Methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in conjunction with a coaxial test probe. Simple, low-cost test fixturing and methods of testing may be used to measure the parasitic capacitance...http://www.google.de/patents/US7208959?utm_source=gb-gplus-sharePatent US7208959 - Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer
