An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays on the large area substrate. The apparatus includes a prober assembly that is movable relative to the large area substrate...http://www.google.de/patents/US7786742?utm_source=gb-gplus-sharePatent US7786742 - Prober for electronic device testing on large area substrates
