A software and hardware system and an associated methodology provides ATE-independent go/no-go testing as well as advanced failure diagnosis of integrated circuits for silicon debug, process characterization, production (volume) testing, and system diagnosis comprises an embedded test architecture designed...http://www.google.de/patents/US6961871?utm_source=gb-gplus-sharePatent US6961871 - Method, system and program product for testing and/or diagnosing circuits using embedded test controller access data
