Systems and methods for performing logic built-in-self-tests (LBISTs) in digital circuits, where scan shift operations of the LBIST circuitry are performed at reduced rates. In one embodiment, a base clock signal is gated before being provided to LBIST circuitry. The clock signal is gated to produce...http://www.google.de/patents/US7266745?utm_source=gb-gplus-sharePatent US7266745 - Programmable scan shift speed control for LBIST
