Disclosed are methods and apparatus for automatically organizing and/or analyzing a plurality of defect images without first providing a predefined set of classified images (herein referred to as a training set). In other words, sorting is not based on a training set or predefined classification codes...http://www.google.de/patents/US7283659?utm_source=gb-gplus-sharePatent US7283659 - Apparatus and methods for searching through and analyzing defect images and wafer maps
