A switch controlling circuit for the testing and fine-tuning of integrated circuits comprising of a series of flip-flops chain together in a serial manner. The contents of the flip-flop are shift in from the input of the first flip-flop in the chain. The output of each flip-flop connects to individual...http://www.google.de/patents/US6815992?utm_source=gb-gplus-sharePatent US6815992 - Circuit for testing and fine tuning integrated circuit (switch control circuit)
