WO2016069264A1 - Magnetic field sensor and electronic circuit that pass amplifier current through a magnetoresistance element - Google Patents

Magnetic field sensor and electronic circuit that pass amplifier current through a magnetoresistance element Download PDF

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Publication number
WO2016069264A1
WO2016069264A1 PCT/US2015/055474 US2015055474W WO2016069264A1 WO 2016069264 A1 WO2016069264 A1 WO 2016069264A1 US 2015055474 W US2015055474 W US 2015055474W WO 2016069264 A1 WO2016069264 A1 WO 2016069264A1
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Prior art keywords
node
transistor
voltage source
coupled
current passing
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PCT/US2015/055474
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French (fr)
Inventor
Mathew Drouin
Devon Fernandez
Jay M. Towne
Alejandro G. Milesi
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Allegro Microsystems, Llc
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Application filed by Allegro Microsystems, Llc filed Critical Allegro Microsystems, Llc
Priority to EP15787111.2A priority Critical patent/EP3213099B1/en
Priority to KR1020177014361A priority patent/KR102367569B1/en
Publication of WO2016069264A1 publication Critical patent/WO2016069264A1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/0023Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/028Electrodynamic magnetometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09Magnetoresistive devices

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)

Abstract

Electronic circuits used in magnetic field sensors use transistors for passing a current through the transistors and also through a magnetoresistance element.

Description

MAGNETIC FIELD SENSOR AND ELECTRONIC CIRCUIT
THAT PASS AMPLIFIER CURRENT THROUGH A MAGNETORESISTANCE ELEMENT
FIELD OF THE INVENTION
This invention relates generally to magnetic field sensors and, more particularly, to a magnetic field sensor, or an electronic circuit used therein, that pass an amplifier supply current through a magnetic field sensing element.
BACKGROUND
Magnetoresistance elements are known. A magnetoresistance element changes resistance in response to a magnetic field. Magnetic field sensors having electronic circuits coupled to the magnetoresistance element can inject a current into the
magnetoresistance element and use a voltage resulting across the magnetoresistance element as being representative of a sensed magnetic field.
Conventionally, the current used to drive the magnetoresistance element uses power.
It would be desirable to provide a magnetic field sensor and associated electronic circuit for which a magnetoresistance element requires no extra power beyond that which is otherwise used by the magnetic field sensor.
SUMMARY
The present invention provides a magnetic field sensor and associated electronic circuit for which a magnetoresistance element requires no extra power beyond that which is otherwise used by the magnetic field sensor.
In accordance with an example useful for understanding an aspect of the present invention, an electronic circuit includes a first magnetoresistance element having first and second terminals. The electronic circuit also includes a first transistor having a control node, a first current passing node, and a second current passing node. The electronic circuit also includes a first voltage source having first and second nodes between which a first voltage is generated. The first terminal of the first magnetoresistance element is coupled to the first current passing node of the first transistor. The first node of the first voltage source is coupled to the control node of the first transistor and the second node of the first voltage source is coupled to the second terminal of the first magnetoresistance element,. The electronic circuit is operable to generate a first current signal at the second current passing node of the first transistor related to a resistance value of the first magnetoresistance element.
In some embodiments, the above electronic circuit can include one or more of the following aspects, in any combination.
In some embodiments, the above electronic circuit further comprises a resistor having first and second terminals, the first terminal of the resistor coupled to the second current passing node of the first transistor, wherein the resistor is operable to pass the first current signal and convert the first current signal to a voltage signal at the second current passing node of the first transistor.
In some embodiments of the above electronic circuit, the first voltage source comprises a reference leg of a current mirror circuit. In some embodiments, the above electronic circuit further comprises a comparator coupled to the second current passing node of the first transistor for generating a two state output signal.
In some embodiments, the above electronic circuit further comprises:
a first resistor having first and second terminals;
a second transistor having a control node, a first current passing node, and a second current passing node;
a second voltage source having first and second nodes between which a second voltage is generated; and
a first load coupled to the second current passing node of the first transistor, wherein the second current passing node of the first transistor is coupled to the second current passing node of the second transistor, wherein the first terminal of the first resistor is coupled to the first current passing node of the second transistor, wherein the first node of the second voltage source is coupled to the control node of the second transistor and the second node of the second voltage source is coupled to the second terminal of the first resistor, wherein the electronic circuit is operable to generate a second current signal at the second current passing node of the second transistor related to a resistance value of the first resistor, wherein a current passing through the first load is equal to a difference between the first current signal and the second current signal.
In some embodiments of the above electronic circuit, the first transistor is an NPN bipolar transistor and the second transistor is a bipolar PNP transistor
In some embodiments of the above electronic circuit, the first transistor is a PNP bipolar transistor and the second transistor is an NPN bipolar transistor In some embodiments of the above electronic circuit, the first voltage source comprises a reference leg of a current mirror circuit.
In some embodiments, the above electronic circuit further comprises a comparator coupled to the second current passing node of the first transistor for generating a two state output signal.
In some embodiments, the above electronic circuit further comprises:
a second magnetoresistance element having first and second terminals;
a third transistor having a control node, and first current passing node, and a second current passing node;
a third voltage source having first and second nodes between which a third voltage is generated, wherein the first terminal of the second magnetoresistance element is coupled to the first current passing node of the third transistor, wherein the first node of the third voltage source is coupled to the control node of the third transistor and the second node of the third voltage source is coupled to the second terminal of the second magnetoresistance element, wherein the electronic circuit is operable to generate a third current signal at the second current passing node of the third transistor related to a resistance value of the second magnetoresistance element, wherein the electronic circuit further comprises: a second resistor having first and second terminals;
a fourth transistor having a control node, a first current passing node, and a second current passing node;
a fourth voltage source having first and second nodes between which a fourth voltage is generated; and
a second load coupled to the second current passing node of the third transistor, wherein the second current passing node of the third transistor is coupled to the second current passing node of the fourth transistor, wherein the first terminal of the second resistor is coupled to the first current passing node of the fourth transistor, wherein the first node of the fourth voltage source is coupled to the control node of the fourth transistor and the second node of the fourth voltage source is coupled to the second terminal of the second resistor, wherein the electronic circuit is operable to generate a fourth current signal at the second current passing node of the fourth transistor related to a resistance value of the second resistor, wherein a current passing through the second load is equal to a difference between the third current signal and the fourth current signal.
In some embodiments of the above electronic circuit, the first voltage source and the third voltage source are a same first common voltage source
In some embodiments of the above electronic circuit, the same first common voltage source comprises a reference leg of a current mirror circuit.
In some embodiments of the above electronic circuit, the second voltage source and the fourth voltage source are a same second common voltage source.
In some embodiments of the above electronic circuit, the same first common voltage source comprises a reference leg of a current mirror circuit and wherein the same second common voltage source comprises a common mode voltage detector circuit coupled to the first and second loads and configured to generate the first and third voltages as the same common-mode-related voltage related to a common mode voltage between the first and second loads. In some embodiments of the above electronic circuit, second voltage source and the fourth voltage source are a same common voltage source. In some embodiments of the above electronic circuit, the same common voltage source comprises a common mode voltage detector circuit coupled to the first and second loads and configured to generate the first and third voltages as the same common-mode- related voltage related to a common mode voltage between the first and second loads. In some embodiments, the above electronic circuit further comprises:
a second magnetoresistance element having first and second terminals;
a second transistor having a control node, a first current passing node, and a second current passing node;
a second voltage source having first and second nodes between which a second voltage is generated; and
a load coupled to the second current passing node of the first transistor, wherein the second current passing node of the first transistor is coupled to the second current passing node of the second transistor, wherein the first terminal of the second
magnetoresistance element is coupled to the first current passing node of the second transistor, wherein the first node of the second voltage source is coupled to the control node of the second transistor and the second node of the second voltage source is coupled to the second terminal of the second magnetoresistance element, wherein the electronic circuit is operable to generate a second current signal at the second current passing node of the second transistor related to a resistance value of the second magnetoresistance element, wherein a current passing through the load is equal to a difference between the first current signal and the second current signal.
In some embodiments of the above electronic circuit, the first voltage source comprises a reference leg of a current mirror circuit.
In some embodiments, the above electronic circuit further comprises:
a comparator coupled to the second current passing node of the first transistor for generating a two state output signal.
In some embodiments, the above electronic circuit further comprises:
a third magnetoresistance element having first and second terminals;
a third transistor having a control node, and first current passing node, and a second current passing node;
a third voltage source having first and second nodes between which a third voltage is generated, wherein the first terminal of the third magnetoresistance element is coupled to the first current passing node of the third transistor, wherein the first node of the third voltage source is coupled to the control node of the third transistor and the second node of the third voltage source is coupled to the second terminal of the third magnetoresistance element, wherein the electronic circuit is operable to generate a third current signal at the second current passing node of the third transistor related to a resistance value of the third magnetoresistance element, wherein the electronic circuit further comprises:
a fourth magnetoresistance element having first and second terminals;
a fourth transistor having a control node, a first current passing node, and a second current passing node;
a fourth voltage source having first and second nodes between which a fourth voltage is generated; and
a second load coupled to the second current passing node of the third transistor, wherein the second current passing node of the third transistor is coupled to the second current passing node of the fourth transistor, wherein the first terminal of the fourth magnetoresistance element is coupled to the first current passing node of the fourth transistor, wherein the first node of the fourth voltage source is coupled to the control node of the fourth transistor and the second node of the fourth voltage source is coupled to the second terminal of the fourth magnetoresistance element, wherein the electronic circuit is operable to generate a fourth current signal at the second current passing node of the fourth transistor related to a resistance value of the fourth magnetoresistance element, wherein a current passing through the second load is equal to a difference between the third current signal and the fourth current signal.
In some embodiments of the above electronic circuit, the first voltage source and the third voltage source are a same first common voltage source.
In some embodiments of the above electronic circuit, the same first common voltage source comprises a reference leg of a current mirror circuit.
In some embodiments of the above electronic circuit, the second voltage source and the fourth voltage source are a same second common voltage source.
In some embodiments of the above electronic circuit, the same first common voltage source comprises a reference leg of a current mirror circuit and wherein the same second common voltage source comprises a common mode voltage detector circuit coupled to the first and second loads and configured to generate the first and third voltages as the same common-mode-related voltage related to a common mode voltage between the first and second loads.
In some embodiments of the above electronic circuit, the second voltage source and the fourth voltage source are a same common voltage source.
In some embodiments of the above electronic circuit, the same common voltage source comprises a common mode voltage detector circuit coupled to the first and second loads and configured to generate the first and third voltages as the same common-mode- related voltage related to a common mode voltage between the first and second loads.
In accordance with another example useful for understanding an aspect of the present invention, a magnetic field sensor includes a substrate and an electronic circuit disposed upon the substrate. The electronic circuit includes a first magnetoresi stance element having first and second terminals. The electronic circuit further includes a first transistor having a control node, a first current passing node, and a second current passing node. The electronic circuit further includes a first voltage source having first and second nodes between which a first voltage is generated, wherein the first terminal of the first magnetoresistance element is coupled to the first current passing node of the first transistor, and wherein the first node of the first voltage source is coupled to the control node of the first transistor and the second node of the first voltage source is coupled to the second terminal of the first magnetoresistance element. The electronic circuit is operable to generate a first current signal at the second current passing node of the first transistor related to a resistance value of the first magnetoresistance element. The electronic circuit further includes a second magnetoresistance element having first and second terminals and a second transistor having a control node, a first current passing node, and a second current passing node. The electronic circuit further includes a second voltage source having first and second nodes between which a second voltage is generated. The electronic circuit further includes a load coupled to the second current passing node of the first transistor, wherein the second current passing node of the first transistor is coupled to the second current passing node of the second transistor. The first terminal of the second magnetoresistance element is coupled to the first current passing node of the second transistor. The first node of the second voltage source is coupled to the control node of the second transistor and the second node of the second voltage source is coupled to the second terminal of the second magnetoresistance element. The electronic circuit is operable to generate a second current signal at the second current passing node of the second transistor related to a resistance value of the second magnetoresistance element, wherein a current passing through the load is equal to a difference between the first current signal and the second current signal.
In some embodiments, the above magnetic field sensor can include one or more of the following aspects, in any combination.
In some embodiments of the above magnetic field sensor, the first voltage source comprises a reference leg of a current mirror circuit.
In some embodiments, the above magnetic field sensor further comprises a comparator coupled to the second current passing node of the first transistor for generating a two state output signal.
In accordance with another example useful for understanding an aspect of the present invention, a magnetic field sensor includes a substrate and an electronic circuit disposed upon the substrate. The electronic circuit includes a first magnetoresistance element having first and second terminals and a first transistor having a control node, and first current passing node, and a second current passing node. The electronic circuit further includes a first voltage source having first and second nodes between which a first voltage is generated. The first terminal of the first magnetoresistance element is coupled to the first current passing node of the first transistor. The first node of the first voltage source is coupled to the control node of the first transistor and the second node of the first voltage source is coupled to the second terminal of the first magnetoresistance element. The electronic circuit is operable to generate a first current signal at the second current passing node of the first transistor related to a resistance value of the first
magnetoresistance element. The electronic circuit further includes a second
magnetoresistance element having first and second terminals and a second transistor having a control node, a first current passing node, and a second current passing node. The electronic circuit further includes a second voltage source having first and second nodes between which a second voltage is generated. The electronic circuit further includes a load coupled to the second current passing node of the first transistor. The second current passing node of the first transistor is coupled to the second current passing node of the second transistor. The first terminal of the second magnetoresistance element is coupled to the first current passing node of the second transistor. The first node of the second voltage source is coupled to the control node of the second transistor and the second node of the second voltage source is coupled to the second terminal of the second magnetoresistance element. The electronic circuit is operable to generate a second current signal at the second current passing node of the second transistor related to a resistance value of the second magnetoresistance element. A current passing through the load is equal to a difference between the first current signal and the second current signal. The electronic circuit further includes a third magnetoresistance element having first and second terminals and a third transistor having a control node, and first current passing node, and a second current passing node. The electronic circuit further includes a third voltage source having first and second nodes between which a third voltage is generated. The first terminal of the third magnetoresistance element is coupled to the first current passing node of the third transistor. The first node of the third voltage source is coupled to the control node of the third transistor and the second node of the third voltage source is coupled to the second terminal of the third magnetoresistance element. The electronic circuit is operable to generate a third current signal at the second current passing node of the third transistor related to a resistance value of the third magnetoresistance element. The electronic circuit further includes a fourth magnetoresistance element having first and second terminals and a fourth transistor having a control node, a first current passing node, and a second current passing node. The electronic circuit further includes a fourth voltage source having first and second nodes between which a fourth voltage is generated. The electronic circuit further includes a second load coupled to the second current passing node of the third transistor. The second current passing node of the third transistor is coupled to the second current passing node of the fourth transistor. The first terminal of the fourth magnetoresistance element is coupled to the first current passing node of the fourth transistor. The first node of the fourth voltage source is coupled to the control node of the fourth transistor and the second node of the fourth voltage source is coupled to the second terminal of the fourth magnetoresistance element. The electronic circuit is operable to generate a fourth current signal at the second current passing node of the fourth transistor related to a resistance value of the fourth magnetoresistance element, wherein a current passing through the second load is equal to a difference between the third current signal and the fourth current signal. In some embodiments, the above magnetic field sensor can include one or more of the following aspects, in any combination.
In some embodiments of the above magnetic field sensor, the first voltage source and the third voltage source are a same first common voltage source.
In some embodiments of the above magnetic field sensor, the same first common voltage source comprises a reference leg of a current mirror circuit.
In some embodiments of the above magnetic field sensor, the second voltage source and the fourth voltage source are a same second common voltage source.
In some embodiments of the above magnetic field sensor, the same first common voltage source comprises a reference leg of a current mirror circuit and wherein the same second common voltage source comprises a common mode voltage detector circuit coupled to the first and second loads and configured to generate the first and third voltages as the same common-mode-related voltage related to a common mode voltage between the first and second loads.
In some embodiments of the above magnetic field sensor, the second voltage source and the fourth voltage source are a same common voltage source. In some embodiments of the above magnetic field sensor, the same common voltage source comprises a common mode voltage detector circuit coupled to the first and second loads and configured to generate the first and third voltages as the same common- mode-related voltage related to a common mode voltage between the first and second loads.
In some embodiments of the above magnetic field sensor, the electronic circuit further comprises:
a fifth magnetoresistance element having first and second terminals;
a fifth transistor having a control node, and first current passing node, and a second current passing node;
a fifth voltage source having first and second nodes between which a first voltage is generated, wherein the first terminal of the fifth magnetoresistance element is coupled to the first current passing node of the fifth transistor, wherein the first node of the fifth voltage source is coupled to the control node of the fifth transistor and the second node of the fifth voltage source is coupled to the second terminal of the fifth magnetoresistance element, wherein the electronic circuit is operable to generate a first current signal at the second current passing node of the fifth transistor related to a resistance value of the fifth magnetoresistance element, wherein the electronic circuit further comprises:
a sixth magnetoresistance element having first and second terminals;
a sixth transistor having a control node, an first current passing node, and a second current passing node; and a sixth voltage source having first and second nodes between which a second voltage is generated; a load coupled to the second current passing node of the fifth transistor, wherein the second current passing node of the fifth transistor is coupled to the second current passing node of the sixth transistor, wherein the first terminal of the sixth magnetoresistance element is coupled to the first current passing node of the sixth transistor, wherein the first node of the sixth voltage source is coupled to the control node of the sixth transistor and the second node of the sixth voltage source is coupled to the second terminal of the sixth
magnetoresistance element, wherein the electronic circuit is operable to generate a second current signal at the second current passing node of the sixth transistor related to a resistance value of the sixth magnetoresistance element, wherein a current passing through the load is equal to a difference between the first current signal and the second current signal, wherein the electronic circuit further comprises:
a seventh magnetoresistance element having first and second terminals; a seventh transistor having a control node, and first current passing node, and a second current passing node; and
a seventh voltage source having first and second nodes between which a third voltage is generated, wherein the first terminal of the seventh
magnetoresistance element is coupled to the first current passing node of the seventh transistor, wherein the first node of the seventh voltage source is coupled to the control node of the seventh transistor and the second node of the seventh voltage source is coupled to the second terminal of the seventh magnetoresistance element, wherein the electronic circuit is operable to generate a third current signal at the second current passing node of the seventh transistor related to a resistance value of the seventh magnetoresistance element, wherein the electronic circuit further comprises:
an eighth magnetoresistance element having first and second terminals; an eighth transistor having a control node, a first current passing node, and a second current passing node;
an eighth voltage source having first and second nodes between which a fourth voltage is generated; and a second load coupled to the second current passing node of the seventh transistor, wherein the second current passing node of the seventh transistor is coupled to the second current passing node of the eighth transistor, wherein the first terminal of the eighth magnetoresistance element is coupled to the first current passing node of the eighth transistor, wherein the first node of the eighth voltage source is coupled to the control node of the eighth transistor and the second node of the eighth voltage source is coupled to the second terminal of the eighth magnetoresistance element, wherein the electronic circuit is operable to generate a fourth current signal at the second current passing node of the eighth transistor related to a resistance value of the eighth magnetoresistance element, wherein a current passing through the second load is equal to a difference between the third current signal and the fourth current signal.
In some embodiments of the above magnetic field sensor, the first voltage source, the third voltage source, the fifth voltage source, and the seventh voltage source are a same first common voltage source, the second voltage source and the fourth voltage source are the same second common voltage source, and the sixth and the eight voltage source are the same third common voltage source.
BRIEF DESCRIPTION OF THE DRAWINGS
The foregoing features of the invention, as well as the invention itself may be more fully understood from the following detailed description of the drawings, in which: FIG. 1 is a schematic diagram of an example of an electronic circuit as may be used in a magnetic field sensor, and which has or is otherwise coupled to one
magnetoresistance element;
FIG. 2 is a schematic diagram of another example of an electronic circuit as may be used in another magnetic field sensor, and which has or is otherwise coupled to one magnetoresistance element; FIG. 3 is a schematic diagram of another example of an electronic circuit as may be used in another magnetic field sensor, and which has or is otherwise coupled to one magnetoresistance element;
FIG. 4 is a schematic diagram of another example of an electronic circuit as may be used in another magnetic field sensor, and which has or is otherwise coupled to one magnetoresistance element;
FIG. 5 is a schematic diagram of another example of an electronic circuit as may be used in another magnetic field sensor, and which has or is otherwise coupled to one magnetoresistance element;
FIG. 6 is a schematic diagram of an example of another electronic circuit as may be used in another magnetic field sensor, and which has or is otherwise coupled to one magnetoresistance element;
FIG. 7 is a schematic diagram of an example of another electronic circuit as may be used in another magnetic field sensor, and which has or is otherwise coupled to two magnetoresistance elements;
FIG. 8 is a schematic diagram of an example of another electronic circuit as may be used in another magnetic field sensor, and which has or is otherwise coupled to two magnetoresistance elements;
FIG. 9 is a block diagram of a magnetic field sensor having a substrate with two magnetoresistance elements disposed thereon, the substrate disposed proximate to a ferromagnetic target object having ferromagnetic target object features;
FIG. 10 is a schematic diagram of an example of another electronic circuit as may be used in another magnetic field sensor, and which has or is otherwise coupled to four magnetoresistance elements;
FIG. 1 1 is a schematic diagram of an example of another electronic circuit as may be used in another magnetic field sensor, and which has or is otherwise coupled to four magnetoresistance elements;
FIG. 12 is a schematic diagram of an example of another electronic circuit as may be used in another magnetic field sensor, and which has or is otherwise coupled to four magnetoresistance elements; FIG. 13 is a block diagram of a magnetic field sensor having a substrate with four magnetoresistance elements disposed thereon, the substrate disposed proximate to a ferromagnetic target object having ferromagnetic target object features;
FIG. 14 is a schematic diagram of an example of another electronic circuit as may be used in another magnetic field sensor, and which has or is otherwise coupled to eight magnetoresistance elements;
FIG. 15 is a block diagram of a magnetic field sensor having a substrate with eight magnetoresistance elements disposed thereon, the substrate disposed proximate to a ferromagnetic target object having ferromagnetic target object features;
FIG. 16 is a schematic diagram of an example of another electronic circuit as may be used in another magnetic field sensor, and which has or is otherwise coupled to four magnetoresistance elements; and
FIG. 17 is a schematic diagram of an example of another electronic circuit as may be used in another magnetic field sensor, and which has or is otherwise coupled to four magnetoresistance elements.
DETAILED DESCRIPTION
As used herein, the term "magnetic field sensing element" is used to describe a variety of electronic elements that can sense a magnetic field. The magnetic field sensing element can be, but is not limited to, a Hall effect element, a magnetoresistance element, or a magnetotransistor. As is known, there are different types of Hall effect elements, for example, a planar Hall element, a vertical Hall element, and a Circular Vertical Hall (CVH) element. As is also known, there are different types of magnetoresistance elements, for example, a semiconductor magnetoresistance element such as Indium Antimonide (InSb), a giant magnetoresistance (GMR) element, for example, a spin valve, an anisotropic magnetoresistance element (AMR), a tunneling magnetoresistance (TMR) element, and a magnetic tunnel junction (MTJ). The magnetic field sensing element may be a single element or, alternatively, may include two or more magnetic field sensing elements arranged in various configurations, e.g., a half bridge or full (Wheatstone) bridge. Depending on the device type and other application requirements, the magnetic field sensing element may be a device made of a type IV semiconductor material such as Silicon (Si) or Germanium (Ge), or a type III-V semiconductor material like Gallium- Arsenide (GaAs) or an Indium compound, e.g., Indium-Antimonide (InSb).
As is known, some of the above-described magnetic field sensing elements tend to have an axis of maximum sensitivity parallel to a substrate that supports the magnetic field sensing element, and others of the above-described magnetic field sensing elements tend to have an axis of maximum sensitivity perpendicular to a substrate that supports the magnetic field sensing element. In particular, planar Hall elements tend to have axes of sensitivity perpendicular to a substrate, while metal based or metallic magnetoresistance elements (e.g., GMR, TMR, AMR) and vertical Hall elements tend to have axes of sensitivity parallel to a substrate.
As used herein, the term "magnetic field sensor" is used to describe a circuit that uses a magnetic field sensing element, generally in combination with other circuits.
Magnetic field sensors are used in a variety of applications, including, but not limited to, an angle sensor that senses an angle of a direction of a magnetic field, a current sensor that senses a magnetic field generated by a current carried by a current-carrying conductor, a magnetic switch that senses the proximity of a ferromagnetic object, a rotation detector that senses passing ferromagnetic articles, for example, magnetic domains of a ring magnet or a ferromagnetic target (e.g., gear teeth) where the magnetic field sensor is used in combination with a back-biased or other magnet, and a magnetic field sensor that senses a magnetic field density of a magnetic field.
As used herein, the term "processor" is used to describe an electronic circuit that performs a function, an operation, or a sequence of operations. The function, operation, or sequence of operations can be hard coded into the electronic circuit or soft coded by way of instructions held in a memory device. A "processor" can perform the function, operation, or sequence of operations using digital values or using analog signals.
In some embodiments, the "processor" can be embodied in an application specific integrated circuit (ASIC), which can be an analog ASIC or a digital ASIC. In some embodiments, the "processor" can be embodied in a microprocessor with associated program memory. In some embodiments, the "processor" can be embodied in a discrete electronic circuit, which can be an analog or digital. As used herein, the term "module" is used to describe a "processor."
A processor can contain internal processors or internal modules that perform portions of the function, operation, or sequence of operations of the processor. Similarly, a module can contain internal processors or internal modules that perform portions of the function, operation, or sequence of operations of the module.
As used herein, the term "predetermined," when referring to a value or signal, is used to refer to a value or signal that is set, or fixed, in the factory at the time of manufacture, or by external means, e.g., programming, thereafter. As used herein, the term "determined," when referring to a value or signal, is used to refer to a value or signal that is identified by a circuit during operation, after manufacture.
As used herein, the term "active electronic component" is used to describe and electronic component that has at least one p-n junction. A transistor, a diode, and a logic gate are examples of active electronic components. In contrast, as used herein, the term "passive electronic component" as used to describe an electronic component that does not have at least one p-n junction. A capacitor and a resistor are examples of passive electronic components.
While electronic circuit shown in figures herein may be shown in the form of analog blocks or digital blocks, it will be understood that the analog blocks can be replaced by digital blocks that perform the same or similar functions and the digital blocks can be replaced by analog blocks that perform the same or similar functions.
Both bipolar junction transistors (BJTs) (or more simply, bipolar transistors) and field effect transistors (FETs) are used in examples herein. It should be understood that, for a bipolar transistor, most of the current flowing through the bipolar transistor flows between a collector terminal and an emitter terminal. Similarly, it should be understood that, for a field effect transistor, most of the current flowing through the field effect transistor flows between a drain terminal and a source terminal. Therefore, for bipolar transistors, the collector terminal and the emitter terminal are both sometimes referred to herein as "current passing terminals." Similarly, for field effect transistors, the drain terminal and the source terminal are also both sometimes referred to herein as "current passing terminals."
It should be also understood that the current flowing through a bipolar transistor is controlled by a current at a base terminal. Similarly, it should be understood that the current flowing through a field effect transistor is controlled by a voltage at a gate terminal. Thus, for bipolar transistors, the base terminal is sometimes referred to herein as a "control terminal." Similarly, for field effect transistors, the gate terminal is sometimes also referred to herein as a "control terminal."
Both current sources and current sinks are described herein. As used herein, the term "current generator" is used to describe either a current source or a current sink.
Referring to FIG. 1 , an example of an electronic circuit 100 can be used in a magnetic field sensor. The electronic circuit 100 can include a fixed resistor 106 having first and second terminals, wherein the first terminal of the resistor 106 is coupled to receive a voltage 102 and the second terminal of the resistor 106 is coupled to an emitter of a PNP bipolar transistor 108.
The electronic circuit 100 can include a voltage source 104 having first and second terminals, wherein the first terminal of the voltage source 104 is coupled to receive the voltage 102 and the second terminal of the voltage source 104 is coupled to a base of the PNP bipolar transistor 108.
The electronic circuit 100 can also include a magnetoresistance element 1 10 having first and second terminals, wherein the first terminal of the magnetoresistance element 110 is coupled to a collector of the PNP bipolar transistor 108 and the second terminal of the magnetoresistance element 1 10 is coupled to a voltage reference, for example, a ground voltage. An output voltage 1 12 can be generated at the collector of the PNP bipolar transistor 108.
In some embodiments, the electronic circuit 100 can include a comparator 1 14 having first and second input terminals, wherein a first input terminal of the comparator 1 14 is coupled to the collector of the PNP bipolar transistor 108 and the second input terminal of the comparator 1 14 is coupled to receive a threshold voltage 1 16. The comparator 114 can be configured to generate a comparison signal 118. The comparison signal 1 18 can have two states.
It will be understood that, for embodiments here and below that use a comparator, the associated electronic circuits form an electronic switch, wherein a state of the comparison signal 1 18 is determined by a strength of a magnetic field experienced by the magnetoresistance element 1 10. It should also be understood that embodiments shown below that are not shown to include a comparator can be adapted to use a comparator to provide an electronic switch.
It should be appreciated that the voltage source 104, the resistor 106, and the PNP bipolar transistor 108 form a current source operable to provide a fixed current, I, to the magnetoresistance element 1 10. Thus, the output voltage 112 is generated according to the following relationships. In this and in all equations that follow in conjunction with other figures below, a base current of bipolar transistors is relatively small and is disregarded. Vout = I x A
= (V-Vbe)/R x A (1) where:
V = voltage of voltage source 204
R = resistance of resistor 106
A = resistance of the magnetoresistance element 1 10
Vbe = base emitter voltage of PNP bipolar transistor 108 = approx. 0.7 volts In the electronic circuit 100, it should be appreciated that the same current, I. flows through the PNP bipolar transistor 108 and through the magnetoresistance element 1 10.
Referring now to FIG. 2, another example of an electronic circuit 200 can be used in another magnetic field sensor. The electronic circuit 200 can include a
magnetoresistance element 206 having first and second terminals, wherein the first terminal of the magnetoresistance element 206 is coupled to receive a voltage 202 and the second terminal of the magnetoresistance element 206 is coupled to an emitter of a PNP bipolar transistor 208.
The electronic circuit 200 can include a voltage source 204 having first and second terminals, wherein the first terminal of the voltage source 204 is coupled to receive the voltage 202 and the second terminal of the voltage source 104 is coupled to a base of the PNP bipolar transistor 208.
The electronic circuit 200 can include a resistor 210 having first and second terminals, wherein the first terminal of the resistor 210 is coupled to a collector of the PNP bipolar transistor 208 and the second terminal of the resistor 210 is coupled to a voltage reference, for example, a ground voltage.
An output voltage 212 can be generated at the collector of the PNP bipolar transistor 208. In some embodiments, the electronic circuit 200 can include a comparator 214 having first and second input terminals, wherein a first input terminal of the comparator 214 is coupled to the collector of the PNP bipolar transistor 208 and the second input terminal of the comparator 214 is coupled to receive a threshold voltage 216. The comparator 214 can be configured to generate a comparison signal 218.
It should be appreciated that the voltage source 204, the magnetoresistance element 206, and the PNP bipolar transistor 208 form a variable current source operable to provide a variable current, I, to the resistor 110. The variable current, I, varies in accordance with a variable resistance of the magnetoresistance element 206, which varies in accordance with a sensed magnetic field. Thus, the output voltage 112 is generated according to the following:
Vout = I x R
= (V-Vbe)/A x R (2) where:
V = voltage of voltage source 204
R = resistance of resistor 210
A = resistance of the magnetoresistance element 206
Vbe = base emitter voltage of PNP bipolar transistor 208 = approx. 0.7 volts In the electronic circuit 200, it should be appreciated that the same current, I, flows through the PNP bipolar transistor 208 and through the magnetoresistance element 206.
Referring to FIG. 3, another example of an electronic circuit 300 can be used in another magnetic field sensor. The electronic circuit 300 can include a magnetoresistance element 304 having first and second terminals, wherein the first terminal of the magnetoresistance element 304 is coupled to receive a voltage 302 and the second terminal of the magnetoresistance element 304 is coupled to a collector of an NPN bipolar transistor 306. The electronic circuit 300 can include a resistor 308 having first and second terminals, wherein the first terminal of the resistor 308 is coupled to an emitter of the NPN bipolar transistor 306 and the second terminal of the resistor 308 is coupled to a reference voltage, for example, a ground reference voltage. The electronic circuit 300 can include a voltage source 310 having first and second terminals, wherein the first terminal of the voltage source 310 is coupled to a base of the NPN bipolar transistor 306 and the second terminal of the voltage source 310 is coupled to the second terminal of the resistor 308.
An output voltage 312 can be generated at the collector of the NPN bipolar transistor 306.
In some embodiments, the electronic circuit 300 can include a comparator 314 having first and second input terminals, wherein a first input terminal of the comparator 314 is coupled to the collector of the NPN bipolar transistor 306 and the second input terminal of the comparator 314 is coupled to receive a threshold voltage 316. The comparator 314 can be configured to generate a comparison signal 318.
It should be appreciated that the voltage source 310, the resistor 308, and the NPN bipolar transistor 306 form a current sink operable to provide a fixed current, I, to the magnetoresistance element 304. Thus, the output voltage 312 is generated according to the following:
Vout = I x A (3) = (V-Vbe)/R x A where:
V = voltage of voltage source 310
R = resistance of resistor 308
A = resistance of the magnetoresistance element 304
Vbe = base emitter voltage of NPN bipolar transistor 306 = approx. 0.7 volts
In the electronic circuit 300, it should be appreciated that the same current, I. flows through the NPN bipolar transistor 306 and through the magnetoresistance element 304.
Referring now to FIG. 4, another example of an electronic circuit 400 can be used in another magnetic field sensor. The electronic circuit 400 can include a resistor 404 having first and second terminals, wherein the first terminal of the resistor 404 is coupled to receive a voltage 402 and the second terminal of the resistor 404 is coupled to a collector of an NPN bipolar transistor 406.
The electronic circuit 400 can include a magnetoresistance element 408 having first and second terminals, wherein the first terminal of the magnetoresistance element 408 is coupled to an emitter of the NPN bipolar transistor 406 and the second terminal of the magnetoresistance element 408 is coupled to a reference voltage, for example, a ground reference voltage.
The electronic circuit 400 can include a voltage source 410 having first and second terminals, wherein the first terminal of the voltage source 410 is coupled to a base of the NPN bipolar transistor 408 and the second terminal of the voltage source 410 is coupled to the second terminal of the magnetoresistance element 408
An output voltage 412 can be generated at the collector of the NPN bipolar transistor 406.
In some embodiments, the electronic circuit 400 can include a comparator 414 having first and second input terminals, wherein a first input terminal of the comparator 414 is coupled to the collector of the NPN bipolar transistor 406 and the second input terminal of the comparator 414 is coupled to receive a threshold voltage 416. The comparator 414 can be configured to generate a comparison signal 418.
It should be appreciated that the voltage source 410, the magnetoresistance element 408, and the NPN bipolar transistor 406 form a variable current sink operable to provide a variable current, I, to the resistor 404. The variable current, I, varies in accordance with a variable resistance of the magnetoresistance element 408, which varies in accordance with a sensed magnetic field. Thus, the output voltage 412 is generated according to the following:
Vout = I x R
= (V-Vbe)/A x R (4) where:
V = voltage of voltage source 410
R = resistance of resistor 404
A = resistance of the magnetoresistance element 408
Vbe = base emitter voltage of PNP bipolar transistor 406 = approx. 0.7 volts
In the electronic circuit 400, it should be appreciated that the same current, I. flows through the NPN bipolar transistor 406 and through the magnetoresistance element 408.
Referring now to FIG. 5, another example of an electronic circuit 500 can be used in another magnetic field sensor. The electronic circuit 500 can include a
magnetoresistance element 506 having first and second terminals, wherein the first terminal of the magnetoresistance element 506 is coupled to receive a voltage 502 and the second terminal of the magnetoresistance element 506 is coupled to an emitter of a PNP bipolar transistor 508.
The electronic circuit 500 can include a voltage source 504 having first and second terminals, wherein the first terminal of the voltage source 504 is coupled to receive the voltage 502 and the second terminal of the voltage source 504 is coupled to a base of the PNP bipolar transistor 508.
The electronic circuit 500 can include a resistor 514 having first and second terminals, wherein the first terminal of the resistor 514 is coupled to an emitter of an NPN bipolar transistor 510 and the second terminal of the resistor 514 is coupled to a voltage reference, for example, a ground voltage.
The electronic circuit 500 can include another voltage source 512 having first and second terminals, wherein the first terminal of the voltage source 512 is coupled a base of the NPN bipolar transistor 510 and the second terminal of the voltage source 512 is coupled to the second terminal of the resistor 514.
A collector of the PNP bipolar transistor 508 can be coupled to a collector of the NPN bipolar transistor 510 at a junction node.
A load 518, which can be a resistive or a complex load, can be coupled between the junction node and a bias voltage, Vb. Current can flow into and/or out of the load 518.
The load 518 is labeled Zload. The nomenclature, Zload, used here and in figures below is not intended to limit the load 518 or loads discussed below to one or more passive electronic components. Instead, the load 518 and loads discussed below can be comprised of passive electronic components, active electronic components, or both.
An output voltage 516 can be generated at the collector of the PNP bipolar transistor 508 (i.e., at the junction node).
In some embodiments, the electronic circuit 500 can include a comparator coupled to the junction node that is the same as or similar to the comparators shown above in conjunction with FIGS. 1-4.
It should be appreciated that the voltage source 504, the magnetoresistance element 506, and the PNP bipolar transistor 508 form a variable current source operable to provide a variable current, II . The variable current, II, varies in accordance with a variable resistance of the magnetoresistance element 506, which varies in accordance with a sensed magnetic field. It should be appreciated that the voltage source 512, the resistor 514, and the NPN bipolar transistor 510 form a current sink operable to provide a fixed current, 12. Thus, the output voltage 516 is generated according to the following:
Vout = Vb + [(11-12) x Zload]
11 = (V1-Vbe)/A
12 = (V2-Vbe)/R
11 -12 = (Vl -Vbe)/A - (V2-Vbe)/R
Vout = Vb +[[(V1-Vbe)/A - (V2-Vbe)/R] x Zload] (5) where:
VI = voltage of voltage source 504
V2 = voltage of voltage source 512
R = resistance of resistor 514
A = resistance of the magnetoresistance element 506
Vb = bias voltage
Vbe = base emitter voltage of PNP bipolar transistor 508 and of NPN bipolar transistor 510 = approx. 0.7 volts
It should be understood that the load 518 can be made to have a high impedance to achieve a gain not obtained with the electronic circuits of FIGS. 1-4 described above.
In the electronic circuit 500, it should be appreciated that the same current, II, flows through the PNP bipolar transistor 508 and through the magnetoresistance element 506.
Referring now to FIG. 6, another example of an electronic circuit 600 can be used in another magnetic field sensor. The electronic circuit 600 can include a resistor 606 having first and second terminals, wherein the first terminal of the resistor 606 is coupled to receive a voltage 602 and the second terminal of the resistor 606 is coupled to an emitter of a PNP bipolar transistor 608.
The electronic circuit 600 can include a voltage source 604 having first and second terminals, wherein the first terminal of the voltage source 604 is coupled to receive the voltage 602 and the second terminal of the voltage source 604 is coupled to a base of the PNP bipolar transistor 608.
The electronic circuit 600 can include a magnetoresistance element 614 having first and second terminals, wherein the first terminal of the magnetoresistance element 614 is coupled to an emitter of an NPN bipolar transistor 610 and the second terminal of the magnetoresistance element 614 is coupled to a voltage reference, for example, a ground voltage.
The electronic circuit 600 can include another voltage source 612 having first and second terminals, wherein the first terminal of the voltage source 612 is coupled a base of the NPN bipolar transistor 610 and the second terminal of the voltage source 612 is coupled to the second terminal of the magnetoresistance element 614.
A collector of the PNP bipolar transistor 608 can be coupled to a collector of the NPN bipolar transistor 610 at a junction node.
A load 618, which can be a resistive or a complex load, can be coupled between the junction node and a bias voltage, Vb. Current can flow into and/or out of the load 618.
The load 618 is labeled Zload. The nomenclature, Zload, used here and in figures below is not intended to limit the load 618 or loads discussed below to one or more passive electronic components. Instead, the load 618 and loads discussed below can be comprised of passive electronic components, active electronic components, or both.
An output voltage 616 can be generated at the collector of the PNP bipolar transistor 608 (i.e., at the junction node).
In some embodiments, the electronic circuit 600 can include a comparator coupled to the junction node that is the same as or similar to the comparators shown above in conjunction with FIGS. 1 -4. Other electronic circuits described below can also include a comparator, though not shown.
It should be appreciated that the voltage source 604, the resistor 606, and the PNP bipolar transistor 608 form a current source operable to provide a fixed current, II . It should be appreciated that the voltage source 612, the magnetoresistance element 614, and the NPN bipolar transistor 610 form a variable current sink operable to provide a variable current, 12. The variable current, 12, varies in accordance with a variable resistance of the magnetoresistance element 614, which varies in accordance with a sensed magnetic field. Thus, the output voltage 616 is generated according to the following:
Vout = Vb + [(11 -12) x Zload]
11 = (V1-Vbe)/R
12 = (V2-Vbe)/A
11-12 = (Vl-Vbe)/R - (V2-Vbe)/A Vout = Vb + [[(VI -Vbe)/R - (V2-Vbe)/A] x Zload] (6) where:
VI = voltage of voltage source 604
V2 = voltage of voltage source 612
R = resistance of resistor 606
A = resistance of the magnetoresistance element 614
Vb = bias voltage
Vbe = base emitter voltage of PNP bipolar transistor 608 and of NPN bipolar transistor 610 = approx. 0.7 volts
It should be understood that the load 618 can be made to have a high impedance to achieve a gain not obtained with the electronic circuits of FIGS. 1-4 described above.
In the electronic circuit 600, it should be appreciated that the same current, 12, flows through the NPN bipolar transistor 610 and through the magnetoresistance element
614.
Referring now to FIG. 7, another example of an electronic circuit 700 can be used in another magnetic field sensor. The electronic circuit 700 can include a
magnetoresistance element 706 having first and second terminals, wherein the first terminal of the magnetoresistance element 706 is coupled to receive a voltage 702 and the second terminal of the magnetoresistance element 706 is coupled to an emitter of a PNP bipolar transistor 708.
The electronic circuit 700 can include a voltage source 704 having first and second terminals, wherein the first terminal of the voltage source 704 is coupled to receive the voltage 702 and the second terminal of the voltage source 704 is coupled to a base of the PNP bipolar transistor 708.
The electronic circuit 700 can include another magnetoresistance element 714 having first and second terminals, wherein the first terminal of the magnetoresistance element 714 is coupled to an emitter of an NPN bipolar transistor 710 and the second terminal of the magnetoresistance element 714 is coupled to a voltage reference, for example, a ground voltage.
The electronic circuit 700 can include another voltage source 712 having first and second terminals, wherein the first terminal of the voltage source 712 is coupled a base of the NPN bipolar transistor 710 and the second terminal of the voltage source 712 is coupled to the second terminal of the magnetoresistance element 714.
A collector of the PNP bipolar transistor 708 can be coupled to a collector of the NPN bipolar transistor 710 at a junction node.
A load 718, which can be a resistive or a complex load, can be coupled between the junction node and a bias voltage, Vb. Current can flow into and/or out of the load 718.
The load 718 is labeled Zload. The nomenclature, Zload, used here and in figures below is not intended to limit the load 718 or loads discussed below to one or more passive electronic components. Instead, the load 718 and loads discussed below can be comprised of passive electronic components, active electronic components, or both.
An output voltage 716 can be generated at the collector of the PNP bipolar transistor 708 (i.e., at the junction node). In some embodiments, the electronic circuit 700 can include a comparator coupled to the junction node that is the same as or similar to the comparators shown above in conjunction with FIGS. 1 -4. Other electronic circuits described below can also include a comparator, though not shown or described below.
It should be appreciated that the voltage source 704, the magnetoresistance element 706, and the PNP bipolar transistor 708 fonn a variable current source operable to provide a variable current, II . The variable current, II, varies in accordance with a variable resistance of the magnetoresistance element 706, which varies in accordance with a sensed magnetic field. It should be appreciated that the voltage source 712, the
magnetoresistance element 714, and the NPN bipolar transistor 710 form a variable current sink operable to provide a variable current, 12. The variable current, 12, varies in accordance with a variable resistance of the magnetoresistance element 714, which varies in accordance with a sensed magnetic field. Thus, the output voltage 716 is generated according to the following:
Vout = Vb + [(11-12) x Zload]
11 = (V1-Vbe)/A
12 = (V2-Vbe)/B
11-12 = (Vl-Vbe)/R - (V2-Vbe)/A
Vout = Vb + [[(Vl-Vbe)/A - (V2-Vbe)/B] x Zload] (7) where:
VI = voltage of voltage source 704
V2 = voltage of voltage source 712
A = resistance of magnetoresistance element 706
B = resistance of the magnetoresistance element 714
Vb = bias voltage
Vbe = base emitter voltage of PNP bipolar transistor 706 and of NPN bipolar
transistor 710 = approx. 0.7 volts It should be understood that the load 718 can be made to have a high impedance to achieve a gain not obtained with the electronic circuits of FIGS. 1 -4 described above.
In the electronic circuit 700, noises of the two magnetoresistance elements 706, 714 add incoherently to result in the square root of two times the noise of one
magnetoresistance element. However, signals resulting from resistance changes of the two magnetoresistance elements 706, 714 add coherently to result in an output signal 716 two times a signal that would result from one magnetoresistance element, for example, as provided by the electronic circuits of FIGS. 1 -6. Thus, a signal to noise ratio improvement is obtained. Similar improvements in signal to noise ratio can be obtained for similar reasons with circuits described below.
In the electronic circuit 700, it should be appreciated that the same current, II , flows through the PNP bipolar transistor 708 and through the magnetoresistance element 706. Also, the same current, 12, flows through the NPN bipolar transistor 710 and through the magnetoresistance element 714.
Referring now to FIG. 8, another example of an electronic circuit 800 can be used in another magnetic field sensor. The electronic circuit 800 can include a
magnetoresistance element 806 having first and second terminals, wherein the first terminal of the magnetoresistance element 806 is coupled to receive a voltage 802 and the second terminal of the magnetoresistance element 806 is coupled to an emitter of a PNP bipolar transistor 808.
The electronic circuit 800 can include a voltage source 804 having first and second terminals, wherein the first terminal of the voltage source 804 is coupled to receive the voltage 802 and the second terminal of the voltage source 804 is coupled to a base of the PNP bipolar transistor 808.
The electronic circuit 800 can include a resistor 814 having first and second terminals, wherein the first terminal of the resistor 814 is coupled to an emitter of an NPN bipolar transistor 810 and the second terminal of the resistor 814 is coupled to a voltage reference, for example, a ground voltage.
The electronic circuit 800 can include another voltage source 812 having first and second terminals, wherein the first terminal of the voltage source 812 is coupled a base of the NPN bipolar transistor 810 and the second terminal of the voltage source 812 is coupled to the second terminal of the resistor 814.
A collector of the PNP bipolar transistor 808 can be coupled to a collector of the NPN bipolar transistor 810 at a junction node.
A load 818, which can be a resistive or a complex load, can be coupled between the junction node and the second terminal of the resistor 814. An output voltage 816 can be generated at the collector of the PNP bipolar transistor 808 (i.e., at the junction node).
It should be appreciated that the voltage source 804, the magnetoresistance element 806, and the PNP bipolar transistor 808 form a variable current source operable to provide a variable current, II . The variable current, II , varies in accordance with a variable resistance of the magnetoresistance element 806, which varies in accordance with a sensed magnetic field. It should be appreciated that the voltage source 812, the resistor 814, and the NPN bipolar transistor 810 form a current sink operable to provide a fixed current, 12. Thus, the output voltage 816 is generated according to the following:
Voutl= Vb + [(11-12) x Zloadl]
11 = (V1 -Vbe)/A
12 = (V2-Vbe)/Rl
11-12 = (Vl-Vbe)/A - (V2-Vbe)/Rl
Voutl = Vb + [[(Vl-Vbe)/A - (V2-Vbe)/Rl] x Zloadl] (8) where:
Zloadl = impedance of load 818
Voutl = voltage 816
VI = voltage of voltage source 804
V2 = voltage of voltage source 812
Rl = resistance of resistor 814
A = resistance of the magnetoresistance element 806
Vb = bias voltage
Vbe = base emitter voltage of PNP bipolar transistor 808 and of NPN bipolar transistor 810 = approx. 0.7 volts
In the electronic circuit 800, it should be appreciated that the same current, II flows through the PNP bipolar transistor 808 and through the magnetoresistance element 806.
The electronic circuit 800 can also include a resistor 820 having first and second terminals, wherein the first terminal of the resistor 820 is coupled to receive the voltage 802 and the second terminal of the resistor 820 is coupled to an emitter of a PNP bipolar transistor 822.
The second terminal of the voltage source 804 can be coupled to a base of the PNP bipolar transistor 822. The electronic circuit 800 can include a magnetoresistance element 826 having first and second terminals, wherein the first terminal of the magnetoresistance element 826 is coupled to an emitter of an NPN bipolar transistor 824 and the second terminal of the magnetoresistance element 826 is coupled to a voltage reference, for example, a ground voltage.
The first terminal of the voltage source 812 is coupled a base of the NPN bipolar transistor 824. A collector of the PNP bipolar transistor 822 can be coupled to a collector of the NPN bipolar transistor 824 at a junction node. A load 830, which can be a resistive or a complex load, can be coupled between the junction node and the second terminal of the magnetoresistance element 826.
An output voltage 828 can be generated at the collector of the PNP bipolar transistor 822 (i.e., at the junction node).
It should be appreciated that the voltage source 804, the resistor 820, and the PNP bipolar transistor 822 form a current source operable to provide a fixed current, 13. It should be appreciated that the voltage source 812, the magnetoresistance element 826, and the NPN bipolar transistor 824 form a variable current sink operable to provide a variable current, 14. The variable current, 14, varies in accordance with a variable resistance of the magnetoresistance element 826, which varies in accordance with a sensed magnetic field. Thus, the output voltage 828 is generated according to the following:
Vout2 = Vb + [(13-14) x Zload2]
13 = (V1-Vbe)/R2
14 = (V2-Vbe)/B
13-14 = (Vl-Vbe)/R2 - (V2-Vbe)/B Vout2 = Vb + [[(VI -Vbe)/R2 - (V2-Vbe)/B] x Zload2] (9) where:
Zload2 = impedance of load 830
Vout2 = voltage 828
VI = voltage of voltage source 804
V2 = voltage of voltage source 812
R2 = resistance of resistor 820 B = resistance of the magnetoresistance element 826
Vb = bias voltage
Vbe = base emitter voltage of PNP bipolar transistor 822 and of NPN bipolar transistor 824 = approx. 0.7 volts
In the electronic circuit 800, it should be appreciated that the same current, 14, flows through the NPN bipolar transistor 824 and through the magnetoresistance element 826. For the electronic circuit 800, the output voltages 816, 828 can be taken individually (i.e., each can be a single ended signal). In other embodiments, the electronic circuit 800 provides a differential signal, Vdiff = voltage 816 - voltage 828 = Voutl- Vout2. It should be understood that the loads 818, 830 can be made to have high impedances to achieve single ended gains not obtained with the electronic circuits of FIGS. 1 -4 described above. Furthermore, the above described differential signal has an amplitude that is double the amplitude of the single ended signals. Referring now to FIG. 9, a magnetic field sensor 900 can include a substrate 902 having a surface 902a, which is one of two parallel major surfaces of the substrate 902.
Two magnetoresistance elements 904, 906 (also referred to herein as
magnetoresistance elements A and B) can be disposed upon the surface 902a along an axis 908. The two magnetoresistance elements 904, 906 (A, B) can be part of or coupled to an electronic circuit 910, which is also disposed upon or within the surface 902a of the substrate 902. The two magnetoresistance elements 904, 906 (A, B) can be the same as or similar to the magnetic field sensing elements 706, 714 of FIG. 7 and the two
magnetoresistance element 806, 812 of FIG. 3-8. The designations A, B can also be found in FIGS. 7 and 8 to represent resistance values.
Magnetoresistance elements, e.g., 904, 906 (A, B), are shown in all embodiments herein to be in the form of so-called "yokes," which have a C-shape (or a reverse C- shape). In some embodiments, the yokes can have longest yoke axes substantially perpendicular to the axis 908. Advantages of yoke shapes are known. It will be understood that other magnetoresistance elements used in embodiments herein can have other shapes, for example, lines, polylines, or rectangles.
Maximum response axes of the magnetoresistance elements 904, 906 (A, B) can be parallel to and along the axis 908 and in the same direction. It should be understood that the magnetoresistance elements 904, 906 (A, B) having maximum response axes parallel to the axis 908 are also responsive to magnetic fields at other angles in the plane of the substrate 902 (and also out of the plane of the substrate 902). The degree to which the magnetoresistance elements 904, 906 (A, B) are responsive to magnetic fields at other angles not parallel to the axis 908 (and not perpendicular to the longest yoke axes) is determined by a magnitude of a geometric projection of the magnetic field at the other angle onto the axis 908. Thus, the term "projected magnetic field" is used below to describe this projection.
In some other embodiments, where the yoke shapes of the magnetoresistance elements 904, 906 may be rotated so that the longest yokes axes are not perpendicular to the axis 908, the degree to which the magnetoresistance elements 904, 906 (A, B) are responsive to magnetic fields at other angles not parallel to the axis 908 is determined by a magnitude of a geometric projection of the magnetic field at the other angle onto an axis that is perpendicular to the longest axes of the yoke shapes. This is also referred to herein as a projected magnetic field.
The magnetic field sensor 900 is responsive to movement of a ferromagnetic target object 912 having features, e.g., 912a, with width 914. For back-biased arrangements in which the magnetic field sensor 900 also includes a magnet (not shown), the
ferromagnetic target 912 object can be, for example, a gear having gear teeth, in which case, the feature 912a of the gear can be one of a plurality of gear teeth or one of a plurality of gear valleys. In other arrangements, the ferromagnetic target object 912 can be a multi-pole ring magnet having alternating north and south poles, in which case, the feature 912a can be one of a plurality of magnetic poles, for example, a north pole or a south pole.
In some embodiments, the two magnetoresistance elements 904, 906 (A, B) have a separation 916 between about one half and about one and one half of the width 914 of the target feature 912a, for example, a gear tooth of a ferromagnetic gear or a magnetic domain of a ferromagnetic ring magnet. In some other embodiments, the two
magnetoresistance elements 904, 906 (A, B) have a separation 916 between about one half and about twice the width 914 of the target feature 912a. However, in other embodiments, the separation 916 is much smaller than half of the width 914, for example, one one hundredth of the width 914, or larger than twice the width 914.
In some embodiments, the separation 916 is about equal to the width 914 of the target feature 912a, for example, a gear tooth of a ferromagnetic gear or a magnetic domain of a ferromagnetic ring magnet.
In operation, the two magnetoresistance elements 904, 906 (A, B) can generate two output signals. FIGS. 7 and 8 above are representative of ways in which the two magnetic field sensing elements 904, 906 can generate two output signals. In FIGS. 7 and 8, the designation A and B are indicative of resistances and are also indicative of physical placement in relation to FIG. 9.
Using as an example the target feature 912a with a width 914 equal to the spacing 916 between the two magnetoresistance elements 904, 906, when the target feature 912a is centered about (i.e., between) the two magnetoresistance elements 904, 906 (A, B), it can be shown that any magnetoresistance element(s) (e.g., 904 (A)) on one side of a center of the target feature 912a experience a projected magnetic field pointed in one direction along the axis 908, and any magnetoresistance element(s) (e.g., 906 (B)) on the other side of the center of the target feature 912a experience a projected magnetic field pointed in the other direction.
Therefore, when the target feature 912a is centered about the two magnetoresistance elements 904, 906, any magnetoresistance element(s) (e.g., 904 (A)) on one side of the center of the target feature 912a changes resistance in one direction, and any magnetoresistance element(s) (e.g., 906 (B)) on the other side of the center of the target feature 912a changes resistance in the other direction.
In contrast, when an edge of the target feature 912a is centered about (i.e., between) the two magnetoresistance elements 904, 906 (A, B), it can be shown that the two magnetoresistance elements 904, 906 (A, B) experience projected magnetic fields pointed in the same direction along the axis 908. Thus, resistances of both of the two magnetoresistance elements 904, 906 (A, B) change in the same direction.
In view of the above, it should be understood that the electronic circuit 700 of FIG. 7 can operate as a so-called "edge detector," generating a largest voltage 716 when the two magnetoresistance elements 706, 714 are on opposite sides of an edge of the feature 912a. Similarly, it should be understood that the electronic circuit 800 of FIG. 8 can operate as a so-called "feature detector," generating a largest differential signal Voutl-Vout2 when the two magnetoresistance elements 806, 826 are on opposite sides of a center of the feature 912a. As described above, while a magnet is not shown, it should be understood that in some embodiments, the magnetic field sensor 900 can include a magnet.
Referring now to FIG. 10, another example of an electronic circuit 1000 can be used in another magnetic field sensor. The electronic circuit 1000 can include a magnetoresistance element 1006 having first and second terminals, wherein the first terminal of the magnetoresistance element 1006 is coupled to receive a voltage 1002 and the second terminal of the magnetoresistance element 1006 is coupled to an emitter of a PNP bipolar transistor 1008.
The electronic circuit 1000 can include a voltage source 1004 having first and second terminals, wherein the first terminal of the voltage source 1004 is coupled to receive the voltage 1002 and the second terminal of the voltage source 1004 is coupled to a base of the PNP bipolar transistor 1008.
The electronic circuit 1000 can include another magnetoresistance element 1014 having first and second terminals, wherein the first terminal of the magnetoresistance element 1014 is coupled to an emitter of an NPN bipolar transistor 1010 and the second terminal of the magnetoresistance element 1014 is coupled to a voltage reference, for example, a ground voltage.
The electronic circuit 1000 can include another voltage source 1012 having first and second terminals, wherein the first terminal of the voltage source 1012 is coupled a base of the NPN bipolar transistor 1010 and the second terminal of the voltage source 1012 is coupled to the second terminal of the magnetoresistance element 1014.
A collector of the PNP bipolar transistor 1008 can be coupled to a collector of the NPN bipolar transistor 1010 at a junction node.
A load 1018, which can be a resistive or a complex load, can be coupled between the junction node and a bias voltage, Vb. Current can flow into and/or out of the load 1018.
The load 1018 is labeled Zloadl . The nomenclature, Zloadl, used here and in figures below is not intended to limit the load 1018 or loads discussed below to one or more passive electronic components. Instead, the load 1018 and loads discussed below can be comprised of passive electronic components, active electronic components, or both.
An output voltage 1016 can be generated at the collector of the PNP bipolar transistor 1008 (i.e., at the junction node).
It should be appreciated that the voltage source 1004, the magnetoresistance element 1006, and the PNP bipolar transistor 1008 form a variable current source operable to provide a variable current, II . The variable current, II, varies in accordance with a variable resistance of the magnetoresistance element 1006, which varies in accordance with a sensed magnetic field.
It should be appreciated that the voltage source 1012, the magnetoresi stance element 1014, and the NPN bipolar transistor 1010 form a variable current sink operable to provide a variable current, 12. The variable current, 12, varies in accordance with a variable resistance of the magnetoresi stance element 1014, which varies in accordance with a sensed magnetic field. Thus, the output voltage 1016 is generated according to the following:
Voutl= Vb + [(11-12) x Zloadl]
11 = (V1-Vbe)/A
12 = (V2-Vbe)/D
11-12 = (Vl-Vbe)/A - (V2-Vbe)/D
Voutl = Vb + [[(Vl-Vbe)/A - (V2-Vbe)/D] x Zloadl ] (10) where:
Zloadl = impedance of load 1018
Voutl = voltage 1016
VI = voltage of voltage source 1004
V2 = voltage of current mirror reference leg 1 102
D = resistance of magnetoresistance element 1014
A = resistance of the magnetoresistance element 1006
Vb = bias voltage
Vbe = base emitter voltage of PNP bipolar transistor 1008 and of NPN bipolar transistor 1010 = approx. 0.7 volts
In the electronic circuit 1000, it should be appreciated that the same current, II, flows through the PNP bipolar transistor 1008 and through the magnetoresistance element 1006. Also, the same current, 12, (different than II) flows through the NPN bipolar transistor 1010 and through the magnetoresistance element 1014. The electronic circuit 1000 can also include a magnetoresistance element 1020 having first and second terminals, wherein the first terminal of the magnetoresistance element 1020 is coupled to receive the voltage 1002 and the second terminal of the magnetoresistance element 1020 is coupled to an emitter of a PNP bipolar transistor 1022.
The second terminal of the voltage source 1004 can be coupled to a base of the PNP bipolar transistor 1022.
The electronic circuit 1000 can include another magnetoresistance element 1026 having first and second terminals, wherein the first terminal of the magnetoresistance element 1026 is coupled to an emitter of an NPN bipolar transistor 1024 and the second terminal of the magnetoresistance element 1026 is coupled to a voltage reference, for example, a ground voltage.
The first terminal of the voltage source 1012 is coupled a base of the NPN bipolar transistor 1024.
A collector of the PNP bipolar transistor 1022 can be coupled to a collector of the NPN bipolar transistor 1024 at a junction node.
A load 1030, which can be a resistive or a complex load, can be coupled between the junction node and a bias voltage, Vb. Current can flow into and/or out of the load 1030.
The load 1030 is labeled Zload2. The nomenclature, Zload2, used here and in figures below is not intended to limit the load 1030 or loads discussed below to one or more passive electronic components. Instead, the load 1030 and loads discussed below can be comprised of passive electronic components, active electronic components, or both.
An output voltage 1028 can be generated at the collector of the PNP bipolar transistor 1022 (i.e., at the junction node). It should be appreciated that the voltage source 1004, the magnetoresistance element 1020, and the PNP bipolar transistor 1022 form a current source operable to provide a variable current, 13. The variable current, 13, varies in accordance with a variable resistance of the magnetoresistance element 1020, which varies in accordance with a sensed magnetic field.
It should be appreciated that the voltage source 1012, the magnetoresistance element 1026, and the NPN bipolar transistor 1024 form a variable current sink operable to provide a variable current, 14. The variable current, 14, varies in accordance with a variable resistance of the magnetoresistance element 1026, which varies in accordance with a sensed magnetic field. Thus, the output voltage 1028 is generated according to the following:
Vout2 = Vb + [(13-14) x Zload2]
13 = (V1 -Vbe)/C
14 = (V2-Vbe)/B
13-14 = (Vl-Vbe)/C - (V2-Vbe)/B
Vout2 = Vb + [[(Vl-Vbe)/C - (V2-Vbe)/B] x Zload2] (Π) where:
Zload2 = impedance of load 1030
Vout2 = voltage 1028
VI = voltage of voltage source 1004
V2 = voltage of voltage source 1012
C = resistance of magnetoresistance element 1020
B = resistance of the magnetoresistance element 1026
Vb = bias voltage
Vbe = base emitter voltage of PNP bipolar transistor 1022 and of NPN bipolar transistor 1024 = approx. 0.7 volts In the electronic circuit 1000, it should be appreciated that the same current, 13, (different than II, 12) flows through the PNP bipolar transistor 1022 and through the magnetoresistance element 1020. Also, the same current, 14, (different than II, 12, 13) flows through the NPN bipolar transistor 1024 and through the magnetoresistance element 1026.
For the electronic circuit 1000, the output voltages 1016, 1028 can be taken individually (i.e., each can be a single ended signal). In other embodiments, the electronic circuit 1000 provides a differential signal, Vdiff = voltage 1016 - voltage 1028 = Voutl- Vout2.
It should be understood that the loads 1018, 1030 can be made to have high impedances to achieve single ended gains not obtained with the electronic circuits of FIGS. 1-4 described above. Furthermore, the above described differential signal has an amplitude that is double the amplitude of the single ended signals.
Referring now to FIG. 11, in which like elements of FIG. 10 are shown having like reference designations, in an electronic circuit 1100, the voltage source 1012 of FIG. 10 is replaced with a circuit portion 1102, which will be recognized to be a reference leg of a current mirror. The circuit portion 1102 can include a current source 1104 having an output node. A collector of an NPN bipolar transistor 1106 can be coupled to the current source. A base of the NPN bipolar transistor 1 106 can be coupled to the collector of the NPN bipolar transistor 1106, such that the NPN bipolar transistor operates merely as a diode. A resistor 1180 having first and second terminals can be coupled such that the first terminal of the resistor is coupled to an emitter of the NPN bipolar transistor 1106 and the second terminal of the resistor 1108 is coupled to a reference voltage, for example, a ground voltage. The base or the NPN bipolar transistor 1106 is coupled to the bases of the NPN bipolar transistors 1010, 1024,
The electronic circuit 1 100 operates in substantially the same way as the electronic circuit 1000 of FIG. 10, and has the same operating equations. Referring now to FIG. 12, in which like elements of FIGS. 10 and 1 1 are shown having like reference designations, in an electronic circuit 1200, the voltage source 1004 of FIGS. 10 and 1 1 is replaced with a circuit portion 1202, which operates as a common mode voltage detector. The circuit portion 1202 can include a common mode voltage detector 1204 coupled to receive the two output voltages 1016, 1028 and operable to generate a common mode detection signal 1204a indicative of a common mode voltage of the output voltages 1016, 1028. A voltage buffer or level translator 1206 can be coupled to receive the common mode detection signal 1204a and operable to generate a signal coupled to the bases of the PNP bipolar transistors 1008, 1022.
In operation, if a common voltage of a differential signal Voutl -Vout2 is not at a desired operating point, the common mode voltage detector 1204 can detect the error condition and adjust the current flowing through the two PNP bipolar transistors 1008, 1022 to remove the error condition.
The electronic circuit 1200 operates in substantially the same way as the electronic circuit 1000 of FIG. 10 and the electronic circuit 1 100 of FIG. 1, and has the same operating equations.
Referring now to FIG. 13, in which like elements of FIG. 9 are shown having like, reference designations, a magnetic field sensor 1300 can include a substrate 1302 having a surface 1302a, which is one of two parallel major surfaces of the substrate 1302.
Four magnetoresistance elements 1304, 1306, 1308, 1310 (A, B, C, D) can be disposed upon the surface 1302a along an axis 1314. The four magnetoresistance elements 1304, 1306, 1308, 1310 (A, B, C, D) can be part of or coupled to an electronic circuit 1312, which is also disposed upon or within the surface 1302a of the substrate 1302. The four magnetoresistance elements 1304, 1306, 1308, 1310 (A, B, C, D) can be the same as or similar to the magnetic field sensing elements 1006, 1026, 1020, 1014, respectively, of FIGS. 10 and 11. Maximum response axes of the four magnetoresistance elements 1304, 1306, 1308, 1310 (A, B, C, D) can be parallel to and along an axis 1314, and in the same direction. Angles of magnetic fields are discussed above in conjunction with FIG. 9.
The magnetic field sensor 1300 is responsive to movement of the ferromagnetic target object 912.
In some embodiments, the four magnetoresistance elements 1304, 1306, 1308, 1310 (A, B, C, D) are disposed along the axis 1314 proximate to the ferromagnetic target object 912.
In some embodiments, the two magnetoresistance elements 1304, 1308 (A, C) have a separation 1320 between about one half and about one and one half of the width 914 of the target feature 912a, for example, a gear tooth of a ferromagnetic gear or a magnetic domain of a ferromagnetic ring magnet. In some other embodiments, the two magnetoresistance elements 1304, 1308 (A, C) have a separation 1320 between about one half and about twice the width 914 of the target feature 912a. However, in other embodiments, the separation 1320 is much smaller than half of the width 914, for example, one one hundredth of the width 914 or larger than twice the width 914.
In some embodiments used in examples below, the separation 1320 is about equal to the width 914 of the target feature 912a.
Similarly, in some embodiments, the two magnetoresistance elements 1306, 1310 (B, D) have a separation 1322 between about one half and about one and one half of the width 914 of the target feature 912a, for example, a gear tooth of a ferromagnetic gear or a magnetic domain of a ferromagnetic ring magnet. In some embodiments, the two magnetoresistance elements 1306, 1310 (B, D) have a separation 1322 between about one half and about twice the width 914 of the target feature 912a. However, in other embodiments, the separation 1322 is much smaller than half of the width 914, for example, one one hundredth of the width 914 or larger than twice the width 914. In some embodiments used in examples below, the separation 1322 is about equal to the width 914 of the target feature 912a.
In some other embodiments, the two magnetoresistance elements 1304, 1306 (A, B) have a separation 1324 between about one half and about one and one half of the width 914 of the target feature 912a. In some other embodiments, the two magnetoresistance elements 1304, 1306 (A, B) have a separation 1324 between about one half and about twice the width 914 of the target feature 912a. However, in other embodiments, the separation 1324 is much smaller than half of the width 914, for example, one one hundredth of the width 914 or larger than twice the width 914.
In some embodiments used in examples below, the separation 1324 is about equal to the width 914 of the target feature 912a. Similarly, in some other embodiments, the two magnetoresistance elements 1308,
1310 (C, D) have a separation 1326 between about one half and about one and one half of the width 914 of the target feature 912a. In some other embodiments, the two
magnetoresistance elements 1308, 1310 (C, D) have a separation 1326 between about one half and twice the width 914 of the target feature 912a. However, in other embodiments, the separation 1326 is much smaller than half of the width 914, for example, one one hundredth of the width 914 or larger than twice the width 914.
In some embodiments used in examples below, the separation 1326 is about equal to the width 914 of the target feature 912a.
In operation, the four magnetoresistance elements 1304, 1306, 1308, 1310 (A, B, C, D) can generate at least two output signals. FIGS. 10, 11, and 12 above are
representative of ways in which the four magnetoresistance elements 1304, 1306, 1308, 1310 (A, B, C, D) can generate at least two output signals. In FIGS. 10, 1 1 , and 12, the designation A, B, C, and D are indicative of resistances and are also indicative of physical placement in relation to FIG. 13. Using as an example the target feature 912a with a width 914 equal to the spacings 1320, 1322, when the target feature 912a is centered about (i.e., between) the four magnetoresistance elements 1304, 1306, 1308, 1310 (A, B, C, D), it can be shown that any magnetoresistance element(s) (e.g., 1304, 1306 (A, B)) on one side of a center of the target feature 912a experiences a projected magnetic field pointed in one direction along the axis 1314, and any magnetoresistance element(s) (e.g., 1308, 1310 (C, D)) on the other side of the center of the target feature 912a experiences a projected magnetic field pointed in the other direction. Therefore, when the target feature 912a is centered about four magnetoresistance elements 1304, 1306, 1308, 1310 (A, B, C, D), any magnetoresistance element(s) (e.g., 1304, 1306 (A, B)) on one side of the center of the target feature 912a change resistance in one direction, and any magnetoresistance element(s) (e.g., 1308, 1310 (C, D)) on the other side of the center of the target feature 912a change resistance in the other direction.
In contrast, when an edge of the target feature 912a is centered about (i.e., between) the four magnetoresistance elements 1304, 1306, 1308, 1310 (A, B, C, D), it can be shown that the two magnetoresistance elements 1304, 1310 (A, D) experience projected magnetic fields pointed in the same direction along the axis 1314. Thus, resistance of both of the two magnetoresistance elements 1304, 1310 change in the same direction.
At the same time, when an edge of the target feature 912a is centered , the two magnetoresistance elements 1306, 1308 (B, C) experience projected magnetic fields pointed in the same direction along the axis 1314, but opposite in direction from the projected magnetic fields experienced by the two magnetoresistance elements 1304, 1310
(A, D). Thus, resistance of both of the two magnetoresistance elements 1306, 1308 (B, C) change in the same direction but opposite to the resistance change of the two
magnetoresistance elements 1304, 1310 (A, D). While a particular example of the spacings 1320, 1322 relative to the width 914 of the target feature 912a is given above, it should be appreciated that for other relative dimensions, magnetic fields at the four magnetoresistance elements 1304, 1306, 1308, 1310 (A, B, C, D) may not be exactly as described above and some resistance changes may be in other directions.
In view of the above, it should be understood that the electronic circuits 1000, 1 10.0, 1200 of FIGS. 10, 1 1 , 12 can operate as a feature detectors, generating a largest differential voltage Voutl -Vout2 when the four magnetoresistance elements 1004 (A), 1026 (B), 1020 (C), 1014 (D) of FIGS. 10, 1 1, 12 are arranged as shown in FIG. 13 by designations A-D, arranged relative to a center of the target feature 912a. While a magnet is not shown, it should be understood that in some embodiments, the magnetic field sensor 1400 can include a magnet.
Referring now to FIG. 14, another example of an electronic circuit 1400 can be used in another magnetic field sensor. The electronic circuit 1400 can include a magnetoresistance element 1404 having first and second terminals, wherein the first terminal of the magnetoresistance element 1404 is coupled to receive a voltage 1402 and the second terminal of the magnetoresistance element 1404 is coupled to an emitter of a PNP bipolar transistor 1406. The electronic circuit 1400 can include a voltage source in the form of a common mode voltage detector circuit 1435 coupled to the base of the PNP bipolar transistor 1406.
The electronic circuit 1400 can include another magnetoresistance element 1410 having first and second terminals, wherein the first terminal of the magnetoresistance element 1410 is coupled to an emitter of an NPN bipolar transistor 1408 and the second terminal of the magnetoresistance element 1410 is coupled to a voltage reference, for example, a ground voltage.
The electronic circuit 1400 can include a voltage source in the form of a current mirror reference leg 1428 coupled to the base of the NPN bipolar transistor 1408.
A collector of the PNP bipolar transistor 1406 can be coupled to a collector of the NPN bipolar transistor 1408 at a junction node.
A load 1414, which can be a resistive or a complex load, can be coupled between the junction node and a bias voltage, Vb. Current can flow into and/or out of the load 1414.
The load 1414 is labeled Zl . The nomenclature, Zl, is not intended to limit the load 1414 to one or more passive electronic components. Instead, the load 1414 can be comprised of passive electronic components, active electronic components, or both.
An output voltage 1412 can be generated at the collector of the PNP bipolar transistor 1406 (i.e., at the junction node).
The output voltage 1412 is generated according to the following:
Voutl= Vb + [(11-12) x Zl ]
11 = (V1 -Vbe)/Al
12 = (V2-Vbe)/C2
11-12 = (Vl -Vbe)/Al - (V2-Vbe)/C2
Voutl = Vb + [[(Vl-Vbe)/Al - (V2-Vbe)/C2] x Zl] (12) where:
Z 1 = impedance of load 1414
Voutl = voltage 1412
VI = voltage of common mode voltage detector circuit 1435
V2 = voltage of current mirror reference let 1428
C2 = resistance of magnetoresistance element 1410
Al = resistance of the magnetoresistance element 1404
Vb = bias voltage
Vbe = base emitter voltage of PNP bipolar transistor 1406 and of NPN bipolar transistor 1408 = approx. 0.7 volts
The electronic circuit 1400 can also include a magnetoresistance element 1416 having first and second terminals, wherein the first terminal of the magnetoresistance element 1416 is coupled to receive the voltage 1402 and the second terminal of the magnetoresistance element 1416 is coupled to an emitter of a PNP bipolar transistor 1418.
The common mode voltage detector circuit 1435 can be coupled to a base of the PNP bipolar transistor 1418.
The electronic circuit 1400 can include another magnetoresistance element 1422 having first and second terminals, wherein the first terminal of the magnetoresistance element 1422 is coupled to an emitter of an NPN bipolar transistor 1420 and the second terminal of the magnetoresistance element 1422 is coupled to a voltage reference, for example, a ground voltage.
The current mirror reference leg 1428 is coupled to a base of the NPN bipolar transistor 1420.
A collector of the PNP bipolar transistor 1418 can be coupled to a collector of the NPN bipolar transistor 1420 at a junction node.
A load 1426, which can be a resistive or a complex load, can be coupled between the junction node and a bias voltage, Vb. Current can flow into and/or out of the load 1426
The load 1426 is labeled Z2. The nomenclature, Z2, is not intended to limit the load 1426 to one or more passive electronic components. Instead, the load 1426 can be comprised of passive electronic components, active electronic components, or both.
An output voltage 1424 can be generated at the collector of the PNP bipolar transistor 1418 (i.e., at the junction node). The output voltage 1424 is generated according to the following:
Vout2 = Vb + [(13-14) x Z2]
13 = (V1-Vbe)/Cl
14 = (V2-Vbe)/A2
13-14 = (Vl-Vbe)/Cl - (V2-Vbe)/A2
Vout2 = Vb + [[(Vl -Vbe)/Cl - (V2-Vbe)/A2] x Z2] (13) where:
Z2 = impedance of load 1426
Vout2 = voltage 1424
VI = voltage of common mode voltage detector circuit 1435
V2 = voltage of current mirror reference leg 1428
CI = resistance of resistor 1416
A2 = resistance of the magnetoresistance element 1422
Vb = bias voltage
Vbe = base emitter voltage of PNP bipolar transistor 1418 and of NPN bipolar transistor 1024 = approx. 0.7 volts
In the electronic circuit 1400, it should be appreciated that the same current, 13, (different than II, 12) flows through the PNP bipolar transistor 1418 and through the magnetoresistance element 1416. Also, the same current, 14, (different than II, 12, 13) flows through the NPN bipolar transistor 1024 and through the magnetoresistance element 1422.
For the electronic circuit 1400, the output voltages 1412, 1424 can be taken individually (i.e. single ended signals). In other embodiments, the electronic circuit 1400 provides a differential signal, Vdiff = voltage 1412 - voltage 1424 = Voutl -Vout2. It should be understood that the loads 1414, 1426 can be made to have high impedances to achieve single ended gains not obtained with the electronic circuits of FIGS. 1-4 described above. Furthermore, the above described differential signal has an amplitude that is double the amplitude of the single ended signals.
The electronic circuit 1400 can also include a magnetoresistance element 1440 having first and second terminals, wherein the first terminal of the magnetoresistance element 1440 is coupled to receive a voltage 1402 and the second terminal of the magnetoresistance element 1440 is coupled to an emitter of a PNP bipolar transistor 1442.
The electronic circuit 1400 can include a common mode voltage detector circuit 1471 coupled to a base of the PNP bipolar transistor 1442.
The electronic circuit 1400 can include another magnetoresistance element 1446 having first and second terminals, wherein the first terminal of the magnetoresistance element 1446 is coupled to an emitter of an NPN bipolar transistor 1444 and the second terminal of the magnetoresistance element 1446 is coupled to a voltage reference, for example, a ground voltage.
The electronic circuit 1400 can include a current mirror reference leg 1464 coupled a base of the NPN bipolar transistor 1444.
A collector of the PNP bipolar transistor 1442 can be coupled to a collector of the NPN bipolar transistor 1444 at a junction node.
A load 1450, which can be a resistive or a complex load, can be coupled between the junction node and a bias voltage, Vb. Current can flow into and/or out of the load 1450.
The load 1450 is labeled Z3. The nomenclature, Z3, is not intended to limit the load 1450 to one or more passive electronic components. Instead, the load 1450 can be comprised of passive electronic components, active electronic components, or both. An output voltage 1448 can be generated at the collector of the PNP bipolar transistor 1442 (i.e., at the junction node).
The output voltage 1448 is generated according to the following:
Vout3 = Vb + [(15-16) x Z3]
15 = (V3-Vbe)/Bl
16 = (V4-Vbe)/D2
15-16 = (V3-Vbe)/Bl - (V4-Vbe)/D2
Vout3 = Vb + [[(V3-Vbe)/Bl - (V4-Vbe)/D2] x Z3] (14) where:
Z3 = impedance of load 1450
Vout3 = voltage 1448
V3 = voltage of common mode voltage detector circuit 1471
V4 = voltage of current mirror reference leg 1464
D2 = resistance of magnetoresistance element 1446
Bl = resistance of the magnetoresistance element 1440
Vb = bias voltage
Vbe = base emitter voltage of PNP bipolar transistor 1442 and of NPN bipolar transistor 1444 = approx. 0.7 volts
The electronic circuit 1400 can also include a magnetoresistance element 1452 having first and second terminals, wherein the first terminal of the magnetoresistance element 1452 is coupled to receive the voltage 1402 and the second terminal of the magnetoresistance element 1452 is coupled to an emitter of a PNP bipolar transistor 1454.
The common mode voltage detector circuit 1471 can be coupled to a base of the PNP bipolar transistor 1454. The electronic circuit 1400 can include another magnetoresistance element 1458 having first and second terminals, wherein the first terminal of the magnetoresistance element 1458 is coupled to an emitter of an NPN bipolar transistor 1456 and the second terminal of the magnetoresistance element 1458 is coupled to a voltage reference, for example, a ground voltage.
The current mirror reference leg 1464 is coupled to a base of the NPN bipolar transistor 1456.
A collector of the PNP bipolar transistor 1454 can be coupled to a collector of the NPN bipolar transistor 1456 at a junction node.
A load 1462, which can be a resistive or a complex load, can be coupled between the junction node and a bias voltage, Vb. Current can flow into and/or out of the load 1462
The load 1462 is labeled Z4. The nomenclature, Z4, is not intended to limit the load 1462 to one or more passive electronic components. Instead, the load 1462 can be comprised of passive electronic components, active electronic components, or both.
An output voltage 1460 can be generated at the collector of the PNP bipolar transistor 1454 (i.e., at the junction node).
The output voltage 1460 is generated according to the following:
Vout4 = Vb + [(17-18) x Z4]
17 = (V3-Vbe) Dl
18 = (V4-Vbe)/B2
17-18 = (V3-Vbe)/Dl - (V4-Vbe)/B2 Vout4 = Vb + [[(V3-Vbe)/Dl - (V4-Vbe)/B2] x Z4] (15) where:
Z4 = impedance of load 1462
Vout4 = voltage 1460
V3 = voltage of common mode voltage detector circuit 1471
V4 = voltage of current mirror reference leg 1464
Dl = resistance of magnetoresistance element 1452
B2 = resistance of the magnetoresistance element 1458
Vb = bias voltage
Vbe = base emitter voltage of PNP bipolar transistor 1454 and of NPN bipolar transistor 1456 = approx. 0.7 volts
For the electronic circuit 1400, the output voltages 1448, 1460 can be taken individually (i.e. single ended signals). In other embodiments, the electronic circuit 1400 provides a differential signal, Vdiff = voltage 1448 - voltage 1460 = Vout3-Vout4.
It should be understood that the loads 1450, 1462 can be made to have high impedances to achieve single ended gains not obtained with the electronic circuits of FIGS. 1 -4 described above. Furthermore, the above described differential signal has an amplitude that is double the amplitude of the single ended signals.
As described above, for the electronic circuit 1400, the output voltages 1412, 1424, 1448, 1460 can be taken individually (i.e., single ended). However, in other embodiments, the output voltages 1412, 1424, 1448, 1460 can be combined in any way, for example, resulting in two differential signals.
Referring now to FIG. 15, in which like elements of FIG. 9 are shown having like reference designations, a magnetic field sensor 1500 can include a substrate 1502 having a surface 1502a, which is one of two parallel major surfaces of the substrate 1502.
The eight magnetoresistance elements 1504a, 1504b, 1506a, 1506b, 1508a, 1508b, 1510a, 1510b (A 1, A2, Bl, B2, CI , C2, Dl , D2) can be disposed upon the surface 1502a along an axis 1514. The eight magnetoresistance elements 1504a, 1504b, 1506a, 1506b, 1508a, 1508b, 1510a, 1510b (A 1 , A2, Bl , B2, CI, C2, Dl , D2) can be part of or coupled to an electronic circuit 1512, which is also disposed upon or within the surface 1502a of the substrate 1502. The eight magnetoresistance elements 1504a, 1504b, 1506a, 1506b, 1508a, 1508b, 1510a, 1510b (A 1 , A2, B 1 , B2, C 1 , C2, D 1 , D2) can be the same as or similar to the eight magnetoresistance elements of FIG. 14.
Maximum response axes of the eight magnetoresistance elements 1504a, 1504b, 1506a, 1506b, 1508a, 1508b, 1510a, 1510b (Al, A2, Bl, B2, CI , C2, Dl , D2) can be parallel to and along an axis 1514, and in the same direction. Angles of magnetic fields are discussed above in conjunction with FIG. 9.
The magnetic field sensor 1500 is responsive to movement of the ferromagnetic target object 912.
In some embodiments, the eight magnetoresistance elements 1504a, 1504b, 1506a, 1506b, 1508a, 1508b, 1510a, 1510b (Al, A2, Bl, B2, CI, C2, Dl , D2) are disposed along the axis 1514 proximate to the ferromagnetic target object 912.
In some embodiments, the two magnetoresistance elements 1504a, 1504b (Al , A2) have a separation 1520 to the two magnetoresistance elements 1508a, 1508b (CI, C2) between about one half and about one and one half of the width 914 of the target feature 912a, for example, a gear tooth of a ferromagnetic gear or a magnetic domain of a ferromagnetic ring magnet. In some embodiments, the two magnetoresistance elements
1504a, 1504b (Al , A2) have a separation 1520 to the two magnetoresistance elements 1508a, 1508b (CI , C2) between about one half and about twice the width 914 of the target feature 912a. However, in other embodiments, the separation 1520 is much smaller than half of the width 914, for example, one one hundredth of the width 914, or larger than twice the width 914.
In some embodiments used in examples below, the separation 1520 is about equal to the width 914 of the target feature 912a.
Similarly, in some embodiments, the two magnetoresistance elements 1506a, 1506b (Bl, B2) have a separation 1522 to the two magnetoresistance elements 1510a, 1510b (D 1 , D2) between about one half and about one and one half of the width 914 of the target feature 912a, for example, a gear tooth of a ferromagnetic gear or a magnetic domain of a ferromagnetic ring magnet. In some embodiments, the two magnetoresistance elements 1506a, 1506b (Bl, B2) have a separation 1522 to the two magnetoresistance elements 1510a, 1510b (Dl, D2) between about one half and about twice the width 914 of the target feature 912a. However, in other embodiments, the separation 1522 is much smaller than half of the width 914, for example, one one hundredth of the width 914, or larger than twice the width 914.
In some embodiments used in examples below, the separation 1522 is about equal to the width 914 of the target feature 912a.
In some other embodiments, the two magnetoresistance elements 1504a, 1504b (Al, A2) have a separation 1524 to the two magnetoresistance elements 1 06a, 1506b (Bl, B2) between about one half and about one and one half of the width 914 of the target feature 912a. In some other embodiments, the two magnetoresistance elements 1504a,
1504b (Al, A2) have a separation 1524 to the two magnetoresistance elements 1506a, 1506b (Bl, B2) between about one half and twice the width 914 of the target feature 912a. However, in other embodiments, the separation 1524 is much smaller than half of the width 914, for example, one one hundredth of the width 914, or larger than twice the width 914.
In some embodiments used in examples below, the separation 1524 is about equal to the width 914 of the target feature 912a. Similarly, in some other embodiments, the two magnetoresistance elements 1508a,
1508b (CI, C2) have a separation 1526 to the two magnetoresistance elements 1510a, 1510b (Dl , D2) between about one half and about one and one half of the width 914 of the target feature 912a. In some other embodiments, the two magnetoresistance elements 1508a, 1508b (CI, C2) have a separation 1526 to the two magnetoresistance elements 1510a, 1510b (Dl , D2) between about twice the width 914 of the target feature 912a. However, in other embodiments, the separation 1526 is much smaller than half of the width 914, for example, one one hundredth of the width 914, or larger than twice the width 914.
In some embodiments used in examples below, the separation 1526 is about equal to the width 914 of the target feature 912a.
In operation, the eight magnetoresistance elements 1504a, 1504b, 1506a, 1506b, 1508a, 1508b, 1510a, 1510b (Al, A2, Bl , B2, CI , C2, Dl, D2) can generate at least two output signals. FIG. 14 is representative of ways in which the eight magnetoresistance elements 1504a, 1504b, 1506a, 1506b, 1508a, 1508b, 1510a, 1510b (Al, A2, Bl, B2, CI, C2, Dl , D2) can generate at least two output signals. In FIG. 14 the designations Al , A2, Bl, B2, CI , C2, Dl, D2are indicative of resistances and are also indicative of physical placement in relation to FIG. 15.
Using as an example the target feature 912a with a width 914 equal to the spacings 1520, 1522, when the target feature 912a is centered about (i.e., between) the eight magnetoresistance elements 1504a, 1504b, 1506a, 1506b, 1508a, 1508b, 1510a, 1510b (Al, A2, Bl, B2, CI, C2, Dl , D2), it can be shown that any magnetoresistance element(s) (e.g., 1504a, 1504b, 1506a, 1506b (Al, A2, Bl, B2) on one side of a center of the target feature 912a experiences a projected magnetic field pointed in one direction along the axis 1514, and any magnetoresistance element(s) (e.g., 1508a, 1508b, 1510a, 1510b (C 1 , C2,
Dl , Dl)) on the other side of the center of the target feature 912a experiences a projected magnetic field pointed in the other direction.
Therefore, when the target feature 912a is centered about eight magnetoresistance elements 1504a, 1504b, 1506a, 1506b, 1508a, 1508b, 1510a, 1510b (A 1 , A2, Bl, B2, CI ,
C2, Dl, D2), any magnetoresistance element(s) (e.g., 1504a, 1504b, 1506a, 1506b (Al, A2, Bl , B2)) on one side of the center of the target feature 912a changes resistance in one direction, and any magnetoresistance element(s) (e.g., 1508a, 1508b, 1510a, 1510b (CI, C2, Dl , D2)) on the other side of the center of the target feature 912a changes resistance in the other direction. In contrast, when an edge of the target feature 912a is centered about (i.e., between) the eight magnetoresistance elements 1504a, 1504b, 1506a, 1506b, 1508a, 1508b, 1510a, 1510b (Al , A2, B 1 , B2, C 1 , C2, D 1 , D2), it can be shown that the four magnetoresistance elements 1504a, 1504b, 1510a, 1510b (A 1 , A2, Dl , D2) experience projected magnetic fields pointed in the same direction along the axis 1514. Thus, resistances the four magnetoresistance elements 1504a, 1504b, 1510a, 1510b (A 1 , A2, D 1 , D2) change in the same direction.
At the same time, when an edge of the target feature 912a is centered, the four magnetoresistance elements 1506a, 1506b, 1508a, 1508b (Bl , B2, CI , C2) experience projected magnetic fields pointed in the same direction along the axis 1514, but opposite in direction from the projected magnetic fields experienced by the four magnetoresistance elements 1504a, 1504b, 1510a, 1510b (Al , A2, Dl, D2). Thus, resistance of four magnetoresistance elements 1506a, 1506b, 1508a, 1508b (Bl, B2, CI, C2) change in the same direction but opposite to the resistance change of the four magnetoresistance elements 1504a, 1504b, 1510a, 1510b (A 1 , A2, Dl, D2).
While a particular example of the spacings 1520, 1515 and 1524, 1526 relative to the width 914 of the target feature 912a is given above, it should be appreciated that for other relative dimensions, magnetic fields at the eight magnetoresistance elements 1504a, 1504b, 1506a, 1506b, 1508a, 1508b, 1510a, 1510b (Al, A2, Bl, B2, CI, C2, Dl, D2) may not be exactly as described above and some resistance changes may be in other directions. However, it should be apparent how to modify equations shown in figures below to accomplish both a feature signal and an edge signal. While a magnet not shown, it should be understood that in some embodiments, the magnetic field sensor 1500 can include a magnet. Referring now to FIG. 16, in which like elements of FIGS. 10, 1 1 , and 12 are shown having like reference designations, another example of an electronic circuit 1600 can be used in another magnetic field sensor. In the electronic circuit 1600, a current mirror reference leg 1602 and a common mode voltage detector circuit 1609 are exchanged in positon and couplings with the current mirror reference leg 1 102 and a common mode voltage detector circuit 1202 of FIG. 12. Operation of the electronic circuit 1600 is similar to operation of the electronic circuit 1200 of FIG. 12.
It should be understood how a current mirror reference leg and a common mode voltage detector circuit can be coupled in either way to all of the above electronic circuits.
In FIG. 16, the designation A, B, C, and D are indicative of resistances and are also indicative of physical placement in relation to FIG. 13. Referring now to FIG. 17, another example of an electronic circuit 1700 can be used in another magnetic field sensor. The electronic circuit 1700 can include a magnetoresistance element 1704 having first and second terminals, wherein the first terminal of the magnetoresistance element 1704 is coupled to receive a voltage 1702 and the second terminal of the magnetoresistance element 1704 is coupled to a source of a P- channel field effect transistor 1706.
The electronic circuit 1700 can include a common mode voltage detector circuit 1727 coupled to a gate of the P-channel field effect transistor 1706. The electronic circuit 1700 can include another magnetoresistance element 1710 having first and second terminals, wherein the first terminal of the magnetoresistance element 1710 is coupled to a source of an N-channel field effect transistor 1708 and the second terminal of the magnetoresistance element 1710 is coupled to a voltage reference, for example, a ground voltage.
The electronic circuit 1700 can include a current mirror reference leg 1732 coupled a gate of the N-channel field effect transistor 1708. A drain of the P-channel field effect transistor 1706 can be coupled to a drain of the N-channel field effect transistor 1708 at a junction node. A load 1714, which can be a resistive or a complex load, can be coupled between the junction node and t a bias voltage, Vb. Current can flow into and/or out of the load 1714.
The load 1714 is labeled Zloadl . The nomenclature, Zloadl , is not intended to limit the load 1714 to one or more passive electronic components. Instead, the load 1714 can be comprised of passive electronic components, active electronic components, or both.
An output voltage 1712 can be generated at the drain of the P-channel field effect transistor 1706 (i.e., at the junction node).
It should be appreciated that the common mode voltage detector circuit 1727, the magnetoresistance element 1704, and the P-channel field effect transistor 1706 form a variable current source operable to provide a variable current, II . The variable current, II , varies in accordance with a variable resistance of the magnetoresistance element 1704, which varies in accordance with a sensed magnetic field.
It should be appreciated that the current mirror reference leg 1732, the
magnetoresistance element 1710, and the N-channel field effect transistor 1708 form a variable current sink operable to provide a variable current, 12. The variable current, 12, varies in accordance with a variable resistance of the magnetoresistance element 1710, which varies in accordance with a sensed magnetic field. Thus, the output voltage 1712 is generated according to the following:
Vout l='(Il -I2) x Zloadl
Equations used to describe the voltage, Voutl , can be similar to the equations used to describe Voutl in conjunction with FIG. 10 above, except that Vbe is replaced by Vgs, where Vgs = a gate source voltage of the field effect transistors (which can be different for P-channel and N-channel field defect transistors). A gate-source voltage can be near one volt.
In the electronic circuit 1700, it should be appreciated that the same current, II flows through the P-channel field effect transistor 1706 and through the magnetoresistance element 1704. Also, the same current, 12, flows through the N-channel field effect transistor 1708 and through the magnetoresistance element 1710.
The electronic circuit 1700 can also include a magnetoresistance element 1716 having first and second terminals, wherein the first terminal of the magnetoresistance element 1716 is coupled to receive the voltage 1702 and the second terminal of the magnetoresistance element 1716 is coupled to a source of a P-channel field effect transistor 1718.
The common mode voltage detector circuit 1727 can be coupled to a gate of the P- channel field effect transistor 1718. The electronic circuit 1700 can include another magnetoresistance element 1722 having first and second terminals, wherein the first terminal of the magnetoresistance element 1722 is coupled to a source of an N-channel field effect transistor 1720 and the second terminal of the magnetoresistance element 1722 is coupled to a voltage reference, for example, a ground voltage.
The current mirror reference leg 1732 is coupled to a gate of the N-channel field effect transistor 1720.
A drain of the P-channel field effect transistor 1718 can be coupled to a drain of the N-channel field effect transistor 1720 at a junction node.
A load 1726, which can be a resistive or a complex load, can be coupled between the junction node and a bias voltage, Vb. Current can flow into and/or out of the load 1726.
The load 1726 is labeled Zload2. The nomenclature, Zload2, is not intended to limit the load 1726 to one or more passive electronic components. Instead, the load 1726 can be comprised of passive electronic components, active electronic components, or both.
An output voltage 1724 can be generated at the drain of the P-channel field effect transistor 1718 (i.e., at the junction node).
It should be appreciated that the common mode voltage detector circuit 1727, the magnetoresistance element 1716, and the P-channel field effect transistor 1718 form a variable current source operable to provide a variable current, 13. The variable current, 13, varies in accordance with a variable resistance of the magnetoresistance element 1716, which varies in accordance with a sensed magnetic field.
It should be appreciated that the current mirror reference leg 1732, the
magnetoresistance element 1722, and the N-channel field effect transistor 1720 form a variable current sink operable to provide a variable current, 14. The variable current, 14, varies in accordance with a variable resistance of the magnetoresistance element 1722, which varies in accordance with a sensed magnetic field. Thus, the output voltage 1724 is generated according to the following:
Vout2 = (13-14) x Zload2
Equations used to describe the voltage, Vout2, can be similar to the equations used to describe Vout2 in conjunction with FIG. 10 above, except that Vbe is replaced by Vgs where Vgs = a gate source voltage of the field effect transistors (which can be different for P-channel and N-channel field defect transistors). A gate-source voltage can be near one volt.
In the electronic circuit 1700, it should be appreciated that the same current, II , flows through the P-channel field effect transistor 1706 and through the magnetoresistance element 1704. Also, the same current, 12, flows through the N-channel field effect transistor 1708 and through the magnetoresistance element 1710. In the electronic circuit 1700, it should be appreciated that the same current, 13, flows through the P-channel field effect transistor 1718 and through the magnetoresistance element 1716. Also, the same current, 14, flows through the N-channel field effect transistor 1720 and through the magnetoresistance element 1722. For the electronic circuit 1700, the output voltages 1712, 1724 can be taken individually (i.e., single ended signals). In other embodiments, the electronic circuit 1700 provides a differential signal, Vdiff = voltage 1712 - voltage 1724 = Voutl-Vout2.
It should be understood that the loads 1714, 1726 can be made to have high impedances to achieve single ended gains not obtained with the electronic circuits of
FIGS. 1 -4 described above. Furthermore, the above described differential signal has an amplitude that is double the amplitude of the single ended signals.
In FIG. 17, the designation A, B, C, and D are indicative of resistances and are also indicative of physical placement in relation to FIG. 13.
It should be understood that all of the above electronic circuits can use field effect transistors in place of bipolar junction transistors. Some embodiments described above show two loads. Similar embodiments can instead drive different ends of the same load. Some embodiments described above show four loads. Similar embodiments can instead drive different ends of two loads. Other load couplings are also possible. While transistors are used in electronic circuits shown and described herein, it should be understood that any electronic component or element now known or later discovered that has a control node to control a current passing between two current passing nodes can be used in place of transistors.
Having described preferred embodiments, which serve to illustrate various concepts, structures and techniques, which are the subject of this patent, it will now become apparent that other embodiments incorporating these concepts, structures and techniques may be used. Accordingly, it is submitted that the scope of the patent should not be limited to the described embodiments but rather should be limited only by the spirit and scope of the following claims. Elements of embodiments described herein may be combined to form other embodiments not specifically set forth above. Various elements, which are described in the context of a single embodiment, may also be provided separately or in any suitable subcombination. Other embodiments not specifically described herein are also within the scope of the following claims.

Claims

1. An electronic circuit, comprising,
a first magnetoresistance element having first and second terminals;
a first transistor having a control node, a first current passing node, and a second current passing node; and
a first voltage source having first and second nodes between which a first voltage is generated, wherein the first terminal of the first magnetoresistance element is coupled to the first current passing node of the first transistor, wherein the first node of the first voltage source is coupled to the control node of the first transistor and the second node of the first voltage source is coupled to the second terminal of the first magnetoresistance element, wherein the electronic circuit is operable to generate a first current signal at the second current passing node of the first transistor related to a resistance value of the first magnetoresistance element.
2. The electronic circuit of Claim 1 , further comprising a resistor having first and second terminals, the first terminal of the resistor coupled to the second current passing node of the first transistor, wherein the resistor is operable to pass the first current signal and convert the first current signal to a voltage signal at the second current passing node of the first transistor.
3. The electronic circuit of Claim 1 , wherein the first voltage source comprises a reference leg of a current mirror circuit.
4. The electronic circuit of Claim 1, further comprising:
a comparator coupled to the second current passing node of the first transistor for generating a two state output signal.
5. The electronic circuit of Claim 1, further comprising:
a first resistor having first and second terminals;
a second transistor having a control node, a first current passing node, and a second current passing node; a second voltage source having first and second nodes between which a second voltage is generated; and
a first load coupled to the second current passing node of the first transistor, wherein the second current passing node of the first transistor is coupled to the second current passing node of the second transistor, wherein the first terminal of the first resistor is coupled to the first current passing node of the second transistor, wherein the first node of the second voltage source is coupled to the control node of the second transistor and the second node of the second voltage source is coupled to the second terminal of the first resistor, wherein the electronic circuit is operable to generate a second current signal at the second current passing node of the second transistor related to a resistance value of the first resistor, wherein a current passing through the first load is equal to a difference between the first current signal and the second current signal.
6. The electronic circuit of Claim 5, wherein the first transistor is an NPN bipolar transistor and the second transistor is a bipolar PNP transistor
7. The electronic circuit of Claim 5, wherein the first transistor is a PNP bipolar transistor and the second transistor is an NPN bipolar transistor
8. The electronic circuit of Claim 5, wherein the first voltage source comprises a reference leg of a current mirror circuit.
9. The electronic circuit of Claim 5, further comprising:
a comparator coupled to the second current passing node of the first transistor for generating a two state output signal.
10. The electronic circuit of Claim 5, further comprising:
a second magnetoresistance element having first and second terminals;
a third transistor having a control node, and first current passing node, and a second current passing node;
a third voltage source having first and second nodes between which a third voltage is generated, wherein the first terminal of the second magnetoresistance element is coupled to the first current passing node of the third transistor, wherein the first node of the third voltage source is coupled to the control node of the third transistor and the second node of the third voltage source is coupled to the second terminal of the second magnetoresi stance element, wherein the electronic circuit is operable to generate a third current signal at the second current passing node of the third transistor related to a resistance value of the second magnetoresistance element, wherein the electronic circuit further comprises:
a second resistor having first and second terminals;
a fourth transistor having a control node, a first current passing node, and a second current passing node;
a fourth voltage source having first and second nodes between which a fourth voltage is generated; and
a second load coupled to the second current passing node of the third transistor, wherein the second current passing node of the third transistor is coupled to the second current passing node of the fourth transistor, wherein the first terminal of the second resistor is coupled to the first current passing node of the fourth transistor, wherein the first node of the fourth voltage source is coupled to the control node of the fourth transistor and the second node of the fourth voltage source is coupled to the second terminal of the second resistor, wherein the electronic circuit is operable to generate a fourth current signal at the second current passing node of the fourth transistor related to a resistance value of the second resistor, wherein a current passing through the second load is equal to a difference between the third current signal and the fourth current signal.
11. The electronic circuit of Claim 10, wherein the first voltage source and the third voltage source are a same first common voltage source
12. The electronic circuit of Claim 11, wherein the same first common voltage source comprises a reference leg of a current mirror circuit.
13. The electronic circuit of Claim 1 1 , wherein the second voltage source and the fourth voltage source are a same second common voltage source.
14. The electronic circuit of Claim 13, wherein the same first common voltage source comprises a reference leg of a current mirror circuit and wherein the same second common voltage source comprises a common mode voltage detector circuit coupled to the first and second loads and configured to generate the first and third voltages as the same common- mode-related voltage related to a common mode voltage between the first and second loads.
15. The electronic circuit of Claim 10, wherein the second voltage source and the fourth voltage source are a same common voltage source.
16. The electronic circuit of Claim 15, wherein the same common voltage source comprises a common mode voltage detector circuit coupled to the first and second loads and configured to generate the first and third voltages as the same common-mode-related voltage related to a common mode voltage between the first and second loads.
17. The electronic circuit of Claim 1, further comprising:
a second magnetoresistance element having first and second terminals;
a second transistor having a control node, a first current passing node, and a second current passing node;
a second voltage source having first and second nodes between which a second voltage is generated; and
a load coupled to the second current passing node of the first transistor, wherein the second current passing node of the first transistor is coupled to the second current passing node of the second transistor, wherein the first terminal of the second
magnetoresistance element is coupled to the first current passing node of the second transistor, wherein the first node of the second voltage source is coupled to the control node of the second transistor and the second node of the second voltage source is coupled to the second terminal of the second magnetoresistance element, wherein the electronic circuit is operable to generate a second current signal at the second current passing node of the second transistor related to a resistance value of the second magnetoresistance element, wherein a current passing through the load is equal to a difference between the first current signal and the second current signal.
18. The electronic circuit of Claim 17, wherein the first voltage source comprises a reference leg of a current mirror circuit.
19. The electronic circuit of Claim 17, further comprising:
a comparator coupled to the second current passing node of the first transistor for generating a two state output signal.
20. The electronic circuit of Claim 17, further comprising:
a third magnetoresistance element having first and second terminals;
a third transistor having a control node, and first current passing node, and a second current passing node;
a third voltage source having first and second nodes between which a third voltage is generated, wherein the first terminal of the third magnetoresistance element is coupled to the first current passing node of the third transistor, wherein the first node of the third voltage source is coupled to the control node of the third transistor and the second node of the third voltage source is coupled to the second terminal of the third magnetoresistance element, wherein the electronic circuit is operable to generate a third current signal at the second current passing node of the third transistor related to a resistance value of the third magnetoresistance element, wherein the electronic circuit further comprises:
a fourth magnetoresistance element having first and second terminals;
a fourth transistor having a control node, a first current passing node, and a second current passing node;
a fourth voltage source having first and second nodes between which a fourth voltage is generated; and
a second load coupled to the second current passing node of the third transistor, wherein the second current passing node of the third transistor is coupled to the second current passing node of the fourth transistor, wherein the first terminal of the fourth magnetoresistance element is coupled to the first current passing node of the fourth transistor, wherein the first node of the fourth voltage source is coupled to the control node of the fourth transistor and the second node of the fourth voltage source is coupled to the second terminal of the fourth magnetoresistance element, wherein the electronic circuit is operable to generate a fourth current signal at the second current passing node of the fourth transistor related to a resistance value of the fourth magnetoresistance element, wherein a current passing through the second load is equal to a difference between the third current signal and the fourth current signal.
21. The electronic circuit of Claim 20, wherein the first voltage source and the third voltage source are a same first common voltage source.
22. The electronic circuit of Claim 21, wherein the same first common voltage source comprises a reference leg of a current mirror circuit.
23. The electronic circuit of Claim 21, wherein the second voltage source and the fourth voltage source are a same second common voltage source.
24. The electronic circuit of Claim 23, wherein the same first common voltage source comprises a reference leg of a current mirror circuit and wherein the same second common voltage source comprises a common mode voltage detector circuit coupled to the first and second loads and configured to generate the first and third voltages as the same common- mode-related voltage related to a common mode voltage between the first and second loads.
25. The electronic circuit of Claim 20, wherein the second voltage source and the fourth voltage source are a same common voltage source.
26. The electronic circuit of Claim 25, wherein the same common voltage source comprises a common mode voltage detector circuit coupled to the first and second loads and configured to generate the first and third voltages as the same common-mode-related voltage related to a common mode voltage between the first and second loads.
27. A magnetic field sensor, comprising:
a substrate; and
an electronic circuit disposed upon the substrate, the electronic circuit comprising: a first magnetoresistance element having first and second terminals; a first transistor having a control node, a first current passing node, and a second current passing node; and
a first voltage source having first and second nodes between which a first voltage is generated, wherein the first terminal of the first magnetoresistance element is coupled to the first current passing node of the first transistor, wherein the first node of the first voltage source is coupled to the control node of the first transistor and the second node of the first voltage source is coupled to the second terminal of the first magnetoresistance element, wherein the electronic circuit is operable to generate a first current signal at the second current passing node of the first transistor related to a resistance value of the first magnetoresistance element, wherein the electronic circuit further comprises:
a second magnetoresistance element having first and second terminals; a second transistor having a control node, a first current passing node, and a second current passing node;
a second voltage source having first and second nodes between which a second voltage is generated; and
a load coupled to the second current passing node of the first transistor, wherein the second current passing node of the first transistor is coupled to the second current passing node of the second transistor, wherein the first terminal of the second magnetoresistance element is coupled to the first current passing node of the second transistor, wherein the first node of the second voltage source is coupled to the control node of the second transistor and the second node of the second voltage source is coupled to the second terminal of the second
magnetoresistance element, wherein the electronic circuit is operable to generate a second current signal at the second current passing node of the second transistor related to a resistance value of the second magnetoresistance element, wherein a current passing through the load is equal to a difference between the first current signal and the second current signal.
28. The magnetic field sensor of Claim 27, wherein the first voltage source comprises a reference leg of a current mirror circuit.
29. The magnetic field sensor of Claim 27, further comprising:
a comparator coupled to the second current passing node of the first transistor for generating a two state output signal.
30. A magnetic field sensor, comprising:
a substrate; and
an electronic circuit disposed upon the substrate, the electronic circuit comprising: a first magnetoresistance element having first and second terminals;
a first transistor having a control node, and first current passing node, and a second current passing node;
a first voltage source having first and second nodes between which a first voltage is generated, wherein the first terminal of the first magnetoresistance element is coupled to the first current passing node of the first transistor, wherein the first node of the first voltage source is coupled to the control node of the first transistor and the second node of the first voltage source is coupled to the second terminal of the first magnetoresistance element, wherein the electronic circuit is operable to generate a first current signal at the second current passing node of the first transistor related to a resistance value of the first magnetoresistance element, wherein the electronic circuit further comprises:
a second magnetoresistance element having first and second terminals; a second transistor having a control node, a first current passing node, and a second current passing node; and
a second voltage source having first and second nodes between which a second voltage is generated; a load coupled to the second current passing node of the first transistor, wherein the second current passing node of the first transistor is coupled to the second current passing node of the second transistor, wherein the first terminal of the second magnetoresistance element is coupled to the first current passing node of the second transistor, wherein the first node of the second voltage source is coupled to the control node of the second transistor and the second node of the second voltage source is coupled to the second terminal of the second magnetoresistance element, wherein the electronic circuit is operable to generate a second current signal at the second current passing node of the second transistor related to a resistance value of the second magnetoresistance element, wherein a current passing through the load is equal to a difference between the first current signal and the second current signal, wherein the electronic circuit further comprises:
a third magnetoresistance element having first and second terminals;
a third transistor having a control node, and first current passing node, and a second current passing node; and
a third voltage source having first and second nodes between which a third voltage is generated, wherein the first terminal of the third magnetoresistance element is coupled to the first current passing node of the third transistor, wherein the first node of the third voltage source is coupled to the control node of the third transistor and the second node of the third voltage source is coupled to the second terminal of the third magnetoresistance element, wherein the electronic circuit is operable to generate a third current signal at the second current passing node of the third transistor related to a resistance value of the third magnetoresistance element, wherein the electronic circuit further comprises:
a fourth magnetoresistance element having first and second terminals;
a fourth transistor having a control node, a first current passing node, and a second current passing node;
a fourth voltage source having first and second nodes between which a fourth voltage is generated; and
a second load coupled to the second current passing node of the third transistor, wherein the second current passing node of the third transistor is coupled to the second current passing node of the fourth transistor, wherein the first terminal of the fourth magnetoresistance element is coupled to the first current passing node of the fourth transistor, wherein the first node of the fourth voltage source is coupled to the control node of the fourth transistor and the second node of the fourth voltage source is coupled to the second terminal of the fourth
magnetoresistance element, wherein the electronic circuit is operable to generate a fourth current signal at the second current passing node of the fourth transistor related to a resistance value of the fourth magnetoresistance element, wherein a current passing through the second load is equal to a difference between the third current signal and the fourth current signal.
31. The magnetic field sensor of Claim 30, wherein the first voltage source and the third voltage source are a same first common voltage source.
32. The magnetic field sensor of Claim 31 , wherein the same first common voltage source comprises a reference leg of a current mirror circuit.
33. The magnetic field sensor of Claim 31, wherein the second voltage source and the fourth voltage source are a same second common voltage source.
34. The magnetic field sensor of Claim 33, wherein the same first common voltage source comprises a reference leg of a current mirror circuit and wherein the same second common voltage source comprises a common mode voltage detector circuit coupled to the first and second loads and configured to generate the first and third voltages as the same common-mode-related voltage related to a common mode voltage between the first and second loads.
35. The magnetic field sensor of Claim 30, wherein the second voltage source and the fourth voltage source are a same common voltage source.
36. The magnetic field sensor of Claim 35, wherein the same common voltage source comprises a common mode voltage detector circuit coupled to the first and second loads and configured to generate the first and third voltages as the same common-mode-related voltage related to a common mode voltage between the first and second loads.
37. The magnetic field sensor of Claim 30, wherein the electronic circuit further comprises:
a fifth magnetoresistance element having first and second terminals;
a fifth transistor having a control node, and first current passing node, and a second current passing node;
a fifth voltage source having first and second nodes between which a first voltage is generated, wherein the first terminal of the fifth magnetoresi stance element is coupled to the first current passing node of the fifth transistor, wherein the first node of the fifth voltage source is coupled to the control node of the fifth transistor and the second node of the fifth voltage source is coupled to the second terminal of the fifth magnetoresistance element, wherein the electronic circuit is operable to generate a first current signal at the second current passing node of the fifth transistor related to a resistance value of the fifth magnetoresistance element, wherein the electronic circuit further comprises:
a sixth magnetoresistance element having first and second terminals;
a sixth transistor having a control node, an first current passing node, and a second current passing node; and
a sixth voltage source having first and second nodes between which a second voltage is generated; a load coupled to the second current passing node of the fifth transistor, wherein the second current passing node of the fifth transistor is coupled to the second current passing node of the sixth transistor, wherein the first terminal of the sixth magnetoresistance element is coupled to the first current passing node of the sixth transistor, wherein the first node of the sixth voltage source is coupled to the control node of the sixth transistor and the second node of the sixth voltage source is coupled to the second terminal of the sixth
magnetoresistance element, wherein the electronic circuit is operable to generate a second current signal at the second current passing node of the sixth transistor related to a resistance value of the sixth magnetoresistance element, wherein a current passing through the load is equal to a difference between the first current signal and the second current signal, wherein the electronic circuit further comprises:
a seventh magnetoresistance element having first and second terminals; a seventh transistor having a control node, and first current passing node, and a second current passing node; and
a seventh voltage source having first and second nodes between which a third voltage is generated, wherein the first terminal of the seventh
magnetoresistance element is coupled to the first current passing node of the seventh transistor, wherein the first node of the seventh voltage source is coupled to the control node of the seventh transistor and the second node of the seventh voltage source is coupled to the second terminal of the seventh magnetoresistance element, wherein the electronic circuit is operable to generate a third current signal at the second current passing node of the seventh transistor related to a resistance value of the seventh magnetoresistance element, wherein the electronic circuit further comprises:
an eighth magnetoresistance element having first and second terminals; an eighth transistor having a control node, a first current passing node, and a second current passing node;
an eighth voltage source having first and second nodes between which a fourth voltage is generated; and
a second load coupled to the second current passing node of the seventh transistor, wherein the second current passing node of the seventh transistor is coupled to the second current passing node of the eighth transistor, wherein the first terminal of the eighth magnetoresistance element is coupled to the first current passing node of the eighth transistor, wherein the first node of the eighth voltage source is coupled to the control node of the eighth transistor and the second node of the eighth voltage source is coupled to the second terminal of the eighth magnetoresistance element, wherein the electronic circuit is operable to generate a fourth current signal at the second current passing node of the eighth transistor related to a resistance value of the eighth magnetoresistance element, wherein a current passing through the second load is equal to a difference between the third current signal and the fourth current signal.
38. The magnetic field sensor of Claim 37, wherein the first voltage source, the third voltage source, the fifth voltage source, and the seventh voltage source are a same first common voltage source, the second voltage source and the fourth voltage source are the same second common voltage source, and the sixth and the eight voltage source are the same third common voltage source.
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Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9823092B2 (en) 2014-10-31 2017-11-21 Allegro Microsystems, Llc Magnetic field sensor providing a movement detector
EP3451244A1 (en) * 2017-08-30 2019-03-06 Robert Bosch GmbH Device and method for use in at least one of production or processing of metallic materials
US11199424B2 (en) 2018-01-31 2021-12-14 Allegro Microsystems, Llc Reducing angle error in a magnetic field angle sensor
US10866117B2 (en) 2018-03-01 2020-12-15 Allegro Microsystems, Llc Magnetic field influence during rotation movement of magnetic target
US10794936B2 (en) 2018-09-24 2020-10-06 Allegro Microsystems, Llc Magnetic field sensor providing constant voltage across magnetoresistance elements
US10823586B2 (en) 2018-12-26 2020-11-03 Allegro Microsystems, Llc Magnetic field sensor having unequally spaced magnetic field sensing elements
US11175359B2 (en) 2019-08-28 2021-11-16 Allegro Microsystems, Llc Reducing voltage non-linearity in a bridge having tunneling magnetoresistance (TMR) elements
US11237020B2 (en) 2019-11-14 2022-02-01 Allegro Microsystems, Llc Magnetic field sensor having two rows of magnetic field sensing elements for measuring an angle of rotation of a magnet
US11280637B2 (en) 2019-11-14 2022-03-22 Allegro Microsystems, Llc High performance magnetic angle sensor
US11467233B2 (en) 2020-03-18 2022-10-11 Allegro Microsystems, Llc Linear bridges having nonlinear elements
US11408948B2 (en) 2020-03-18 2022-08-09 Allegro Microsystems, Llc Linear bridge having nonlinear elements for operation in high magnetic field intensities

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5168244A (en) * 1991-06-19 1992-12-01 Nec Corporation Electric circuit fabricated from magneto-resistive elements and active circuit elements
JPH1038988A (en) * 1996-07-30 1998-02-13 Yazaki Corp Integrated magnetoresistive effect element circuit
EP2730893A1 (en) * 2011-07-05 2014-05-14 Denso Corporation Mobile object detecting apparatus

Family Cites Families (354)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3132337A (en) 1960-09-12 1964-05-05 Ibm Variable reluctance slotted drum position indicating device
US3195043A (en) 1961-05-19 1965-07-13 Westinghouse Electric Corp Hall effect proximity transducer
DE1514822A1 (en) 1964-08-14 1969-06-26 Telefunken Patent Method for manufacturing a semiconductor device
US3607528A (en) 1968-02-08 1971-09-21 James S Gassaway Magnetic memory members and methods of making the same
US3661061A (en) 1969-05-05 1972-05-09 Atomic Energy Commission Picture position finder
US3611138A (en) 1970-03-05 1971-10-05 Gen Motors Corp Tachometer system including an rf signal modulator and detector
FR2114148A5 (en) 1970-11-16 1972-06-30 Crouzet Sa
DE2518054C2 (en) 1975-04-23 1984-08-02 Siemens AG, 1000 Berlin und 8000 München Arrangement for determining the direction of rotation of a rotary movement
US4048670A (en) 1975-06-30 1977-09-13 Sprague Electric Company Stress-free hall-cell package
FR2396417A1 (en) 1977-06-29 1979-01-26 Tokyo Shibaura Electric Co SEMICONDUCTOR COMPONENT INCLUDING A RESISTOR
US4204317A (en) 1977-11-18 1980-05-27 The Arnold Engineering Company Method of making a lead frame
US4188605A (en) 1978-07-21 1980-02-12 Stout Glenn M Encapsulated Hall effect device
JPS5518056A (en) 1978-07-25 1980-02-07 Nec Corp Semiconductor device
US4283643A (en) 1979-05-25 1981-08-11 Electric Power Research Institute, Inc. Hall sensing apparatus
US4315523A (en) 1980-03-06 1982-02-16 American Flow Systems, Inc. Electronically controlled flow meter and flow control system
DE3030620A1 (en) 1980-08-13 1982-03-11 Siemens AG, 1000 Berlin und 8000 München ARRANGEMENT FOR CHANGING THE ELECTRICAL CIRCUIT CONFIGURATION OF INTEGRATED SEMICONDUCTOR CIRCUITS
JPS5886405A (en) 1981-11-18 1983-05-24 Nec Corp Angle detector
US4670715A (en) 1983-01-28 1987-06-02 Caterpillar Inc. Frictionally supported gear tooth sensor with self-adjusting air gap
CA1238389A (en) 1983-02-07 1988-06-21 Nl Industries, Inc. Spinner transducer
JPS60152256A (en) 1984-01-18 1985-08-10 Atsugi Motor Parts Co Ltd Manufacture of motor
JPS60257546A (en) 1984-06-04 1985-12-19 Mitsubishi Electric Corp Semiconductor device and manufacture thereof
CH664632A5 (en) 1984-08-16 1988-03-15 Landis & Gyr Ag CIRCUIT ARRANGEMENT FOR COMPENSATING VARIATIONS OF THE TRANSMISSION FACTOR OF A MAGNETIC FIELD SENSOR.
US4614111A (en) 1985-02-15 1986-09-30 Wolff George D Position sensor for fuel injection apparatus
SE447608B (en) 1985-04-03 1986-11-24 Hightech Network Ab PROCEDURE AND DEVICE FOR SETTING A DIGITAL REGULATOR
DE3590792T (en) 1985-05-10 1987-07-16
US4719419A (en) 1985-07-15 1988-01-12 Harris Graphics Corporation Apparatus for detecting a rotary position of a shaft
JPS6234316A (en) 1985-08-07 1987-02-14 Victor Co Of Japan Ltd Magnetic head using magneto-resistance effect element and its manufacture
JPH0665967B2 (en) 1985-08-27 1994-08-24 株式会社エスジー Absolute rotational position detector
JPS62235523A (en) 1986-03-19 1987-10-15 Honda Motor Co Ltd Manufacture of rotational angle sensor
US4833406A (en) 1986-04-17 1989-05-23 Household Commercial Financial Services Inc. Temperature compensated Hall-effect sensor apparatus
US4649796A (en) 1986-06-18 1987-03-17 The United States Of America As Represented By The Secretary Of The Army Method and apparatus for setting a projectile fuze during muzzle exit
US4745363A (en) 1986-07-16 1988-05-17 North American Philips Corporation Non-oriented direct coupled gear tooth sensor using a Hall cell
DE3632624C1 (en) 1986-09-25 1988-03-10 Balluff Gebhard Feinmech Proximity switch insensitive to interference fields
JPS6384176A (en) 1986-09-29 1988-04-14 Toshiba Corp Magnetic focusing type hall element and manufacture thereof
US4746859A (en) 1986-12-22 1988-05-24 Sundstrand Corporation Power and temperature independent magnetic position sensor for a rotor
US4772929A (en) 1987-01-09 1988-09-20 Sprague Electric Company Hall sensor with integrated pole pieces
US4789826A (en) 1987-03-19 1988-12-06 Ampex Corporation System for sensing the angular position of a rotatable member using a hall effect transducer
US4760285A (en) 1987-03-30 1988-07-26 Honeywell Inc. Hall effect device with epitaxal layer resistive means for providing temperature independent sensitivity
JPS63263782A (en) 1987-04-22 1988-10-31 Hitachi Ltd Magnetoelectric converter
FR2614695B1 (en) 1987-04-28 1989-06-23 Commissariat Energie Atomique METHOD FOR THE DIGITIZATION AND LINEARIZATION OF A SENSOR WITH QUASI-SINUSOIDAL PERIODIC CHARACTERISTICS AND CORRESPONDING DEVICE
GB8711559D0 (en) 1987-05-15 1987-06-17 Ssd Ltd Shaft encoders
US5012322A (en) 1987-05-18 1991-04-30 Allegro Microsystems, Inc. Semiconductor die and mounting assembly
JPH0612266B2 (en) 1987-05-30 1994-02-16 株式会社安川電機 Multi-turn absolute value encoder
US4823075A (en) 1987-10-13 1989-04-18 General Electric Company Current sensor using hall-effect device with feedback
US5078944A (en) 1987-11-02 1992-01-07 Matsushita Electric Industrial Co., Ltd. Method for making permanent magnet type demagnetizing head
DE3743521A1 (en) 1987-12-22 1989-07-06 Foerster Inst Dr Friedrich DEVICE FOR TESTING SEMI-PRODUCTS
US4983916A (en) 1988-01-26 1991-01-08 Yamaha Corporation Compact magnetic encoder
ATE86800T1 (en) 1988-04-21 1993-03-15 Landis & Gyr Betriebs Ag INTEGRATED SEMICONDUCTOR CIRCUIT WITH A MAGNETIC SENSOR MADE OF SEMICONDUCTOR MATERIAL.
EP0357013A3 (en) 1988-09-02 1991-05-15 Honeywell Inc. Magnetic field measuring circuit
JPH0248882U (en) 1988-09-30 1990-04-04
US4910861A (en) 1988-10-07 1990-03-27 Emerson Electric Co. Method of manufacturing retention structure for electric motor rotor magnets
KR930004094Y1 (en) 1988-10-11 1993-06-30 미쓰비시전기 주식회사 Hall eefect type sensing device and magnetic circuit device for a hall effect type sensor
JPH02116753A (en) 1988-10-26 1990-05-01 Mitsubishi Electric Corp Detector for direction of rotation
JPH02149013A (en) 1988-11-30 1990-06-07 Toshiba Corp Oscillation circuit
EP0388584B1 (en) 1989-01-17 1993-10-27 Gec Alsthom Sa Device for determining the position of a steel shaft comprising an electrically discontinuous band and procedure for manufacturing said band
KR910004884B1 (en) 1989-02-01 1991-07-15 한국식품개발연구원 Against oxidation of oils
US5789915A (en) 1989-02-17 1998-08-04 Nartron Corporation Magnetic field energy responsive position sensing apparatus and method
US4935698A (en) 1989-03-03 1990-06-19 Sprague Electric Company Sensor having dual Hall IC, pole piece and magnet
JPH02236183A (en) 1989-03-09 1990-09-19 Mitsubishi Electric Corp Hall sensor device and its manufacture
US5196794A (en) 1989-03-14 1993-03-23 Mitsubishi Denki K.K. Hall-effect sensor with integrally molded frame, magnet, flux guide and insulative film
JPH0329817A (en) 1989-06-28 1991-02-07 Fanuc Ltd Wireless manual encoder
JP2522214B2 (en) 1989-10-05 1996-08-07 日本電装株式会社 Semiconductor device and manufacturing method thereof
US5121289A (en) 1990-01-31 1992-06-09 Honeywell Inc. Encapsulatable sensor assembly
US5021493A (en) 1990-03-21 1991-06-04 The Goodyear Tire & Rubber Company Rubber composition and tire with component(s) thereof
US5045920A (en) 1990-06-28 1991-09-03 Allegro Microsystems, Inc. Dual-Hall ferrous-article-proximity sensor
DE4031560C2 (en) 1990-10-05 1993-10-14 Dieter Prof Dr Ing Seitzer Current sensor with components sensitive to magnetic fields and use
JPH04152688A (en) 1990-10-17 1992-05-26 Fujitsu Ltd Magnetoresistance element
US5038130A (en) 1990-11-06 1991-08-06 Santa Barbara Research Center System for sensing changes in a magnetic field
US5185919A (en) 1990-11-19 1993-02-16 Ford Motor Company Method of manufacturing a molded fuel injector
US5139973A (en) 1990-12-17 1992-08-18 Allegro Microsystems, Inc. Method for making a semiconductor package with the distance between a lead frame die pad and heat spreader determined by the thickness of an intermediary insulating sheet
US5216405A (en) 1991-01-14 1993-06-01 General Motors Corporation Package for the magnetic field sensitive device
US5167896A (en) 1991-01-16 1992-12-01 Kyowa Electric & Chemical Co., Ltd. Method of manufacturing a front cabinet for use with a display
DE4104902A1 (en) 1991-02-18 1992-08-20 Swf Auto Electric Gmbh METHOD AND ARRANGEMENT FOR DETECTING A DIRECTION OF MOVEMENT, IN PARTICULAR A DIRECTION OF DIRECTION
US5349743A (en) 1991-05-02 1994-09-27 At&T Bell Laboratories Method of making a multilayer monolithic magnet component
DE4114835A1 (en) 1991-05-07 1992-11-12 Vdo Schindling SWITCHING DEVICE, IN PARTICULAR FOR USE IN MOTOR VEHICLES
US5491633A (en) 1991-05-20 1996-02-13 General Motors Corporation Position sensor for electromechanical suspension
JP2958821B2 (en) 1991-07-08 1999-10-06 株式会社村田製作所 Solid inductor
DE69232236T2 (en) 1991-07-16 2002-08-08 Asahi Chemical Ind SEMICONDUCTOR SENSOR AND ITS MANUFACTURING METHOD
EP0537419A1 (en) 1991-10-09 1993-04-21 Landis & Gyr Business Support AG Device comprising an integrated magnetic field sensor and first and second magnetic flux concentrator, and method to build into a container of synthetic material a plurality of these devices
KR940004952B1 (en) 1991-11-08 1994-06-07 주식회사 금성사 Arrangement for starting dc motor
US5247278A (en) 1991-11-26 1993-09-21 Honeywell Inc. Magnetic field sensing device
DE4141959A1 (en) 1991-12-19 1993-06-24 Swf Auto Electric Gmbh SPEED SENSOR, IN PARTICULAR GEAR SENSOR
CA2080177C (en) 1992-01-02 1997-02-25 Edward Allan Highum Electro-magnetic shield and method for making the same
DE69324242T2 (en) 1992-01-31 1999-08-19 Northrop Grumman Corp Vortex current probe system in an array
US5210493A (en) 1992-02-27 1993-05-11 General Motors Corporation Method for embedding wires within a powder metal core and sensor assembly produced by such a method
WO1993018369A1 (en) 1992-03-02 1993-09-16 Seiko Epson Corporation Displacement sensor
US5286426A (en) 1992-04-01 1994-02-15 Allegro Microsystems, Inc. Assembling a lead frame between a pair of molding cavity plates
US5304926A (en) 1992-04-08 1994-04-19 Honeywell Inc. Geartooth position sensor with two hall effect elements
US5250925A (en) 1992-05-11 1993-10-05 General Motors Corporation Package for speed sensing device having minimum air gap
US5757181A (en) 1992-06-22 1998-05-26 Durakool Incorporated Electronic circuit for automatically compensating for errors in a sensor with an analog output signal
US5497081A (en) 1992-06-22 1996-03-05 Durakool Incorporated Mechanically adjustable linear-output angular position sensor
US5332965A (en) 1992-06-22 1994-07-26 Durakool Incorporated Contactless linear angular position sensor having an adjustable flux concentrator for sensitivity adjustment and temperature compensation
CH683469A5 (en) 1992-07-03 1994-03-15 Landis & Gyr Business Support Semiconductor wafer contg. magnetic field sensor - is installed between pole shoes of laminated ferromagnetic magnetic flux concentrator to measure magnetic field in proximity
JP2691665B2 (en) 1992-07-07 1997-12-17 日本精機株式会社 Guideline manufacturing method
US5691637A (en) 1992-08-28 1997-11-25 True Position Magnetics, Inc. Magnetic field position transducer for two or more dimensions
US5341097A (en) 1992-09-29 1994-08-23 Honeywell Inc. Asymmetrical magnetic position detector
US5331478A (en) * 1992-10-07 1994-07-19 Silicon Systems, Inc. Magnetoresistive head amplifier
US5289344A (en) 1992-10-08 1994-02-22 Allegro Microsystems Inc. Integrated-circuit lead-frame package with failure-resistant ground-lead and heat-sink means
ES2110555T3 (en) 1992-10-21 1998-02-16 Bosch Gmbh Robert DEVICE FOR THE DETECTION OF THE MOVEMENT OF A MOBILE PART.
JPH077196A (en) * 1992-12-29 1995-01-10 Eastman Kodak Co Magnetic field sensor and method of magnetic field detection
US5469058A (en) 1992-12-30 1995-11-21 Dunnam; Curt Feedback enhanced sensor, alternating magnetic field detector
JPH06273437A (en) 1993-03-22 1994-09-30 Yazaki Corp Rotation detection apparatus
GB2276727B (en) 1993-04-01 1997-04-09 Rolls Royce & Ass Improvements in and relating to magnetometers
US5424558A (en) 1993-05-17 1995-06-13 High Yield Technology, Inc. Apparatus and a method for dynamically tuning a particle sensor in response to varying process conditions
DE4319146C2 (en) 1993-06-09 1999-02-04 Inst Mikrostrukturtechnologie Magnetic field sensor, made up of a magnetic reversal line and one or more magnetoresistive resistors
US5329416A (en) 1993-07-06 1994-07-12 Alliedsignal Inc. Active broadband magnetic flux rate feedback sensing arrangement
JPH07203645A (en) 1993-12-30 1995-08-04 Mabuchi Motor Co Ltd Manufacture of miniature motor and rotor thereof
US5477143A (en) 1994-01-11 1995-12-19 Honeywell Inc. Sensor with magnetoresistors disposed on a plane which is parallel to and displaced from the magnetic axis of a permanent magnet
US5414355A (en) 1994-03-03 1995-05-09 Honeywell Inc. Magnet carrier disposed within an outer housing
US5434105A (en) 1994-03-04 1995-07-18 National Semiconductor Corporation Process for attaching a lead frame to a heat sink using a glob-top encapsulation
US5508611A (en) 1994-04-25 1996-04-16 General Motors Corporation Ultrathin magnetoresistive sensor package
US6104231A (en) 1994-07-19 2000-08-15 Honeywell International Inc. Temperature compensation circuit for a hall effect element
JPH0897486A (en) 1994-09-22 1996-04-12 Hitachi Cable Ltd Hall sensor
US5581170A (en) 1994-12-12 1996-12-03 Unitrode Corporation Battery protector
US5500589A (en) 1995-01-18 1996-03-19 Honeywell Inc. Method for calibrating a sensor by moving a magnet while monitoring an output signal from a magnetically sensitive component
US5488294A (en) 1995-01-18 1996-01-30 Honeywell Inc. Magnetic sensor with means for retaining a magnet at a precise calibrated position
JPH08201490A (en) 1995-01-31 1996-08-09 Mitsumi Electric Co Ltd Sensor ic
DE59607223D1 (en) 1995-02-02 2001-08-09 Siemens Ag DEVICE FOR MEASURING THE SPEED OR DETECTING THE DIRECTION OF A TURNING MAGNET
DE19510579C2 (en) 1995-03-23 1997-08-21 Inst Physikalische Hochtech Ev Angle of rotation or speed sensor
US5627315A (en) 1995-04-18 1997-05-06 Honeywell Inc. Accelerometer with a cantilever beam formed as part of the housing structure
JP3605880B2 (en) 1995-05-12 2004-12-22 株式会社デンソー Non-contact rotation sensor
US5581179A (en) 1995-05-31 1996-12-03 Allegro Microsystems, Inc. Hall-effect ferrous-article-proximity sensor assembly
US5719496A (en) 1995-06-07 1998-02-17 Durakool Incorporated Dual-element proximity sensor for sensing the direction of rotation of a ferrous target wheel
US5781005A (en) 1995-06-07 1998-07-14 Allegro Microsystems, Inc. Hall-effect ferromagnetic-article-proximity sensor
US5818222A (en) 1995-06-07 1998-10-06 The Cherry Corporation Method for adjusting ferrous article proximity detector
US5596272A (en) 1995-09-21 1997-01-21 Honeywell Inc. Magnetic sensor with a beveled permanent magnet
US5696790A (en) 1995-10-04 1997-12-09 Tut Systems, Inc. Method and apparatus for time dependent data transmission
US5712562A (en) 1995-10-13 1998-01-27 Bently Nevada Corporation Encapsulated transducer with an alignment plug and method of manufacture
DE19539458C2 (en) 1995-10-24 2001-03-15 Bosch Gmbh Robert Sensor with test input
EP0772046B1 (en) 1995-10-30 2002-04-17 Sentron Ag Magnetic field probe and current or energy probe
DE19540674C2 (en) 1995-10-31 1999-01-28 Siemens Ag Adaptation procedure for correcting tolerances of an encoder wheel
US5621319A (en) 1995-12-08 1997-04-15 Allegro Microsystems, Inc. Chopped hall sensor with synchronously chopped sample-and-hold circuit
JPH09166612A (en) 1995-12-18 1997-06-24 Nissan Motor Co Ltd Magnetic sensor
US6525531B2 (en) 1996-01-17 2003-02-25 Allegro, Microsystems, Inc. Detection of passing magnetic articles while adapting the detection threshold
US6297627B1 (en) 1996-01-17 2001-10-02 Allegro Microsystems, Inc. Detection of passing magnetic articles with a peak-to-peak percentage threshold detector having a forcing circuit and automatic gain control
US5631557A (en) 1996-02-16 1997-05-20 Honeywell Inc. Magnetic sensor with encapsulated magnetically sensitive component and magnet
FR2748105B1 (en) 1996-04-25 1998-05-29 Siemens Automotive Sa MAGNETIC SENSOR AND METHOD FOR PRODUCING SUCH A SENSOR
CH690934A5 (en) 1996-04-29 2001-02-28 Suisse Electronique Microtech A position detection and motion in magnetic field variation.
JP2816668B2 (en) 1996-07-04 1998-10-27 愛知製鋼株式会社 Method for manufacturing magnetically anisotropic resin-bonded magnet
US6822443B1 (en) 2000-09-11 2004-11-23 Albany Instruments, Inc. Sensors and probes for mapping electromagnetic fields
DE19634715A1 (en) 1996-08-28 1998-03-05 Teves Gmbh Alfred Arrangement for detecting the turning behavior of a wheel
US5912347A (en) 1996-09-30 1999-06-15 Mallinckrodt Inc. Process for preparing a morphinan derivative
US6175233B1 (en) 1996-10-18 2001-01-16 Cts Corporation Two axis position sensor using sloped magnets to generate a variable magnetic field and hall effect sensors to detect the variable magnetic field
US5912556A (en) 1996-11-06 1999-06-15 Honeywell Inc. Magnetic sensor with a chip attached to a lead assembly within a cavity at the sensor's sensing face
US5729128A (en) 1996-11-22 1998-03-17 Honeywell Inc. Magnetic sensor with a magnetically sensitive component that is movable during calibration and rigidly attachable to a formed magnet
US5859387A (en) 1996-11-29 1999-01-12 Allegro Microsystems, Inc. Semiconductor device leadframe die attach pad having a raised bond pad
DE19650935A1 (en) 1996-12-07 1998-06-10 Teves Gmbh Alfred Method and circuit arrangement for the transmission of speed information and additional data
JPH10232242A (en) 1997-02-19 1998-09-02 Mitsubishi Electric Corp Detector
US5839185A (en) 1997-02-26 1998-11-24 Sundstrand Corporation Method of fabricating a magnetic flux concentrating core
JP4093381B2 (en) 1997-04-01 2008-06-04 株式会社デンソー Detection signal processing device for rotation sensor
US5900773A (en) * 1997-04-22 1999-05-04 Microchip Technology Incorporated Precision bandgap reference circuit
EP0990123B1 (en) 1997-06-21 2002-02-20 Micro-Epsilon Messtechnik GmbH & Co. KG Eddy current sensor
US5963028A (en) 1997-08-19 1999-10-05 Allegro Microsystems, Inc. Package for a magnetic field sensing device
US6198373B1 (en) 1997-08-19 2001-03-06 Taiyo Yuden Co., Ltd. Wire wound electronic component
JPH1164363A (en) 1997-08-25 1999-03-05 Aisin Seiki Co Ltd Rotation detector
JP3745509B2 (en) 1997-08-27 2006-02-15 株式会社Neomax Cylindrical resin magnet molding equipment
ES2262241T3 (en) 1997-09-15 2006-11-16 Ams International Ag CURRENT SUPERVISION SYSTEM AND MANUFACTURING PROCEDURE OF THIS SYSTEM.
KR100530607B1 (en) 1997-10-08 2005-11-22 가부시키가이샤 가네가 Balloon catheter and method of production thereof
US5883567A (en) 1997-10-10 1999-03-16 Analog Devices, Inc. Packaged integrated circuit with magnetic flux concentrator
US6452381B1 (en) 1997-11-28 2002-09-17 Denso Corporation Magnetoresistive type position detecting device
US6011770A (en) 1997-12-10 2000-01-04 Texas Instrumental Incorporated Method and apparatus for high-order bandpass filter with linearly adjustable bandwidth
US6136250A (en) 1998-01-30 2000-10-24 Comair Rotron, Inc. Apparatus and method of encapsulating motors
EP1064559A1 (en) 1998-03-20 2001-01-03 Continental Teves AG & Co. oHG Sensor system for detecting movements
JPH11304414A (en) 1998-04-21 1999-11-05 Mitsubishi Electric Corp Magnetism detecting device
US6242905B1 (en) 1998-04-23 2001-06-05 Siemens Aktiengesellschaft Method for identifying the direction of rotation of a wheel using hall probes
JP2000023423A (en) 1998-06-30 2000-01-21 Ykk Corp Brushless motor rotation angle detector and brushless motor employing the same
US6809515B1 (en) 1998-07-31 2004-10-26 Spinix Corporation Passive solid-state magnetic field sensors and applications therefor
US6100754A (en) * 1998-08-03 2000-08-08 Advanced Micro Devices, Inc. VT reference voltage for extremely low power supply
US6297628B1 (en) 1998-11-17 2001-10-02 Honeywell Inc Magnetoresistive bridge array
JP3378816B2 (en) 1998-12-21 2003-02-17 三洋電機株式会社 Semiconductor device and manufacturing method thereof
US20010009367A1 (en) 1999-02-26 2001-07-26 Dieter Seitzer Sensor device to record speed and motion direction of an object, especially rotational speed and direction of a rotating object
US6278269B1 (en) 1999-03-08 2001-08-21 Allegro Microsystems, Inc. Magnet structure
US6351506B1 (en) 1999-04-19 2002-02-26 National Semiconductor Corporation Switched capacitor filter circuit having reduced offsets and providing offset compensation when used in a closed feedback loop
JP2001043475A (en) 1999-07-27 2001-02-16 Nsk Ltd Transmitting method for detection signal of sensor
DE19937155A1 (en) 1999-08-06 2001-03-15 Bosch Gmbh Robert System for generating a signal for superimposing information
US6291989B1 (en) 1999-08-12 2001-09-18 Delphi Technologies, Inc. Differential magnetic position sensor with adaptive matching for detecting angular position of a toothed target wheel
US6436748B1 (en) 1999-08-31 2002-08-20 Micron Technology, Inc. Method for fabricating CMOS transistors having matching characteristics and apparatus formed thereby
JP2001141738A (en) 1999-11-18 2001-05-25 Sumitomo Electric Ind Ltd Rotation sensor and manufacturing method thereof
FR2801445A1 (en) 1999-11-23 2001-05-25 Koninkl Philips Electronics Nv AMPLIFIER WITH ADJUSTABLE BANDWIDTH
JP4964358B2 (en) 1999-12-07 2012-06-27 株式会社デンソー Rotation sensor detection signal processing apparatus and rotation sensor detection signal output method
JP2001165702A (en) 1999-12-10 2001-06-22 Sumitomo Electric Ind Ltd Magnetic variate detecting sensor
DE19961504A1 (en) 1999-12-20 2001-06-28 Bosch Gmbh Robert Rotational speed signal error detection method for anti-slip or anti-lock regulation system of vehicle, involves detecting speed change based on specific condition involving pulse width of falling pulses of measurement signal
US6640451B1 (en) 2000-01-28 2003-11-04 Visteon Global Technologies, Inc. System and method for sensing the angular position of a rotatable member
US6492697B1 (en) 2000-04-04 2002-12-10 Honeywell International Inc. Hall-effect element with integrated offset control and method for operating hall-effect element to reduce null offset
US6724191B1 (en) 2000-05-09 2004-04-20 Admiralty Corporation Systems and methods useful for detecting presence and/or location of various materials
US6501270B1 (en) 2000-05-15 2002-12-31 Siemens Vdo Automotive Corporation Hall effect sensor assembly with cavities for integrated capacitors
US6917321B1 (en) 2000-05-21 2005-07-12 Analog Devices, Inc. Method and apparatus for use in switched capacitor systems
US6853178B2 (en) 2000-06-19 2005-02-08 Texas Instruments Incorporated Integrated circuit leadframes patterned for measuring the accurate amplitude of changing currents
DE10032530C2 (en) 2000-07-05 2002-10-24 Infineon Technologies Ag Amplifier circuit with offset compensation
JP2002026419A (en) 2000-07-07 2002-01-25 Sanken Electric Co Ltd Magnetism-electricity conversion device
JP4936299B2 (en) 2000-08-21 2012-05-23 メレクシス・テクノロジーズ・ナムローゼフェンノートシャップ Magnetic field direction detection sensor
US6617846B2 (en) 2000-08-31 2003-09-09 Texas Instruments Incorporated Method and system for isolated coupling
CN1387678A (en) 2000-09-08 2002-12-25 Asm技术新加坡私人有限公司 Mold
JP3479275B2 (en) 2000-10-05 2003-12-15 株式会社エヌ・ティ・ティ・データ Air route setting device and recording medium
JP2002149013A (en) 2000-11-06 2002-05-22 Minolta Co Ltd Image forming apparatus
US7190784B2 (en) 2000-12-29 2007-03-13 Legerity, Inc. Method and apparatus for adaptive DC level control
TW473951B (en) 2001-01-17 2002-01-21 Siliconware Precision Industries Co Ltd Non-leaded quad flat image sensor package
US6700813B2 (en) * 2001-04-03 2004-03-02 Canon Kabushiki Kaisha Magnetic memory and driving method therefor
EP1260825A1 (en) 2001-05-25 2002-11-27 Sentron Ag Magnetic field probe
GB0126014D0 (en) 2001-10-30 2001-12-19 Sensopad Technologies Ltd Modulated field position sensor
JP4168604B2 (en) 2001-05-31 2008-10-22 日本ゼオン株式会社 Development method and image forming method
US6498474B1 (en) 2001-06-27 2002-12-24 Kelsey-Hayes Company Rotational velocity and direction sensing system
US8107901B2 (en) 2001-08-20 2012-01-31 Motorola Solutions, Inc. Feedback loop with adjustable bandwidth
DE10141877B4 (en) 2001-08-28 2007-02-08 Infineon Technologies Ag Semiconductor device and converter device
JP4184963B2 (en) 2001-09-25 2008-11-19 ダイハツ工業株式会社 Nondestructive inspection method
DE10148042B4 (en) 2001-09-28 2006-11-09 Infineon Technologies Ag Electronic component with a plastic housing and components of a height-structured metallic system carrier and method for their production
US6803757B2 (en) 2001-10-02 2004-10-12 Bentley Nevada, Llc Multi-coil eddy current proximity probe system
EP1443332B1 (en) 2001-11-01 2014-04-16 Melexis Technologies NV Current sensor
JP3877998B2 (en) 2001-11-05 2007-02-07 株式会社山武 Temperature information detecting device and position detecting device for angle sensor
US20030107366A1 (en) 2001-12-06 2003-06-12 Busch Nicholas F. Sensor with off-axis magnet calibration
JP2003177171A (en) 2001-12-11 2003-06-27 Sumitomo Electric Ind Ltd Magnetism variation sensor and its manufacturing method
US6815944B2 (en) 2002-01-31 2004-11-09 Allegro Microsystems, Inc. Method and apparatus for providing information from a speed and direction sensor
DE10210184A1 (en) 2002-03-07 2003-09-18 Philips Intellectual Property Magnetic field arrangement for detection of the position and rotational velocity of a rotating element has a coil arrangement for generation of an additional time varying magnetic field to reduce finishing tolerance effects
JP4190780B2 (en) 2002-03-18 2008-12-03 株式会社デンソー Rotation detector
US7170280B2 (en) 2002-04-18 2007-01-30 Continental Teves, Ag And Company Ohg Method and device for the detection of local displacements and rotations
DE10219091A1 (en) 2002-04-29 2003-11-20 Siemens Ag Rotational movement detector comprises a hollow cylindrical induction element inside which are arranged an Eddy current excitation arrangement and an Eddy current sensor arrangement
JP4575153B2 (en) 2002-06-18 2010-11-04 旭化成エレクトロニクス株式会社 Current measuring method and current measuring apparatus
US6590804B1 (en) * 2002-07-16 2003-07-08 Hewlett-Packard Development Company, L.P. Adjustable current mode differential amplifier
JP4402865B2 (en) 2002-07-22 2010-01-20 旭化成エレクトロニクス株式会社 Magnetoelectric transducer and method for producing the same
US6798193B2 (en) 2002-08-14 2004-09-28 Honeywell International Inc. Calibrated, low-profile magnetic sensor
JP3980450B2 (en) 2002-08-30 2007-09-26 株式会社東芝 Radiation detector and radiation detection method
US20040046248A1 (en) 2002-09-05 2004-03-11 Corning Intellisense Corporation Microsystem packaging and associated methods
US20040062362A1 (en) 2002-09-18 2004-04-01 Yasuyuki Matsuya Data communication method, data transmitting apparatus, data receiving apparatus, and data transmission program
US6781359B2 (en) 2002-09-20 2004-08-24 Allegro Microsystems, Inc. Integrated current sensor
US6674679B1 (en) * 2002-10-01 2004-01-06 Hewlett-Packard Development Company, L.P. Adjustable current mode differential amplifier for multiple bias point sensing of MRAM having equi-potential isolation
FR2845469B1 (en) 2002-10-07 2005-03-11 Moving Magnet Tech ANALOGUE POSITION SENSOR WITH VARIABLE RELUCTANCE
JP3720801B2 (en) 2002-10-24 2005-11-30 三菱電機株式会社 Magnetic detector
DE10250538B4 (en) 2002-10-29 2008-02-21 Infineon Technologies Ag Electronic component as multichip module and method for its production
JP2004152688A (en) 2002-10-31 2004-05-27 Toshiba Plant Systems & Services Corp Method for connection and insulation of cable
JP2004207477A (en) 2002-12-25 2004-07-22 Sanken Electric Co Ltd Semiconductor device having hall element
US7259545B2 (en) 2003-02-11 2007-08-21 Allegro Microsystems, Inc. Integrated sensor
US6995957B2 (en) 2003-03-18 2006-02-07 Hitachi Global Storage Technologies Netherland B.V. Magnetoresistive sensor having a high resistance soft magnetic layer between sensor stack and shield
DE10314602B4 (en) 2003-03-31 2007-03-01 Infineon Technologies Ag Integrated differential magnetic field sensor
JP4292571B2 (en) 2003-03-31 2009-07-08 株式会社デンソー Magnetic sensor adjustment method and magnetic sensor adjustment device
JP2004356338A (en) 2003-05-28 2004-12-16 Res Inst Electric Magnetic Alloys Thin film magnetic sensor and its manufacturing method
JP2004357858A (en) 2003-06-03 2004-12-24 Samii Kk Attachment/detachment facilitating mechanism for game board
JP3857255B2 (en) * 2003-06-12 2006-12-13 ローム株式会社 Magnetic recording / reproducing device
US20050017709A1 (en) 2003-07-25 2005-01-27 Honeywell International Inc. Magnetoresistive turbocharger compressor wheel speed sensor
DE10335153B4 (en) 2003-07-31 2006-07-27 Siemens Ag Circuit arrangement on a substrate having a component of a sensor, and method for producing the circuit arrangement on the substrate
US20060219436A1 (en) 2003-08-26 2006-10-05 Taylor William P Current sensor
US7476816B2 (en) 2003-08-26 2009-01-13 Allegro Microsystems, Inc. Current sensor
US20050122095A1 (en) 2003-12-05 2005-06-09 Dooley Kevin A. Rotation sensor and method
JP2005171769A (en) 2003-12-08 2005-06-30 Kokusan Denki Co Ltd Rotation information detecting device of engine
US20050146057A1 (en) 2003-12-31 2005-07-07 Khor Ah L. Micro lead frame package having transparent encapsulant
JP2005249488A (en) 2004-03-02 2005-09-15 Denso Corp Detection signal processing circuit and detection signal processing device for rotation sensor
US7199579B2 (en) 2004-03-08 2007-04-03 Allegro Microsystems, Inc. Proximity detector
US7193412B2 (en) 2004-03-24 2007-03-20 Stoneridge Control Devices, Inc. Target activated sensor
JP4605435B2 (en) 2004-03-24 2011-01-05 アイシン精機株式会社 Rotation detector
US7365530B2 (en) 2004-04-08 2008-04-29 Allegro Microsystems, Inc. Method and apparatus for vibration detection
US20050225318A1 (en) 2004-04-08 2005-10-13 Bailey James M Methods and apparatus for vibration detection
EP1751766A1 (en) 2004-05-18 2007-02-14 Koninklijke Philips Electronics N.V. Digital magnetic current sensor and logic
JP2005337866A (en) 2004-05-26 2005-12-08 Asahi Kasei Corp Magnetic substance detector and semiconductor package
DE102004025776B3 (en) 2004-05-26 2005-07-21 Infineon Technologies Ag Detecting faults in determining angular speed and/or rotation direction of rotor involves determining phase difference between first angular speed signal and first rotation direction signal to detect faults
US7961823B2 (en) 2004-06-02 2011-06-14 Broadcom Corporation System and method for adjusting multiple control loops using common criteria
JP4274051B2 (en) 2004-06-03 2009-06-03 株式会社デンソー Rotation detection device and method of manufacturing rotation detection device
JP4969026B2 (en) 2004-06-15 2012-07-04 三菱電機株式会社 Magnetic detector
US7112957B2 (en) 2004-06-16 2006-09-26 Honeywell International Inc. GMR sensor with flux concentrators
US7184876B2 (en) 2004-06-18 2007-02-27 Siemens Vdo Automotive Device and process for determining the position of an engine
JP4476717B2 (en) 2004-06-30 2010-06-09 オークマ株式会社 Electromagnetic induction type position sensor
US20060038559A1 (en) 2004-08-20 2006-02-23 Honeywell International, Inc. Magnetically biased eddy current sensor
EP1637898A1 (en) 2004-09-16 2006-03-22 Liaisons Electroniques-Mecaniques Lem S.A. Continuously calibrated magnetic field sensor
US8288046B2 (en) 2004-09-29 2012-10-16 GM Global Technology Operations LLC Integrated current sensors for a fuel cell stack
US7253613B2 (en) 2004-11-02 2007-08-07 Denso Corporation Rotation detecting device
ATE361488T1 (en) 2004-11-25 2007-05-15 Alcatel Lucent METHOD AND DEVICE FOR DIRECTION DETECTION
EP1679524A1 (en) 2005-01-11 2006-07-12 Ecole Polytechnique Federale De Lausanne Epfl - Sti - Imm - Lmis3 Hall sensor and method of operating a Hall sensor
US7476953B2 (en) 2005-02-04 2009-01-13 Allegro Microsystems, Inc. Integrated sensor having a magnetic flux concentrator
US7701208B2 (en) 2005-02-08 2010-04-20 Rohm Co., Ltd. Magnetic sensor circuit and portable terminal provided with such magnetic sensor circuit
DE102005047413B8 (en) 2005-02-23 2012-06-06 Infineon Technologies Ag A magnetic field sensor element and method for performing an on-wafer function test, and methods of fabricating magnetic field sensor elements and methods of fabricating magnetic field sensor elements having an on-wafer function test
JP2006300779A (en) 2005-04-21 2006-11-02 Denso Corp Rotation detector
US7325175B2 (en) 2005-05-04 2008-01-29 Broadcom Corporation Phase adjust using relative error
US7769110B2 (en) 2005-05-13 2010-08-03 Broadcom Corporation Threshold adjust system and method
US7425824B2 (en) 2005-05-20 2008-09-16 Honeywell International Inc. Magnetoresistive sensor
JP4744248B2 (en) 2005-05-30 2011-08-10 財団法人国際超電導産業技術研究センター RE oxide superconducting wire joining method
DE102005027767A1 (en) 2005-06-15 2006-12-28 Infineon Technologies Ag Integrated magnetic sensor component for e.g. measuring magnetic field intensity, has contact surfaces electrically connected with flat conductors by flip-chip-contacts and homogenization disk attached between semiconductor chip and magnet
US7269992B2 (en) 2005-06-15 2007-09-18 Honeywell International Inc. Magnet orientation and calibration for small package turbocharger speed sensor
WO2007007239A2 (en) 2005-07-08 2007-01-18 Nxp B.V. Semiconductor device
US7808074B2 (en) 2005-07-08 2010-10-05 Infineon Technologies Ag Advanced leadframe having predefined bases for attaching passive components
US7126327B1 (en) 2005-07-22 2006-10-24 Honeywell International Inc. Asymmetrical AMR wheatstone bridge layout for position sensor
KR101208325B1 (en) * 2005-09-09 2012-12-05 세미컨덕터 콤포넨츠 인더스트리즈 엘엘씨 A current sense circuit and method of forming thereof
US7361531B2 (en) 2005-11-01 2008-04-22 Allegro Microsystems, Inc. Methods and apparatus for Flip-Chip-On-Lead semiconductor package
US7323780B2 (en) 2005-11-10 2008-01-29 International Business Machines Corporation Electrical interconnection structure formation
US20070110199A1 (en) 2005-11-15 2007-05-17 Afshin Momtaz Receive equalizer with adaptive loops
US7362094B2 (en) 2006-01-17 2008-04-22 Allegro Microsystems, Inc. Methods and apparatus for magnetic article detection
US7768083B2 (en) 2006-01-20 2010-08-03 Allegro Microsystems, Inc. Arrangements for an integrated sensor
US7292095B2 (en) 2006-01-26 2007-11-06 Texas Instruments Incorporated Notch filter for ripple reduction in chopper stabilized amplifiers
JP4754985B2 (en) 2006-02-17 2011-08-24 旭化成エレクトロニクス株式会社 Magnetic sensor module
JP4607049B2 (en) 2006-02-23 2011-01-05 株式会社デンソー Rotation angle detector
EP1991862B1 (en) 2006-02-24 2013-07-10 Commissariat à l'Énergie Atomique et aux Énergies Alternatives Method and device for non destructive evaluation of defects in a metallic object
US8274276B2 (en) 2006-03-10 2012-09-25 European Advanced Superconductor Gmbh & Co. Kg System and method for the non-destructive testing of elongate bodies and their weldbond joints
JP4916821B2 (en) 2006-03-31 2012-04-18 株式会社ダイヘン Voltage detection printed circuit board and voltage detector using the same
WO2007138508A1 (en) 2006-05-30 2007-12-06 Koninklijke Philips Electronics N. V. Sensor device with adaptive field compensation
US20080013298A1 (en) 2006-07-14 2008-01-17 Nirmal Sharma Methods and apparatus for passive attachment of components for integrated circuits
DE102006037226B4 (en) 2006-08-09 2008-05-29 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Calibratable magnetic 3D-point sensor during measuring operation
DE102006045141B9 (en) 2006-09-25 2009-02-19 Infineon Technologies Ag Magnetic field sensor device
GB0620307D0 (en) 2006-10-16 2006-11-22 Ami Semiconductor Belgium Bvba Auto-calibration of magnetic sensor
CA2566933C (en) 2006-10-17 2013-09-24 Athena Industrial Technologies Inc. Inspection apparatus and method
US7425821B2 (en) 2006-10-19 2008-09-16 Allegro Microsystems, Inc. Chopped Hall effect sensor
US8115479B2 (en) 2006-11-21 2012-02-14 Hitachi Metals, Ltd. Rotation-angle-detecting apparatus, rotating machine, and rotation-angle-detecting method
FR2909756B1 (en) 2006-12-06 2009-02-20 Bosch Gmbh Robert MOTION DETECTION SYSTEM FOR MOTOR VEHICLE.
US7729675B2 (en) 2006-12-08 2010-06-01 Silicon Laboratories Inc. Reducing noise during a gain change
US8128549B2 (en) 2007-02-20 2012-03-06 Neuronetics, Inc. Capacitor failure detection
US7816772B2 (en) 2007-03-29 2010-10-19 Allegro Microsystems, Inc. Methods and apparatus for multi-stage molding of integrated circuit package
DE102007018238A1 (en) 2007-04-18 2008-10-23 Robert Bosch Gmbh Device for detecting the rotational speed of a rotatable part
EP2000813A1 (en) 2007-05-29 2008-12-10 Ecole Polytechnique Fédérale de Lausanne Magnetic field sensor for measuring a direction of a magnetic field in a plane
US7982454B2 (en) 2007-06-26 2011-07-19 Allegro Microsystems, Inc. Calibration circuits and methods for a proximity detector using a first rotation detector for a determined time period and a second rotation detector after the determined time period
DE102007029817B9 (en) 2007-06-28 2017-01-12 Infineon Technologies Ag Magnetic field sensor and method for calibrating a magnetic field sensor
US7605580B2 (en) 2007-06-29 2009-10-20 Infineon Technologies Austria Ag Integrated hybrid current sensor
US7800389B2 (en) 2007-07-13 2010-09-21 Allegro Microsystems, Inc. Integrated circuit having built-in self-test features
US7694200B2 (en) 2007-07-18 2010-04-06 Allegro Microsystems, Inc. Integrated circuit having built-in self-test features
US7839141B2 (en) 2007-08-14 2010-11-23 Infineon Technologies Ag Method of biasing a magneto resistive sensor element
JP2009058240A (en) 2007-08-30 2009-03-19 Denso Corp Rotation detector
DE102007041230B3 (en) 2007-08-31 2009-04-09 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Calibratable multi-dimensional magnetic point sensor and corresponding method and computer program therefor
US7973635B2 (en) 2007-09-28 2011-07-05 Access Business Group International Llc Printed circuit board coil
US20090102467A1 (en) 2007-10-22 2009-04-23 Johnson Controls Inc. Method and apparatus for sensing shaft rotation
EP2063229B1 (en) 2007-11-21 2012-05-02 Micronas GmbH Magnetic field sensor system
US8587297B2 (en) 2007-12-04 2013-11-19 Infineon Technologies Ag Integrated circuit including sensor having injection molded magnetic material
US8575920B2 (en) 2007-12-05 2013-11-05 Infineon Technologies Ag Magneto-resistive magnetic field sensor
US7923996B2 (en) 2008-02-26 2011-04-12 Allegro Microsystems, Inc. Magnetic field sensor with automatic sensitivity adjustment
US7936144B2 (en) 2008-03-06 2011-05-03 Allegro Microsystems, Inc. Self-calibration algorithms in a small motor driver IC with an integrated position sensor
US8203335B2 (en) 2008-03-28 2012-06-19 Infineon Technologies Austria Ag System and method for an inductive proximity switch on a common substrate
US7605647B1 (en) 2008-04-29 2009-10-20 Allegro Microsystems, Inc. Chopper-stabilized amplifier and magnetic field sensor
US8058870B2 (en) 2008-05-30 2011-11-15 Infineon Technologies Ag Methods and systems for magnetic sensing
US7816905B2 (en) 2008-06-02 2010-10-19 Allegro Microsystems, Inc. Arrangements for a current sensing circuit and integrated current sensor
US8203332B2 (en) 2008-06-24 2012-06-19 Magic Technologies, Inc. Gear tooth sensor (GTS) with magnetoresistive bridge
US8624588B2 (en) 2008-07-31 2014-01-07 Allegro Microsystems, Llc Apparatus and method for providing an output signal indicative of a speed of rotation and a direction of rotation as a ferromagnetic object
US8063634B2 (en) 2008-07-31 2011-11-22 Allegro Microsystems, Inc. Electronic circuit and method for resetting a magnetoresistance element
US8098062B2 (en) * 2008-08-22 2012-01-17 Honeywell International Inc. Comparator circuit having latching behavior and digital output sensors therefrom
US7764118B2 (en) 2008-09-11 2010-07-27 Analog Devices, Inc. Auto-correction feedback loop for offset and ripple suppression in a chopper-stabilized amplifier
US8253413B2 (en) 2008-09-22 2012-08-28 Infineon Technologies Ag System that obtains a switching point with the encoder in a static position
US8486755B2 (en) 2008-12-05 2013-07-16 Allegro Microsystems, Llc Magnetic field sensors and methods for fabricating the magnetic field sensors
US20100188078A1 (en) 2009-01-28 2010-07-29 Andrea Foletto Magnetic sensor with concentrator for increased sensing range
US8289019B2 (en) 2009-02-11 2012-10-16 Infineon Technologies Ag Sensor
DE112010000848B4 (en) 2009-02-17 2018-04-05 Allegro Microsystems, Llc Circuits and methods for generating a self-test of a magnetic field sensor
US8253210B2 (en) 2009-04-30 2012-08-28 Infineon Technologies Ag Semiconductor device including a magnetic sensor chip
US8362579B2 (en) 2009-05-20 2013-01-29 Infineon Technologies Ag Semiconductor device including a magnetic sensor chip
US7990209B2 (en) 2009-06-19 2011-08-02 Allegro Microsystems, Inc. Switched capacitor notch filter
EP2634592B1 (en) 2009-07-22 2015-01-14 Allegro Microsystems, LLC Circuits and methods for generating a diagnostic mode of operation in a magnetic field sensor
US8299783B2 (en) 2009-08-27 2012-10-30 Allegro Microsystems, Inc. Circuits and methods for calibration of a motion detector
US10107875B2 (en) 2009-11-30 2018-10-23 Infineon Technologies Ag GMR sensor within molded magnetic material employing non-magnetic spacer
US8680848B2 (en) 2010-06-03 2014-03-25 Allegro Microsystems, Llc Motion sensor, method, and computer-readable storage medium providing a motion sensor that adjusts gains of two circuit channels to bring the gains close to each other
US8664943B2 (en) 2010-07-07 2014-03-04 Asahi Kasei Microdevices Corporation Position detecting apparatus
US9678175B2 (en) 2010-07-26 2017-06-13 Radiation Monitoring Devices, Inc. Eddy current detection
US8729892B2 (en) 2011-04-01 2014-05-20 Allegro Microsystems, Llc Differential magnetic field sensor structure for orientation independent measurement
US8680846B2 (en) 2011-04-27 2014-03-25 Allegro Microsystems, Llc Circuits and methods for self-calibrating or self-testing a magnetic field sensor
GB2481482B (en) 2011-04-27 2012-06-20 Univ Manchester Improvements in sensors
DE102011102483A1 (en) 2011-05-24 2012-11-29 Austriamicrosystems Ag Method for operating a Hall sensor arrangement and Hall sensor arrangement
US20130015845A1 (en) 2011-07-11 2013-01-17 Honeywell International Inc. Absolute angular position sensor using two magnetoresistive sensors
US9121880B2 (en) 2011-11-04 2015-09-01 Infineon Technologies Ag Magnetic sensor device
US9395391B2 (en) 2013-03-15 2016-07-19 Allegro Microsystems, Llc Magnetic field sensor and associated method that can store a measured threshold value in a memory device during a time when the magnetic field sensor is powered off
US9201122B2 (en) 2012-02-16 2015-12-01 Allegro Microsystems, Llc Circuits and methods using adjustable feedback for self-calibrating or self-testing a magnetic field sensor with an adjustable time constant
US9817078B2 (en) 2012-05-10 2017-11-14 Allegro Microsystems Llc Methods and apparatus for magnetic sensor having integrated coil
US9606190B2 (en) 2012-12-21 2017-03-28 Allegro Microsystems, Llc Magnetic field sensor arrangements and associated methods
US8749005B1 (en) 2012-12-21 2014-06-10 Allegro Microsystems, Llc Magnetic field sensor and method of fabricating a magnetic field sensor having a plurality of vertical hall elements arranged in at least a portion of a polygonal shape
EP3361275B1 (en) * 2015-01-14 2019-12-25 Allegro MicroSystems, LLC Integrated magnetic field sensor and method of powering on and off a load

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5168244A (en) * 1991-06-19 1992-12-01 Nec Corporation Electric circuit fabricated from magneto-resistive elements and active circuit elements
JPH1038988A (en) * 1996-07-30 1998-02-13 Yazaki Corp Integrated magnetoresistive effect element circuit
EP2730893A1 (en) * 2011-07-05 2014-05-14 Denso Corporation Mobile object detecting apparatus

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