There is disclosed an apparatus for the automated loading of probes in a probe head intended for use in automated testing of printed circuit boards. The invention automatically places probes in a probe head at on-grid and at off-grid test points, with probes for the latter test points being vertically...http://www.google.de/patents/US5511304?utm_source=gb-gplus-sharePatent US5511304 - Automated test pin loading apparatus
