A semiconductor device with high reliability is provided using an SOI substrate. When the SOI substrate is fabricated by using a technique typified by SIMOX, ELTRAN, or Smart-Cut, a single crystal semiconductor substrate having a main surface (crystal face) of a {110} plane is used. In such an SOI substrate,...http://www.google.de/patents/US7473971?utm_source=gb-gplus-sharePatent US7473971 - Method of fabricating a semiconductor device
