An integrated circuit device disclosed herein includes a test device and a setup and hold measuring circuit. The setup and hold measuring circuit generates a reference signal and a data signal in response to an external clock signal in a test mode of operation. The test device receives the data signal...http://www.google.de/patents/US20050094448?utm_source=gb-gplus-sharePatent US20050094448 - Integrated circuit device with on-chip setup/hold measuring circuit
