Apparatus and methods provide built-in testing enhancements in integrated circuits. These testing enhancements permit, for example, continuity testing to pads and/or leakage current testing for more than one pad. The disclosed techniques may permit more thorough testing of integrated circuits at the...http://www.google.de/patents/US7612574?utm_source=gb-gplus-sharePatent US7612574 - Systems and methods for defect testing of externally accessible integrated circuit interconnects
