Probes for a probe card adapted to test integrated circuit patterns having contacts deployed thereon, the card including an opening providing access to a pattern and a ring of spaced conductive pads surrounding the opening. The probes are adapted to be anchored on selected pads of the card, each probe...http://www.google.de/patents/US4382228?utm_source=gb-gplus-sharePatent US4382228 - Probes for fixed point probe cards
