A device-under-test card includes a matrix of fuses and/or antifuses formed as part of a multi-layered structure. The matrix of fuses and/or antifuses can be electrically programmed to connect any one of first electrical contacts to any one of second electrical contacts and so allows the ...http://www.google.de/patents/US5726482?utm_source=gb-gplus-sharePatent US5726482 - Device-under-test card for a burn-in board
