A testing method and system is used to test memory modules each of which has a memory hub coupled to a plurality of memory devices. The testing system and method includes a test interface circuit having a memory interface that is coupled to transmit and receive memory signals to and from a tester through...http://www.google.de/patents/US20070038907?utm_source=gb-gplus-sharePatent US20070038907 - Testing system and method for memory modules having a memory hub architecture
