The present invention has a purpose to provide method of measuring the inclination of an IC in order to correct its position quickly and precisely without binzarized images. The method according to this invention: 1) defines an inspection area including open ends of IC pins, 2) extracts longitudinal...http://www.google.de/patents/US5627912?utm_source=gb-gplus-sharePatent US5627912 - Inspection method of inclination of an IC
