Techniques for inline measurement of switching delay history effects in an integrated circuit device are provided. A pulse is launched down a delay chain. The pulse is substantially synchronized with a signal of a ring oscillator. The delay chain and the ring oscillator comprise substantially identical...http://www.google.de/patents/US7504896?utm_source=gb-gplus-sharePatent US7504896 - Methods and apparatus for inline measurement of switching delay history effects in PD-SOI technology
