A method of testing integrated circuitry includes providing a substrate comprising integrated circuitry to be tested. The circuitry substrate to be tested has a plurality of exposed conductors in electrical connection with the integrated circuitry. In one implementation, at least some of the exposed...http://www.google.de/patents/US6337575?utm_source=gb-gplus-sharePatent US6337575 - Methods of testing integrated circuitry, methods of forming tester substrates, and circuitry testing substrates
