A system for interfacing wafer sort prober apparatus and packaged IC handler apparatus to a common test computer is provided that includes a single motherboard and at least one daughter board. The motherboard includes a probe card interface area having a plurality of contactors that mate with symmetrical...http://www.google.de/patents/US5489852?utm_source=gb-gplus-sharePatent US5489852 - System for interfacing wafer sort prober apparatus and packaged IC handler apparatus to a common test computer
