A memory device includes an output data path that transfers data from an I/O circuit coupled to a memory array to an output tri-state buffer. A comparing circuit compares data from the I/O circuit to a desired data pattern. If the data does not match the desired pattern, the comparing circuit outputs...http://www.google.de/patents/US6032274?utm_source=gb-gplus-sharePatent US6032274 - Method and apparatus for compressed data testing of more than one memory array
