) | 2009-02-17 | 2014-08-26 | Allegro Microsystems, Llc | Circuits and methods for generating a self-test of a magnetic field sensor |
US9151807B2 (en) | 2009-02-17 | 2015-10-06 | Allegro Microsystems, Llc | Circuits and methods for generating a self-test of a magnetic field sensor |
US8680846B2 (en) | 2011-04-27 | 2014-03-25 | Allegro Microsystems, Llc | Circuits and methods for self-calibrating or self-testing a magnetic field sensor |
US9201122B2 (en) | 2012-02-16 | 2015-12-01 | Allegro Microsystems, Llc | Circuits and methods using adjustable feedback for self-calibrating or self-testing a magnetic field sensor with an adjustable time constant |
US9383425B2 (en) | 2012-12-28 | 2016-07-05 | Allegro Microsystems, Llc | Methods and apparatus for a current sensor having fault detection and self test functionality |
US11578997B1 (en) | 2021-08-24 | 2023-02-14 | Allegro Microsystems, Llc | Angle sensor using eddy currents |
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KR101556587B1 (en) | 2015-10-13 |
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US20090212765A1 (en) | 2009-08-27 |
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US20110074405A1 (en) | 2011-03-31 |
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CN101960319A (en) | 2011-01-26 |
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