Microelectronic components are commonly tested with probe cards. Certain aspects of the invention provide alternative probes, probe cards, and methods of testing microelectronic components. In one specific example, a probe card includes a base and a probe carried by the base. An actuator is associated...http://www.google.de/patents/US6952109?utm_source=gb-gplus-sharePatent US6952109 - Selectively configurable probe structures, e.g., for testing microelectronic components
